l Logic-Level Gate Drive
l Advanced Process Technology
l Surface Mount (IRL3303S)
l Low-profile through-hole (IRL3303L)
l 175°C Operating Temperature
l Fast Switching
l Fully Avalanche Rated
Description
G
HEXFET® Power MOSFET
D
S
R
DS(on)
V
DSS
= 38A
I
D
= 30V
= 0.026Ω
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power MOSFETs
are well known for, provides the designer with an extremely
efficient and reliable device for use in a wide variety of
applications.
2
The D
Pak is a surface mount power package capable of
accommodating die sizes up to HEX-4. It provides the
highest power capability and the lowest possible onresistance in any existing surface mount package. The
2
D
Pak is suitable for high current applications because of
2
D Pa k
TO-262
its low internal connection resistance and can dissipate
up to 2.0W in a typical surface mount application.
The through-hole version (IRL3303L) is available for lowprofile applications.
Linear Derating Factor0.45W/°C
Gate-to-Source Voltage ±16V
Single Pulse Avalanche Energy130mJ
Avalanche Current20A
Repetitive Avalanche Energy6.8mJ
Operating Junction and-55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds300 (1.6mm from case )
VGS = -16V
Total Gate Charge––––––26ID = 20A
Gate-to-Source Charge––––––8.8nCVDS = 24V
Gate-to-Drain ("Miller") Charge––––––15VGS = 4.5V, See Fig. 6 and 13
Turn-On Delay Time–––7.4 –––VDD = 15V
Rise Time–––200 –––ID = 20A
Turn-Off Delay Time–––14–––RG = 6.5Ω
Fall Time–––36–––RD = 0.7Ω, See Fig. 10
Internal Source Inductance 7.5
––––––
Between lead,
nH
and center of die contact
Input Capacitance–––870 –––VGS = 0V
Output Capacitance–––340 – ––pFVDS = 25V
Reverse Transfer Capacitance–––170 –––ƒ = 1.0MHz, See Fig. 5
p-n junction diode.
Diode Forward Voltage––– –––1.3VTJ = 25°C, IS = 20A, VGS = 0V
Reverse Recovery Time–––72110n sTJ = 25°C, IF = 20A
Reverse Recovery Charge––– 180 28 0µCdi/dt = 100A/µs
Forward Turn-On TimeIntrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
D
G
S
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
= 15V, starting TJ = 25°C, L = 470µH
DD
RG = 25Ω, I
= 20A. (See Figure 12)
AS
≤ 20A, di/dt ≤ 140A/µs, V
SD
TJ ≤ 175°C
Pulse width ≤ 300µs; duty cycle ≤ 2%.
Uses IRL3303 data and test conditions.
DD
≤ V
I
** When mounted on 1" square PCB ( FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
(BR)DSS
,
Page 3
IRL3303S/L
1000
VGS
TO P 15V
12V
10V
8.0V
6.0V
4.0V
3.0V
100
BOTTOM 2.5V
10
1
D
I , D rain-to -S o urc e C u rre nt (A )
2.5V
20µs PULSE W IDTH
T = 25 °C
0.1
0.1110100
V , Drain -to -Source V oltag e ( V)
DS
J
Fig 1. Typical Output Characteristics
1000
1000
VGS
TOP 15V
12V
10V
8.0V
6.0V
4.0V
3.0V
100
BOTT OM 2.5V
10
2.5V
1
D
I , D rain-to -S o urc e C u rre nt (A )
20µs PULSE W IDTH
T = 175°C
A
0.1
0.1110100
V , Dra in-to-So urc e V olta ge (V )
DS
J
A
Fig 2. Typical Output Characteristics
2.0
I = 34A
D
100
10
1
D
I , Dra in -to -Sou rce C urr en t (A )
0.1
2345678910
T = 25°C
J
T = 175°C
J
V = 15V
DS
20µs PULSE WIDTH
V , Ga te -to-So u rc e Vo ltag e (V)
GS
Fig 3. Typical Transfer Characteristics
1.5
1.0
(No rm a lized)
0.5
DS(on)
R , D rain -to-S ou rc e O n R e si stan ce
A
0.0
-60 -40 -20020 40 60 80 100 120 140 160 180
T , Ju nc tion Temperature (°C )
J
V = 1 0V
GS
A
Fig 4. Normalized On-Resistance
Vs. Temperature
Page 4
IRL3303S/L
1600
1400
1200
1000
800
600
C , Capac itance (pF)
400
200
0
110100
V = 0V , f = 1MHz
GS
C = C + C , C SHORT E D
is s gs gd ds
C = C
rss gd
C = C + C
oss d s gd
C
iss
C
oss
C
rss
V , Drain-to -Sou rce Vo ltage (V )
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
15
I = 20A
V , Gate-to-Source Voltage (V )
12
9
6
3
GS
D
V = 2 4V
DS
V = 1 5V
DS
FOR TEST CIRCUIT
A
0
0 10203040
Q , To tal Ga te Cha rge (nC )
G
SEE FIGURE 13
A
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
O PERA T ION IN THIS ARE A LIM ITED
B Y R
DS(on)
100
T = 175°C
J
T = 25 °C
10
SD
I , Rev ers e Dr ain C u rren t (A)
1
0.00.51.01.52.02.5
V , Source-to-Drain Voltage (V )
SD
J
V = 0V
Fig 7. Typical Source-Drain Diode
Forward Voltage
GS
100
10
D
I , D rain C u rren t (A)
T = 25° C
C
T = 175 ° C
J
A
Single Pulse
1
110100
V , Drain-to-So urc e Vo ltag e (V)
DS
10µs
100µs
1ms
10ms
A
Fig 8. Maximum Safe Operating Area
Page 5
+
-
40
30
20
D
I , Drain Current (A)
10
0
255075100125150175
T , Case Temperature ( C)
C
°
Fig 9. Maximum Drain Current Vs.
Case Temperature
IRL3303S/L
V
DS
V
GS
R
G
4.5V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
d(on)tr
Fig 10b. Switching Time Waveforms
D.U.T.
t
d(off)tf
V
DD
10
thJC
D = 0.50
1
0.20
0.10
0.05
0.1
0.02
0.01
SINGLE PULSE
(THERMAL RESPONSE)
Thermal Response(Z )
Notes:
1. Duty factor D = t / t
2. Peak T = Px Z+ T
0.01
0.000010.00010.0010.010.1
t , Rectangular Pulse Duration (sec)
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
JDMthJCC
1 2
P
DM
t
1
t
2
Page 6
IRL3303S/L
D.U.T .
I
AS
L
0.01Ω
+
V
DD
-
R
10 V
V
DS
G
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
V
DD
V
DS
I
AS
Fig 12b. Unclamped Inductive Waveforms
300
250
200
150
100
50
AS
V = 15 V
E , S in gle Pulse A valanche Energ y (m J)
DD
0
255075100125150175
Starting T , Junction Temperature (°C)
J
I
TOP 8.3 A
14 A
BOTTOM 20A
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
D
A
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
12V
.2µF
V
GS
.3µF
D.U.T .
3mA
I
G
Current Sampling Resistors
I
D
Fig 13b. Gate Charge Test Circuit
+
V
DS
-
Page 7
IRL3303S/L
+
-
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
controlled by Duty Factor "D"
• I
SD
• D.U.T. - Device Under Test
Period
-
D =
G
Period
P.W.
+
V
DD
VGS=10V
*
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. ISDWaveform
Body Diode Forward
D.U.T. VDSWaveform
Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5%
* V
= 5V for Logic Level Devices
GS
Fig 14. For N-Channel HEXFETS
Current
di/dt
Diode Recovery
dv/dt
V
DD
I
SD
Page 8
IRL3303S/L
D2Pak Package Outline
10.54 (.415)
1.40 (.055)
MAX.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTES:
1 DIMENSIONS AFTER SOLDER DIP.
2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
3 CONTROLLING DIMENSION : INCH.
4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
10.29 (.405)
- A 2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.25 (.010) M B A M
Part Marking Information
D2Pak
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
LEAD ASS IGNM ENT S
1 - GATE
2 - DRAIN
3 - SOURC E
10.16 (.400)
REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350)
REF.
MINIMUM RECOMMENDED FOOTP RINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082)
2X
2.54 (.100)
2X
INTERNATIONAL
RECTIFIE R
L OG O
AS SEMBLY
LOT CO DE
F530S
9246
9B 1M
PART NUMBER
A
DATE CODE
(YYW W)
YY = YEAR
WW = WEEK
Page 9
Package Outline
TO-262 Outline
IRL3303S/L
Part Marking Information
TO-262
Page 10
IRL3303S/L
Tape & Reel Information
D2Pak
TRR
1.60 (.063)
1.50 (.059)
4.10 (.161)
3.90 (.153)
1.60 (.063)
1.50 (.059)
0.368 (.0145)
0.342 (.0135)
FEED DIRECTION
1.85 (.073)
1.65 (.065)
TRL
10.90 (.429)
10.70 (.421)
FEED DIRECTION
13.5 0 (. 532 )
12.8 0 (. 504 )
330.0 0
(14.17 3)
M A X .
NOT ES :
1. CO MFO R MS T O EIA -418 .
2. CONTRO LLING DIMEN SION: MILLIME TER .
3. DIM E NS IO N MEASURE D @ HUB .
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
11.6 0 (.457 )
11.4 0 (.449 )
1.75 (.0 69 )
1.25 (.0 49 )
16.10 (.634)
15.90 (.626)
15.4 2 (.609 )
15.2 2 (.601 )
27.4 0 (1 .079 )
23.9 0 (.9 41)
4
26.40 (1. 03 9)
24.40 (.961)
3
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
60.0 0 (2 .36 2)
MIN.
30.4 0 (1 .19 7)
MA X .
4
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/Data and specifications subject to change without notice.8/9 7
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