Converters with Synchronous Rectification
for Telecom and Consumer Use
l Lead-Free
Benefits
V
DSS
30V
PD - 95270
IRL7833PbF
IRL7833SPbF
IRL7833LPbF
HEXFET® Power MOSFET
R
DS(on)
3.8m
max
:
Qg
32nC
l Very Low RDS(on) at 4.5V V
l Ultra-Low Gate Impedance
l Fully Characterized Avalanche Voltage
GS
and Current
ParameterUnits
DS
V
GS
@ TC = 25°C
I
D
ID @ TC = 100°C
I
DM
PD @TC = 25°C
@TC = 100°C
P
D
T
J
T
STG
R
JC
θ
R
CS
θ
R
JA
θ
R
JA
θ
Drain-to-Sour ce VoltageV
Gate-to-Source Volt age
GS
Conti n uous Drai n Cur r e nt, V
c
Linear D er ating Factor W/°C
Operating Junction and°C
Stor ag e Temperat ur e Ra ng e
Mount ing Torque, 6-32 or M 3 s c r ew
@ 10V
GS
gg
ParameterTyp.Max.Units
Junction-to-Case–––1.04
Junction-to-Ambient
h
g
TO-220AB
IRL7833
D2Pak
IRL7833S
TO-262
IRL7833L
Max.
30
± 20
f
150
f
110
600
140
72
0.96
-55 to + 175
y
in (1.1Nym)
10 lbf
h
0.50–––°C/W
–––62
–––40
A
W
Notes through are on page 12
www.irf.com1
05/18/04
Page 2
IRL7833/S/LPbF
S
D
G
BV
V
/∆T
R
m
V
V
/∆T
I
I
Q
Q
Q
Q
Q
QswSwitch Charge (Q
+ Qgd)
Q
t
t
t
t
C
C
C
Avalanche Characteristics
EASSingle Pul se Av a la nc h e Energ y
IARAvalanche Current
EARRepeti ti ve Avalanche Energy
Diode Characterist ics
I
I
V
t
Q
Static @ TJ = 25°C (unless otherwise specified)
ParameterMin. Typ. Max. Units
DSS
∆Β
DSS
DS(on)
GS(th)
∆
GS(th)
DSS
GSS
gfsForward Tra nsconductance150––––––S
g
gs1
gs2
gd
godr
oss
d(on)
r
d(off)
f
iss
oss
rss
Drain-to-Sou r c e Br eakdown V ol t a ge30––––––V
Breakdown Voltag e Temp. Coefficient–––18––– mV/°C
J
Stat ic D r ai n- to-Sou rce On-Res i s tance–––3.13.8
–––3.74.5
Gate Threshold Voltage1.4–––2.3V
Gate Th res hold Voltage Coe fficien t–––-11– –– mV/°C
J
Drain-to-Sou r c e Le akage Cur rent––––––1.0µA
––––––150
Gate-to-Sour c e Forward Lea k age––––––100nA
Gate-to-Sou rce Rever s e Le akage––––––-100
Total Gate Charge –––3247
Pre-Vth Gate-to-Source Charge–––8.7–––
Post-Vth Gate-to-Source Charge–––5.1–––nC
Gate-to-Drain Charge–––13–––
Gate Cha r ge Ov e r dr i v e–––5.3–––See Fig. 16
gs2
–––18–––
Output Charge–––22–––nC
Turn-On Delay Time–––18–––
Rise Time–––50–––ns
Turn-Off Delay Time–––21–––
Fall Tim e–––6.9–– –
Input Capacitance–––4170–––
Output Capacitance–––950–––pF
Reverse Transfer Capacitance–––470–––
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRL7833/S/LPbF
S
Current Regulator
I
A
9
+
-
15V
V
DS
R
G
20V
V
GS
L
D.U.T
I
AS
Ω
0.01
t
p
DRIVER
+
V
DD
-
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
AS
Fig 12b. Unclamped Inductive Waveforms
2000
TOP
1600
1200
800
400
AS
E , Single Pulse Avalanche Energy (m J )
0
255075100125150175
BOTTOM
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
L
V
DS
D
I
D
12A
21A
30A
V
DD
D.U.T
V
Same Type as D.U.T.
GS
Pulse W i dt h < 1µs
Duty Factor < 0.1%
12V
.2µF
50KΩ
.3µF
D.U.T.
+
Fig 14a. Switching Time Test Circuit
V
D
-
V
DS
0%
V
GS
3mA
10%
I
G
Current Sampling Resistors
Fig 13. Gate Charge Test Circuit
I
D
V
GS
t
d(on)
t
r
t
d(off)
t
f
Fig 14b. Switching Time Waveforms
6www.irf.com
Page 7
IRL7833/S/LPbF
R
V
+
-
Id
Reverse
Recovery
Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
e-Applied
oltage
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P.W.
Period
VGS=10V
V
DD
I
SD
*
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Vds
Vgs
Vgs(th)
Qgs1
Qgs2QgdQgodr
Fig 16. Gate Charge Waveform
www.irf.com7
Page 8
IRL7833/S/LPbF
f
P
P
f
)
Power MOSFET Selection for Non-Isolated DC/DC Converters
Control FET
Special attention has been given to the power losses
in the switching elements of the circuit - Q1 and Q2.
Power losses in the high side switch Q1, also called
the Control FET, are impacted by the R
MOSFET, but these conduction losses are only about
one half of the total losses.
Power losses in the control switch Q1 are given
by;
P
= P
loss
This can be expanded and approximated by;
P
loss
conduction
= I
()
rms
⎛
⎜
+ I ×
⎝
+ Qg× Vg× f
()
Q
⎛
+
⎝
This simplified loss equation includes the terms Q
and Q
charge that is included in all MOSFET data sheets.
The importance of splitting this gate-source charge
into two sub elements, Q
Fig 16.
the gate driver between the time that the threshold
voltage has been reached and the time the drain current rises to I
gins to change. Minimizing Q
reducing switching losses in Q1.
put capacitance of the MOSFET during every switching cycle. Figure A shows how Q
parallel combination of the voltage dependant (nonlinear) capacitances Cds and Cdg when multiplied by
the power supply input buss voltage.
which are new to Power MOSFET data sheets.
oss
Q
is a sub element of traditional gate-source
gs2
Q
indicates the charge that must be supplied by
gs2
Q
is the charge that must be supplied to the out-
oss
8www.irf.com
+ P
2
× R
ds(on )
Q
gd
× Vin× f
i
g
oss
×Vin× f
2
at which time the drain voltage be-
dmax
switching
⎞
⎟
⎠
⎞
⎠
and Q
gs1
+ P
+ I ×
+ P
drive
⎛
Q
gs2
⎜
i
⎝
g
, can be seen from
gs2
is a critical factor in
gs2
is formed by the
oss
of the
ds(on)
output
× Vin×
Synchronous FET
The power loss equation for Q2 is approximated
by;
= P
loss
conduction
= I
loss
+ Qg× Vg× f
+
rms
()
⎛
Q
⎜
⎝
*dissipated primarily in Q1.
For the synchronous MOSFET Q2, R
portant characteristic; however, once again the im-
⎞
⎟
portance of gate charge must not be overlooked since
⎠
it impacts three critical areas. Under light load the
MOSFET must still be turned on and off by the control IC so the gate drive losses become much more
significant. Secondly , the output charge Q
verse recovery charge Qrr both generate losses that
are transfered to Q1 and increase the dissipation in
that device. Thirdly, gate charge will impact the
MOSFETs’ susceptibility to Cdv/dt turn on.
gs2
The drain of Q2 is connected to the switching node
of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and of f there is
a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce
a voltage spike on the gate that is sufficient to turn
the MOSFET on, resulting in shoot-through current .
The ratio of Qgd/Q
potential for Cdv/dt turn on.
Figure A: Q
+ P
2
× R
ds(on)()
oss
×Vin× f
2
must be minimized to reduce the
gs1
Characteristic
oss
drive
+ P
⎞
⎠
*
output
+ Q
(
× Vin×
rr
ds(on)
oss
is an im-
and re-
Page 9
N
.
TO-220AB Package Outline
R
Dimensions are shown in millimeters (inches)
IRL7833/S/LPbF
10.54 (.415)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
1.40 (.055)
3X
1.15 (.045)
2.54 (.100)
OTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB.
2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INC LUD E BURR S
THIS IS AN IRF1010
LOT CODE 1789
AS S EMBLED ON WW 19, 1997
IN THE AS SEMBLY LINE "C"
Note: "P" in asse mbly line
position indicates "Lead-Free"
INTERNAT IONAL
RE CTIF IE R
LOGO
AS SEMBLY
LOT CODE
PART NUMBE
DAT E CODE
YEAR 7 = 1997
WEEK 19
LINE C
Page 10
IRL7833/S/LPbF
R
2
Pak Package Outline
D
D2Pak Part Marking Information
THIS IS AN IRF530S WITH
LOT CODE 8024
ASSEMBLED ON WW 02, 2000
IN THE ASSEMBLY LINE "L"
Note: "P" in assembly line
pos i ti on indi cates "L ead- F r ee"
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY
LO T CODE
F530S
PA RT NUM BE
DATE CODE
YEAR 0 = 2000
WEEK 02
LINE L
OR
INTERNATIONA L
RECTIFIER
LOGO
ASSEMBLY
LOT CODE
F530S
10www.irf.com
PART NUMBER
DATE CODE
P = DESIGNA TES LEAD-FREE
PRODUCT (OPTIONAL)
YEAR 0 = 2000
WE E K 02
A = ASSEMBLY SITE CODE
Page 11
TO-262 Package Outline
IRL7833/S/LPbF
TO-262 Part Marking Information
EXAMPLE:
THIS IS AN IRL3103L
LOT CODE 1789
ASSEMBLED ON WW 19, 1997
IN THE ASSEMBLY LINE " C"
Note: "P" in ass embly line
pos ition indi cates "L ead-Free"
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY
LOT CO DE
PAR T NUMBER
DATE CODE
YEAR 7 = 1997
WEEK 19
LIN E C
OR
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY
LOT CO DE
www.irf.com11
PAR T NUMBER
DATE CODE
P = DESIGNATES LEAD-FREE
PRODUCT (OPTIONAL)
YEAR 7 = 1997
WEEK 19
A = AS S E MB L Y S I T E CODE
Page 12
IRL7833/S/LPbF
TRR
F
F
)
)
)
D2Pak Tape & Reel Information
Dimensions are shown in millimeters (inches)
EED DIRECTION
TRL
EED DIRECTION
1.85 (.073)
1.65 (.065)
10.90 (.429)
10.70 (.421)
4.10 (.161)
3.90 (.153)
1.60 (.063)
1.50 (.059)
11.60 (.457)
11.40 (.449)
16.10 ( .634)
15.90 ( .626)
1.60 (.063)
1.50 (.059)
1.75 (.069)
1.25 (.049)
15.42 (.609)
15.22 (.601)
0.368 (.0145)
0.342 (.0135)
24.30 (.957
23.90 (.941
4.72 (.136)
4.52 (.178)
13.50 (.532)
12.80 (.504)
330.00
(14.173)
MAX.
NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
27.40 (1.079)
23.90 (.941)
4
26.40 (1.039)
24.40 (.961)
3
60.00 (2.362
MIN.
30.40 (1.197)
MAX.
4
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Starting T
= 25°C, L = 1.3mH, RG = 25Ω, I
J
AS
= 30A.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 75A.
When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to
application note #AN-994.
This is only applied to TO-220AB package.
TO-220AB package isnot recommended for Surface Mount Application.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.05/04
12www.irf.com
Page 13
Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/
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