Datasheet irfp260npbf DATASHEETS (Philips)

Page 1
IRFP260NPbF
HEXFET® Power MOSFET
l Advanced Process Technology l Dynamic dv/dt Rating l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated l Ease of Paralleling l Simple Drive Requirements
l Lead-Free
Description
Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications.
The TO-247 package is preferred for commercial-industrial applications where higher power levels preclude the use of TO-220 devices. The TO-247 is similar but superior to the earlier TO-218 package because of its isolated mounting hole.
G
PD - 95010
D
V
R
DS(on)
DSS
= 200V
= 0.04Ω
ID = 50A
S
TO-247AC
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 50 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 35 A I
DM
PD @TC = 25°C Power Dissipation 300 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 10 V/ns T
J
T
STG
Pulsed Drain Current 200
Linear Derating Factor 2.0 W/°C Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy 560 mJ Avalanche Current 50 A Repetitive Avalanche Energy 30 mJ
Operating Junction and -55 to +175 Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case ) Mounting torque, 6-32 or M3 srew 10 lbf•in (1.1N•m)
°C
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θCS
R
θJA
www.irf.com 1
Junction-to-Case ––– 0.50 Case-to-Sink, Flat, Greased Surface 0.24 ––– °C/W Junction-to-Ambient ––– 40
2/12/04
Page 2
IRFP260NPbF
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 200 ––– ––– V VGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.26 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.04 Ω VGS = 10V, ID = 28A Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 27 ––– ––– S VDS = 50V, ID = 28A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 160V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 200V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge ––– ––– 234 ID = 28A Gate-to-Source Charge ––– ––– 38 nC VDS = 160V Gate-to-Drain ("Miller") Charge ––– ––– 110 VGS = 10V Turn-On Delay Time ––– 17 ––– VDD = 100V Rise Time ––– 60 ––– ID = 28A Turn-Off Delay Time ––– 55 ––– RG = 1.8Ω
ns
Fall Time ––– 48 ––– VGS = 10V
Internal Drain Inductance
Internal Source Inductance ––– –––
––– –––
5.0
13
Between lead,
6mm (0.25in.)
nH
from package
and center of die contact Input Capacitance ––– 4057 ––– VGS = 0V Output Capacitance ––– 603 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 161 ––– ƒ = 1.0MHz
D
G
S
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature.
Starting T
RG = 25Ω, I
2 www.irf.com
Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode)
––– –––
––– –––
50
200
showing the
A
p-n junction diode.
G
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 28A, VGS = 0V Reverse Recovery Time ––– 268 402 ns TJ = 25°C, IF = 28A Reverse Recovery Charge ––– 1.9 2.8 µC di/dt = 100A/µs Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
I
≤ 28A, di/dt ≤ 486A/µs, V
SD
DD
≤ V
(BR)DSS
,
TJ ≤ 175°C
= 25°C, L = 1.5mH
J
= 28A.
AS
Pulse width ≤ 400µs; duty cycle ≤ 2%.
D
S
Page 3
IRFP260NPbF
1000
100
10
TOP
BOTTOM
VGS 15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
4.5V
1
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH
°
T = 25 C
0.1
0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
1000
J
1000
100
10
1
D
I , Drain-to-Source Current (A)
0.1
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
20µs PULSE WIDTH T = 175 C
J
V , Drain-to-Source Voltage (V)
DS
4.5V
°
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
3.5
3.0
I =
D
50A
100
10
D
I , Drain-to-Source Current (A)
1
4.0 5.0 6.0 7.0 8.0 9.0 10.0
°
T = 175 C
J
°
T = 25 C
J
V = 50V
DS
20µs PULSE WIDTH
V , Gate-to-Source Voltage (V)
GS
Fig 3. Typical Transfer Characteristics
2.5
2.0
1.5
(Normalized)
1.0
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
Fig 4. Normalized On-Resistance
V =
GS
°
10V
Vs. Temperature
www.irf.com 3
Page 4
IRFP260NPbF
8000
7000
6000
) F p
(
5000
e c n a
t
i
4000
c a p a
3000
C ,
C
2000
Ciss
Coss
V
= 0V, f = 1 MHZ
GS
C
= C
iss
gs
C
= C
rss
oss
= C
gd
ds
C
+ Cgd, C
+ C
gd
Crss
1000
0
1 10 100 1000
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
SHORTED
ds
1000
16
I =
28A
D
12
8
4
GS
V , Gate-to-Source Voltage (V)
0
0 50 100 150 200
Q , Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge Vs.
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Gate-to-Source Voltage
OPERATION IN THIS AREA LIMITED
BY R
V = 160V V = 100V V = 40V
DS(on)
DS DS DS
100
T = 175 C
10
1
SD
I , Reverse Drain Current (A)
0.1
0.2 0.6 1.0 1.4 1.8 2.2
Fig 7. Typical Source-Drain Diode
Fig 7. Typical Source-Drain Diode
°
J
°
T = 25 C
J
V = 0 V
V ,Source-to-Drain Voltage (V)
SD
Forward Voltage
Forward Voltage
GS
100
10
D
I , Drain Current (A)I , Drain Current (A)
°
= 25 C
C
T T= 175 C
J
Single Pulse
1
1 10 100 1000
°
V , Drain-to-Source Voltage (V)
DS
10us
100us
1ms
10ms
Fig 8. Maximum Safe Operating Area
4 www.irf.com
Page 5
50
40
30
50
40
30
IRFP260NPbF
V
V
DS
DS
V
V
GS
GS
R
R
G
G
10V
10V
Pulse Width ≤ 1 µs
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Duty Factor ≤ 0.1 %
D.U.T.
D.U.T.
R
D
+
V
DD
-
20
20
D
I , Drain Current (A)
D
I , Drain Current (A)
10
10
0
25 50 75 100 125 150 175
0
25 50 75 100 125 150 175
Fig 9. Maximum Drain Current Vs.
Fig 9. Maximum Drain Current Vs.
1
thJC
0.1
0.01
T , Case Temperature ( C)
C
T , Case Temperature ( C)
C
Case Temperature
Case Temperature
D = 0.50
0.20
0.10
0.05
0.02
0.01
SINGLE PULSE
(THERMAL RESPONSE)
°
°
Fig 10a. Switching Time Test Circuit
Fig 10a. Switching Time Test Circuit
V
V
DS
DS
90%
90%
10%
10% V
V
GS
GS
t
P
t
d(off)tf
d(off)tf
DM
t
1
t
t
d(on)tr
d(on)tr
Fig 10b. Switching Time Waveforms
Fig 10b. Switching Time Waveforms
Thermal Response (Z )
Notes:
1. Duty factor D = t / t
0.001
0.00001 0.0001 0.001 0.01 0.1 1
t , Rectangular Pulse Duration (sec)
1
2. Peak T = P x Z + T
1 2
J DM thJC C
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com 5
Page 6
IRFP260NPbF
A
15V
DRIVER
R
G
20V
V
DS
t
L
D.U.T
I
AS
Ω
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
1500
TOP
I
D 11A 20A
BOTTOM
1000
+
V
DD
-
500
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting T , Junction Temperature ( C)
J
28A
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Current Regulator
Same Type as D.U.T.
50KΩ
Q
G
12V
.2µF
.3µF
10 V
Q
GS
V
G
Fig 13a. Basic Gate Charge Waveform
Q
GD
Charge
V
GS
3mA
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
6 www.irf.com
D.U.T.
I
G
I
D
+
V
DS
-
Page 7
IRFP260NPbF
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance Current Transformer
-
-
• dv/dt controlled by R
• Driver same type as D.U.T.
G
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Period
D =
Period
P. W .
+
+
V
DD
-
VGS=10V
*
D.U.T. ISDWaveform
Reverse Recovery Current
Re-Applied Voltage
D.U.T. VDSWaveform
Inductor Curent
* V
= 5V for Logic Level Devices
GS
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
V
DD
I
SD
Fig 14. For N-Channel HEXFETS
www.irf.com 7
Page 8
IRFP260NPbF
TO-247AC Package Outline
Dimensions are shown in millimeters (inches)
- A -
5.50 (.217)
2X
- C -
4.30 (.170)
3.70 (.145)
1.40 (.056)
1.00 (.039)
0.25 (.010)
3.65 (.143)
3.55 (.140)
0.25 (.010)
5.50 (.217)
4.50 (.177)
M
C
D
MMB
A
S
20.30 (. 800)
19.70 (. 775)
14.80 (.583)
14.20 (.559)
2.40 (.094)
2.00 (.079) 2X
5.45 (.215)
2X
15.90 (.626)
15.30 (.602)
- B -
1
23
3X
3.40 (.133)
3.00 (.118)
TO-247AC Part Marking Information
EXAMPLE:
THIS IS AN IRF PE30 WITH ASSEMBLY LOT CODE 5657
ASS EMB LED ON WW 35, 2000 IN THE AS SEMBLY LINE "H"
Note: "P" in assembly line positio n indicates "Lead-Free"
INTER NATIONAL
RECTIF IER
LOGO
ASSEMBLY LOT CODE
- D -
2.50 (.089)
1.50 (.059)
3X
2.60 (.102)
2.20 (.087)
IRFPE30
56 57
5.30 (.209)
4.70 (.185)
4
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 2 CONTROLLING DIMENSION : INCH. 3 CONFORMS TO JEDEC OUTLINE TO-247-AC.
LEAD ASSIGNMENTS
Hexfet
0.80 (.031)
0.40 (.016)
035H
LEAD ASSIGNMENTS
1 - Gate 2 - Drain 3 - Source 4 - Drain
PART NUMBER
DAT E CODE YEAR 0 = 2000 WE EK 35 LINE H
1 - GATE 2 - DRAIN 3 - SOURCE 4 - DRAIN
IGBT 1 - Gate 2 - Collector 3 - Emitter 4 - Collector
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.02/04
8 www.irf.com
Loading...