This N-Channel enhancement mode silicon gate power field
effect transistor is an advanced power MOSFET designed,
tested, and guaranteed to withstand a specified level of
energy in the breakdown avalanche mode of operation. All of
these power MOSFETs are designed for applications such
as switching regulators, switching convertors, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Formerly developmental type TA9600.
Ordering Information
PART NUMBERPACKAGEBRAND
IRFF220TO-205AFIRFF220
NOTE: When ordering, include the entire part number.
File Number1889.3
Features
• 3.5A, 200V
•r
DS(ON)
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
= 0.800Ω
Components to PC Boards”
Symbol
D
Packaging
JEDEC TO-205AF
DRAIN
(CASE)
G
S
SOURCE
GATE
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
85mJ
-55 to 150
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate to Threshold VoltageV
GS(TH)VGS
Zero-Gate Voltage Drain CurrentI
On-State Drain Current (Note 2)I
D(ON)
Gate to Source Leakage ForwardI
Drain to Source On Resistance (Note 2)r
FIGURE 6. SATURATION CHARACTERISTICSFIGURE 7. TRANSFER CHARACTERISTICS
1.5
1.0
DRAIN TO SOURCE
0.5
ON RESISTANCE (Ω)
DS(ON),
r
CURRENT PULSE 2µs
TJ = 25oC
5010
ID, DRAIN CURRENT (A)
VGS = 10V
VGS = 20V
1520
2.2
1.8
1.4
1.0
ON RESISTANCE
0.6
NORMALIZED DRAIN TO SOURCE
0.2
ID = 2A
VGS = 10V
-404080120
0160
T
, JUNCTION TEMPERATURE (oC)
J
NOTE: Heating effect of 2µs pulse is minimal.
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
4
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
Page 5
Typical Performance Curves (Continued)
IRFF220
1.25
ID = 250µA
1.15
1.05
0.95
BREAKDOWN VOLTAGE
0.85
NORMALIZED DRAIN TO SOURCE
0.75
-404080120
0160
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 10. NORMALIZED DRAIN TOSOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
5
80µs PULSE TEST
4
3
2
TJ = -55oC
TJ = 25oC
TJ = 125oC
1000
800
600
400
C, CAPACITANCE (pF)
200
0
C
ISS
C
C
RSS
1020304050
V
DS
OSS
, DRAIN TO SOURCE VOLTAGE (V)
VGS = 0V, f = 1MHz
= CGS + C
C
C
C
ISS
RSS
OSS
= C
GD
≈ CDS + C
GD
GS
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
2
10
10
TJ = 150oC
TJ = 25oC
TJ = 150oC
, TRANSCONDUCTANCE (S)
1
fs
g
0
2468010
ID, DRAIN CURRENT (A)
, SOURCE TO DRAIN CURRENT (A)
SD
I
1
0134
VSD, SOURCE TO DRAIN VOLTAGE (V)
TJ = 25oC
2
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENTFIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
20
ID = 3.5A
15
10
5
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
481216020
VDS = 40V
= 100V
V
DS
V
= 160V
DS
Q
, TOTAL GATE CHARGE (nC)
g(TOT)
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
5
Page 6
IRFF220
Test Circuits and Waveforms
V
DS
BV
DSS
t
AV
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
AS
L
R
G
+
V
DD
-
t
P
I
AS
DUT
0V
P
I
AS
0.01Ω
0
t
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUITFIGURE 16. UNCLAMPED ENERGY WAVEFORMS
V
DS
V
DD
t
ON
t
d(ON)
t
R
L
+
V
R
G
DD
-
V
DS
0
r
90%
10%
DUT
V
GS
V
GS
10%
0
50%
PULSE WIDTH
FIGURE 17. SWITCHING TIME TEST CIRCUITFIGURE 18. RESISTIVE SWITCHING WAVEFORMS
V
DS
(ISOLATED
SUPPLY)
SAME TYPE
AS DUT
V
DD
Q
g(TOT)
Q
gd
Q
gs
12V
BATTERY
0.2µF
50kΩ
CURRENT
REGULATOR
0.3µF
t
d(OFF)
90%
V
GS
t
OFF
50%
t
f
90%
10%
D
V
DS
S
CURRENT
I
D
SAMPLING
DUT
0
V
DS
I
g(REF)
0
G
I
0
g(REF)
IG CURRENT
SAMPLING
RESISTORRESISTOR
FIGURE 19. GATE CHARGE TEST CIRCUITFIGURE 20. GATE CHARGE WAVEFORM
6
Page 7
IRFF220
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the rightto make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
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NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
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FAX: (407) 724-7240
7
EUROPE
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