Advanced Process Technology
Dynamic dv/dt Rating
175°C Operating Temperature
Fast Switching
Fully Avalanche Rated
Description
Fifth Generation HEXFETs from International Rectifier utilize advanced processing
techniques to achieve the lowest possible on-resistance per silicon area. This
benefit, combined with the fast switching speed and ruggedized device design that
HEXFET Power MOSFETs are well known for, provides the designer with an
extremely efficient device for use in a wide variety of applications.
The TO-220 package is universally preferred for all commercial-industrial
applications at power dissipation levels to approximately 50 watts. The low
thermal resistance and low package cost of the TO-220 contribute to its wide
acceptance throughout the industry.
IRFZ34N
V
= 55V
DSS
R
DS(on)
ID = 26A
= 0.040Ω
Absolute Maximum Ratings
ParameterMax.Units
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V26
ID @ TC = 100°CContinuous Drain Current, VGS @ 10V18A
I
DM
PD @TC = 25°CPower Dissipation56W
V
GS
E
AS
I
AR
E
AR
dv/dtPeak Diode Recovery dv/dt 4.6V/ns
T
J
T
STG
Pulsed Drain Current 100
Linear Derating Factor0.37W/°C
Gate-to-Source Voltage±20V
Single Pulse Avalanche Energy 110mJ
Avalanche Current16A
Repetitive Avalanche Energy 5.6mJ
Operating Junction and-55 to + 175
Storage Temperature Range°C
Soldering Temperature, for 10 seconds300 (1.6mm from case)
Mounting torque, 6-32 or M3 screw.10 lbf•in (1.1N•m)
and center of die contact
Input Capacitance––– 700 –––VGS = 0V
Output Capacitance––– 240 –––pFVDS = 25V
Reverse Transfer Capacitance––– 100 –––ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
ParameterMin. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
DD
RG = 25Ω, I
Continuous Source CurrentMOSFET symbol
(Body Diode)showing the
Pulsed Source Currentintegral reverse
(Body Diode) p-n junction diode.
––––––26
––––––100
Diode Forward Voltage––– –––1.6VTJ = 25°C, IS = 16A, VGS = 0V
Reverse Recovery Time–––5786nsTJ = 25°C, IF = 16A
Reverse Recovery Charge––– 130 200nCdi/dt = 100A/µs
Forward Turn-On Time
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
I
SD
TJ ≤ 175°C
= 25V, starting TJ = 25°C, L = 610µH
= 16A. (See Figure 12)
AS
Pulse width ≤ 300µs; duty cycle ≤ 2%.
A
≤ 16 A, di/dt ≤ 420A/µs, V
DD
≤ V
(BR)DSS
,
Page 3
IRFZ34N
A
A
A
A
1000
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
100
10
D
I , Drain-to-Source Current (A)
4.5V
20µs PULSE WIDTH
T = 25°C
1
0.1110100
V , Drain-to-Source Voltage (V)
DS
C
Fig 1. Typical Output Characteristics,
TC = 25oC
100
1000
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTO M 4.5V
100
10
4.5V
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH
T = 175°C
1
0.1110100
V , Drain-to-Source Voltage (V)
DS
C
Fig 2. Typical Output Characteristics,
TC = 175oC
2.4
I = 26A
D
T = 25°C
J
T = 175°C
J
10
D
I , Drain-to-Source Current (A)
1
45678910
V , Gate-to-Source Voltage (V)
GS
V = 25V
DS
20µs PULSE WIDTH
2.0
1.6
1.2
(Normalized)
0.8
0.4
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature (°C)
J
Fig 3. Typical Transfer CharacteristicsFig 4. Normalized On-Resistance
Vs. Temperature
V = 10V
GS
Page 4
IRFZ34N
A
A
A
A
1200
1000
800
600
400
C, Capacitance (pF)
200
0
110100
V = 0V, f = 1MHz
GS
C = C + C , C SHORTED
iss gs gd ds
C = C
rss gd
C = C + C
C
oss ds gd
iss
C
oss
C
rss
V , Drain-to-Source Voltage (V)
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I = 16A
D
16
12
8
4
GS
V , Gate-to-Source Voltage (V)
V = 44V
DS
V = 28V
DS
FOR TEST CIRCUIT
0
010203040
Q , Total Gate Charge (nC)
G
SEE FIGURE 13
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
100
T = 175°C
J
T = 25°C
10
SD
I , Reverse Drain Current (A)
1
0.40.81.21.62.0
V , Source-to-Drain Voltage (V)
SD
J
V = 0V
Fig 7. Typical Source-Drain Diode
Forward Voltage
GS
100
10
D
I , Drain Current (A)
T = 25°C
C
T = 175°C
J
Single Pulse
1
110100
V , Drain-to-Source Voltage (V)
DS
Fig 8. Maximum Safe Operating Area
10µs
100µs
1ms
10ms
Page 5
IRFZ34N
A
R
D.U.T.
D
V
DD
V
DS
V
30
25
GS
R
G
10 V
20
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
15
10
D
I , Drain Current (Amps)
5
0
255075100125150175
T , Case Temperature (°C)
C
Fig 9. Maximum Drain Current Vs.
Fig 10a. Switching Time Test Circuit
Fig 10b. Switching Time Waveforms
Case Temperature
10
thJC
D = 0.50
1
0.20
0.10
0.05
0.02
0.1
0.01
SINGLE PULSE
Thermal Response (Z )
0.01
0.000010.00010.0010.010.11
(THERMAL RESPONSE)
N otes :
1. D uty fac tor D = t / t
2. P eak T = P x Z + T
t , Rectangular Pulse Duration (sec)
1
DM
J
1 2
thJC
P
D M
t
1
C
t
2
A
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Appendix A: Figure 14, Peak Diode Recovery dv/dt Test Circuit
Appendix B: Package Outline Mechanical Drawing
Appendix C: Part Marking Information
Page 7
Appendix A
IRFZ34N
Peak Diode Recovery dv/dt Test Circuit
D.U.T
R
G
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
V
DD
*
* VGS = 5V for Logic Level Devices
Fig 14. For N-Channel HEXFETS
Page 8
IRFZ34N
A
Package Outline
Appendix B
TO-220AB Outline
Dimensions are shown in millimeters (inches)
10.54 (.415)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
1.40 (.055)
3X
1.15 (.045)
2.54 (.100)
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB.
2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.