INSULATED GATE BIPOLAR TRANSISTOR WITH
ULTRAFAST SOFT RECOVERY DIODE
FeaturesFeatures
Features
FeaturesFeatures
• Short Circuit Rated UltraFast: Optimized for
high operating frequencies >5.0 kHz , and Short
C
Short Circuit Rated
UltraFast IGBT
V
= 600V
CES
Circuit Rated to 10µs @ 125°C, VGE = 15V
• Generation 4 IGBT design provides tighter
parameter distribution and higher efficiency than
previous generation
TM
• IGBT co-packaged with HEXFRED
ultrafast,
ultra-soft-recovery anti-parallel diodes for use in
bridge configurations
• Industry standard D
2
Pak package
G
E
n-chan nel
V
CE(on) typ.
= 2.27V
@VGE = 15V, IC = 9.0A
Benefits
• Latest generation 4 IGBTs offer highest power
density motor controls possible.
•HEXFRED
TM
diodes optimized for performance
with IGBTs. Minimized recovery characteristics
reduce noise, EMI and switching losses.
•This part replaces the IRGBC20KD2-S and
IRGBC20MD2-S products.
• For hints see design tip 97003.
2
D Pak
Absolute Maximum Ratings
ParameterMax.Units
V
CES
IC @ TC = 25°CContinuous Collector Current16
IC @ TC = 100°CContinuous Collector Current9.0
I
CM
I
LM
IF @ TC = 100°CDiode Continuous Forward Current7.0
I
FM
t
sc
V
GE
PD @ TC = 25°CMaximum Power Dissipation60
PD @ TC = 100°CMaximum Power Dissipation24
T
J
T
STG
Collector-to-Emitter Voltage600V
Pulsed Collector Current Q32A
Clamped Inductive Load Current R32
Diode Maximum Forward Current32
Short Circuit Withstand Time10µs
Gate-to-Emitter Voltage± 20V
Operating Junction and-55 to +150
Storage Temperature Range°C
Soldering Temperature, for 10 sec.300 (0.063 in. (1.6mm) from case)
Mounting Torque, 6-32 or M3 Screw.10 lbf•in (1.1 N•m)
Fall Time—160—Energy losses include "tail"
Total Switching Loss—0.85—mJand diode reverse recovery
Internal Emitter Inductance—7.5—nHMeasured 5mm from package
Input Capacitance—450—VGE = 0V
Output Capacitance—61—pFVCC = 30V See Fig. 7
Reverse Transfer Capacitance—14—ƒ = 1.0MHz
Diode Reverse Recovery Time—3755nsTJ = 25°C See Fig.
—5590TJ = 125°C 14 IF = 8.0A
Diode Peak Reverse Recovery Current—3.55.0ATJ = 25°C See Fig.
—4.58.0TJ = 125°C 15 VR = 200V
Diode Reverse Recovery Charge—65138nCTJ = 25°C See Fig.
—124360TJ = 125°C 16 di/dt = 200Aµs
/dtDiode Peak Rate of Fall of Recovery—240—A/µs TJ = 25°C See Fig.
During t
b
—210—TJ = 125°C 17
CPK
< 500V
2www.irf.com
Page 3
IRG4BC20KD-S
2.5
For both:
2.0
1.5
1.0
Square wave:
60 % o f r a ted
v o l tage
I
LOAD CURRENT (A)
0.5
0.0
0.1 1 10 100
Ideal diodes
f, Frequency (KHz)
Fig. 1 - Typical Load Current vs. Frequency
(Load Current = I
of fundamental)
RMS
Duty cycle: 50%
T = 125°C
J
55°C
T = 90°C
sink
Gate drive as specified
Pow e r D issip ation = W
1.8
100
o
T = 25 C
J
T = 150 C
J
10
C
I , Collector-to-Emitter Current (A)
1
1 10
V , Collector-to-Emitter Voltage (V)
CE
V = 15V
GE
20µs PULSE WIDTH
Fig. 2 - Typical Output Characteristics
o
100
10
C
I , Collector-to-Emitter Current (A)
1
5101520
o
T = 150 C
J
o
T = 25 C
J
V = 50V
5µs PULSE WIDTH
V , Gate-to-Emitter Voltage (V)
GE
CC
Fig. 3 - Typical Transfer Characteristics
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Page 4
IRG4BC20KD-S
20
15
10
5
Maximum DC Collector Current(A)
0
255075100125150
T , Case Temperature ( C)
C
°
Fig. 4 - Maximum Collector Current vs. Case
Temperature
10
5.0
V = 15V
GE
80 us PULSE WIDTH
I = A18
4.0
3.0
2.0
CE
V , Collector-to-Emitter Voltage(V)
1.0
-60 -40 -20 0 20 40 60 80 100 120 140 160
T , Junction Temperature ( C)
J
C
9.0A
I = A9
C
I = A4.5
C
°
Fig. 5 - Typical Collector-to-Emitter Voltage
vs. Junction Temperature
thJC
D = 0.50
1
0.20
0.10
P
0.05
0.1
0.02
Thermal Response (Z )
0.01
0.01
0.000010.00010.0010.010.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =Px Z+ T
t , Rectangular Pulse Duration (sec)
1
JDMthJCC
DM
t
1 2
1
t
2
Fig. 6 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
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Page 5
IRG4BC20KD-S
800
600
400
C, Capacitance (pF)
200
0
1 10 100
V
=
0V,
GE
C
=
iesgegc ,ce
C
=
resgc
C
=
oescegc
C
ies
C
oes
C
res
V , Collector-to-Emitter Voltage (V)
CE
f = 1MHz
C
+ C
C
C
C SHORTED
+ C
Fig. 7 - Typical Capacitance vs.
Collector-to-Emitter Voltage
0.8
V = 480V
CC
V = 15V
GE
T = 25 C
J
I = 9.0A
C
0.7
°
20
V= 400V
CC
I= 9.0A
C
16
12
8
4
GE
V , Gate-to-Emitter Voltage (V)
0
010203040
Q , Total Gate Charge (nC)
G
Fig. 8 - Typical Gate Charge vs.
Gate-to-Emitter Voltage
10
R = Ohm
50Ω
G
V = 15V
GE
V = 480V
CC
I = A
18
C
0.6
Total Switching Losses (mJ)
0.5
01020304050
R , Gate Resistance (Ohm)
R
, Gate Resistance ( Ω )
G
G
Fig. 9 - Typical Switching Losses vs. Gate
Resistance
1
Total Switching Losses (mJ)
0.1
-60 -40 -20 0 20 40 60 80 100 120 140 160
T , Junction Temperature ( C )
J
Fig. 10 - Typical Switching Losses vs.
Junction Temperature
9.0A
I = A
9
C
I = A
4.5
C
°
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Page 6
IRG4BC20KD-S
)
3.0
2.0
1.0
Total Switching Losses (mJ)
0.0
50Ω
R = Ohm
G
T = 150 C
J
V = 480V
CC
V = 15V
GE
048121620
°
I , Collector-to-emitter Current (A)
C
Fig. 11 - Typical Switching Losses vs.
Collector-to-Emitter Current
100
100
V = 20V
GE
T = 125 C
J
10
C
I , Collector-to-Emitter Current (A)
1
1 10 100 1000
o
SAFE OPERATING AREA
V , Collector-to-Emitter Voltage (V)
CE
Fig. 12 - Turn-Off SOA
F
10
T = 150°C
J
T = 125°C
J
T = 25°C
J
1
Instantaneous Forward Current - I (A)
0.1
0.40.81.21.62.02.42.83.2
Forward Voltage Drop - V (V
FM
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
6www.irf.com
Page 7
IRG4BC20KD-S
)
)
(A/µs)
)
100
V = 200V
R
T = 125 °C
J
T = 25°C
J
80
I = 16 A
F
60
rr
t - (ns)
40
I = 4.0A
F
20
0
1001000
d i /d t -
f
I = 8.0 A
F
Fig. 14 - Typical Reverse Recovery vs. dif/dt
500
V = 200V
R
T = 125 °C
J
T = 25°C
J
400
100
V = 200V
R
T = 125°C
J
T = 25°C
J
I = 16 A
10
IRR M
I - (A)
I = 8.0A
F
1
1001000
F
di /dt - (A/µs
f
I = 4.0 A
F
Fig. 15 - Typical Recovery Current vs. dif/dt
10000
V = 200V
R
T = 125°C
J
T = 25°C
J
300
I = 4.0 A
I = 8.0 A
I = 16 A
F
di /dt - (A/µs
F
F
f
(rec)M
/dt vs. dif/dt
I = 16 A
F
1000
RR
Q - (n C )
200
I = 8.0 A
F
100
I = 4.0 A
F
0
1001000
di /d t - (A/µs
f
d i(rec)M/d t - (A / µ s )
100
1001000
Fig. 16 - Typical Stored Charge vs. dif/dtFig. 17 - Typical di
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Page 8
IRG4BC20KD-S
Same type
device as
D.U.T.
80%
of Vce
430µF
D.U.T.
Fig. 18a - Test Circuit for Measurement of
I
, Eon, E
LM
Vcc
td(on)
10% +Vg
10% Ic
off(diode)
Vce
t1
, trr, Qrr, Irr, t
90% Ic
5% Vc e
tr
, tr, t
d(on)
GATE VOLTAG E D.U.T.
+Vg
d(off)
DUT VO LTAGE
AND CURRE NT
Ipk
t2
Vce ie dt
Vce Ic dt
Eon =
∫
t1
t2
90% Vge
+Vge
Vce
10% Vce
Ic
td(off)
, t
f
t1
90% Ic
Ic
5% Ic
tf
Eo ff =
∫
t2
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining
E
, t
d(off)
t3
, t
f
trr
Qrr =
10% Irr
DIODE RECO V E RY
W AVEFORMS
t4
Erec =
Vd id dt
Vd Ic dt
∫
t3
t4
off
Ic
tx
10% Vc c
Vpk
Ic
DIO DE REVERSE
RECOVERY ENERGY
Irr
t1+5µS
Vce icdt
Vce Ic dt
t1
trr
id dt
Ic dt
∫
tx
Vcc
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,
Defining E
, t
d(on)
, t
r
on
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining E
, trr, Qrr, I
rec
rr
8www.irf.com
Page 9
Vg
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(
)
)
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GATE SIGNAL
DEVICE UNDER TEST
CURRENT D.U.T.
VOLTAGE IN D.U.T.
CURRENT IN D1
IRG4BC20KD-S
t0
t1 t2
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit
D.U.T.
50V
6000µF
100V
1000V
L
V *
c
Figure 19. Clamped Inductive Load Test Circuit
Tape & Reel Information
D2Pak
TR R
FEED DIRECTION
TRL
FEED DIRECTION
1.85 (.0 7 3
1.65 (.0 6 5
10.90 (.429
10.70 (.421
4.10 (.161
3.90 (.153
1.60 (.063
1.50 (.059
11.60 (.457
11.40 (.449
16.10 (.634
15.90 (.626
1.60 (.063
1.50 (.059
1.75 (.069
1.25 (.049
0 - 480V
Figure 20. Pulsed Collector Current
Test Circuit
0.368 (.0145
0.342 (.0135
15.42 (.609
15.22 (.601
24.30 (.957
23.90 (.941
4.72 (.136
4.52 (.178
RL=
480V
4 X IC @25°C
13.50 (.532
12.80 (.504
330.00
14.173
MAX.
NOTES :
1. CO MF OR M S TO EIA- 418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ H U B.
4. INCLUDES FLANG E DISTORTION @ OUT ER E DGE.
27.40 (1.079
23.90 (.941
4
26.40 (1.039
24.40 (.961
3
60.00 (2.362
M IN .
30.40 (1.197
M A X .
4
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Page 10
IRG4BC20KD-S
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)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
Notes:
Q Repetitive rating: VGE=20V; pulse width limited by maximum junction temperature (figure 20)
R V
=80%(V
CC
S Pulse width ≤ 80µs; duty factor ≤ 0.1%.
T Pulse width 5.0µs, single shot.
U
When mounted on 1" square PCB (FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
D2Pak Package Outline
), VGE=20V, L=10µH, RG= 50Ω (figure 19)
CES
10.54 (.4 1 5
1.40 (.055
MA X.
1.78 (.070
1.27 (.050
1.40 (.0 5 5
3X
1.14 (.0 4 5
5.08 (.200
NOTES:
1 D IMEN S IO N S AFTE R S OL D E R D IP.
2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
3 C O N T RO L L IN G D IM ENSIO N : INC H.
4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
10.29 (.4 0 5
- A 2
1 3
15.49 (.610
14.73 (.580
0.93 (.037
3X
0.69 (.027
0.25 (.010) M B A M
4.69 (.185
4.20 (.165
5.28 (.208
4.78 (.188
0.55 (.0 2 2
0.46 (.0 1 8
LEAD ASSIGNMENTS
1 - G A TE
2 - D R A IN
3 - SO U R CE
- B -
1.32 (.0 5 2
1.22 (.0 4 8
2.79 (.1 1 0
2.29 (.0 9 0
1.39 (.055
1.14 (.045
10.16 (.400
RE F .
6.47 (.255
6.18 (.243
2.61 (.103
2.32 (.091
8.89 (.3 5 0
RE F.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.4 5 0
8.89 (.350
17.78 (.700
3.81 (.150
2.08 (.082
2X
2.54 (.1 0 0
2X
IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111
IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936
Data and specifications subject to change without notice. 10/00
10www.irf.com
Page 11
Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/
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