Datasheet IRFHM831PbF Datasheet (IRF)

Page 1
PD -97539A
IRFHM831PbF
HEXFET® Power MOSFET
V
DS
R
DS(on) max
(@VGS = 10V)
Q
g (typical)
R
G (typical)
I
D
(@T
c(Bottom)
= 25°C)
30 V
7.8
7.3
0.5
40
h
m
nC
:
A
:
D
5
D
6
D
7
D
G
4
S
3
S
2
S
18
Applications
• Control MOSFET for Buck Converters
Features and Benefits
Features
Low Charge (typical 7.3nC) Lower Switching Losses Low Thermal Resistance to PCB (<4.7°C/W) Enable Better Thermal Dissipation 100% Rg tested Increased Reliability Low Profile (<1.0mm) results in Increased Power Density
Industry-Standard Pinout
⇒
Compatible with Existing Surface Mount Techniques RoHS Compliant Containing no Lead, no Bromide and no Halogen MSL1, Industrial Qualification Increased Reliability
Benefits
Multi-Vendor Compatibility Easier Manufacturing Environmentally Friendlier
Orderable part number P acka ge Type Standar d Pack
Form Quantity
IRFHM831TRPBF PQFN 3.3mm x 3 .3m m Tape and Reel 4000 IRFHM831TR2PBF PQFN 3.3mm x 3 .3m m Tape and Reel 400
Absolute Maximum Ratings
Parameter Units
V
DS
V
GS
ID @ TA = 25°C Continuous Drain Current, VGS @ 10V
I
@ TA = 70°C Continuous Drain Current, VGS @ 10V
D
I
@ T
D
I
@ T
D
I
DM
PD @TA = 25°C
P
@ T
D
T
J
T
STG
= 25°C Continuous Drain Current, VGS @ 10V
C(Bottom)
= 100°C Continuous Drain Current, VGS @ 10V
C(Bottom)
= 25°C
C(Bottom)
Notes through are on page 8
Drain-to-Source Voltage
Gate-to-Source Voltage
Pulsed Drain Current
Power Dissipation
Power Dissipation
Linear Derating Factor Operating Junction and
Storage Temperature Range
c g g
g
-55 to + 150
Max.
30
±20
14
11
40
h
28
96
2.5
27
0.02
Note
V
A
W
W/°C
°C
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9/8/10
Page 2
IRFHM831PbF
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
BV
DSS
V
R
V
I
DSS
I
GSS
GS(th)
V
DS(on)
GS(th)
DSS
/ΔT
ΔΒ
Δ
gfs Forward Transconductance 82 ––– ––– S Q
g
Q
g
Q
gs1
Q
gs2
Q
gd
Q
godr
Q
sw
Q
oss
R
G
t
d(on)
t
r
t
d(off)
t
f
C
iss
C
oss
C
rss
Avalanche Characteristics
E
AS
I
AR
Diode Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Drain-to-Source Breakdown Voltage 30 ––– ––– V
Breakdown Voltage Temp. Coefficient ––– 0.02 ––– V/°C
J
Static Drain-to-Source On-Resistance ––– 6.6 7.8
––– 10.7 12.6
Gate Threshold Voltage 1.35 1.8 2.35 V
Gate Threshold Voltage Coefficient ––– -6.8 ––– mV/°C
Drain-to-Source Leakage Current ––– ––– 1.0
––– ––– 150
Gate-to-Source Forward Leakage ––– ––– 100
Gate-to-Source Reverse Leakage ––– ––– -100
Total Gate Charge ––– 16 ––– nC
Total Gate Charge ––– 7.3 11
Pre-Vth Gate-to-Source Charge ––– 1.7 –––
Post-Vth Gate-to-Source Charge ––– 0.9 –––
Gate-to-Drain Charge ––– 2.5 –––
Gate Charge Overdrive ––– 2.2 ––– See Fig.17 & 18 Switch Charge (Q
gs2
+ Qgd)
––– 3.4 –––
Output Charge ––– 5.1 ––– nC
Gate Resistance ––– 0.5
–––
Turn-On Delay Time ––– 6.9 –––
Rise Time ––– 12 –––
Turn-Off Delay Time ––– 6.2 –––
Fall Time ––– 4.7 –––
Input Capacitance ––– 1050 –––
Output Capacitance ––– 190 –––
Reverse Transfer Capacitance ––– 80 –––
Parameter Units
Single Pulse Avalanche Energy
Avalanche Current
c
d
Typ.
–––
–––
Parameter Min. Typ. Max. Units
Continuous Source Current
––– –––
40
h
(Body Diode) Pulsed Source Current
(Body Diode)
c
––– ––– 96
Diode Forward Voltage ––– ––– 1.0 V
Reverse Recovery Time ––– 15 22 ns
Reverse Recovery Charge ––– 16 24 nC
Forward Turn-On Time Time is dominated by parasitic Inductance
= 0V, ID = 250μA
V
GS
Reference to 25°C, I
V
= 10V, ID = 12A
GS
mΩ
V
= 4.5V, ID = 12A
GS
= VGS, ID = 25μA
V
DS
= 24V, VGS = 0V
V
DS
μA
V
= 24V, VGS = 0V, TJ = 125°C
DS
V
= 20V
GS
nA
V
= -20V
GS
= 15V, ID = 12A
V
DS
= 10V, VDS = 15V, ID = 12A
V
GS
= 15V
V
DS
= 4.5V
V
GS
nC
= 12A
I
D
V
= 16V, VGS = 0V
DS
Ω
= 15V, VGS = 4.5V
V
DD
I
= 12A
D
ns
R
G
=1.8Ω
See Fig.15
VGS = 0V
pF
V
= 25V
DS
ƒ = 1.0MHz
MOSFET symbol
showing the
A
integral reverse
p-n junction diode.
= 25°C, IS = 12A, VGS = 0V
T
J
T
= 25°C, IF = 12A, VDD = 15V
J
di/dt = 300A/μs
Max.
50
12
Conditions
= 1mA
D
e
e
Conditions
e
mJ
A
D
G
S
e
Thermal Resistance
Parameter Typ. Max. Units
R
θ
JC
R
θ
JC
R
θ
JA
R
θ
JA
(Bottom)
(Top)
(<10s)
Junction-to-Case
Junction-to-Case
Junction-to-Ambient
Junction-to-Ambient
2 www.irf.com
f f
g g
––– 4.7
––– 44
––– 50
––– 32
°C/W
Page 3
IRFHM831PbF
1000
≤
60μs PULSE WIDTH
) A
( t n e
r
r u
C e
c
r u o S
­o
t
­n
i a
r D
,
D
I
Tj = 25°C
100
10
2.8V
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
100
) A
( t n e
r
r u
C e
c
r u o S
­o
t
­n
i a
r D
,
D
I
TJ = 150°C
10
TJ = 25°C
1
V
= 15V
DS
≤ 60μs PULSE WIDTH
0.1
2.0 3.0 4.0 5.0
VGS, Gate-to-Source Voltage (V)
TOP 10V
BOTTOM 2.8V
VGS
8.0V
4.5V
3.8V
3.5V
3.3V
3.0V
1000
≤ 60μs PULSE WIDTH
) A
( t n e
r
r u
C e
c
r u o S
­o
t
­n
i a
r D
,
D
I
Tj = 150°C
100
10
2.8V
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 2. Typical Output Characteristics
2.0
e c n a
t s
i s e
R n O e
c
r u o S
­o
t
­n
i a
r D
,
) n o
( S D
R
ID = 12A
V
= 10V
GS
1.5
) d e z
i
l a
m
r o
N
(
1.0
0.5
-60 -40 -20 0 20 40 60 80 100 120 140 160
TJ , Junction Temperature (°C)
TOP 10V
BOTTOM 2.8V
VGS
8.0V
4.5V
3.8V
3.5V
3.3V
3.0V
Fig 3. Typical Transfer Characteristics
) F p
( e
c n a
t
i c a p a
C ,
C
10000
1000
100
10
1 10 100
V
= 0V, f = 1 MHZ
GS
C
= C
C
C
iss
rss
oss
= C
= C
+ Cgd, C
gs
gd
+ C
ds
SHORTED
ds
gd
Ciss
Coss
Crss
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.Drain-to-Source Voltage
Fig 4. Normalized On-Resistance Vs. Temperature
14
) V
( e
g a
t
l o V
e c
r u o S
­o
t
­e
t a
G ,
V
ID= 12A
12
10
8
6
4
S G
2
VDS= 24V
VDS= 15V
VDS= 6.0V
0
0 5 10 15 20
Q
Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge Vs.Gate-to-Source Voltage
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Page 4
IRFHM831PbF
100.0
) A
( t n e
r
r
10.0
u C n
i a
r D e
s
r e v
1.0
e R
,
D S
I
0.1
TJ = 150°C
TJ = 25°C
V
= 0V
GS
0.2 0.4 0.6 0.8 1.0
VSD, Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
50
LIMITED BY PACKAGE
40
) A
( t n e
30
r
r u
C n
i a
r
20
D ,
D
I
10
0
25 50 75 100 125 150
TC, Case Temperature (°C)
1000
OPERATION IN THIS AREA
) A
( t n
100
e
r
r u
C e
c
r u
10
o S
­o
t
­n
i a
r D
1
,
D
I
Tc = 25°C Tj = 150°C Single Pulse
0.1
0.1 1 10 100
LIMITED BY RDS(on)
10msec
1msec
VDS, Drain-to-Source Voltage (V)
Fig 8. Maximum Safe Operating Area
3.0
) V
( e
2.5
g a
t
l o V
d
l
2.0
o h s e
r h
t e
t a
G ) h
t
(
S G
V
ID = 1.0A
1.5
ID = 1.0mA
ID = 250μA
ID = 25μA
1.0
0.5
-75 -50 -25 0 25 50 75 100 125 150
TJ , Temperature ( °C )
100μsec
Fig 9. Maximum Drain Current Vs.
Case (Bottom) Temperature
10
)
C J h
t Z (
e s n o p s e
R l a
m
r e h T
0.01
0.001
D = 0.50
1
0.1
1E-006 1E-005 0.0001 0.001 0.01 0.1
0.20
0.10
0.05
0.02
0.01
SINGLE PULSE ( THERMAL RESPONSE )
t1 , Rectangular Pulse Duration (sec)
Fig 10. Threshold Voltage Vs. Temperature
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case (Bottom)
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Page 5
A
)
Ω
40
(
m
e c
35
n a
t s
i s
30
e R n
25
O e
c
r
20
u o S
-
15
o
t
­n
i a
r
10
D ,
) n
5
o
(
S D
0
R
2 4 6 8 10 12 14 16 18 20
VGS, Gate-to-Source Voltage (V)
ID = 12A
TJ = 125°C
TJ = 25°C
IRFHM831PbF
200
) J
m
( y
g
r
160
e n E
e h c
120
n a
l a v A
e s
80
l u P
e
l g n
i
40
S
, S A
E
0
25 50 75 100 125 150
Starting TJ, Junction Temperature (°C)
I
TOP
6.4A
BOTTOM
D
3.1A
12A
Fig 12. On-Resistance vs. Gate Voltage
15V
DRIVER
+
V
DD
-
R
20V
V
DS
G
L
D.U.T
I
AS
Ω
0.01
t
p
Fig 14a. Unclamped Inductive Test Circuit
R
D.U.T.
D
+
V
DD
-
V
DS
V
GS
R
G
10V
V
GS
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1
Fig 13. Maximum Avalanche Energy vs. Drain Current
V
(BR)DSS
t
p
I
AS
Fig 14b. Unclamped Inductive Waveforms
V
DS
90%
10%
V
GS
t
d(on)
t
r
t
d(of f)
t
f
Fig 15a. Switching Time Test Circuit
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Fig 15b. Switching Time Waveforms
Page 6
IRFHM831PbF
Reverse Recovery Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied Voltage
+
-
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 16. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Vds
Id
Vgs
L
VCC
0
1K
Fig 17. Gate Charge Test Circuit
DUT
Vgs(th)
Qgs1
Qgs2 Qgd Qgodr
Fig 18. Gate Charge Waveform
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Page 7
PQFN 3.3x3.3 Outline Package Details
IRFHM831PbF
8
7
6
For footprint and stencil design recommendations, please refer to application note AN-1154 at
http://www.irf.com/technical-info/appnotes/an-1154.pdf
PQFN 3.3x3.3 Part Marking
3.3x3.3 PQFN PART MARKING DETAIL
INTERNATIONAL
RECTIFIER LOGO
DATE CODE
ASSEMBLY SITE CODE
(Per SCOP 200-002)
PIN 1
IDENTIFIER
::::
!;99!
:::::
(Eng Mode - Min last 4 digits of EATI#)
(Prod Mode - 4 digits of SPN code)
PART NUMBER
MARKING CODE
(Per Marking Spec)
LOT CODE
1
2
3
45
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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Page 8
IRFHM831PbF
PQFN 3.3x3.3 Tape and Reel
NOTE: Controlling dimensions in mm Std reel quantity is 4000 p arts.
REEL DIMENSIONS
STANDARD OPTION (QTY 4000)
METRIC IMPERI AL
CODE
A B C D E F G
MAX
MIN
330.25
326.0
20.45
20.2
13.50
12.8
1.5
102.0 REF 4.016 REF
18.3
17.8
12.9
12.4
Qualification Information
Qualification level
2.5
CODE
A
12.835
†
0.795
0.504
0.059
0.701
0.488
0.805
0.531
0.098
0.720
0.508
MAX
MIN
13.002
B C D E F G H
Industrial
(per JEDEC JESD47F
DIMENSIONS
METRIC IMPERIAL
MIN
7.90
3.90
11.70
5.45
3.50
3.50
0.25
1.10
MAX
8.10
4.10
12.30
5.55
3.70
3.70
0.35
1.30
††
†††
guidel ine s)
Moisture Sensitivity Le vel PQFN 3.3mm x 3.3mm
(per JEDEC J-STD-020D
RoHS Compliant
Yes
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
 Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
 Applicable version of JEDEC standard at the time of product release.
Notes:
Repetitive rating; pulse width limited by max. junction temperature.Starting TPulse width ≤ 400μs; duty cycle ≤ 2%. R
is measured at T
θ
When mounted on 1 inch square 2 oz copper pad on 1.5x1.5 in. board of FR-4 material.
Calculated continouous current based on maximum allowable junction temperature. Package is limited to 40A by
production test capability.
= 25°C, L = 0.69mH, RG = 50Ω, I
J
of approximately 90°C.
J
AS
= 12A.
MIN
0.311
0.154
0.461
0.215
0.138
0.138
0.010
0.043
MSL1
MAX
0.319
0.161
0.484
0.219
0.146
0.146
0.014
0.051
†††
)
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.9/2010
8 www.irf.com
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