Datasheet IRFNG40 Datasheet (International Rectifier)

Page 1
Provisional Data Sheet No. PD-9.1555
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®
HEXFET
1000 Volt, 3.5
POWER MOSFET
ΩΩ
Ω HEXFET
ΩΩ
HEXFET technology is the key to International Rectifier’s advanced line of power MOSFET transis­tors. The efficient geometry achieves very low on­state resistance combined with high transconductance.
HEXFET transistors also feature all of the well-es­tablish advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical parameter temperature stability. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers, and high energy pulse circuits.
The Surface Mount Device (SMD-1) package repre­sents another step in the continual evolution of sur­face mount technology. The SMD-1 will give designers the extra flexibility they need to increase circuit board density. International Rectifier has en­gineered the SMD-1 package to meet the specific needs of the power market by increasing the size of the termination pads, thereby enhancing thermal and electrical performance.
IRFNG40
N-CHANNEL
Product Summary
Part Number BVDSS RDS(on) ID
IRFNG40 1000V 3. 5Ω 3.9A
Features:
■ Avalanche Energy Rating
■ Dynamic dv/dt Rating
■ Simple Drive Requirements
■ Ease of Paralleling
■ Surface Mount
■ Light-weight
Absolute Maximum Ratings
Parameter IRFNG40 Units
ID @ VGS = 10V, TC = 25°C Continuous Drain Current 3.9
ID @ VGS = 10V, TC = 100°C Continuous Drain Current 2.5
I
DM
PD @ TC = 25°C Max. Power Dissipation 125 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt ➂ 1.0
T
J
T
STG
Pulsed Drain Current ➀ 15.6
Linear Derating Factor 1.0 W/K ➄ Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy ➁ 530 mJ Avalanche Current ➀ 3.9 A Repetitive Avalanche Energy ➀ 12.5 mJ
Operating Junction -55 to 150 Storage Temperature Range
Package Mounting Surface Temperature 300 Weight 2.6 (typical) g
(for 5 seconds)
A
V/ns
o
C
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Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min. Typ. Max. Units Test Conditions
BV
DSS
∆BV R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
DSS
Drain-to-Source Breakdown Voltage 1000 — — V VGS = 0V, ID = 1.0 mA
/∆TJTemperature Coefficient of Breakdown — 1.4 — V/°C Reference to 25°C, ID = 1.0 mA
Voltage Static Drain-to-Source — — 3.5 VGS = 10V, ID = 2.5A On-State Resistance — — 4.2 Ω VGS = 10V, ID = 3.9A Gate Threshold Voltage 2.0 — 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 3.3 — — S ( )VDS > 15V, IDS = 2.5A ➃ Zero Gate Voltage Drain Current — — 25 VDS = 0.8 x Max Rating,VGS = 0V
— — 250 VDS = 0.8 x Max Rating
Gate-to-Source Leakage Forward — — 100 VGS = 20V Gate-to-Source Leakage Reverse — — -100 VGS = -20V Total Gate Charge 51 — 120 VGS =10V, ID = 3.9A Gate-to-Source Charge 5.4 — 1 2 VDS = Max. Rating x 0.5 Gate-to-Drain (“Miller”) Charge 29 — 66 see figures 6 and 13 Turn-On Delay T ime — — 30 VDD = 500V, ID = 3.9A, Rise Time — — 50 RG = 9.1Ω, VGS = 10V Turn-Off Delay Time — — 170 Fall Time — — 50 see figure 10 Internal Drain Inductance — 2.0 —
Internal Source Inductance — 6.5 —
Input Capacitance — 1700 — VGS = 0V, VDS = 25V Output Capacitance — 250 — f = 1.0 MHz Reverse Transfer Capacitance — 100 — see figure 5
Ω
µA
nA
nC
ns
Measured from the drain lead, 6mm (0.25 in.) from package to center of die.
nH
Measured from the source lead, 6mm (0.25 in.) from package to source bonding pad.
pF
VGS = 0V, TJ = 125°C
Modified MOSFET symbol showing the internal inductances.
➃
Source-Drain Diode Ratings and Characteristics
Parameter Min. Typ. Max. Units Test Conditions
I
Continuous Source Current (Body Diode) — — 3.9 Modified MOSFET symbol showing the
S
I
Pulse Source Current (Body Diode) ➀ — — 15.6 integral reverse p-n junction rectifier.
SM
V
Diode Forward Voltage — — 1.8 V Tj = 25°C, IS = 3.9A, VGS = 0V ➃
SD
t
Reverse Recovery Time — — 1000 ns Tj = 25°C, IF = 3.9A, di/dt ≤ 100A/µs
rr
Q
Reverse Recovery Charge — — 5.6 µCV
RR
t
Forward Turn-On Time
on
Intrinsic turn-on time is negligible. T urn-on speed is substantially controlled by LS + LD.
Thermal Resistance
Parameter Min. Typ. Max. Units Test Conditions
R
thJC
R
thJPCB
Junction-to-Case — — 1.0 Junction-to-PC Board — TBD — K/W Soldered to a copper clad PC board
A
≤ 50V ➃
DD
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Fig. 1 — Typical Output Characteristics
Fig. 3 — Typical Transfer Characteristics
T
C
= 25°C
Fig. 2 — Typical Output Characteristics
TC = 150°C
ID = 3.9A
Fig. 4 — Normalized On-Resistance Vs.Temperature
ID = 3.9A
Fig. 5 — Typical Capacitance Vs. Drain-to-Source
Voltage
Fig. 6 — Typical Gate Charge Vs. Gate-to-Source
Voltage
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100
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
Fig. 7 — Typical Source-to-Drain Diode Forward
Voltage
10
1
D
I , Drain Current (A)I , Drain Current (A)
= 25 C°
C
°
T T= 150 C
J
Single Pulse
0.1 10 100 1000 10000
V , Drain-to-Source Voltage (V)
DS
10us
100us
1ms
10ms
Fig. 8 — Maximum Safe Operating Area
Fig. 10a — Switching Time Test Circuit
Fig. 9 — Maximum Drain Current Vs. Case Temperature
Fig. 10b — Switching Time Waveforms
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10
thJC
1
0.50
0.20
0.10
0.1
0.05
0.02
Thermal Response (Z )
0.01
0.01
0.00001 0.0001 0.001 0.01 0.1 1
Fig. 11 — Maximum Effective Transient Thermal Impedance, Junction-to-Case Vs. Pulse Duration
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
t , Rectangular Pulse Duration (sec)
1
P
DM
1 2
J DM thJC C
t
1
t
2
Fig. 12a — Unclamped Inductive Test Circuit
Fig. 12c — Max. Avalanche Energy vs. Current Fig. 13a — Gate Charge Test Circuit
Fig. 12b — Unclamped Inductive Waveforms
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Fig. 13b — Basic Gate Charge Waveform
Case Outline and Dimensions — SMD-1
➀ Repetitive Rating; Pulse width limited by
maximum junction temperature. (see figure 11)
➁ @ V
➂ I
= 50V, Starting TJ = 25°C,
DD
EAS = [0.5 * L * (I Peak IL = 3.9A, VGS = 10V, 25 ≤ RG ≤ 200Ω
≤ 3.9A, di/dt ≤ 100A/µs,
SD VDD ≤ BV Suggested RG = 2.35Ω
, TJ ≤ 150°C
DSS
2
) * [BV
L
DSS
/(BV
DSS-VDD
➃ Pulse width ≤ 300 µs; Duty Cycle ≤ 2% ➄ K/W = °C/W
W/K = W/°C
)]
All dimensions in millimeters (inches)
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