Rectifier’s advanced line of power MOSFET transistors. The
efficient geometry design achieves very low on-state resistance combined with high transconductance. HEXFET
transistors also feature all of the well-established advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical parameter temperature
stability . They are well-suited f or applications such as switching power supplies, motor controls, inverters, choppers,
audio amplifiers, high energy pulse circuits, and virtually
any application where high reliability is required. The
HEXFET transistor’s totally isolated package eliminates the
need for additional isolating material between the device
and the heatsink. This improves thermal efficiency and
reduces drain capacitance.
®
MOSFET technology is the key to International
TO-254AA
Features:
n Simple Drive Requirements
n Ease of Paralleling
n Hermetically Sealed
n Electrically Isolated
n Dynamic dv/dt Rating
n Light-weight
Absolute Maximum Ratings
ParameterUnits
ID @ VGS = 10V, TC = 25°CContinuous Drain Current18
Linear Derating Factor1.0W/°C
Gate-to-Source Voltage±20V
Single Pulse Avalanche Energy ➁450mJ
Avalanche Current ➀18A
Repetitive Avalanche Energy ➀12.5mJ
Operating Junction-55 to 150
Storage Temperature Range
Lead Temperature
Weight2.6 (Typical)g
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRFM240
A
15V
DRIVER
+
-
R
V
G
20V
1
DS
L
.
D.U.T
I
AS
0.01
t
p
Ω
Fig 12a. Unclamped Inductive Test Circuit
V
(BR )DS S
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
V
DD
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Current Regulator
Same Type as D.U.T.
50KΩ
12V
.2µF
0
.3µF
D.U.T.
+
V
DS
-
V
V
G
Charge
Fig 13a. Basic Gate Charge Waveform
GS
3mA
I
G
Current Sampling Resistors
I
D
Fig 13b. Gate Charge Test Circuit
6www.irf.com
Page 7
Footnotes:
➀ Repetitive Rating; Pulse width limited by
maximum junction temperature.
➁ V
= 50V, starting TJ = 25°C, L= 1.3mH
DD
Peak IL = 18A, VGS = 10V
➂ I
➃ Pulse width ≤ 300 µs; Duty Cycle ≤ 2%
Case Outline and Dimensions — TO-254AA
≤ 18A, di/dt ≤ 150A/µs,
SD
VDD ≤ 200V, TJ ≤ 150°C
IRFM240
3.78 [.149]
3.53 [.139]
A
17.40 [.685]
16.89 [.665]
123
C
3.81 [.150]
2X
NOTES:
1. DIMENSIONING & TOLERANCING PER ASM E Y14.5M-1994.
2. ALL DIMENS IONS A RE SHOWN IN MILLIMETERS [INCHES ].
3. CONTRO LLING DIMENS ION: INCH.
4. CONFORMS TO JEDEC OUTLINE T O-254AA.
13.84 [.545]
13.59 [.535]
20.32 [.800]
20.07 [.790]
17.40 [.685]
16.89 [.665]
1.14 [.045]
3X
0.89 [.035]
0.36 [.014] B A
6.60 [.260]
6.32 [.249]
13.84 [.545]
13.59 [.535]
0.12 [.005]
1.27 [.050]
1.02 [.040]
B
0.84 [.033]
MAX.
3.81 [.150]
22.73 [.895]
21.21 [.835]
3.78 [.149]
3.53 [.139]
A
17.40 [.685]
16.89 [.665]
4.82 [.190]
3.81 [.150]
3.81 [.150]
2X
PIN ASSIGNMENT S
1 = DRAIN
2 = SOURCE
3 = GATE
123
13.84 [.545]
13.59 [.535]
20.32 [.800]
20.07 [.790]
1.14 [.04 5 ]
3X
0.89 [.03 5 ]
0.36 [.014]
BA
6.60 [.260]
6.32 [.249]
13.84 [.545]
13.59 [.535]
0.12 [.005]
1.27 [.050]
1.02 [.040]
B
R 1.52 [.060]
4.06 [.160]
3.56 [.140]
CAUTION
BERYLLIA WARNING PER MIL-PRF-19500
Packages containing beryllia shall not be ground, sandblasted, machined or have other operations performed on them
which will produce beryllia or beryllium dust. Furthermore, beryllium oxide packages shall not be placed in acids that
will produce fumes containing beryllium.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 01/02
www.irf.com7
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