Datasheet irg4ibc20fd Datasheet

Page 1
PD -91750A
IRG4IBC20FD
INSULATED GATE BIPOLAR TRANSISTOR WITH
Fast CoPack IGBT
ULTRAFAST SOFT RECOVERY DIODE
FeaturesFeatures
Features
FeaturesFeatures
• Very Low 1.66V votage drop
• 2.5kV, 60s insulation voltage
U
• 4.8 mm creapage distance to heatsink
• Fast: Optimized for medium operating
frequencies ( 1-5 kHz in hard switching, >20 kHz in resonant mode).
• IGBT co-packaged with HEXFRED
TM
ultrafast,
ultrasoft recovery antiparallel diodes
• Tighter parameter distribution
• Industry standard Isolated TO-220 Fullpak
TM
G
n-channel
outline
Benefits
• Simplified assembly
• Highest efficiency and power density
• HEXFRED
TM
antiparallel Diode minimizes
switching losses and EMI
Absolute Maximum Ratings
Parameter Max. Units
V
CES
IC @ TC = 25°C Continuous Collector Current 14.3 IC @ TC = 100°C Continuous Collector Current 7.7 I
CM
I
LM
IF @ TC = 100°C Diode Continuous Forward Current 6.5 I
FM
Visol RMS Isolation Voltage, Terminal to CaseU 2500 V V
GE
PD @ TC = 25°C Maximum Power Dissipation 34 PD @ TC = 100°C Maximum Power Dissipation 14 T
J
T
STG
Collector-to-Emitter Voltage 600 V
Pulsed Collector CurrentQ 64 A Clamped Inductive Load Current R 64
Diode Maximum Forward Current 64
Gate-to-Emitter Voltage ± 20
Operating Junction and -55 to +150 Storage Temperature Range °C Soldering Temperature, for 10 sec. 300 (0.063 in. (1.6mm) from case) Mounting Torque, 6-32 or M3 Screw. 10 lbf•in (1.1 N•m)
C
E
TO-220 FULLPAK
V
= 600V
CES
V
CE(on) typ.
= 1.66V
@VGE = 15V, IC = 9.0A
W
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θJC
R
θJA
Wt Weight 2.0 (0.07) ––– g (oz)
Junction-to-Case - IGBT ––– 3.7 Junction-to-Case - Diode ––– 5.1 °C/W Junction-to-Ambient, typical socket mount ––– 65
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IRG4IBC20FD
Electrical Characteristics @ T
= 25°C (unless otherwise specified)
J
Parameter Min. Typ. Max. Units Conditions
V
(BR)CES
∆V
(BR)CES
V
CE(on)
Collector-to-Emitter Breakdown VoltageS 600 —— VVGE = 0V, IC = 250µA
/∆T
Temperature Coeff. of Breakdown Voltage — 0.72 — V/°CVGE = 0V, IC = 1.0mA
J
Collector-to-Emitter Saturation Voltage — 1.66 2.0 IC = 9.0A VGE = 15V
— 2.06 — VIC = 16A See Fig. 2, 5 — 1.76 — IC = 9.0A, TJ = 150°C
V
∆V
g I
CES
GE(th)
GE(th)
fe
Gate Threshold Voltage 3.0 — 6.0 VCE = VGE, IC = 250µA
/∆TJTemperature Coeff. of Threshold Voltage — -11 — mV/°CVCE = VGE, IC = 250µA
Forward TransconductanceT 2.9 5.1 — SVCE = 100V, IC = 9.0A Zero Gate Voltage Collector Current ——250 µA VGE = 0V, VCE = 600V
——1700 VGE = 0V, VCE = 600V, TJ = 150°C
V
FM
Diode Forward Voltage Drop — 1.4 1.7 V IC = 8.0A See Fig. 13
— 1.3 1.6 IC = 8.0A, TJ = 150°C
I
GES
Gate-to-Emitter Leakage Current ——±100 nA VGE = ±20V
Switching Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
Q
g
Total Gate Charge (turn-on) — 27 40 IC = 9.0A Qge Gate - Emitter Charge (turn-on) — 4.2 6.2 nC VCC = 400V See Fig. 8 Q t
d(on)
t
r
t
d(off)
t
f
E E E t
d(on)
t
r
t
d(off)
t
f
E L C C C t
rr
gc
on
off
ts
ts
E
ies
oes
res
Gate - Collector Charge (turn-on) — 9.9 15 VGE = 15V
Turn-On Delay Time — 43 — TJ = 25°C
Rise Time — 20 — ns IC = 9.0A, VCC = 480V
Turn-Off Delay Time — 240 360 VGE = 15V, RG = 50Ω
Fall Time — 150 220 Energy losses include "tail" and
Turn-On Switching Loss — 0.25 — diode reverse recovery.
Turn-Off Switching Loss — 0.64 — mJ See Fig. 9, 10, 18
Total Switching Loss — 0.89 1.3
Turn-On Delay Time — 41 — TJ = 150°C, See Fig. 11, 18
Rise Time — 22 — ns IC = 9.0A, VCC = 480V
Turn-Off Delay Time — 320 — VGE = 15V, RG = 50Ω
Fall Time — 290 — Energy losses include "tail" and
Total Switching Loss — 1.35 — m J diode reverse recovery.
Internal Emitter Inductance — 7.5 — nH Measured 5mm from package
Input Capacitance — 540 — VGE = 0V
Output Capacitance — 37 — pF VCC = 30V See Fig. 7
Reverse Transfer Capacitance — 7.0 —ƒ = 1.0MHz
Diode Reverse Recovery Time — 37 55 n s TJ = 25°C See Fig.
— 55 90 TJ = 125°C 14 IF = 8.0A
I
rr
Diode Peak Reverse Recovery Current — 3.5 5.0 A TJ = 25°C See Fig.
— 4.5 8.0 TJ = 125°C 15 VR = 200V
Q
rr
Diode Reverse Recovery Charge — 65 138 nC TJ = 25°C See Fig.
— 124 360 TJ = 125°C 16 di/dt = 200Aµs
di
/dt Diode Peak Rate of Fall of Recovery — 240 — A/µs TJ = 25°C See Fig.
(rec)M
During t
b
— 210 — TJ = 125°C 17
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IRG4IBC20FD
10.0
For both:
Duty cycle: 50% T = 125°C
8.0
6.0
4.0
Square wave:
60 % of rated v oltag e
I
LOAD CURRENT (A)
2.0
0.0
0.1 1 10 100
Ideal diodes
f, Frequency (KHz)
Fig. 1 - Typical Load Current vs. Frequency
(Load Current = I
of fundamental)
RMS
J
T = 90 °C
sink
Gate drive as specified
Pow er Dissipation = W
9.5
100
o
T = 25 C
J
o
T = 150 C
J
10
C
I , Collector-to-Emitter Current (A)
1
1 10
V , Collector-to-Emitter Voltage (V)
CE
V = 15V
GE
20µs PULSE WIDTH
Fig. 2 - Typical Output Characteristics
100
o
T = 150 C
J
10
o
T = 25 C
J
C
I , Collector-to-Emitter Current (A)
1
5 6 7 8 9 10 11 12 13 14
V , Gate-to-Emitter Voltage (V)
GE
V = 50V
CC
5µs PULSE WIDTH
Fig. 3 - Typical Transfer Characteristics
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IRG4IBC20FD
16
12
8
4
Maximum DC Collector Current(A)
0
25 50 75 100 125 150
T , Case Temperature ( C)
C
°
Fig. 4 - Maximum Collector Current vs. Case
Temperature
10
3.0
V = 15V
GE
80 us PULSE WIDTH
2.0
CE
V , Collector-to-Emitter Voltage(V)
1.0
-60 -40 -20 0 20 40 60 80 100 120 140 160
T , Junction Temperature ( C)
J
I = A18
C
9.0 A
I = A9
C
I = A4.5
C
°
Fig. 5 - Typical Collector-to-Emitter Voltage
vs. Junction Temperature
D = 0.50
thJC
1
0.20
0.10
0.05
P
0.02
0.1
0.01
Thermal Response (Z )
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
DM
t
1 2
1
t
2
Fig. 6 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRG4IBC20FD
1000
800
600
400
C, Capacitance (pF)
200
0
1 10 100
V
=
0V,
GE
C
=
iesgegc , ce
C
=
resgc
C
=
oes cegc
V , Collector-to-Emitter Voltage (V)
CE
f = 1MHz
C
+ C C C
C
ies
C
oes
C
res
C SHORTED
+ C
Fig. 7 - Typical Capacitance vs.
Collector-to-Emitter Voltage
0.90
V = 480V
CC
V = 15V
GE
0.88
0.86
0.84
0.82
T = 25 C
J
I = 9.0A
C
°
20
V = 400V
CC
I = 9.0A
C
16
12
8
4
GE
V , Gate-to-Emitter Voltage (V)
0
0 5 10 15 20 25 30
Q , Total Gate Charge (nC)
G
Fig. 8 - Typical Gate Charge vs.
Gate-to-Emitter Voltage
10
R = 50Ohm
G
V = 15V
GE
V = 480V
CC
1
Ω
I = A
C
I = A
C
I = A
C
18
9.0 A
9
4.5
Total Switching Losses (mJ)
0.80
0.78 0 10 20 30 40 50
R , Gate Resistance (Ohm)
G
Ω
Fig. 9 - Typical Switching Losses vs. Gate
Resistance
Total Switching Losses (mJ)
0.1
-60 -40 -20 0 20 40 60 80 100 120 140 160
T , Junction Temperature ( C )
J
°
Fig. 10 - Typical Switching Losses vs.
Junction Temperature
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IRG4IBC20FD
)
3.0
R = 50Ohm T = 150 C V = 480V
2.5
V = 15V
2.0
1.5
1.0
Total Switching Losses (mJ)
0.5
0.0 0 4 8 12 16 20
Ω
G
J CC GE
°
I , Collector-to-emitter Current (A)
C
Fig. 11 - Typical Switching Losses vs.
Collector-to-Emitter Current
100
100
V = 20V
GE
T = 125 C
J
10
C
I , Collector Current (A)
1
1 10 100 1000
o
SAFE OPERATING AREA
V , Collector-to-Emitter Voltage (V)
CE
Fig. 12 - Turn-Off SOA
F
10
T = 150°C
J
T = 125°C
J
T = 25°C
J
1
Instantaneous Forward Current - I (A)
0.1
0.4 0.8 1.2 1.6 2.0 2.4 2.8 3.2
Forward Voltage D rop - V (V
FM
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
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IRG4IBC20FD
)
)
(A/µs)
)
100
V = 200V
R
T = 125 °C
J
T = 25° C
J
80
I = 16 A
F
60
rr
t - (ns)
40
I = 4.0A
F
20
0
100 1000
di /dt -
f
I = 8 .0 A
F
Fig. 14 - Typical Reverse Recovery vs. dif/dt
500
V = 200V
R
T = 125 °C
J
T = 25° C
J
400
100
V = 200V
R
T = 125°C
J
T = 25°C
J
I = 1 6A
10
IRRM
I - (A )
I = 8.0A
F
1
100 1000
F
di /dt - (A/µs
f
I = 4.0 A
F
Fig. 15 - Typical Recovery Current vs. dif/dt
10000
V = 200V
R
T = 125 °C
J
T = 25° C
J
300
I = 4.0 A
I = 8.0A
I = 1 6A
F
di /dt - (A/µs
F
F
f
(rec)M
/dt vs. dif/dt
I = 16 A
F
1000
RR
Q - (nC)
200
I = 8 .0 A
F
100
I = 4.0 A
F
0
100 1000
di /dt - (A/µs
f
d i(re c)M /d t - (A /µ s)
100
100 1000
Fig. 16 - Typical Stored Charge vs. dif/dt Fig. 17 - Typical di
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IRG4IBC20FD
Same type device as D.U.T.
80% of Vce
430µF
D.U.T.
Fig. 18a - Test Circuit for Measurement of
I
LM
Vcc
, Eon, E
10% +Vg
10% Ic
td(on)
t1
off(diode)
Vce
tr
, trr, Qrr, Irr, t
GATE VOLTAGE D.U.T.
+Vg
90% Ic
5% Vce
d(on)
, tr, t
Eon =
t2
, t
d(off)
DUT VOLTAGE AND CURRE NT
Ipk
Ic
t2
Vce Ic dt
Vce ie dt
∫
t1
V
ge
V
C
90%
10%
5%
I
C
t
f
d(on)
10%
t
r
E
on
E = (E +E )
90%
t
d(off)
ts on off
t
f
E
off
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining
, t
d(off)
t3
, t
f
trr
10% Irr
DIODE RECO VERY W AVEFORMS
Erec =
t4
Qrr =
∫
t3
trr
id dt
Ic dt
∫
tx
t4
Vd id dt
Vd Ic dt
E
Ic
tx
10% Vcc
Vpk
DIODE REVERSE RECOVERY ENERGY
Irr
off
t=5µs
Vcc
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,
Defining E
, t
d(on)
, t
r
on
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining E
, trr, Qrr, I
rec
rr
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Vg
GATE SIGNAL DEVICE UNDER TEST
CURRENT D.U.T.
VOLTAGE IN D.U.T.
CURRENT IN D1
IRG4IBC20FD
t0
t1
t2
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit
50V
6000µF 100V
1000V
L
V *
c
D.U.T.
Figure 19. Clamped Inductive Load Test Circuit
0 - 480V
Figure 20. Pulsed Collector Current
Test Circuit
RL=
480V
4 X IC @25°C
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IRG4IBC20FD
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)
Notes:
Q Repetitive rating: VGE=20V; pulse width limited by maximum junction temperature (figure 20)
R V
=80%(V
CC
S Pulse width £ 80µs; duty factor ≤ 0.1%.
T Pulse width 5.0µs, single shot.
U t = 60s, f = 60Hz
Case Outline  TO-220 FULLPAK
), VGE=20V, L=10µH, RG = 50Ω (figure 19)
CES
16.00 (.6 30
15.80 (.6 22
13.70 (.5 40
13.50 (.5 30
1.40 (.055
3X
1.05 (.042
2.54 (.100 2X
10.60 (.41 7
10.40 (.40 9
1 2 3
1.15 (.04 5 MIN .
0.90 (.0 35
3X
0.70 (.0 28
0.25 (.010
ø
3.70 (.1 45
3.20 (.1 26
3.30 (.1 30
3.10 (.1 22
3.40 (.1 33
3.10 (.1 23
- A -
- B -
M
A M B
4.80 (.189
4.60 (.181
7.10 (.2 80
6.70 (.2 63
2.80 (.110
2.60 (.102
NOTES:
1 DIMENSIONING & TOLERANCING PE R A N SI Y1 4.5M , 19 82
2 CONT ROLLING DIM ENSION: INCH .
0.48 (.019
3X
0.44 (.017
2.85 (.11 2
2.65 (.10 4
LEAD ASSIGN MENTS
LEAD ASSIGMENTS
1 - GAT E
1- GATE
2 - D RA IN
2- COLLECTOR
3 - S OU R CE
3- EMITTER
MINIMUM CREEPAGE DIS TANCE BETW EEN A-B-C-D = 4.80 (.1 89
C
D
A
B
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Data and specifications subject to change without notice. 4/00
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