Datasheet irfz46ns Datasheet

Page 1
PD - 9.1305B
IRFZ46NS
IRFZ46NL
HEXFET® Power MOSFETl Advanced Process Technology
l Surface Mount (IRFZ46NS) l Low-profile through-hole (IRFZ46NL) l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated
G
Description
Advanced HEXFET® Power MOSFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications.
2
The D
Pak is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on-resistance in any existing surface mount package. The D for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRFZ46NL) is available for low­profile applications.
2
Pak is suitable
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 53 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 37 A I
DM
PD @TA = 25°C Power Dissipation 3.8 W PD @TC = 25°C Power Dissipation 107 W
V
GS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt  5.0 V/ns T
J
T
STG
Pulsed Drain Current  180
Linear Derating Factor 0.71 W/°C Gate-to-Source Voltage ± 20 V Avalanche Current 28 A Repetitive Avalanche Energy 11 mJ
Operating Junction and -55 to + 175 Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case )
D
R
DS(on)
V
= 55V
DSS
= 0.0165Ω
ID = 53A
S
2
D Pak
TO-262
°C
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θJA
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Junction-to-Case ––– 1.4 Junction-to-Ambient ( PCB Mounted,steady-state)** ––– 40
°C/W
03/12/01
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IRFZ46NS/IRFZ46NL
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
S
C
iss
C
oss
C
rss
E
AS
Source-Drain Ratings and Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Drain-to-Source Breakdown Voltage 55 ––– ––– VVGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.057 ––– V/°C Reference to 25°C, ID =1mA
J
Static Drain-to-Source On-Resistance ––– ––– .0165 Ω VGS =10V, ID = 28A Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 19 ––– ––– SVDS = 25V, ID = 28A
Drain-to-Source Leakage Current
––– ––– 25 ––– ––– 250 VDS = 44V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 V Gate-to-Source Reverse Leakage ––– ––– -100
µA
nA
V
= 55V, VGS = 0V
DS
= 20V
GS
VGS = -20V Total Gate Charge ––– ––– 72 ID = 28A Gate-to-Source Charge ––– ––– 11 nC VDS = 44V Gate-to-Drain ("Miller") Charge ––– ––– 26 VGS = 10V, See Fig. 6 and 13  Turn-On Delay Time ––– 14 ––– VDD = 28V Rise Time ––– 76 ––– ID = 28A Turn-Off Delay Time ––– 52 ––– RG = 12Ω
ns
Fall Time ––– 57 ––– RD = 0.98Ω, See Fig. 10 Internal Source Inductance
––– –––
7.5
Between lead,
nH
and center of die contact Input Capacitance ––– 1696 ––– VGS = 0V Output Capacitance ––– 407 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 110 ––– ƒ = 1.0MHz, See Fig. 5 Single Pulse Avalanche Energy ––– 583152 I
= 28A, L = 389mH
AS
Parameter Min. Typ. Max. Units Conditions Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode)
––– –––
––– –––
53
180
showing the
A
p-n junction diode. Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 28A, VGS = 0V Reverse Recovery Time ––– 67 101 ns TJ = 25°C, IF = 28A Reverse Recovery Charge ––– 208 312 nC di/dt = 100A/µs Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)

D
G
S
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Starting T
RG = 25Ω, I
I
SD
= 25°C, L = 389µH
J
= 28A. (See Figure 12)
AS
≤ 28A, di/dt ≤ 220A/µs, V
DD
≤ V
(BR)DSS
Pulse width ≤ 400µs; duty cycle ≤ 2%. Uses IRFZ46N data and test conditions.
This is a typical value at device destruction and represents operation outside rated limits. This is a calculated value limited to TJ = 175°C
,
TJ ≤ 175°C
** When mounted on 1" square PCB (FR-4 or G-10 Material ). For recommended footprint and soldering techniques refer to application note #AN-994.
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IRFZ46NS/IRFZ46NL
)
A
)
A
A
)
A
1000
V G S TO P 1 5V 10 V
8. 0V
7. 0V
6. 0V
5. 5V
5. 0V BO T T O M 4.5V
100
10
4.5V
D
I , Drain-to-Source C urrent (A)
20µs PUL SE WIDTH
TJ = 25°C
T = 25°C
1
0.1 1 10 100
V , Dra in-t o-Sou r ce Voltage (V
DS
C
Fig 1. Typical Output Characteristics
1000
1000
VGS TOP 15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V BOTTOM 4.5V
100
10
D
I , Drain-to-Source Current (A)
4.5V
20µs PULSE WIDTH
TJ = 175°C
T = 175°C
1
0.1 1 10 100
V , Dra in-t o-Sou r ce Voltage (V
DS
C
Fig 2. Typical Output Characteristics
2.5
I = 46 A
D
2.0
T = 25°C
100
10
D
I , D rain-to-Source C urrent (A)
1
45678910
V , Gate -to -S ource Voltage (V
GS
Fig 3. Typical Transfer Characteristics
J
T = 175°C
J
V = 2 5 V
DS
20µs PULSE WIDTH
1.5
1.0
(Normaliz ed)
0.5
DS (on)
R , D ra in-to -S o u rc e O n R e s ista n c e
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature (°C)
J
Fig 4. Normalized On-Resistance
Vs. Temperature
V = 10 V
GS
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Page 4
IRFZ46NS/IRFZ46NL
)
A
A
)
A
g
)
A
g
g
g
2800
2400
2000
1600
1200
C, C apa citance (p F)
800
400
0
1 10 100
V = 0V, f = 1M Hz
GS
C = C + C , C S H O R T E D
iss
C = C C = C + C
C
iss
C
oss
C
rss
V , Drai n-to -So urce Voltage (V
DS
s gd d s
d
rss oss ds
d
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I = 2 8A
V , Gate -to- S o u rc e V o lta ge (V)
16
12
8
4
GS
D
V = 44 V
DS
V = 28 V
DS
FOR TEST CIRCUIT
0
0 102030405060
Q , T ota l G a te C h a rge (nC
G
SE E F IG U RE 1 3
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
OP ER A T IO N IN T HIS ARE A L IM IT E D BY R
DS(on)
100
T = 175°C
J
T = 25°C
J
10
SD
I , Re ve r se D r ain C u rre n t (A )
1
0.4 0.8 1.2 1.6 2.0 2.4
V , Source-to-Drain V oltage (V)
SD
V = 0V
Fig 7. Typical Source-Drain Diode
GS
100
10
D
I , D rain C u rr ent ( A )
T = 25°C
C
T = 175°C
J
Sin
le Pulse
1
1 10 100
V , Dra in-t o-Sou r ce Voltage (V
DS
Fig 8. Maximum Safe Operating Area
10µs
100µs
1ms
10ms
Forward Voltage
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Page 5
60
50
40
30
20
D
I , Drain Current (A)
10
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
IRFZ46NS/IRFZ46NL
R
D.U.T.
t
d(off)tf
D
+
-
V
DD
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
Fig 9. Maximum Drain Current Vs.
Fig 10b. Switching Time Waveforms
Case Temperature
10
thJC
1
D = 0.50
0.20
0.10
0.05
0.1
0.02
Thermal Response (Z )
0.01
0.01
0.00001 0.0001 0.001 0.01 0.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
P
DM
t
1 2
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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Page 6
IRFZ46NS/IRFZ46NL
A
)
D.U.T.
I
AS
L
0.01Ω
+
V
DD
-
R
10 V
V
DS
G
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
V
DD
V
DS
I
AS
Fig 12b. Unclamped Inductive Waveforms
500
400
300
200
100
AS
V = 25 V
E , S ingle Pu lse A valanc he E n ergy (m J)
DD
0
25 50 75 100 125 150 175
Starting T , Junction Temperature (°C
J
I TO P 11A 20A BOTT O M 28 A
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
D
Current Regulator
Same Type as D.U.T.
50KΩ
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
12V
Fig 13b. Gate Charge Test Circuit
.2µF
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
I
+
V
DS
-
D
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Page 7
IRFZ46NS/IRFZ46NL
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance Current Transformer
-
-
• dv/dt controlled by R
• Driver same type as D.U.T.
G
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Period
D =
P.W.
Period
+
+
V
DD
-
VGS=10V
*
D.U.T. ISDWaveform
Reverse Recovery Current
Re-Applied Voltage
D.U.T. VDSWaveform
Inductor Curent
* V
= 5V for Logic Level Devices
GS
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
V
DD
I
SD
Fig 14. For N-Channel HEXFETS
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Page 8
IRFZ46NS/IRFZ46NL
A
D2Pak Package Outline
10.54 (.415)
1.40 (.055) MA X.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTE S: 1 DIMENSIONS AFTER SOLDER DIP. 2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 CONTROLLING DIMENSION : INCH. 4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
10.29 (.405)
- A ­2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.2 5 ( .0 10) M B A M
Part Marking Information
D2Pak
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
LEAD ASSIGNMENTS 1 - G ATE 2 - D RAIN 3 - S OU R CE
10.16 (.400) REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350) REF.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082) 2X
2.54 (.100) 2X
INTERNATIONAL RE CTIFIER LO G O
A S SEMBLY LO T CO D E
F530S
9246
9 B 1 M
PART NUMB ER
DATE CODE (Y Y W W ) YY = YEAR WW = WEEK
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Page 9
Package Outline
TO-262 Outline
IRFZ46NS/IRFZ46NL
Part Marking Information
TO-262
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Page 10
IRFZ46NS/IRFZ46NL
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(
)
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Tape & Reel Information
D2Pak
TRR
1.60 (.063
1.50 (.059
4.10 (.1 6 1
3.90 (.1 5 3
1.60 (.06 3
1.50 (.05 9
0.368 (.0145
0.342 (.0135
FEED D IRECTION
1.85 (.0 7 3
1.65 (.0 6 5
TRL
10.90 (.42 9
10.70 (.42 1
FEED DIRECTION
13.50 (.532
12.80 (.504
330.00
14.173
MAX.
NOTES :
1. COM FO R M S TO E IA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HU B.
4. INC LUDES FLANGE DISTORTION @ OUTER EDGE.
11.60 (.457
11.40 (.449
16.10 (.634
15.90 (.626
1.75 (.069
1.25 (.049
15.42 (.609
15.22 (.601
27.40 (1.079
23.90 (.9 41
4
26.40 (1.039
24.40 (.961
3
24.30 (.957
23.90 (.941
4.72 (.136
4.52 (.178
60.00 (2.362 MIN.
30.40 (1.197 MAX .
4
Data and specifications subject to change without notice.
This product has been designed and qualified for the industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 3/01
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