This advanced power MOSFET is designed, tested, and
guaranteed to withstand a specified level of energy in the
breakdown avalanche mode of operation. These are
P-Channel enhancement mode silicon gate power field
effecttransistors designed for applications such as switching
regulators, switching convertors, motor drivers, relay drivers
and drivers for high power bipolar switching transistors
requiring high speed and low gate drive power. These types
can be operated directly from integrated circuits.
Formerly developmental type TA17501.
Ordering Information
PART NUMBERPACKAGEBRAND
IRFD9120HEXDIPIRFD9120
NOTE: When ordering, use the entire part number.
File Number
Features
• 1.0A, 100V
DS(ON)
= 0.6Ω
•r
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
Symbol
D
G
S
2285.3
Packaging
HEXDIP
DRAIN
GATE
SOURCE
4-45
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
370mJ
-55 to 150
300
260
o
C
o
C
o
C
NOTE:
1. TJ = 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate to Threshold VoltageV
GS(TH)VGS
Zero Gate Voltage Drain CurrentI
On-State Drain Current (Note 2)I
D(ON)
Gate to Source Leakage CurrentI
Drain to Source On Resistance (Note 2)r
FIGURE 11. TRANSCONDUCTANCE vs DRAIN CURRENTFIGURE 12. SOURCE TO DRAIN DIODE VOLTAGE
0
-5
ID = -4A
-10
-15
, GATE TO SOURCE VOLTAGE (V)
GS
V
-20
FIGURE 13. GATE TO SOURCE VOLTAGE vs GATE CHARGE
fd
Test Circuits and Waveforms
VARY t
TO OBTAIN
P
REQUIRED PEAK I
0V
V
GS
t
P
AS
R
G
VDS = -80V
VDS = -50V
V
= -20V
DS
0481216
Q
, TOTAL GATE CHARGE (nC)
g(TOT)
V
DS
L
+
V
DD
-
DUT
I
AS
0.01Ω
0
V
DD
I
AS
20
t
AV
V
t
P
BV
DSS
DS
FIGURE 14. UNCLAMPED ENERGY TEST CIRCUITFIGURE 15. UNCLAMPED ENERGY WAVEFORMS
4-49
Page 6
IRFD9120
Test Circuits and Waveforms
DUT
R
V
GS
FIGURE 16. SWITCHING TIME TEST CIRCUITFIGURE 17. RESISTIVE SWITCHING WAVEFORMS
12V
BATTERY
0.2µF
G
50kΩ
CURRENT
REGULATOR
0.3µF
(Continued)
R
L
D
-
V
DD
+
-V
DS
(ISOLATED
SUPPLY)
DUT
t
ON
t
d(ON)
t
50%
r
10%
90%
PULSE WIDTH
Q
gd
V
DS
0
V
DS
V
GS
0
0
10%
Q
gs
t
d(OFF)
V
GS
t
OFF
50%
90%
90%
t
f
10%
Q
G
0
I
G(REF)
IG CURRENT
SAMPLING
RESISTORRESISTOR
DUT
S
CURRENT
I
D
SAMPLING
+V
DS
V
DD
0
I
G(REF)
g(TOT)
FIGURE 18. GATE CHARGE TEST CIRCUITFIGURE 19. GATE CHARGE WAVEFORMS
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
4-50
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