processing techniques to achieve extremely low
on-resistance per silicon area. Additional features
of this design are a 175°C junction operating
temperature, fast switching speed and improved
repetitive avalanche rating. These features combine
to make this design an extremely efficient and
reliable device for use in a wide variety of applications.
D-Pak
IRLR3705ZPbF
I-Pak
IRLU3705ZPbF
Absolute Maximum Ratings
ID @ TC = 25°C
ID @ TC = 100°C
@ TC = 25°C
I
D
I
DM
PD @TC = 25°C
V
GS
E
AS (Th ermally limited)
E
(Tested )
AS
I
AR
E
AR
T
J
T
STG
ParameterUnits
(Silicon Limited)
Continuous Drain Current, V
Continuous Drain Current, V
Continuous Drain Current, V
Pulsed Drain Current
Power Dissipation W
Linear Derating Factor W/°C
Gate-to-S ource VoltageV
Single Pulse Avalanche Energy
Single P ulse Avalanche Energy Tested Value
Avalanche Current
Repetitive Avalanche Energy
Operating Junction and
Storage Temperature Range°C
Soldering Tem perature, for 10 seconds
Mounting Torque, 6-32 or M3 screw
c
c
@ 10V
GS
@ 10V
GS
@ 10V
GS
d
g
(Package Limited)
h
See Fig.12a, 12b, 15, 16
300 (1.6mm from case )
Max.
89
63
42
360
130
0.88
± 16
110
190
-55 to + 175
10 lbf
y
in (1.1Nym)
A
mJ
A
mJ
Thermal Resistance
ParameterTyp.Max.Units
R
θJC
R
JA
θ
R
θJA
Junction-to-Case
Junction-to-Ambient (PCB mount)
Junction-to-Ambient
j
ij
j
–––1.14
–––40°C/W
–––110
HEXFET® is a registered trademark of International Rectifier.
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRLR/U3705ZPbF
A
15V
L
D.U.T
I
AS
Ω
0.01
t
p
R
20V
V
V
DS
G
GS
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
DRIVER
+
-
V
DD
500
)
J
m
(
y
g
r
400
e
n
E
e
h
c
300
n
a
l
a
v
A
e
s
200
l
u
P
e
l
g
n
i
100
S
,
S
A
E
0
255075100125150175
I
TOP
7.0A
BOTTOM
Starting TJ, Junction Temperature (°C)
Fig 12c. Maximum Avalanche Energy
vs. Drain Current
D
5.3A
42A
10 V
Q
GS
V
G
Fig 13a. Basic Gate Charge Waveform
0
1K
Fig 13b. Gate Charge Test Circuit
Q
GD
Charge
DUT
2.5
)
V
(
e
2.0
g
a
t
l
o
V
d
l
1.5
o
h
s
e
r
h
t
e
1.0
t
a
G
)
h
t
(
S
0.5
L
G
V
ID = 250µA
ID = 150µA
ID = 50µA
VCC
0.0
-75 -50 -25 025 50 75 100 125 150 175
TJ , Temperature ( °C )
Fig 14. Threshold Voltage vs. Temperature
6www.irf.com
Page 7
IRLR/U3705ZPbF
1000
Duty Cycle = Single Pulse
100
)
A
(
t
n
e
r
r
u
C
10
e
h
c
n
a
l
a
v
A
1
0.1
1.0E-061.0E-051.0E-041.0E-031.0E-021.0E-01
0.01
0.05
0.10
tav (sec)
Fig 15. Typical Avalanche Current vs.Pulsewidth
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
avalanche losses. Note: In no
case should Tj be allowed to
exceed Tjmax
120
TOP Single Pulse
)
100
J
m
(
y
g
r
80
e
n
E
e
h
60
c
n
a
l
a
v
40
A
,
R
A
E
20
BOTTOM 1% Duty Cycle
ID = 42A
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
every part type.
2. Safe operation in Avalanche is allowed as long asT
not exceeded.
. This is validated for
jmax
jmax
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. P
avalanche pulse.
= Average power dissipation per single
D (ave)
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
0
255075100125150175
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
vs. Temperature
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
AS (AR)
= P
·f
av
D (ave)·tav
thJC
www.irf.com7
is
Page 8
IRLR/U3705ZPbF
Reverse
Recovery
Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied
Voltage
+
-
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
R
D.U.T.
D
+
V
DD
-
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 18a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
d(on)tr
t
d(off)tf
Fig 18b. Switching Time Waveforms
8www.irf.com
Page 9
D-Pak (TO-252AA) Package Outline
Dimensions are shown in millimeters (inches)
IRLR/U3705ZPbF
D-Pak (TO-252AA) Part Marking Information
EXAMPL E:
THIS IS AN IRFR120
WIT H AS SE MB LY
LOT CODE 1234
AS SE MB LED ON WW 16, 2001
IN THE ASS EMBLY LINE "A"
Note: "P" in ass embly line pos ition
in dicates "L ead-F r ee"
"P" in assembly line position indicates
"L ead-F ree" q uali fi cati on to the cons umer -l evel
OR
INTERNATIONAL
RECTIFIER
LOGO
AS S E MB L Y
LOT CODE
INTERNATIONAL
RECTIFIER
LOGO
AS S E MB L Y
LOT CODE
IRF R120
12
IRF R120
PART NUMBER
DATE CODE
P = DESIGNAT ES L EAD-FRE E
34
P = DESIGNAT ES L EAD-FRE E
YEAR 1 = 2001
WE E K 16
A = AS S E MB L Y S I T E CODE
Notes:
1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/
2. For the most current drawing please refer to IR website at http://www.irf.com/package/
www.irf.com9
PART NUMBER
DATE CODE
116A
YEAR 1 = 2001
3412
WE EK 16
LINE A
PRODUCT (OPTIONAL )
PRODUCT QUALIFIED TO THE
CONS UME R LEVEL (OPTI ONAL)
Page 10
IRLR/U3705ZPbF
I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)
I-Pak (TO-251AA) Part Marking Information
EXAMPLE :
THIS IS AN IRF U120
WI T H AS S EM BL Y
LOT CODE 5678
ASS EMBLED ON WW 19, 2001
IN T HE ASSEMBLY LINE "A"
Note: "P" in assembly line position
in dicates L ead- F ree"
INTERNATIONAL
RECTIFIER
LOGO
AS S E MB L Y
LOT CODE
IRFU120
56
OR
INTERNATIONAL
RECTIFIER
LOGO
AS S E MB L Y
LOT CODE
IRFU 120
56 78
PART NUMBER
DATE COD E
P = DES IGNATES LEAD-FREE
YEAR 1 = 2001
WE E K 1 9
A = ASSEMBLY SITE CODE
Notes:
1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/
2. For the most current drawing please refer to IR website at http://www.irf.com/package/
10www.irf.com
PART NUMBER
DATE CODE
119A
PRODUCT (OPT IONAL)
YEAR 1 = 2001
78
WE E K 1 9
LINE A
Page 11
IRLR/U3705ZPbF
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters
TR
TRR TRL
16.3 ( .641 )
15.7 ( .619 )
12.1 ( .476 )
11.9 ( .469 )
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMET ERS ( INCHES ).
3. OUTLINE CONFO RMS TO EIA-481 & EIA-541.
13 INCH
NOTES :
1. OUTLINE CONFORMS TO EIA-481.
FEED DIRECTION
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
Limited by T
RG = 25Ω, I
, starting TJ = 25°C, L = 0.12mH
Jmax
= 42A, VGS =10V. Part not
AS
recommended for use above this value.
Pulse width ≤ 1.0ms; duty cycle ≤ 2%.
16.3 ( .641 )
15.7 ( .619 )
8.1 ( .318 )
7.9 ( .312 )
C
eff. is a fixed capacitance that gives the same charging time
oss
as C
Limited by T
16 mm
oss
FEED DIR ECTION
while V
is rising from 0 to 80% V
DS
, see Fig.12a, 12b, 15, 16 for typical repetitive
Jmax
DSS
.
avalanche performance.
This value determined from sample failure population. 100%
tested to this value in production.
When mounted on 1" square PCB (FR-4 or G-10 Material) .
For recommended footprint and soldering techniques refer to
application note #AN-994
R
is measured at TJ approximately 90°C
θ
Data and specifications subject to change without notice.
This product has been designed for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.10/2010
www.irf.com11
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