Datasheet IRLR2905ZPBF Specification

Page 1
PD - 95848C
AUTOMOTIVE MOSFET
IRLR2905Z IRLU2905Z
HEXFET® Power MOSFET
Features
O Logic Level O Advanced Process Technology O Ultra Low On-Resistance O 175°C Operating Temperature O Fast Switching O Repetitive Avalanche Allowed up to Tjmax
G
Description
Specifically designed for Automotive applications, this HEXFET Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating tempera­ture, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications.
Absolute Maximum Ratings
Parameter Units
ID @ TC = 25°C
ID @ TC = 100°C
@ TC = 25°C
I
D
I
DM
PD @TC = 25°C
V
GS
E
AS (Thermally limited)
E
(Tested )
AS
I
AR
E
AR
T
J
T
STG
Continuous Drain Current, V
Continuous Drain Current, V
Continuous Drain Current, V Pulsed Drain Current
Power Dissipation W
Linear Derating Factor W/°C Gate-to-Source Voltage V
Single Pulse Avalanche Energy
Single Pulse Avalanche Energy Tested Value
Avalanche Current
Repetitive Avalanche Energy
Operating Junction and
Storage Temperature Range °C
Soldering Temperature, for 10 seconds
Mounting Torque, 6-32 or M3 screw
c
c
@ 10V (Silicon Limited)
GS
@ 10V
GS
@ 10V (Package Limited)
GS
d
h
g
Thermal Resistance
Parameter Typ. Max. Units
R
θ
JC
R
θ
JA
R
θ
JA
Junction-to-Case
Junction-to-Ambient (PCB mount)
Junction-to-Ambient ––– 110
j
i
HEXFET® is a registered trademark of International Rectifier.
www.irf.com 1
D
V
= 55V
DSS
R
S
®
D-Pak
IRLR2905Z
ID = 42A
= 13.5mΩ
I-Pak
IRLU2905Z
Max.
60
43
42
240
110
0.72
± 16
57
85
See Fig.12a, 12b, 15, 16
-55 to + 175
300 (1.6mm from case )
y
10 lbf
in (1.1Nym)
––– 1.38
––– 50 °C/W
A
mJ
A
mJ
8/28/09
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IRLR/U2905Z
/
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
V
(BR)DSS
ΔV
(BR)DSS
R
DS(on)
V
GS(th)
gfs Forward Transconductance 25 ––– ––– S I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C
oss
C
oss
C
eff.
oss
Source-Drain Ratings and Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Drain-to-Source Breakdown Voltage 55 ––– ––– V
ΔT
Breakdown Voltage Temp. Coefficient ––– 0.053 ––– V/°C
J
Static Drain-to-Source On-Resistance ––– 11 13.5
––– ––– 20
––– ––– 22.5
mΩ
mΩ
mΩ
Gate Threshold Voltage 1.0 ––– 3.0 V
Drain-to-Source Leakage Current ––– ––– 20 μA
––– ––– 250
Gate-to-Source Forward Leakage ––– ––– 200 nA
Gate-to-Source Reverse Leakage ––– ––– -200
Total Gate Charge ––– 23 35
Gate-to-Source Charge ––– 8.5 ––– nC
Gate-to-Drain ("Miller") Charge ––– 12 –––
Turn-On Delay Time ––– 14 –––
Rise Time ––– 130 –––
Turn-Off Delay Time ––– 24 ––– ns
Fall Time ––– 33 –––
Internal Drain Inductance ––– 4.5 ––– Between lead,
nH 6mm (0.25in.)
Internal Source Inductance ––– 7.5 ––– from package
Input Capacitance ––– 1570 –––
Output Capacitance ––– 230 –––
Reverse Transfer Capacitance ––– 130 ––– pF
Output Capacitance ––– 840 –––
Output Capacitance ––– 180 –––
Effective Output Capacitance ––– 290 –––
Parameter Min. Typ. Max. Units
Continuous Source Current ––– ––– 42
(Body Diode) A Pulsed Source Current ––– ––– 240
(Body Diode) Diode Forward Voltage ––– ––– 1.3 V
Reverse Recovery Time ––– 22 33 ns
Reverse Recovery Charge ––– 14 21 nC
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
c
Conditions
VGS = 0V, ID = 250μA
Reference to 25°C, I
V
= 10V, ID = 36A
GS
VGS = 5.0V, ID = 30A
V
= 4.5V, ID = 15A
GS
= 1mA
D
e
e e
VDS = VGS, ID = 250μA
V
= 25V, ID = 36A
DS
= 55V, VGS = 0V
V
DS
V
= 55V, VGS = 0V, TJ = 125°C
DS
VGS = 16V
V
= -16V
GS
= 36A
I
D
= 44V
V
DS
VGS = 5.0V
e
VDD = 28V
I
= 36A
D
R
= 15 Ω
G
VGS = 5.0V
and center of die contact
e
D
G
S
VGS = 0V
V
= 25V
DS
ƒ = 1.0MHz
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz
V
= 0V, VDS = 44V, ƒ = 1.0MHz
GS
V
= 0V, VDS = 0V to 44V
GS
f
Conditions
MOSFET symbol
showing the integral reverse
p-n junction diode. T
= 25°C, IS = 36A, VGS = 0V
J
TJ = 25°C, IF = 36A, VDD = 28V di/dt = 100A/μs
e
e
2 www.irf.com
Page 3
IRLR/U2905Z
1000
) A
( t n e
r
r
100
u C e
c
r u o S
­o
t
-
10
n
i a
r D
,
D
I
1
0.1 1 10 100
3.0V
≤
Tj = 25°C
TOP 10V
BOTTOM 3.0V
60μs PULSE WIDTH
VDS, Drain-to-Source Voltage (V)
1000.0
VGS
9.0V
7.0V
5.0V
4.5V
4.0V
3.5V
1000
) A
( t n e
r
r
100
u C e
c
r u o S
­o
t
-
10
n
i a
r D
,
D
I
3.0V
≤
TOP 10V
BOTTOM 3.0V
60μs PULSE WIDTH
Tj = 175°C
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
60
VGS
9.0V
7.0V
5.0V
4.5V
4.0V
3.5V
DS
TJ = 25°C
TJ = 175°C
= 8.0V
)
Α
(
t n e
r
r
100.0
u C e
c
r u o S
­o
t
-
10.0
n
i a
r D
,
D
I
1.0
2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0
V
= 10V
DS
≤
60μs PULSE WIDTH
VGS, Gate-to-Source Voltage (V)
TJ = 25°C
TJ = 175°C
) S
(
50
e c n a
t c
40
u d n o c s
30
n a
r T
d
r a
20
w
r o F , s
10
f G
V
380μs PULSE WIDTH
0
0 1020304050
ID, Drain-to-Source Current (A)
Fig 3. Typical Transfer Characteristics
Fig 4. Typical Forward Transconductance
Vs. Drain Current
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IRLR/U2905Z
2500
2000
) F p
(
1500
e c n a
t
i c a p
1000
a C
, C
500
0
1 10 100
V
= 0V, f = 1 MHZ
GS
C
= C
= C
= C
gs
gd
ds
Ciss
Coss
Crss
+ Cgd, C
+ C
iss
C
rss
C
oss
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000.0
) A
( t
100.0
n e
r
r u
C n
i a
r
10.0
D e
s
r e v e
R ,
D S
I
TJ = 175°C
TJ = 25°C
1.0
0.1
0.2 0.6 1.0 1.4 1.8 2.2
VSD, Source-to-Drain Voltage (V)
12
SHORTED
ds
gd
ID= 36A
) V
10
( e
g a
t
l o
8
V e
c
r u
6
o S
­o
t
­e
t
4
a G
,
S G
2
V
0
0 1020304050
VDS= 44V
VDS= 28V VDS= 11V
Q
Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
V
GS
= 0V
1000
) A
( t
100
n e
r
r u
C e
c
r u
10
o S
­o
t
­n
i a
r D
1
,
D
I
Tc = 25°C Tj = 175°C Single Pulse
0.1 1 10 100 1000
OPERATION IN THIS AREA LIMITED BY RDS(on)
V
, Drain-toSource Voltage (V)
DS
100μsec
1msec
10msec
Fig 7. Typical Source-Drain Diode
Fig 8. Maximum Safe Operating Area
Forward Voltage
4 www.irf.com
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IRLR/U2905Z
τ
60
LIMITED BY PACKAGE
50
) A
(
40
t n e
r
r u
C
30
n
i a
r D
,
20
D
I
10
0
25 50 75 100 125 150 175
TC , Case Temperature (°C)
Fig 9. Maximum Drain Current Vs.
Case Temperature
10
2.0
e c n a
t s
i s e
R n O
)
e
d
c
e
r
z
u
i
l
o
a
S
-
m
r
o
t
o
­n
N
i
( a
r D
,
) n o
( S D
R
ID = 30A
V
= 5.0V
GS
1.5
1.0
0.5
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (°C)
Fig 10. Normalized On-Resistance
Vs. Temperature
)
C
1
J h
t
Z (
e s n o p s e
R l a
m
r e h T
0.001
D = 0.50
0.20
0.1
0.10
0.05
τ
0.02
0.01
0.01
SINGLE PULSE ( THERMAL RESPONSE )
1E-006 1E-005 0.0001 0.001 0.01
J
τ
J
τ
1
τ
1
Ci= τi/Ri
R
R
1
2
R
R
1
2
τ
2
τ
2
Ri (°C/W) τi (sec)
τ
C
0.765 0.000269
0.6141 0.001614
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRLR/U2905Z
A
15V
L
D.U.T
I
AS
0.01
t
p
Ω
R
V
20V
V
DS
G
GS
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
DRIVER
+
-
V
DD
240
) J
m
( y
200
g
r e n E
e
160
h c n a
l a v
120
A e
s
l u P
80
e
l g n
i S
40
, S A
E
0
25 50 75 100 125 150 175
I
TOP
6.2A
BOTTOM
Starting TJ, Junction Temperature (°C)
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
D
4.3A
36A
10 V
Q
GS
V
G
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
.2μF
12V
V
GS
Fig 13b. Gate Charge Test Circuit
Q
GD
Charge
50KΩ
.3μF
D.U.T.
3mA
I
G
Current Sampling Resistors
3.0
) V
( e
g
2.5
a
t
l o V
d
l o h s
2.0
e
r h
t e
t a
G
) h
1.5
t
( S G
+
V
DS
-
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175
ID = 250μA
TJ , Temperature ( °C )
I
D
Fig 14. Threshold Voltage Vs. Temperature
6 www.irf.com
Page 7
IRLR/U2905Z
1000
Duty Cycle = Single Pulse
100
) A
( t n e
r
r u
C
10
e h c n a
l a v A
1
0.1
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02
0.01
0.05
0.10
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
Allowed avalanche Current vs avalanche pulsewidth, tav assuming ΔTj = 25°C due to avalanche losses. Note: In no case should Tj be allowed to exceed Tjmax
60
TOP Single Pulse
50
) J
m
( y
g
40
r e n E
e h
30
c n a
l a v
20
A ,
R A
E
10
BOTTOM 1% Duty Cycle ID = 36A
Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
2. Safe operation in Avalanche is allowed as long asT
jmax
not exceeded.
3. Equation below based on circuit and waveforms shown in Figures 12a, 12b.
4. P
= Average power dissipation per single
D (ave)
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ΔT = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
0
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
Vs. Temperature
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
AS (AR)
= P
·f
av
D (ave)·tav
thJC
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is
Page 8
IRLR/U2905Z
Reverse Recovery Current
Driver Gate Drive
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied Voltage
+
-
Period
P.W.
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
R
D.U.T.
D
+
V
DD
-
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 18a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
t
d(off)tf
Fig 18b. Switching Time Waveforms
8 www.irf.com
Page 9
D-Pak (TO-252AA) Package Outline
Dimensions are shown in millimeters (inches)
IRLR/U2905Z
2.38 (.094)
2.19 (.086)
10.42 (.410)
9.40 (.370)
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2 CONTROLLING DIMENSION : INCH.
3 CONFORMS TO JEDEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).
5.46 (.215)
5.21 (.205)
1.02 (.040)
1.64 (.025)
1.52 (.060)
1.15 (.045)
1.14 (.045)
2X
0.76 (.030)
2.28 (.090)
6.73 (.265)
6.35 (.250)
- A -
4
1 2 3
1.27 (.050)
0.88 (.035)
6.22 (.245)
5.97 (.235)
- B -
0.89 (.035)
3X
0.64 (.025)
0.25 (.010) M A M B
4.57 (.180)
D-Pak (TO-252AA) Part Marking Information
Notes : T hi s part mar k i ng infor mati on appli es to devices pr oduced before 02/26 /20 0 1
EXAMPLE:
THIS IS AN IRFR120 WIT H AS S E MB LY LOT CODE 9U1P
INTERNAT IONAL
RECTIF IER
LOGO
ASSEMBLY LOT CODE
IRFU120
016
9U 1P
1.14 (.045)
0.89 (.035)
0.58 (.023)
0.46 (.018)
6.45 (.245)
5.68 (.224)
0.51 (.020) MIN.
0.58 (.023)
0.46 (.018)
LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
DAT E CODE YEAR = 0 WEEK = 16
Notes : This part marking information applies to devices produced after 02/26/2001
EXAMPLE:
THIS IS AN IRFR120 WIT H AS S E MB LY
LOT CODE 1234 ASS EMBLED ON WW 16, 1999 IN THE AS SEMBLY LINE "A"
INTERNAT IONAL
RECTIF IER
LOGO
AS S E M B L Y LOT CODE
IRFU120
916A
PAR T NUMB ER
DATE CODE
3412
YEAR 9 = 1999 WE EK 16 LINE A
www.irf.com 9
Page 10
IRLR/U2905Z
I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)
5.46 (.215)
5.21 (.205)
1.52 (.060)
1.15 (.045)
- B -
2.28 (.090)
1.91 (.075)
1.14 (.045)
3X
0.76 (.030)
2.28 (.090)
6.73 (.265)
6.35 (.250)
- A -
4
1 2 3
3X
2X
1.27 (.050)
0.88 (.035)
6.22 (.245)
5.97 (.235)
9.65 (.380)
8.89 (.350)
0.89 (.035)
0.64 (.025)
0.25 (.010) M A M B
2.38 (.094)
2.19 (.086)
0.58 (.023)
0.46 (.018)
6.45 (.245)
5.68 (.224)
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2 CONTROLLING DIMENSION : INCH.
3 CONFORMS TO JEDEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).
1.14 (.045)
0.89 (.035)
0.58 (.023)
0.46 (.018)
I-Pak (TO-251AA) Part Marking Information
Notes : T hi s part mar k i ng i nfor mati on applies to devices produced befor e 02/26 /2001
LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
EXAMPLE:
THIS IS AN IRFR 120 WITH ASSEMBLY LOT CODE 9U1P
INTERNAT IONAL
RECTIF IER
LOGO
AS S E M B L Y LOT CODE
IRF U120
016
9U 1P
DATE CODE YEAR = 0 WE EK = 1 6
Notes : This part marking information applies to devices produced after 02/26/2001
EXAMPLE:
THIS IS AN IRFR 120 WITH ASSEMBLY LOT CODE 5678 ASS EMBL E D ON WW 19, 1999 IN T HE ASS EMBLY LINE "A"
INTERNAT IONAL
RECTIF IER
LOGO
AS S E MB L Y LOT CODE
IRF U120
56
919A
78
PAR T NUMBER
DATE CODE YEAR 9 = 1999 WE E K 1 9 LINE A
10 www.irf.com
Page 11
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters (inches)
TR
TRR
IRLR/U2905Z
TRL
12.1 ( .476 )
11.9 ( .469 )
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
13 INCH
NOTES :
1. OUTLINE CONFORMS TO EIA-481.
FEED DIRECTION
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
 Limited by T
RG = 25Ω, I
, starting TJ = 25°C, L = 0.089mH
Jmax
= 36A, VGS =10V. Part not
AS
recommended for use above this value.
Pulse width ≤ 1.0ms; duty cycle ≤ 2%.
16.3 ( .641 )
15.7 ( .619 )
C
as C Limited by T
8.1 ( .318 )
7.9 ( .312 )
16 mm
eff. is a fixed capacitance that gives the same charging time
oss
oss
while V
is rising from 0 to 80% V
DS
, see Fig.12a, 12b, 15, 16 for typical repetitive
Jmax
16.3 ( .641 )
15.7 ( .619 )
FEED DIRECTION
DSS
.
avalanche performance. This value determined from sample failure population. 100% tested to this value in production. When mounted on 1" square PCB (FR-4 or G-10 Material) .
For recommended footprint and soldering techniques refer to
application note #AN-994
R
is measured at TJ approximately 90°C
θ
Data and specifications subject to change without notice.
This product has been designed for the Automotive [Q101] market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.8/09
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