These are N-Channel enhancement mode silicon gate
power field effect transistors designed, tested, and
guaranteed to withstand a specified level of energy in the
breakdown avalanche mode of operation. These advanced
power MOSFETs are designed for use in applications such
as switching regulators, switching converters, motor drivers,
relay drivers and drivers for high-power bipolar switching
transistors requiring high speed and low gate-drive power.
These transistors can be operated directly from integrated
circuits.
Formerly developmental type TA17441.
Ordering Information
PART NUMBERPACKAGEBRAND
IRFU110TO-251AAIFU110
IRFR110TO-252AAIFR110
NOTE: When ordering, use the entire part number.
Features
• 4.7A, 100V
DS(ON)
= 0.540Ω
•r
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
o
C Operating Temperature
• 175
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards”
Symbol
D
G
3275.3
Packaging
JEDEC TO-251AAJEDEC TO-252AA
SOURCE
DRAIN
GATE
DRAIN (FLANGE)
GATE
SOURCE
S
DRAIN (FLANGE)
4-371
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
19mj
-55 to 175
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 150oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate to Threshold VoltageV
Zero Gate Voltage Drain CurrentI
DSSID
GS(TH)VGS
DSS
= 250µA, VGS = 0V (Figure 10)100--V
= VDS, ID = 250µA2-4V
VDS = Rated BV
VDS = 0.8 x Rated BV
, VGS = 0V--25µA
DSS
, VGS = 0V,
DSS
--250µA
TJ = 150oC
On-State Drain CurrentI
Gate to Source Leakage CurrentI
Drain to Source On Resistance
FIGURE 6. SATURATION CHARACTERISTICSFIGURE 7. TRANSFER CHARACTERISTICS
5
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
4
3
2
, DRAIN TO SOURCE
ON RESISTANCE (Ω)
1
DS(ON)
r
0
0 4 8121620
VGS = 10V
ID, DRAIN CURRENT (A)
VGS = 20V
3.0
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
= 10V
V
GS
2.4
1.8
1.2
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-60 -40 -20 020 40 60 80 100 120 140 160 180
T
, JUNCTION TEMPERATURE (oC)
J
ID = 3.3A
FIGURE 8. DRAIN TO SOURCE ON RESISTANCEvs GATE
VOLTAGE AND DRAIN CURRENT
4-374
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
Page 5
IRFR110, IRFU110
Typical Performance Curves
1.25
ID = 250µA
1.15
1.05
0.95
BREAKDOWN VOLTAGE
0.85
NORMALIZED DRAIN TO SOURCE
0.75
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T
, JUNCTION TEMPERATURE (oC)
J
Unless Otherwise Specified (Continued)
FIGURE 10. DRAIN TO SOURCE BREAKDOWN VOLTAGEvs
JUNCTION TEMPERATURE
2.5
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
≥ 50V
DS
2.0
1.5
1.0
TJ = 25oC
TJ = 175oC
500
VGS = 0V, f = 1MHz
C
= CGS + CGD
ISS
C
= CGD
RSS
400
C
≈ CDS + CGS
OSS
300
C
C
RSS
ISS
C
OSS
10
200
C, CAPACITANCE (pF)
100
0
110
VDS, DRAIN TO SOURCE VOLTAGE (V)
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
2
10
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
10
TJ = 175oC
1.0
2
, TRANSCONDUCTANCE (S)
0.5
fs
g
0
0246810
, DRAIN CURRENT (A)
I
D
, SOURCE TO DRAIN CURRENT (A)
SD
I
0.1
00.40.81.21.62.0
VSD, SOURCE TO DRAIN VOLTAGE (V)
TJ = 25oC
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENTFIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
20
ID = 5.6A
16
12
8
4
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0246810
VDS = 80V
VDS = 50V
VDS = 20V
Q
, GATE CHARGE (nC)
g
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
4-375
Page 6
IRFR110, IRFU110
Test Circuits and Waveforms
V
DS
BV
DSS
L
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
AS
R
G
+
V
DD
-
DUT
0V
P
I
AS
0.01Ω
0
t
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUITFIGURE 16. UNCLAMPED ENERGY WAVEFORMS
t
P
I
AS
t
AV
V
DS
V
DD
t
ON
t
d(ON)
t
R
L
+
V
R
G
DD
-
V
DS
90%
0
r
10%
DUT
V
GS
V
GS
10%
0
50%
PULSE WIDTH
FIGURE 17. SWITCHING TIME TEST CIRCUITFIGURE 18. RESISTIVE SWITCHING WAVEFORMS
V
DS
D
S
CURRENT
I
D
SAMPLING
(ISOLATED
SUPPLY)
SAME TYPE
AS DUT
DUT
V
DS
V
DD
Q
g(TOT)
Q
gd
Q
gs
V
DS
0
I
G(REF)
0
12V
BATTERY
0
0.2µF
50kΩ
I
G(REF)
CURRENT
REGULATOR
0.3µF
G
IG CURRENT
SAMPLING
RESISTORRESISTOR
t
d(OFF)
90%
V
GS
t
OFF
50%
t
f
90%
10%
FIGURE 19. GATE CHARGE TEST CIRCUITFIGURE 20. GATE CHARGE WAVEFORMS
4-376
Page 7
IRFR110, IRFU110
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reservesthe right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third partieswhich may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
4-377
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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