Datasheet irfp2410 Datasheet

Page 1
Preliminary Data Sheet PD - 9.1251
HEXFET® Power MOSFET
Advanced Process Technology Ultra Low On-Resistance Dynamic dv/dt Rating Repetitive Avalanche Rated 175°C Operating Temperature Fast Switching Ease of Paralleling
Description
Fourth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications.
The TO-247 package is preferred for commercial-industrial applications where higher power levels preclude the use of TO-220 devices. The TO-247 is similar but superior to the earlier TO-218 package because of its isolated mounting hole. It also provides greater creepage distance between pins to meet the requirements of most safety specifications.
IRFP2410
V
DSS
R
DS(on)
ID = 61A
= 0.025Ω
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 61 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 43 A I
DM
PD @TC = 25°C Power Dissipation 230 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 5.5 V/ns T
J
T
STG
Pulsed Drain Current 240
Linear Derating Factor 1.5 W/°C Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy 830 mJ Avalanche Current 37 A Repetitive Avalanche Energy 23 mJ
Operating Junction and -55 to + 175 Storage Temperature Range °C Soldering Temperature, for 10 seconds 300 (1.6mm from case) Mounting torque, 6-32 or M3 screw. 10 lbf•in (1.1N•m)
Thermal Resistance
Parameter Min. Typ. Max. Units
R
θJC
R
θCS
R
θJA
Junction-to-Case –––– –––– 0.65 Case-to-Sink, Flat, Greased Surface –––– 0.24 –––– °C/W Junction-to-Ambient –––– –––– 40
Revision 0
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IRFP2410
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆V
(BR)DSS
R
DS(ON)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 100 ––– ––– V VGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.11 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.025 Ω VGS = 10V, ID = 37A Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 16 ––– ––– S VDS = 25V, ID = 37A
Drain-to-Source Leakage Current
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -20V
––– ––– 25 VDS = 100V , VGS = 0V ––– ––– 250 VDS = 80V, VGS = 0V, TJ = 150°C
µA
nA
Total Gate Charge ––– ––– 180 ID = 37A Gate-to-Source Charge ––– ––– 30 nC VDS = 80V Gate-to-Drain ("Miller") Charge ––– ––– 69 VGS = 10V, See Fig. 6 and 13 Turn-On Delay Time ––– 16 ––– VDD = 50V Rise Time ––– 100 ––– ID = 37A Turn-Off Delay Time ––– 120 ––– RG = 6.2Ω
ns
Fall Time ––– 97 ––– RD = 1.3Ω, See Fig. 10
Internal Drain Inductance ––– 5.0 –––
Internal Source Inductance ––– 13 –––
Between lead, 6mm (0.25in.)
nH
from package
and center of die contact Input Capacitance ––– 4600 ––– VGS = 0V Output Capacitance ––– 1100 --–– pF VDS = 25V Reverse Transfer Capacitance ––– 200 ––– ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
DD
RG = 25Ω, I
Continuous Source Current MOSFET symbol (Body Diode) showing the Pulsed Source Current integral reverse (Body Diode) p-n junction diode.
––– ––– 61
––– ––– 240
Diode Forward Voltage ––– ––– 2.5 V TJ = 25°C, IS = 37A, VGS = 0V Reverse Recovery Time ––– 180 270 ns TJ = 25°C, IF = 37A Reverse Recovery Charge ––– 990 1500 nC di/dt = 100A/µs Forward Turn-On Time
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
I
SD
TJ ≤ 175°C
= 25V, starting TJ = 25°C, L = 270µH
= 37A. (See Figure 12)
AS
Pulse width ≤ 300µs; duty cycle ≤ 2%.
A
≤ 37A, di/dt ≤ 200A/µs, V
DD
≤ V
(BR)DSS
,
Page 3
IRFP2410
A
A
A
A
1000
VGS TOP 15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V BOTTOM 4.5V
100
10
D
I , Drain-to-Source Current (A)
4.5V
20µs PULSE WIDTH T = 25°C
1
0.01 0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
C
Fig 1. Typical Output Characteristics,
TC = 25oC
1000
1000
VGS TOP 15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V BOTTOM 4.5V
100
4.5V
10
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH T = 175°C
1
0.01 0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
C
Fig 2. Typical Output Characteristics,
TC = 175oC
3.0
I = 61A
D
2.5
T = 25°C
J
100
10
D
I , Drain-to-Source Current (A)
1
4 5 6 7 8 9 10
V , Gate-to-Source Voltage (V)
GS
T = 175°C
J
V = 50V
DS
20µs PULSE WIDTH
2.0
1.5
(Normalized)
1.0
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( °C)
J
Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance
Vs. Temperature
V = 10V
GS
Page 4
IRFP2410
A
A
A
A
8000
6000
4000
V = 0V, f = 1MHz
GS
C = C + C , C SHORTED
iss gs gd ds
C = C
rss gd
C = C + C
oss ds gd
C
iss
C
oss
C, Capacitance (pF)
2000
C
rss
0
1 10 100
V , Drain-to-Source Voltage (V)
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I = 37A
D
V = 80V
DS
V = 50V
16
12
8
4
GS
V , Gate-to-Source Voltage (V)
DS
V = 20V
DS
FOR TEST CIRCUIT
0
0 40 80 120 160 200
Q , Total Gate Charge (nC)
G
SEE FIGURE 13
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
OPERATION IN THIS AREA LIMITED BY R
DS(on)
T = 25°C
J
100
SD
I , Reverse Drain Current (A)
10
0.0 1.0 2.0 3.0 4.0 5.0 6.0
V , Source-to-Drain Voltage (V)
SD
T = 175°C
J
V = 0V
Fig 7. Typical Source-Drain Diode
Forward Voltage
GS
10µs
100
100µs
1ms
10
D
I , Drain Current (A)
T = 25°C
C
T = 175°C
J
Single Pulse
1
1 10 100 1000
V , Drain-to-Source Voltage (V)
DS
10ms
Fig 8. Maximum Safe Operating Area
Page 5
IRFP2410
A
R
D.U.T.
D
V
DD
V
DS
V
70
60
GS
R
G
50
40
10 V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
30
20
D
I , Drain Current (Amps)
10
0
25 50 75 100 125 150 175
T , Case Temperature (°C)
C
Fig 9. Maximum Drain Current Vs.
Fig 10b. Switching Time Waveforms
Case Temperature
1
D = 0.50
thJC
0.01
Thermal Response (Z )
0.001
0.20
0.1
0.10
0.05
0.02
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
SINGLE PULSE (THERMAL RESPONSE)
N otes :
1. D uty fac tor D = t / t
2. P eak T = P x Z + T
t , Rectangular Pulse Duration (sec)
1
DM
J
P
D M
t
1
t
2
2
1
thJC
C
A
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Page 6
IRFP2410
A
10 V
Fig 12a. Unclamped Inductive Test Circuit
Fig 12b. Unclamped Inductive Waveforms
2000
1600
1200
800
400
AS
V = 25V
E , Single Pulse Avalanche Energy (mJ)
DD
0
25 50 75 100 125 150 175
Starting T , Junction Temperature ( °C)
J
I TOP 15A 26A BOTTOM 37A
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
D
10 V
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
Page 7
IRFP2410
Peak Diode Recovery dv/dt Test Circuit
D.U.T
R
G
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance Current Transformer
• dv/dt controlled by R
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
V
DD
*
* VGS = 5V for Logic Level Devices
Fig 14. For N-Channel HEXFETS
Page 8
IRFP2410
A
Package Outline
TO-247AC Outline
Dimensions are shown in millimeters (inches)
15.90 (.626)
15.30 (.602)
20.30 (.800)
19.70 (.775)
14.80 (.583)
14.20 (.559)
2.40 (.094)
2.00 (.079) 2X
5.45 (.215) 2X
- B -
1 2
3
3.40 (.133)
3.00 (.118)
1.40 (.056)
3X
1.00 (.039)
0.25 (.010)
- A -
Part Marking Information
TO-247AC
3.65 (.143)
3.55 (.140)
0.25 (.010)
5.50 (.217)
5.50 (.217)
2X
4.50 (.177)
- C -
4.30 (.170)
3.70 (.145)
M
C A
D
MMB
S
- D -
2.50 (.089)
1.50 (.059)
3X
2.60 (.102)
2.20 (.087)
5.30 (.209)
4.70 (.185)
4
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 2 CONTROLLING DIMENSION : INCH. 3 CONFORMS TO JEDEC OUTLINE TO-247-AC.
0.80 (.031)
0.40 (.016)
LEAD ASSIGNMENTS
1 - GATE 2 - DRAIN 3 - SOURCE 4 - DRAIN
EXAMPLE : THIS IS AN IRFPE30 WITH ASSEMBLY LOT CODE 3A1Q
INTERNATIONAL RECTIFIER
IRFPE30
PART NUMBER
LOGO
3A1Q 9302
ASSEMBLY LOT CODE
DATE CODE (YYWW) YY = YEAR WW WEEK
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 3L1, Tel: (905) 475 1897 IR GERMANY:
Saalburgstrasse 157, 61350 Bad Homburg Tel: 6172 37066 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: (39) 1145 10111 IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo 171 Tel: (03)3983 0641 IR
SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, 0316 Tel: 65 221 8371
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: (44) 0883 713215
Data and specifications subject to change without notice.
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