Datasheet IRFR1018ETRPBF Specification

Page 1
PD - 97129A
)
)
)
IRFR1018EPbF IRFU1018EPbF
Applications
l High Efficiency Synchronous Rectification in
SMPS
l Uninterruptible Power Supply l High Speed Power Switching l Hard Switched and High Frequency Circuits
D
G
S
HEXFET® Power MOSFET
V
DSS
R
DS(on
typ.
max. I
D (Silicon Limited
I
D (Package Limited
Benefits
l Improved Gate, Avalanche and Dynamic
dv/dt Ruggedness
l Fully Characterized Capacitance and
Avalanche SOA
l Enhanced body diode dV/dt and dI/dt
Capability
D-Pak
IRFR1018EPbF
GDS
Gate Drain Source
I-Pak
IRFU1018EPbF
Absolute Maximum Ratings
Symbol Parameter Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited)
I
@ TC = 100°C Continuous Drain Current, VGS @ 10V (Silicon Limited)
D
I
@ TC = 25°C Continuous Drain Current, VGS @ 10V (Wire Bond Limited)
D
I
DM
@TC = 25°C
P
D
V
GS
dv/dt T
J
T
STG
Pulsed Drain Current
Maximum Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Peak Diode Recovery
Operating Junction and
Storage Temperature Range
Soldering Temperature, for 10 seconds
(1.6mm from case)
d
f
Max.
c
79
c
56
56
315
110
0.76
± 20
21
-55 to + 175
300
60V
7.1m
8.4m 79A
56A
W/°C
V/ns
: :
c
A
W
V
°C
Avalanche Characteristics
g
e
88
47
11
E
AS (Thermally limited)
I
AR
E
AR
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
d
Thermal Resistance
Symbol Parameter Typ. Max. Units
R
JC
θ
R
JA
θ
R
JA
θ
Junction-to-Case
Junction-to-Ambient (PCB Mount)
Junction-to-Ambient
k –––
jk ––– 50
k ––– 110
1.32
°C/W
Notes through are on page 2
mJ
A
mJ
4/21/09
Page 2
IRFR/U1018EPbF
h
Static @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units
V
(BR)DSS
ΔV
(BR)DSS
R
DS(on)
V
GS(th)
I
DSS
I
GSS
Dynamic @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units
gfs Forward Transconductance 110 ––– ––– S Q
g
Q
gs
Q
gd
Q
sync
R
G(int)
t
d(on)
t
r
t
d(off)
t
f
C
iss
C
oss
C
rss
eff. (ER)
C
oss
eff. (TR)
C
oss
Drain-to-Source Breakdown Voltage 60 ––– ––– V
/ΔT
Breakdown Voltage Temp. Coefficient ––– 0.073 ––– V/°C
J
Static Drain-to-Source On-Resistance ––– 7.1 8.4 Gate Threshold Voltage 2.0 ––– 4.0 V Drain-to-Source Leakage Current ––– ––– 20 μA
––– ––– 250 Gate-to-Source Forward Leakage ––– ––– 100 nA Gate-to-Source Reverse Leakage ––– ––– -100
Total Gate Charge ––– 46 69 nC Gate-to-Source Charge ––– 10 ––– Gate-to-Drain ("Miller") Charge ––– 12 ––– Total Gate Charge Sync. (Qg - Qgd)
Internal Gate Resistance
––– 34 –––
–––
0.73 ––– Ω Turn-On Delay Time ––– 13 ––– ns Rise Time ––– 35 ––– Turn-Off Delay Time ––– 55 ––– Fall Time ––– 46 ––– Input Capacitance ––– 2290 ––– Output Capacitance ––– 270 ––– Reverse Transfer Capacitance ––– 130 ––– pF
Effective Output Capacitance (Energy Related) Effective Output Capacitance (Time Related)
––– 390 ––– ––– 630 –––
g
VGS = 0V, ID = 250μA Reference to 25°C, I
= 10V, ID = 47A
V
mΩ
GS
= VGS, ID = 100μA
V
DS
= 60V, VGS = 0V
V
DS
= 48V, VGS = 0V, TJ = 125°C
V
DS
V
= 20V
GS
= -20V
V
GS
VDS = 50V, ID = 47A
= 47A
I
D
= 30V
V
DS
g
= 10V
V
GS
= 47A, VDS =0V, VGS = 10V
I
D
V
= 39V
DD
= 47A
I
D
= 10Ω
R
G
VGS = 10V V
GS
V
DS
g
= 0V = 50V
ƒ = 1.0MHz
= 0V, VDS = 0V to 60V
V
GS
= 0V, VDS = 0V to 60V
V
GS
Conditions
= 5mA
D
g
Conditions
d
i
h
Diode Characteristics
Symbol Parameter Min. Typ. Max. Units
I
S
I
SM
V
SD
t
rr
Q
rr
I
RRM
t
on
Notes:
Calculated continuous current based on maximum allowable junction
temperature. Bond wire current limit is 56A. Note that current limitations arising from heating of the device leads may occur with
some lead mounting arrangements.
Repetitive rating; pulse width limited by max. junction
temperature.
Limited by T
RG = 25Ω, I
use above this value.
I
≤ 47A, di/dt ≤ 1668A/μs, V
SD
Continuous Source Current ––– –––
79
c
(Body Diode) Pulsed Source Current ––– ––– 315
(Body Diode)
d
Diode Forward Voltage ––– ––– 1.3 V Reverse Recovery Time ––– 26 39 ns
––– 31 47
Reverse Recovery Charge ––– 24 36 nC
––– 35 53 Reverse Recovery Current ––– 1.8 ––– A Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width ≤ 400μs; duty cycle ≤ 2%. C
eff. (TR) is a fixed capacitance that gives the same charging time
oss
as C
C
C
while V
oss
eff. (ER) is a fixed capacitance that gives the same energy as
oss
while V
oss
DS
is rising from 0 to 80% V
DS
When mounted on 1" square PCB (FR-4 or G-10 Material). For recom
, starting TJ = 25°C, L = 0.08mH
Jmax
= 47A, VGS =10V. Part not recommended for
AS
DD
≤ V
(BR)DSS
, TJ ≤ 175°C.
mended footprint and soldering techniques refer to application note #AN-994.
R
is measured at TJ approximately 90°C.
θ
A
MOSFET symbol
showing the integral reverse
p-n junction diode. T
= 25°C, IS = 47A, VGS = 0V
J
TJ = 25°C VR = 51V,
= 125°C IF = 47A
T
J
TJ = 25°C
= 125°C
T
J
TJ = 25°C
is rising from 0 to 80% V
Conditions
.
DSS
.
DSS
G
g
di/dt = 100A/μs
g
2 www.irf.com
D
S
Page 3
IRFR/U1018EPbF
1000
TOP 15V
) A
( t n e
r
r
100
u C e
c
r u o S
­o
t
­n
i
10
a
r D
,
D
I
4.5V
BOTTOM 4.5V
≤60μs PULSE WIDTH
Tj = 25°C
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
1000
) A
(
t
100
n e
r
r u
C e
c
r u
10
o S
­o
t
­n
i a
r D
,
D
I
1
TJ = 175°C
TJ = 25°C
V
DS
≤
60μs PULSE WIDTH
= 25V
0.1 2 3 4 5 6 7 8 9
VGS, Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
VGS
10V
8.0V
6.0V
5.5V
5.0V
4.8V
) A
( t n e
r
r u
C e
c
r u o S
­o
t
­n
i a
r D
, I
1000
D
100
10
TOP 15V
BOTTOM 4.5V
VGS
10V
8.0V
6.0V
5.5V
5.0V
4.8V
4.5V
≤60μs PULSE WIDTH
Tj = 175°C
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 2. Typical Output Characteristics
2.5
e c n a
t s
i s e
R n O e
c
r u o S
­o
t
­n
i a
r D
,
) n o
( S D
R
ID = 47A
V
= 10V
GS
2.0
) d e z
i
l a
1.5
m
r o
N
(
1.0
0.5
-60 -40 -20 0 20 40 60 80 100120 140160180
TJ , Junction Temperature (°C)
Fig 4. Normalized On-Resistance vs. Temperature
4000
3000
) F p
( e
c n a
t
i
2000
c a p a
C ,
C
1000
0
V
= 0V, f = 1 MHZ
GS
C
= C
C
C
iss
rss
oss
= C
= C
C
C
C
+ Cgd, C
gs
gd
+ C
ds
iss
oss
rss
SHORTED
ds
gd
1 10 100
VDS, Drain-to-Source Voltage (V)
16
ID= 47A
) V
( e
g
12
a
t
l o V
e c
r u o
8
S
­o
t
­e
t a
G ,
4
S G
V
VDS= 48V
VDS= 30V
VDS= 12V
0
0 102030405060
Q
Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge vs. Gate-to-Source VoltageFig 5. Typical Capacitance vs. Drain-to-Source Voltage
Page 4
IRFR/U1018EPbF
1000
) A
( t
100
n e
r
r u
C n
i a
r
10
D e
s
r e v e
R ,
1
D S
I
0.1
TJ = 175°C
TJ = 25°C
V
= 0V
GS
0.0 0.5 1.0 1.5 2.0
VSD, Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
80
LIMITED BY PACKAGE
60
) A
( t n e
r
r u
C
40
n
i a
r D
,
D
I
20
0
25 50 75 100 125 150 175
TC, Case Temperature (°C)
10000
) A
(
1000
t n e
r
r u
C
100
e c
r u o S
­o
t
10
­n
i a
r D
,
D
I
LIMITED BY PACKAGE
1
Tc = 25°C Tj = 175°C Single Pulse
0.1
0.1 1 10 100
OPERATION IN THIS AREA LIMITED BY RDS(on)
1msec
10msec
DC
VDS, Drain-toSource Voltage (V)
Fig 8. Maximum Safe Operating Area
) V
(
80
e g a
t
l o V
n w
o d k a e
r B
e c
r u o S
­o
t
­n
i a
r D ,
S S D
) R B
(
V
Id = 5mA
75
70
65
60
-60 -40 -20 0 20 40 60 80 100120140160180
TJ , Temperature ( °C )
100μsec
Fig 9. Maximum Drain Current vs. Case Temperature
0.8
0.6
) J
μ
( y
0.4
g
r e n E
0.2
0.0
0 10 20 30 40 50 60
V
Drain-to-Source Voltage (V)
DS,
Fig 11. Typical C
Stored Energy
OSS
Fig 10. Drain-to-Source Breakdown Voltage
400
) J
m
(
350
y g
r e
300
n E
e h
250
c n a
l a v
200
A e
s
l
150
u P
e
l g
100
n
i S
,
50
S A
E
0
25 50 75 100 125 150 175
Starting TJ, Junction Temperature (°C)
I
TOP
5.3A
11A
BOTTOM
47A
D
Fig 12. Maximum Avalanche Energy vs. DrainCurrent
4 www.irf.com
Page 5
IRFR/U1018EPbF
(
)
τ
10
)
1
C J h
t Z (
e s n o p s e
R l a
m
r e h T
0.001
D = 0.50
0.20
R
R
R
R
0.1
0.01
0.10
0.05
0.02
0.01
SINGLE PULSE ( THERMAL RESPONSE )
τ
J
τ
J
τ
1
τ
Ci= τi/Ri
1
2
R
1
1
τ
3
R
R
2
3
τ
2
3
τ
τ
2
3
Notes:
1. Duty Factor D = t1/t2
Ri (°C/W)
4
R
4
0.026741 0.000007
τ
C
0.28078 0.000091
τ
4
τ
4
0.606685 0.000843
0.406128 0.005884
2. Peak Tj = P dm x Zthjc + Tc
1E-006 1E-005 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case
τι
sec
100
Duty Cycle = Single Pulse
Allowed avalanche Current vs avalanche pulsewidth, tav, assuming ΔTj = 150°C and
Tstart =25°C (Single Pulse)
) A
(
10
t n e
r
r u
C e
h c n a
l a
1
v A
Allowed avalanche Current vs avalanche pulsewidth, tav, assuming ΔΤj = 25°C and
0.01
0.05
0.10
Tstart = 150°C.
0.1
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
Fig 14. Typical Avalanche Current vs.Pulsewidth
100
TOP Single Pulse
) J
80
m
( y
g
r e n
60
E e
h c n a
l
40
a v
A ,
R A
20
E
0
25 50 75 100 125 150 175
BOTTOM 10% Duty Cycle ID = 47A
Starting TJ , Junction Temperature (°C)
Notes on Repetitive Avalanche Curves , Figures 14, 15: (For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of T
2. Safe operation in Avalanche is allowed as long asT
. This is validated for every part type.
jmax
is not exceeded.
jmax
3. Equation below based on circuit and waveforms shown in Figures 16a, 16b.
4. P
= Average power dissipation per single avalanche pulse.
D (ave)
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ΔT = Allowable rise in junction temperature, not to exceed T
(assumed as
jmax
25°C in Figure 14, 15). t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t Z
(D, tav) = Transient thermal resistance, see Figures 13)
thJC
P
D (ave)
·f
av
= 1/2 ( 1.3·BV·Iav) = DT/ Z
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
D (ave)·tav
thJC
Fig 15. Maximum Avalanche Energy vs. Temperature
Page 6
IRFR/U1018EPbF
4.5
) V
4.0
( e
g a
t
l
3.5
o V
d
l o
3.0
h s e
r h
t
2.5
e
t a
G )
2.0
h
t
(
S G
1.5
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175
TJ , Temperature ( °C )
ID = 1.0A
ID = 1.0mA
ID = 250μA
ID = 100μA
Fig 16. Threshold Voltage vs. Temperature
14
IF = 47A
12
VR = 51V
TJ = 25°C
10
TJ = 125°C
)
8
A
(
R R
I
6
4
14
IF = 32A
12
VR = 51V
TJ = 25°C
10
TJ = 125°C
)
8
A
(
R R
I
6
4
2
0
0 200 400 600 800 1000
diF /dt (A/μs)
Fig. 17 - Typical Recovery Current vs. dif/dt
320
IF = 32A
280
VR = 51V
TJ = 25°C
240
TJ = 125°C
200
) A
(
160
R R
Q
120
80
2
0
0 200 400 600 800 1000
diF /dt (A/μs)
320
280
240
200
) A
(
160
R R
Q
120
80
40
40
0
0 200 400 600 800 1000
diF /dt (A/μs)
Fig. 19 - Typical Stored Charge vs. dif/dtFig. 18 - Typical Recovery Current vs. dif/dt
IF = 47A
VR = 51V
TJ = 25°C
TJ = 125°C
0
0 200 400 600 800 1000
diF /dt (A/μs)
Fig. 20 - Typical Stored Charge vs. dif/dt
6 www.irf.com
Page 7
IRFR/U1018EPbF
A
D.U.T
+
-
R
G
*
Use P-Channel Driver for P-Channel Measurements
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance Current Transformer
*
• dv/dt controlled by R
• Driver same type as D.U.T.
controlled by Duty Factor "D"
• I
SD
• D.U.T. - Device Under Test
-
+
G
** Reverse Polarity for P-Channel
Fig 21. Diode Reverse Recovery Test Circuit for HEXFET® Power MOSFETs
15V
V
DS
L
DRIVER
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
Reverse Recovery Current
D.U.T. VDSWaveform
V
DD
Re-Applied Voltage
+
**
-
Inductor Curent
*** V
GS
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
t
p
D =
P. W .
Period
V
(BR)DSS
***
VGS=10V
V
DD
I
SD
R
20V
G
V
GS
D.U.T
I
AS
0.01
t
p
Ω
Fig 22a. Unclamped Inductive Test Circuit
R
V
DS
V
GS
R
G
D
D.U.T.
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 23a. Switching Time Test Circuit
0
20K
1K
DUT
+
V
DD
-
I
AS
Fig 22b. Unclamped Inductive Waveforms
V
DS
90%
+
V
DD
-
10%
V
GS
t
d(on)
t
r
t
d(off)
t
f
Fig 23b. Switching Time Waveforms
Id
Vgs
Vds
L
VCC
Vgs(th)
Qgs1
Qgs2QgdQgodr
Fig 24a. Gate Charge Test Circuit
Fig 24b. Gate Charge Waveform
Page 8
IRFR/U1018EPbF
D-Pak (TO-252AA) Package Outline
Dimensions are shown in millimeters (inches)
D-Pak (TO-252AA) Part Marking Information
EXAMPLE:
Note: "P" in ass embly line posi tion
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
8 www.irf.com
TH IS IS AN IR FR120 WITH ASSEMBLY LOT CODE 1234 ASS EMBLE D ON WW 16, 2001 IN THE ASSEMBLY LINE "A"
i ndi cates "L ead-F r ee"
"P" in as sembly line position indicates "L ead-F r ee" qu ali fi cati on t o the con s umer -lev el
OR
INTE RNATIONAL
RECTIFIER
LOGO
AS S E MB L Y LOT CODE
INTE RNATIONAL
RECTIFIER
LOGO
ASSEMBLY LOT CODE
IRF R120
12
IRF R120
116A
PART NUMBER
DATE CODE P = DE S I GNAT E S L E AD- F R E E
34
P = DE S I GNAT E S L E AD- F R E E
YEAR 1 = 2001 WE E K 16 A = ASSEMBLY SITE CODE
PART NUMBER
DATE CODE
3412
YEAR 1 = 2001 WE EK 16 LINE A
PRODU CT (OPTIONAL)
PRODUCT QUALIFIE D TO T HE CONSUMER LEVEL (OPTIONAL)
Page 9
I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)
IRFR/U1018EPbF
I-Pak (TO-251AA) Part Marking Information
78
PART NUMBER
DATE CODE YEAR 1 = 2001 WEEK 19 LINE A
EXAMPLE:
TH IS IS AN IRFU120 WITH ASSEMBLY LOT CODE 5678 ASS EMBLE D ON WW 19, 2001 IN THE ASSEMBLY LINE "A"
Note: "P" in ass embly line position
indicates Lead-Free"
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY LOT CODE
IRF U120
56
119A
OR
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY LOT CODE
IRFU120
56 78
PART NUMBER
DATE CODE P = DESIGNATES LEAD-FREE
PRODUCT (OPTIONAL )
YEAR 1 = 2001 WEEK 19 A = ASSEMBLY SITE CODE
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
Page 10
IRFR/U1018EPbF
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters (inches)
TR
16.3 ( .641 )
15.7 ( .619 )
12.1 ( .476 )
11.9 ( .469 )
FEED DIRECTION
8.1 ( .318 )
7.9 ( .312 )
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
TRR
TRL
16.3 ( .641 )
15.7 ( .619 )
FEED DIRECTION
13 INCH
16 mm
NOTES :
1. OUTLINE CONFORMS TO EIA-481.
Data and specifications subject to change without notice.
This product has been designed for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.4/09
10 www.irf.com
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