l Surface Mount (IRFZ46NS)
l Low-profile through-hole (IRFZ46NL)
l 175°C Operating Temperature
l Fast Switching
l Fully Avalanche Rated
G
Description
Advanced HEXFET® Power MOSFETs from International
Rectifier utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This benefit,
combined with the fast switching speed and ruggedized
device design that HEXFET power MOSFETs are well known
for, provides the designer with an extremely efficient and
reliable device for use in a wide variety of applications.
2
The D
Pak is a surface mount power package capable of
accommodating die sizes up to HEX-4. It provides the highest
power capability and the lowest possible on-resistance in
any existing surface mount package. The D
for high current applications because of its low internal
connection resistance and can dissipate up to 2.0W in a
typical surface mount application.
The through-hole version (IRFZ46NL) is available for lowprofile applications.
2
Pak is suitable
Absolute Maximum Ratings
ParameterMax.Units
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V 53
ID @ TC = 100°CContinuous Drain Current, VGS @ 10V37A
I
Fall Time–––57–––RD = 0.98Ω, See Fig. 10
Internal Source Inductance
––––––
7.5
Between lead,
nH
and center of die contact
Input Capacitance––– 1696 –––VGS = 0V
Output Capacitance–––407 –––pFVDS = 25V
Reverse Transfer Capacitance–––110 –––ƒ = 1.0MHz, See Fig. 5
Single Pulse Avalanche Energy ––– 583152I
p-n junction diode.
Diode Forward Voltage––– ––– 1.3VTJ = 25°C, IS = 28A, VGS = 0V
Reverse Recovery Time–––67101nsTJ = 25°C, IF = 28A
Reverse Recovery Charge––– 208 312nCdi/dt = 100A/µs
Forward Turn-On TimeIntrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
D
G
S
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Starting T
RG = 25Ω, I
I
SD
= 25°C, L = 389µH
J
= 28A. (See Figure 12)
AS
≤ 28A, di/dt ≤ 220A/µs, V
DD
≤ V
(BR)DSS
Pulse width ≤ 400µs; duty cycle ≤ 2%.
Uses IRFZ46N data and test conditions.
This is a typical value at device destruction
and represents operation outside rated limits.
This is a calculated value limited to TJ = 175°C
,
TJ ≤ 175°C
** When mounted on 1" square PCB (FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
2www.irf.com
Page 3
IRFZ46NS/IRFZ46NL
)
A
)
A
A
)
A
1000
V G S
TO P 1 5V
10 V
8. 0V
7. 0V
6. 0V
5. 5V
5. 0V
BO T T O M 4.5V
100
10
4.5V
D
I , Drain-to-Source C urrent (A)
20µs PUL SE WIDTH
TJ = 25°C
T = 25°C
1
0.1110100
V , Dra in-t o-Sou r ce Voltage (V
DS
C
Fig 1. Typical Output Characteristics
1000
1000
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
100
10
D
I , Drain-to-Source Current (A)
4.5V
20µs PULSE WIDTH
TJ = 175°C
T = 175°C
1
0.1110100
V , Dra in-t o-Sou r ce Voltage (V
DS
C
Fig 2. Typical Output Characteristics
2.5
I = 46 A
D
2.0
T = 25°C
100
10
D
I , D rain-to-Source C urrent (A)
1
45678910
V , Gate -to -S ource Voltage (V
GS
Fig 3. Typical Transfer Characteristics
J
T = 175°C
J
V = 2 5 V
DS
20µs PULSE WIDTH
1.5
1.0
(Normaliz ed)
0.5
DS (on)
R , D ra in-to -S o u rc e O n R e s ista n c e
0.0
-60 -40 -20020 40 60 80 100 120 140 160 180
T , Junction Temperature (°C)
J
Fig 4. Normalized On-Resistance
Vs. Temperature
V = 10 V
GS
www.irf.com3
Page 4
IRFZ46NS/IRFZ46NL
)
A
A
)
A
g
)
A
g
g
g
2800
2400
2000
1600
1200
C, C apa citance (p F)
800
400
0
110100
V = 0V, f = 1M Hz
GS
C = C + C , C S H O R T E D
iss
C = C
C = C + C
C
iss
C
oss
C
rss
V , Drai n-to -So urce Voltage (V
DS
s gd d s
d
rss
oss ds
d
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I = 2 8A
V , Gate -to- S o u rc e V o lta ge (V)
16
12
8
4
GS
D
V = 44 V
DS
V = 28 V
DS
FOR TEST CIRCUIT
0
0 102030405060
Q , T ota l G a te C h a rge (nC
G
SE E F IG U RE 1 3
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
OP ER A T IO N IN T HIS ARE A L IM IT E D
BY R
DS(on)
100
T = 175°C
J
T = 25°C
J
10
SD
I , Re ve r se D r ain C u rre n t (A )
1
0.40.81.21.62.02.4
V , Source-to-Drain V oltage (V)
SD
V = 0V
Fig 7. Typical Source-Drain Diode
GS
100
10
D
I , D rain C u rr ent ( A )
T = 25°C
C
T = 175°C
J
Sin
le Pulse
1
110100
V , Dra in-t o-Sou r ce Voltage (V
DS
Fig 8. Maximum Safe Operating Area
10µs
100µs
1ms
10ms
Forward Voltage
4www.irf.com
Page 5
60
50
40
30
20
D
I , Drain Current (A)
10
0
255075100125150175
T , Case Temperature ( C)
C
°
IRFZ46NS/IRFZ46NL
R
D.U.T.
t
d(off)tf
D
+
-
V
DD
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
d(on)tr
Fig 9. Maximum Drain Current Vs.
Fig 10b. Switching Time Waveforms
Case Temperature
10
thJC
1
D = 0.50
0.20
0.10
0.05
0.1
0.02
Thermal Response (Z )
0.01
0.01
0.000010.00010.0010.010.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =Px Z+ T
t , Rectangular Pulse Duration (sec)
1
JDMthJCC
P
DM
t
1 2
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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Page 6
IRFZ46NS/IRFZ46NL
A
)
D.U.T.
I
AS
L
0.01Ω
+
V
DD
-
R
10 V
V
DS
G
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
V
DD
V
DS
I
AS
Fig 12b. Unclamped Inductive Waveforms
500
400
300
200
100
AS
V = 25 V
E , S ingle Pu lse A valanc he E n ergy (m J)
DD
0
255075100125150175
Starting T , Junction Temperature (°C
J
I
TO P 11A
20A
BOTT O M 28 A
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
D
Current Regulator
Same Type as D.U.T.
50KΩ
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
12V
Fig 13b. Gate Charge Test Circuit
.2µF
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
I
+
V
DS
-
D
6www.irf.com
Page 7
IRFZ46NS/IRFZ46NL
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
-
• dv/dt controlled by R
• Driver same type as D.U.T.
G
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Period
D =
P.W.
Period
+
+
V
DD
-
VGS=10V
*
D.U.T. ISDWaveform
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. VDSWaveform
Inductor Curent
* V
= 5V for Logic Level Devices
GS
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
V
DD
I
SD
Fig 14. For N-Channel HEXFETS
www.irf.com7
Page 8
IRFZ46NS/IRFZ46NL
A
D2Pak Package Outline
10.54 (.415)
1.40 (.055)
MA X.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTE S:
1 DIMENSIONS AFTER SOLDER DIP.
2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
3 CONTROLLING DIMENSION : INCH.
4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
10.29 (.405)
- A 2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.2 5 ( .0 10) M B A M
Part Marking Information
D2Pak
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
LEAD ASSIGNMENTS
1 - G ATE
2 - D RAIN
3 - S OU R CE
10.16 (.400)
REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350)
REF.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082)
2X
2.54 (.100)
2X
INTERNATIONAL
RE CTIFIER
LO G O
A S SEMBLY
LO T CO D E
F530S
9246
9 B 1 M
PART NUMB ER
DATE CODE
(Y Y W W )
YY = YEAR
WW = WEEK
8www.irf.com
Page 9
Package Outline
TO-262 Outline
IRFZ46NS/IRFZ46NL
Part Marking Information
TO-262
www.irf.com9
Page 10
IRFZ46NS/IRFZ46NL
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
)
(
)
)
)
)
)
)
)
Tape & Reel Information
D2Pak
TRR
1.60 (.063
1.50 (.059
4.10 (.1 6 1
3.90 (.1 5 3
1.60 (.06 3
1.50 (.05 9
0.368 (.0145
0.342 (.0135
FEED D IRECTION
1.85 (.0 7 3
1.65 (.0 6 5
TRL
10.90 (.42 9
10.70 (.42 1
FEED DIRECTION
13.50 (.532
12.80 (.504
330.00
14.173
MAX.
NOTES :
1. COM FO R M S TO E IA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HU B.
4. INC LUDES FLANGE DISTORTION @ OUTER EDGE.
11.60 (.457
11.40 (.449
16.10 (.634
15.90 (.626
1.75 (.069
1.25 (.049
15.42 (.609
15.22 (.601
27.40 (1.079
23.90 (.9 41
4
26.40 (1.039
24.40 (.961
3
24.30 (.957
23.90 (.941
4.72 (.136
4.52 (.178
60.00 (2.362
MIN.
30.40 (1.197
MAX .
4
Data and specifications subject to change without notice.
This product has been designed and qualified for the industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 3/01
10www.irf.com
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