Page 1
PD - 9.1387B
PRELIMINARY
IRFI3710
HEXFET® Power MOSFET
l Advanced Process Technology
l Isolated Package
l High Voltage Isolation = 2.5KVRMS
l Sink to Lead Creepage Dist. = 4.8mm
l Fully Avalanche Rated
G
Description
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient and reliable device for use
in a wide variety of applications.
The TO-220 Fullpak eliminates the need for additional
insulating hardware in commercial-industrial
applications. The moulding compound used provides
a high isolation capability and a low thermal resistance
between the tab and external heatsink. This isolation
is equivalent to using a 100 micron mica barrier with
standard TO-220 product. The Fullpak is mounted to
a heatsink using a single clip or by a single screw
fixing.
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 32
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 23 A
I
DM
PD @TC = 25°C Power Dissipation 63 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 5.0 V/ns
T
J
T
STG
Pulsed Drain Current 180
Linear Derating Factor 0.42 W/°C
Gate-to-Source Voltage ± 20 V
Single Pulse Avalanche Energy 530 mJ
Avalanche Current 28 A
Repetitive Avalanche Energy 6.3 mJ
Operating Junction and -55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Mounting torque, 6-32 or M3 screw 10 lbf•in (1.1N•m)
Thermal Resistance
Parameter Typ. Max. Units
R
θ JC
R
θ JA
Junction-to-Case ––– 2.4
Junction-to-Ambient ––– 65
D
V
= 100V
DSS
R
DS(on)
= 0.025Ω
ID = 32A
S
°C/W
°C
3/16/98
Page 2
IRFI3710
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆ V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C Drain to Sink Capacitance ––– 12 ––– ƒ = 1.0MHz
Drain-to-Source Breakdown Voltage 100 ––– ––– V VGS = 0V, ID = 250µA
/∆ T
Breakdown Voltage Temp. Coefficient ––– 0.12 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.025 Ω VGS = 10V, ID = 16A
Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA
Forward Transconductance 20 ––– ––– S VDS = 25V, ID = 28A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 80V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V
Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 100V, VGS = 0V
µA
nA
VGS = -20V
Total Gate Charge ––– ––– 190 ID = 28A
Gate-to-Source Charge ––– ––– 26 nC VDS = 80V
Gate-to-Drain ("Miller") Charge ––– ––– 82 VGS = 10V, See Fig. 6 and 13
Turn-On Delay Time ––– 14 ––– VDD = 50V
Rise Time ––– 59 ––– ID = 28A
Turn-Off Delay Time ––– 58 ––– RG = 2.5Ω
ns
Fall Time ––– 48 ––– RD = 1.7Ω, See Fig. 10
4.5
Internal Drain Inductance
Internal Source Inductance ––– –––
––– –––
7.5
Between lead,
6mm (0.25in.)
nH
from package
and center of die contact
Input Capacitance ––– 3000 ––– VGS = 0V
Output Capacitance ––– 640 ––– VDS = 25V
Reverse Transfer Capacitance ––– 330 ––– ƒ = 1.0MHz, See Fig. 5
pF
D
G
S
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
DD
RG = 25Ω , I
I
SD
TJ ≤ 175°C
Continuous Source Current MOSFET symbol
(Body Diode)
Pulsed Source Current integral reverse
(Body Diode)
––– –––
––– –––
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 16A, VGS = 0V
Reverse Recovery Time ––– 210 320 ns TJ = 25°C, IF = 28A
Reverse RecoveryCharge ––– 1.7 2.6 µC di/dt = 100A/µs
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width ≤ 300µs; duty cycle ≤ 2%.
= 25V, starting TJ = 25°C, L = 1.4mH
= 28A. (See Figure 11)
AS
≤ 28A, di/dt ≤ 460A/µs, V
DD
≤ V
(BR)DSS
,
t=60s, ƒ=60Hz
Uses IRF3710 data and test conditions
32
180
showing the
A
p-n junction diode.
D
G
S
Page 3
IRFI3710
1000
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOT TOM 4. 5V
100
10
D
I , D ra in-to -S o u rc e C u rre n t (A )
4.5V
20µs PULS E WIDTH
T = 25°C
1
0.1 1 10 100
V , D rain-to-S ource V oltage (V)
DS
C
Fig 1. Typical Output Characteristics
1000
1000
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
100
4.5V
10
D
I , D ra in-to -S o u rc e C u rre n t (A )
20µs PULS E WIDTH
T = 175°C
1
0.1 1 10 100
V , D rain-to-S ource V oltage (V)
DS
C
Fig 2. Typical Output Characteristics
3.0
I = 4 6A
D
T = 25°C
100
10
D
I , D rain-to-Source Current (A)
1
4567891 0
V , Ga te-to - S o u rc e Vo ltage (V
GS
J
T = 175°C
J
V = 50 V
DS
20µs PULSE W IDTH
Fig 3. Typical Transfer Characteristics
2.5
2.0
1.5
(N o rma lize d )
1.0
0.5
DS(on)
R , D ra in -to -S o u rc e On R e s is tan c e
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Tem pe rature (°C)
J
Fig 4. Normalized On-Resistance
Vs. Temperature
V = 10 V
GS
Page 4
IRFI3710
6000
5000
4000
3000
2000
C, Capacitance (pF)
1000
0
1 10 100
V = 0V, f = 1M Hz
GS
C = C + C , C SH OR T ED
iss g s gd d s
C = C
rss g d
C = C + C
oss d s g d
C
iss
C
oss
C
rss
V , D rain-to -Source V oltage (V)
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I = 28 A
V , Gate -to- S o ur ce V o lta ge (V )
16
12
GS
D
8
4
V = 8 0 V
DS
V = 5 0 V
DS
V = 2 0 V
DS
FOR TEST CIRCUIT
0
0 40 80 120 160 200
Q , To ta l Ga te C h a rg e (n C)
G
SEE FIGURE 13
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
O P E R A T IO N IN TH IS A R EA L IM IT E D
BY R
DS(on)
100
T = 175°C
J
T = 25°C
10
SD
I , R everse Drain Current (A)
1
0.4 0.8 1.2 1.6 2.0
V , So urce-to-Drain Voltage (V)
SD
J
V = 0V
Fig 7. Typical Source-Drain Diode
Forward Voltage
GS
100
10
D
I , Drain Current (A )
T = 2 5°C
C
T = 175°C
J
Single Pulse
1
1 10 100 1000
V , D rain-to-S ource V oltage (V)
DS
10µs
100µs
1ms
10ms
Fig 8. Maximum Safe Operating Area
Page 5
IRFI3710
35
30
25
20
15
D
10
I , Drain Current (A)
5
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
Fig 9. Maximum Drain Current Vs.
Case Temperature
10
R
V
DS
V
GS
R
G
D
D.U.T.
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
d(on)tr
t
d(off)tf
Fig 10b. Switching Time Waveforms
+
V
DD
-
D = 0.50
1
thJC
0.01
Thermal Response (Z )
0.001
0.20
0.10
0.05
0.1
0.02
0.01
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =P x Z + T
J DM thJC C
0.00001 0.0001 0.001 0.01 0.1 1 10
t , Rectangular Pulse Duration (sec)
1
1 2
P
DM
t
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Page 6
IRFI3710
15V
DRIVER
+
-
R
V
G
20V
DS
L
D.U.T
I
AS
0.01
t
p
Ω
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
1200
1000
800
600
V
DD
400
200
AS
V = 25 V
E , Single Pulse Avalanche Energy (mJ)
DD
0
25 50 75 100 125 150 175
Starting T , Junction Temperature (°C)
J
I
TO P 11A
20A
BOTTOM 28A
D
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
12V
.2µ F
V
GS
.3µ F
D.U.T.
3mA
I
G
Current Sampling Resistors
I
+
V
-
D
Fig 13b. Gate Charge Test Circuit
DS
Page 7
IRFI3710
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
-
• dv/dt controlled by R
G
• Driver same type as D.U.T.
• I SD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Period
D =
P.W.
Period
+
+
V
DD
-
VGS=10V
*
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. ISDWaveform
Body Diode Forward
D.U.T. VDSWaveform
Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5%
* V
= 5V for Logic Level Devices
GS
Fig 14. For N-Channel HEXFETS
Current
di/dt
Diode Recovery
dv/dt
V
DD
I
SD
Page 8
IRFI3710
Package Outline
TO-220 Fullpak Outline
Dimensions are shown in millimeters (inches)
10.60 (.417)
10.40 (.409)
16.00 (.630)
15.80 (.622)
1 2 3
13.70 (.540)
13.50 (.530)
1.40 (.055)
3X
1.05 (.042)
2.54 (.100)
2 X
3X
Part Marking Information
TO-220 Fullpak
E X A M P L E : T H I S I S A N I R F1010
E X A MPL E : THIS IS AN I R F I84 0 G
W I T H ASSE M B L Y
W ITH AS SE MBL Y
L OT CO DE E4 0 1
L O T C O D E 9 B 1 M
3.70 (.145)
3.20 (.126)
1.15 (.045)
MIN.
3.30 (.130)
3.10 (.122)
0.90 (.035)
0.70 (.028)
0.25 (.010)
3.40 (.133)
ø
3.10 (.123)
- A -
- B -
M
4.80 (.189)
4.60 (.181)
7.10 (.280)
6.70 (.263)
A M B
IN T E R N A T IO N A L
INTERNATIONAL
RE CT I F I E R
R E CT IF IER
L O G O
L OG O
A SSEM BL Y
ASSEMBLY
L O T C O D E
L O T C O DE
2.80 (.110)
2.60 (.102)
NOTES:
1 DIMENSIONING & TOLERANCING
PE R ANSI Y14.5M, 1982
2 CONTROLLING DIMENSION: INCH.
0.48 (.019)
3X
0.44 (.017)
2.85 (.112)
2.65 (.104)
IR F 1 0 1 0
IRFI840G
LEAD ASSIGNMENTS
1 - G A T E
2 - DRAIN
3 - S O URCE
MINIMUM CREEPAGE
DISTANCE BETW E EN
A-B-C-D = 4.80 (.189)
PAR T NU M BER
PART NUM BER
92 4 6
9B 1 M
E401 9245
DA T E CO DE
( YYW W )
YY = YE A R
WW = WE E K
C
D
A
B
DATE CODE
(YYWW )
YY = YEAR
WW = WEEK
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/ Data and specifications subject to change without notice. 3/98