Datasheet IRL630 Datasheet (International Rectifier)

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HEXFET® Power MOSFET
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Dynamic dv/dt Rating Repetitive Avalanche Rated Logic-Level Gate Drive R 150°C Operating Temperature Fast Switching Ease of paralleling
Description
Third Generation HEXFETs from International Rectifier provide the designer with the best combination of fast switching, ruggedized device design, low on­resistance and cost-effectiveness.
The TO-220 package is universally preferred for all commercial-industrial applications at power dissipation levels to approximately 50 watts. The low thermal resistance and low package cost of the TO-220 contribute to its wide acceptance throughout the industry.
Specified at V
DS(ON)
= 4V & 5V
GS
PD -9.1255
IRL630
V
DSS
R ID = 9.0A
DS(on)
= 0.40 Ω
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 5.0V 9.0 ID @ TC = 100°C Continuous Drain Current, VGS @ 5.0V 5.7 A I
DM
PD @TC = 25°C Power Dissipation 74 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 5.0 V/ns T
J
T
STG
Pulsed Drain Current 36
Linear Derating Factor 0.59 W/°C Gate-to-Source Voltage ±10 V Single Pulse Avalanche Energy 250 mJ Avalanche Current 9.0 A Repetitive Avalanche Energy 7.4 mJ
Operating Junction and -55 to + 150 Storage Temperature Range °C Soldering Temperature, for 10 seconds 300 (1.6mm from case) Mounting torque, 6-32 or M3 screw. 10 lbf•in (1.1N•m)
Thermal Resistance
Parameter Min. Typ. Max. Units
R
θJC
R
θCS
R
θJA
Junction-to-Case –––– –––– 1.7 Case-to-Sink, Flat, Greased Surface –––– 0.50 –––– °C/W Junction-to-Ambient –––– –––– 62
Revision 0
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IRL630
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Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆V
(BR)DSS
R
DS(ON)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 200 ––– ––– V VGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.27 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance
––– ––– 0.40 VGS = 5.0V, ID = 5.4A ––– ––– 0.50 VGS = 4.0V, ID = 4.5A
Ω
Gate Threshold Voltage 1.0 ––– 2.0 V VDS = VGS, ID = 250µA Forward Transconductance 4.8 ––– ––– S VDS = 50V, ID = 5.4A
Drain-to-Source Leakage Current
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 10V Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -10V
––– ––– 25 VDS = 200V , VGS = 0V ––– ––– 250 VDS = 160V , VGS = 0V, TJ = 125°C
µA
nA
Total Gate Charge ––– ––– 40 ID = 9.0A Gate-to-Source Charge ––– ––– 5.5 nC VDS = 160V Gate-to-Drain ("Miller") Charge ––– ––– 24 VGS = 10V, See Fig. 6 and 13 Turn-On Delay Time ––– 8.0 ––– VDD = 100V Rise Time ––– 57 ––– ID = 9.0A
ns
Turn-Off Delay Time ––– 38 ––– RG = 6.0Ω Fall Time ––– 33 ––– RD = 11Ω, See Fig. 10
Internal Drain Inductance ––– 4.5 –––
Internal Source Inductance ––– 7.5 –––
Between lead, 6mm (0.25in.)
nH
from package
and center of die contact Input Capacitance ––– 1100 ––– VGS = 0V Output Capacitance ––– 220 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 70 ––– ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
= 25V, starting TJ = 25°C, L = 4.6mH
DD
RG = 25Ω, I
Parameter Min. Typ. Max. Units Conditions Continuous Source Current MOSFET symbol (Body Diode) showing the Pulsed Source Current integral reverse (Body Diode) p-n junction diode.
––– ––– 9.0
A
––– ––– 36
Diode Forward Voltage ––– ––– 2.0 V TJ = 25°C, IS = 9.0A, VGS = 0V Reverse Recovery Time ––– 230 350 ns TJ = 25°C, IF = 9.0A Reverse Recovery Charge ––– 1.7 2.6 µC di/dt = 100A/µs Forward Turn-On Time
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
I
≤ 9.0A, di/dt ≤ 120A/µs, V
SD
DD
≤ V
(BR)DSS
,
TJ ≤ 150°C
Pulse width ≤ 300µs; duty cycle ≤ 2%.
= 9.0A. (See Figure 12)
AS
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100
A
A
A
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VGS TOP 7 .50V
5.00V
4.00V
3.50V
3.00V
2.75V
2.50V BOTTOM 2.25 V
10
1
IRL630
D
I , Drain-to-Source Current (A)
0.1
0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
2.25V
20µs PULSE WIDTH T = 25°C
c
Fig 1. Typical Output Characteristics,
TC = 25oC
100
10
T = 150° C
J
1
T = 25 °C
J
0.1
D
I , Drain-to-Source Current (A)
0.01
2.0 2.5 3.0 3.5 4.0 4.5 5.0
V , Gate-to-Source Voltage (V)
GS
V = 50V
DS
20µs PULSE WIDTH
D
I , Drain-to-Source Current (A)
Fig 2. Typical Output Characteristics,
TC = 150oC
2.5
I = 9.0A
D
2.0
1.5
1.0
(Normalized)
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160
T , Junction Temperature (°C)
J
V = 5.0V
GS
Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance
Vs. Temperature
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A
A
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2000
1500
1000
C, Capacitance (pF)
500
0
1 10 100
V = 0V, f = 1MHz
GS
C = C + C , C SHORTED
iss gs gd ds
C = C
rss gd
C = C + C
oss ds gd
C
iss
C
oss
C
rss
V , Drain-to-Source Voltage (V)
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
100
10
I = 9.0A
D
V = 160V
DS
8
6
4
2
GS
V , Gate-to-Source Voltage (V)
A
0
0 10 20 30 40
Q , Total Gate Charge (nC)
G
V = 100V
DS
V = 40V
DS
FOR TEST CIRCUIT SEE FIGURE 13
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
100
OPERATION IN THIS AREA LIMITED BY R
DS(on)
10µs
10
1
SD
I , Reverse Drain Current (A)
0.1 0 0.4 0.8 1.2 1.6
Fig 7. Typical Source-Drain Diode
T = 150°C
J
T = 25°C
J
V = 0V
GS
V , Source-to-Drain Voltage (V)
SD
Forward Voltage
10
1
D
I , Drain Current (A)
T = 25°C
C
T = 150°C
J
Single Pulse
0.1 1 10 10 0 1000
V , Drain-to-Source Voltage (V)
DS
Fig 8. Maximum Safe Operating Area
100µs
1ms
10ms
100ms
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A
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8
6
4
D
I , Drain Current (Amps)
2
0
25 50 75 100 125 150
T , Case Temperature (°C)
C
IRL630
R
V
DS
V
GS
R
G
5.0 V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
D
D.U.T.
V
DD
Fig 9. Maximum Drain Current Vs.
Fig 10b. Switching Time Waveforms
Case Temperature
10
thJC
1
D = 0.50
0.20
0.10
0.05
0.1
0.02
Thermal Response (Z )
0.01
0.01 SINGLE PULSE
(THERMAL RESPONSE)
0.00001 0.0001 0.001 0.01 0.1 1 10
t , Rectangu lar Puls e Duration (sec)
1
Notes :
1. Duty fa ctor D = t / t
2. Peak T = P x Z + T
D M
J
P
DM
t
1
t
2
2
1
thJC
C
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
A
A
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5.0V
Fig 12a. Unclamped Inductive Test Circuit
Fig 12b. Unclamped Inductive Waveforms
600
500
400
300
200
100
AS
V = 50V
E , Single Pulse Avalanche Energy (mJ)
DD
0
25 50 75 100 125 150
Starting T , Juntion Temperature (°C)
J
I TOP 9.0A
5.7A BOTTOM 4.0A
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
D
5.0V
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
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Peak Diode Recovery dv/dt Test Circuit
D.U.T
R
G
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance Current Transformer
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
V
DD
*
* VGS = 5V for Logic Level Devices
Fig 14. For N-Channel HEXFETS
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Package Outline
TO-220AB Outline
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
10.54 (.415)
10.29 (.405)
1 2 3
4
6.47 (.255)
6.10 (.240)
1.15 (.045) MIN
3 X
4.06 (.160)
3.55 (.140)
3.78 (.149)
3.54 (.139)
- A -
4.69 (.185)
4.20 (.165)
- B -
1.32 (.052)
1.22 (.048)
NOTES: 1 DIMENSIONS & TOLERANCING PER ANSI Y14.5M, 1982. 2 CONTROLLING DIMENSION : INCH. 3 DIMENSIONS ARE SHOWN MILLIMETERS (INCHES). 4 CONFORMS TO JEDEC OUTLINE TO-220AB.
LEAD ASSIGNMENTS 1 - GAT E 2 - DRAIN 3 - SOURCE 4 - DRAIN
0.93 (.037)
3 X
1.40 (.055)
3 X
1.15 (.045)
2.54 (.100) 2X
0.69 (.027)
0.36 (.014) M B A M
CONFORMS TO JEDEC OUTLINE TO-220AB
Part Marking Information
TO-220AB
EXAMPLE: T HIS IS AN IRF1010 WITH
ASSEMBLY LOT CODE 9B1M
Dimensions in Millimeters and (Inches)
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY LOT CODE
0.55 (.022)
3 X
0.46 (.018)
2.92 (.115)
2.64 (.104)
IRF1010
9B 1M
PART NUMBER
9246
DATE CODE
(YYWW)
YY = YEAR WW = WEEK
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 3L1, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: 6172 37066 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: (39) 1145 10111 IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo 171 Tel: (03)3983 0641 IR
SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, 0316 Tel: 65 221 8371
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: (44) 0883 713215
Data and specifications subject to change without notice.
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