l Brushed Motor drive applications
l BLDC Motor drive applications
l Battery powered circuits
l Half-bridge and full-bridge topologies
l Synchronous rectifier applications
l Resonant mode power supplies
l OR-ing and redundant power switches
l DC/DC and AC/DC converters
l DC/AC Inverters
Benefits
l Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
l Fully Characterized Capacitance and Avalanche
SOA
l Enhanced body diode dV/dt and dI/dt Capability
l Lead-Free
S trongIRFET
IRFB7446PbF
HEXFET® Power MOSFET
V
D
G
S
GDS
GateDrainSource
DSS
R
typ.2.6m
DS(on)
max.3.3m
I
D
(Silicon Limited)
I
D
(Package Limit ed)
D
S
D
G
TO-220AB
IRFB7446PbF
PD - 96435A
40V
Ω
Ω
123A
c
120A
Ordering Information
Base part numberPackage Type
IRFB7446PbFTO-220Tube50IRFB7446PbF
)
8
Ω
m
(
e
c
n
a
t
s
6
i
s
e
R
n
O
e
c
r
4
u
o
S
o
t
n
i
a
2
r
D
,
)
n
o
(
S
D
0
R
246810 12 14 16 1820
V
Gate -to -Source Voltage (V)
GS,
ID = 70A
TJ = 125°C
TJ = 25°C
Fig 1. Typical On-Resistance vs. Gate Voltage
Standard Pack
Complete Part Number
FormQuantity
125
100
)
A
(
t
n
e
75
r
r
u
C
n
i
a
r
50
D
,
D
I
25
0
255075100125150175
TC , Case Temperature (°C)
Fig 2. Maximum Drain Current vs. Case Temperature
www.irf.com1
09/11/12
Page 2
IRFB7446PbF
D
D
DM
GS
J
STG
AS (Thermally limited)
AS
AR
AR
θ
JC
θ
CS
θ
JA
(BR)DSS
Δ
(BR)DSS
J
DS( on)
GS(th)
DSS
GSS
G
GS
D
DS
DS
GS
GS
Absolute Maximum Ratings
SymbolParameterUnits
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V (Silic on Limited)
Soldering Temperature, for 10 seconds (1.6mm from c ase)
Mounting torque, 6-32 or M3 screw
Avalanche Characteristics
E
E
(tested)Single Pulse Avalanche Energy Tested Value
I
E
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanc he Energy
d
d
e
k
See Fig. 14, 15 , 22a, 22b
Thermal Resistance
SymbolParameterTyp.Max.Units
R
R
R
Junction-to-Case
j
–––1.52
Case-to-Sink, Flat Greased Surface0.50–––
Junction-to-Ambient–––62
Max.
123
87
120
492
99
0.66
± 20
-55 to + 175
300
10lbf
x
in (1.1Nxm)
111
160
c
°C/W
A
°C
mJ
A
mJ
Static @ TJ = 25°C (unless otherwise specified)
SymbolParameterMin.Typ.Max.Units
V
V
/ΔT
R
V
I
I
R
Notes:
Calculated continuous current based on maximum allowable junction
temperature. Bond wire current limit is 120A. Note that current
limitations arising from heating of the device leads may occur with
some lead mounting arrangements. (Refer to AN-1140)
Repetitive rating; pulse width limited by max. junction temperature.
Limited by T
I
= 70A, VGS =10V.
AS
I
≤ 70A, di/dt ≤ 1174A/μs, V
SD
Drain-to-Source Breakdown Voltage40––––––V
Breakdown Voltage Temp. Coefficient–––0.033–––V/°C
Static Drain-to-Source On-Resistance–––2.63.3mΩ
3.9–––mΩ
Gate Thres hold Voltage2.23.03.9V
Drain-to-Source Leak age Current––––––1.0
Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case
1000
100
)
A
(
t
n
e
r
r
u
C
10
e
h
c
n
a
l
a
v
A
1
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ΔΤ j = 25°C and
Tstart = 150°C.
0.1
1.0E-061.0E-051.0E-041.0E-031.0E-021.0E-01
D = 0.50
0.20
0.10
0.05
0.02
0.01
SINGLE PULSE
( THERMAL RESPONSE )
t1 , Rectangular Pulse Duration (sec)
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming Δ Tj = 150°C and
Tstart = 25°C (Single Pulse)
Fig 14. Typical Avalanche Current vs.Pulsewidth
tav (sec)
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
120
TOP Single Pulse
BOTTOM 1.0% Duty Cycle
)
J
m
(
y
g
80
r
e
n
E
e
h
c
n
a
l
a
v
A
40
,
R
A
E
ID = 70A
0
255075100125150175
Starting TJ , Junction Temperature (°C)
Notes on Repetitive Avalanche Curves , Figures 14, 15:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a temperature far in
excess of T
2. Safe operation in Avalanche is allowed as long asT
. This is validated for every part type.
jmax
is not exceeded.
jmax
3. Equation below based on circuit and waveforms shown in Figures 22a, 22b.
4. P
= Average power dissipation per single avalanche pulse.
D (ave)
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase
during avalanche).
6. I
= Allowable avalanche current.
av
7. ΔT = Allowable rise in junction temperature, not to exceedT
(assumed as
jmax
25°C in Figure 14, 15).
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see Figures 13)
thJC
P
D (ave)
·f
av
= 1/2 ( 1.3·BV·Iav) = DT/ Z
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
D (ave)·tav
thJC
Fig 15. Maximum Avalanche Energy vs. Temperature
6www.irf.com
Page 7
IRFB7446PbF
4.5
)
V
(
e
g
3.5
a
t
l
o
V
d
l
o
h
s
e
2.5
r
h
t
e
t
a
G
,
)
h
t
(
S
G
V
ID = 100μA
ID = 250μA
ID = 1.0mA
1.5
ID = 1.0A
0.5
-75-252575125175225
TJ , Temperature ( °C )
Fig 16. Threshold Voltage vs. Temperature
5
IF = 70A
VR = 34V
4
TJ = 25°C
TJ = 125°C
)
3
A
(
M
R
R
I
2
6
IF = 46A
VR = 34V
5
TJ = 25°C
TJ = 125°C
4
)
A
(
3
M
R
R
I
2
1
0
02004006008001000
diF /dt (A/μs)
Fig. 17 - Typical Recovery Current vs. dif/dt
70
IF = 46A
60
VR = 34V
TJ = 25°C
50
TJ = 125°C
)
40
C
n
(
R
R
30
Q
1
0
02004006008001000
diF /dt (A/μs)
60
IF = 70A
VR = 34V
50
TJ = 25°C
TJ = 125°C
40
)
C
n
(
30
R
R
Q
20
10
0
02004006008001000
20
10
0
02004006008001000
diF /dt (A/μs)
Fig. 19 - Typical Stored Charge vs. dif/dtFig. 18 - Typical Recovery Current vs. dif/dt
diF /dt (A/μs)
Fig. 20 - Typical Stored Charge vs. dif/dt
www.irf.com7
Page 8
IRFB7446PbF
A
V
DS
90%
10%
V
GS
t
d(on)tr
t
d(off)tf
Reverse
Recovery
Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Current
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• I
controlled by Duty Factor "D"
SD
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied
Voltage
+
-
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
V
15V
V
DS
L
DRIVER
t
p
(BR)DSS
R
G
20V
V
GS
Fig 22a. Unclamped Inductive Test Circuit
V
GS
R
G
10V
V
GS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
D.U.T
I
AS
Ω
0.01
t
p
+
V
DD
-
I
AS
Fig 22b. Unclamped Inductive Waveforms
R
D.U.T.
D
+
V
DD
-
V
DS
Fig 23a. Switching Time Test CircuitFig 23b. Switching Time Waveforms
Current Regulator
Same Type as D.U.T.
.2μF
12V
V
GS
50KΩ
3mA
.3μF
D.U.T.
+
V
DS
-
Vds
Vgs(th)
Id
Vgs
I
Current Sampling Resistors
Fig 24a. Gate Charge Test Circuit
8www.irf.com
I
G
D
Qgs1
Qgs2QgdQgodr
Fig 24b. Gate Charge Waveform
Page 9
TO-220AB Package Outline
Qualification information
Indust rial
Date
Comment
Dimensions are shown in millimeters (inches)
TO-220AB Part Marking Information
IRFB7446PbF
EXAMPLE: T HIS I S AN IRF1010
Note: "P" in as sembly line position
LOT CODE 1789
ASS EMBLE D ON WW 19, 2000
IN THE ASSEMBLY LINE "C"
i ndi cates " Lead - F ree"
INTERNATIONAL
RECTIFIE R
LOGO
AS S E MB L Y
LOT CODE
PART NUMBER
DATE CODE
YEAR 0 = 2000
WE EK 19
LINE C
TO-220AB packages are not recommended for Surface Mount Application.
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
†
Yes
††
†††
guidelines)
N/A
(per JE DEC J-S TD-020D
†††
)
Qualification level
RoHS compliant
(per JEDEC JESD47F
TO-220ABMoisture Sensitivity Level
Qualification standards can be found at International Rectifiers web site: http://www.irf.com/product-info/reliability/
Higher qualification ratings may be available should the user have such requirements. Please contact your
Inte rn ati onal Rectifier sales representative for further information: http:www.irf.com/whoto-call/salesrep/
Applicable version of JEDEC standard at the time of product release.
Revision History
9/11/2012Added Package limit on pg1,2 and updated Fig2 , Fig10
www.irf.com9
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 101N Sepulveda., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 09/2012
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