Datasheet IRF8313PBF Datasheet

Page 1
PD - 97145
IRF8313PbF
HEXFET® Power MOSFET
Applications
l Load Switch l DC/DC Conversion
Benefits
l Low Gate Charge and Low R l Fully Characterized Avalanche Voltage
DS(on)
and Current
l 20V V l 100% Tested for R l Lead-Free (Qualified to 260°C Reflow) l RoHS Compliant (Halogen Free)
Max. Gate Rating
GS
G
The IRF8313PbF incorporates the latest HEXFET Power MOSFET Silicon Technology into the industry standard SO-8 package. The IRF8313PbF has been optimized for parameters that are critical in synchronous buck operation including Rds(on) and gate charge to reduce both conduction and switching losses. The reduced total losses make this product ideal for high efficiency DC-DC converters that power the latest generation of processors for notebook and Netcom applications.
V
DSS
30V
S2 1
G2
S1
G1
15.5m:@V
2
3
4
R
DS(on)
6
D28
D27
D1D15
max
= 10V
GS
Qg
6.0nC
SO-8
Absolute Maximum Ratings
V
DS
V
GS
@ TA = 25°C
I
D
I
@ TA = 70°C
D
I
DM
PD @TA = 25°C
@TA = 70°C
P
D
T
J
T
STG
Parameter Units
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current, V
Continuous Drain Current, V Pulsed Drain Current
Power Dissipation
Power Dissipation
Linear Derating Factor W/°C Operating Junction and
Storage Temperature Range
c
@ 10V
GS
@ 10V
GS
Max.
30
±20
9.7
8.1
81
2.0
1.3
0.016
-55 to + 175
V
A
W
°C
Thermal Resistance
Parameter Typ. Max. Units
fg
g
––– 42
––– 62.5
°C/W
R
θ
JL
R
θ
JA
Junction-to-Drain Lead
Junction-to-Ambient
Notes through are on page 9
ORDERING INFORMATION: See detailed ordering and shipping information on the last page of this data sheet.
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11/5/08
Page 2
IRF8313PbF
)
)
)
g
g
g
g
g
g
g
g
)
)
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
BV
DSS
ΔΒV
DSS
R
DS(on
V
GS(th
ΔV
GS(th
I
DSS
I
GSS
gfs Forward Transconductance 23 ––– ––– S
Q
Q
s1
Q
s2
Q
d
Q
odr
Q
sw
Q
oss
R
t
d(on
t
r
t
d(off
t
f
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 30 ––– ––– V
/ΔTJ Breakdown Voltage Temp. Coefficient ––– 0.021 ––– V/°C
Static Drain-to-Source On-Resistance ––– 12.5 15.5
––– 18.6 21.6
Gate Threshold Voltage 1.35 1.80 2.35 V
VGS = 0V, ID = 250μA
Reference to 25°C, I
V
GS
mΩ
V
GS
V
DS
Gate Threshold Voltage Coefficient ––– -6.0 ––– mV/°C
Drain-to-Source Leakage Current ––– ––– 1.0
––– ––– 150
Gate-to-Source Forward Leakage ––– ––– 100
Gate-to-Source Reverse Leakage ––– ––– -100
μA
nA
V
DS
V
DS
V
GS
V
GS
V
DS
Total Gate Charge ––– 6.0 9.0
Pre-Vth Gate-to-Source Charge ––– 1.5 –––
Post-Vth Gate-to-Source Charge ––– 0.9 –––
Gate-to-Drain Charge ––– 2.2 –––
nC
V
DS
VGS = 4.5V
I
D
Gate Charge Overdrive ––– 1.4 ––– See Figs. 17a & 17b
Switch Charge (Q
Output Charge ––– 3.8 ––– nC
+ Q
) ––– 2.9 –––
s2
d
V
DS
Gate Resistance ––– 2.2 3.6 Ω
Turn-On Delay Time ––– 8.3 –––
Rise Time ––– 9.9 –––
Turn-Off Delay Time ––– 8.5 –––
Fall Time ––– 4.2 –––
Input Capacitance ––– 760 –––
Output Capacitance ––– 172 –––
Reverse Transfer Capacitance ––– 87 –––
V
DD
I
D
ns
R
G
See Fig. 15a & 15b
V
GS
pF
V
DS
ƒ = 1.0MHz
= 8.0A
= 8.0A
Avalanche Characteristics
Parameter Units
E
AS
I
AR
Single Pulse Avalanche Energy
Avalanche Current
c
d
Typ.
–––
–––
Diode Characteristics
Parameter Min. Typ. Max. Units
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Continuous Source Current ––– –––
(Body Diode)
Pulsed Source Current ––– –––
(Body Diode)
c
82 A
Diode Forward Voltage ––– ––– 1.0 V
Reverse Recovery Time ––– 20 30 ns
Reverse Recovery Charge ––– 10 15 nC
MOSFET symbol
A3.1
showing the
integral reverse
p-n junction diode. TJ = 25°C, IS = 8.0A, VGS = 0V
T
= 25°C, IF = 8.0A, VDD = 15V
J
di/dt = 100A/μs
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
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Conditions
= 1mA
D
= 10V, ID = 9.7A
= 4.5V, ID = 8.0A
e
e
= VGS, ID = 25μA
= 24V, VGS = 0V
= 24V, VGS = 0V, TJ = 125°C
= 20V
= -20V
= 15V, ID = 8.0A
= 15V
= 16V, VGS = 0V
= 15V, VGS = 4.5V
= 1.8Ω
= 0V
= 15V
Max.
46
8.0
Conditions
G
e
mJ
A
D
S
e
Page 3
IRF8313PbF
100
) A
( t
10
n e
r
r u
C e
c
r u
1
o S
­o
t
­n
i a
r D
0.1
,
D
I
≤60μs PULSE WIDTH
Tj = 25°C
2.3V
0.01
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
100
) A
(
t
10
n e
r
r u
C e
c
r u o S
­o
t
­n
i a
r D
, I
D
0.01
0.1
TJ = 175°C
1
TJ = 25°C
V
= 15V
DS
≤
60μs PULSE WIDTH
1 2 3 4 5 6
VGS, Gate-to-Source Voltage (V)
TOP 10V
BOTTOM 2.3V
VGS
5.0V
4.5V
3.5V
3.0V
2.7V
2.5V
100
) A
( t n e
r
r
10
u C e
c
r u o S
­o
t
­n
i
1
a
r D
,
D
I
2.3V
≤60μs PULSE WIDTH
Tj = 175°C
0.1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 2. Typical Output Characteristics
2.0
e c n a
t s
i s e
R n O e
c
r u o S
­o
t
­n
i a
r D
,
) n o
( S D
R
ID = 9.8A
V
= 10V
GS
1.5
) d e z
i
l a
m
r o
N
(
1.0
0.5
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (°C)
TOP 10V
BOTTOM 2.3V
VGS
5.0V
4.5V
3.5V
3.0V
2.7V
2.5V
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
vs. Temperature
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Page 4
IRF8313PbF
10000
) F
1000
p
( e
c n a
t
i c a p a
C
100
, C
10
0.1 1 10 100
V
= 0V, f = 1 MHZ
GS
C
= C
= C
= C
+ Cgd, C
gs
gd
+ C
ds
iss
C
rss
C
oss
Ciss
Coss
Crss
VDS, Drain-to-Source Voltage (V)
SHORTED
ds
gd
Fig 5. Typical Capacitance vs.
Drain-to-Source Voltage
100
) A
( t n e
r
r
10
u C n
i a
r D e
s
r e v
1
e R
,
D S
I
0.1
TJ = 175°C
TJ = 25°C
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VSD, Source-to-Drain Voltage (V)
16
) V
( e
g a
t
l o V
e c
r u o S
­o
t
­e
t a
G ,
V
ID= 8.0A
VDS= 24V
12
8
4
S G
0
02468101214
Qg, Total Gate Charge (nC)
VDS= 15V
Fig 6. Typical Gate Charge vs.
Gate-to-Source Voltage
1000
) A
( t
100
n e
r
r u
C e
c
r u
10
o S
­o
t
­n
i a
r D
1
,
D
I
V
= 0V
GS
TA = 25°C
Tj = 175°C Single Pulse
0.1 0 1 10 100
OPERATION IN THIS AREA LIMITED BY RDS(on)
100μsec
1msec
10msec
VDS, Drain-to-Source Voltage (V)
Fig 7. Typical Source-Drain Diode
Fig 8. Maximum Safe Operating Area
Forward Voltage
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Page 5
IRF8313PbF
R
R
R
i
R
R
R
10
8
) A
( t n e
6
r
r u
C n
i a
r
4
D ,
D
I
2
0
25 50 75 100 125 150 175
TA, Ambient Temperature (°C)
Fig 9. Maximum Drain Current vs.
Ambient Temperature
100
2.5
) V
( e
g a
2.0
t
l o V
d
l o h s e
r
1.5
h T
e
t a
G ,
) h
1.0
t
( S G
V
ID = 25μA
ID = 250μA
0.5
-75 -50 -25 0 25 50 75 100 125 150 175
TJ , Temperature ( °C )
Fig 10. Threshold Voltage vs. Temperature
D = 0.50
)
A
10
J h
t Z (
e s n o
1
p s e
R l a
m
r e
0.1
h T
0.20
0.10
0.05
0.02
0.01
SINGLE PULSE ( THERMAL RESPONSE )
(sec)
Ri (°C/W)
0.1396039 0.000010
R
R
6
1
2
3
R
R
1
τ
J
τ
J
τ
1
τ
1
Ci= τi/R
2
τ
2
τ
2
4
R
R
3
4
τ
τ
3
τ
4
τ
τ
3
4
7
5
R
R
R
6
7
5
τ
τ
6
7
5
τ
τ
τ
6
7
5
0.4048955 0.000030
8
0.5273926 0.000020
R
8
1.2084906 0.001289
τ
a
1.5779475 0.000340
τ
8
7.0394610 0.009747
τ
8
18.0102679 27.798341
33.5929564 0.575346
τι
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthja + Tc
0.01
1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10 100 1000
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
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Page 6
IRF8313PbF
A
)
Ω
38
m
( e
c n
34
a
t s
i s e
30
R n O
26
e c
r u o S
22
­o
t
­n
i
18
a
r D
,
)
14
n o
(
S D
10
R
2.0 4.0 6.0 8.0 10.0
ID = 9.8A
TJ = 125°C
TJ = 25°C
VGS, Gate-to-Source Voltage (V)
Fig 12. On-Resistance vs. Gate Voltage
15V
200
) J
m
( y
g
r
160
e n E
e h c
120
n a
l a v A
e s
80
l u P
e
l g n
i
40
S
, S A
E
0
25 50 75 100 125 150 175
I
TOP
5.0A
BOTTOM
Starting TJ, Junction Temperature (°C)
Fig 13. Maximum Avalanche Energy
vs. Drain Current
t
p
D
3.0A
8.0A
V
(BR)DSS
R
D
DRIVER
+
V
DD
-
I
AS
Fig 14b. Unclamped Inductive Waveforms
V
DS
L
D.U.T
I
AS
Ω
0.01
t
p
R
V
20V
V
DS
G
GS
Fig 14a. Unclamped Inductive Test Circuit
V
DS
90%
V
GS
R
G
V
GS
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 15a. Switching Time Test Circuit
D.U.T.
+
V
DD
-
10% V
GS
t
d(on)tr
t
d(off)tf
Fig 15b. Switching Time Waveforms
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Page 7
IRF8313PbF
Reverse Recovery Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied Voltage
+
-
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 16. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
L
VCC
0
1K
20K
Fig 17a. Gate Charge Test Circuit
DUT
Vgs(th)
Qgs1
Qgs2QgdQgodr
Fig 17b. Gate Charge Waveform
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Page 8
IRF8313PbF
]
SO-8 Package Outline
Dimensions are shown in milimeters (inches)
D B
8X b
5
65
4312
e1
CAB
A1
H
0.25 [.010]
A
A
C
0.10 [.004]
A
E
6
e
6X
0.25 [.010]
87
NOTE S:
1. DIMENS IONING & TOLERANCING PER ASME Y14. 5M-1994.
2. CONTROLL ING DIMENS ION: MIL L IMET E R
3. DIMENS IONS ARE S HOWN IN MILL IME T E R S [INCHES ].
4. OUT LINE CONF ORMS T O JE DEC OUT LINE MS-012AA.
5 DIMENS ION DOES NOT INCLU DE MOLD PR OT RU S IONS . MOL D PR OTR U S IONS NOT T O EXCEE D 0.15 [.006].
6 DIMENS ION DOES NOT INCLU DE MOLD PR OT RU S IONS . MOL D PR OTR U S IONS NOT T O EXCEE D 0.25 [.010].
7 DIMENS ION IS T HE L ENGTH OF LEAD FOR S OLDE RING TO A SUBS TRATE .
y
6.46 [.255]
DIM
MIN MAX
A
.0532
A1
b
c .0075 .0098 0.19 0.25
D
E
e
e1
H
K
L
y
K x 45°
8X L
7
.0688
.0040
.0098
.013
.020
.189
.1968
.1497
.1574
.050 BASIC
.025 BASIC 0.635 BASIC
.2284
.2440
.0099
.0196
.016
.050
0°
8°
8X c
F OOT P R I NT
8X 0.72 [.028]
MIL L IME TE RSINCHES
MIN MAX
1.35
1.75
0.10
0.25
0.33
0.51
4.80
5.00
3.80
4.00
1.27 BASIC
5.80
6.20
0.25
0.50
0.40
1.27
0°
8°
3X 1.27 [.050]
8X 1.78 [.070
SO-8 Part Marking Information
EXAMPLE: T HIS IS AN IRF 7101 (MOSFE T )
INTERNAT IONAL
XXXX
F7101
RECTIFIER
LOGO
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
8 www.irf.com
DAT E CODE (YWW) P = DISGNATES LEAD - FREE
PRODUCT (OPT IONAL) Y = LAST DIGIT OF T H E YE AR WW = WEEK
A = ASSEMBLY SITE CODE LOT CODE
PART NUMBER
Page 9
SO-8 Tape and Reel
Dimensions are shown in milimeters (inches)
TERMINAL NUMBER 1
12.3 ( .484 )
11.7 ( .461 )
IRF8313PbF
8.1 ( .318 )
7.9 ( .312 )
NOTES:
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
330.00 (12.992) MAX.
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. OUTLINE CO NFORMS TO EIA- 481 & EIA-541.
Notes:
Repetitive rating; pulse width limited by max. junction temperature.  Starting T
= 25°C, L = 1.43mH, RG = 25Ω, I
J
AS
= 8.0A.
Pulse width ≤ 400μs; duty cycle ≤ 2%.
When mounted on 1 inch square copper board.
R
is measured at T
θ
of approximately 90°C.
J
FEED DIRECTION
14.40 ( .566 )
12.40 ( .488 )
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
www.irf.com 9
Page 10
IRF8313PbF
Orderable Part number Package Type
Standard Pack
Note
Form Quantity
IRF8313PbF SO-8 Tube/Bulk 95
IRF8313TRPbF SO-8 Tape and Reel 4000
Qualification Information
Qualification Level
Moisture Sensitivity Level
RoHS Compliant
†
Consumer
(per JEDEC JESD47F
††
†††
guidelines)
SO-8 MSL1
(per JEDEC J-STD-020D
†††
)
Yes
 Qualification standards can be found at International Rectifiers web site: http//www.irf.com/
 Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http//www.irf.com/whoto-call/salesrep/
 Applicable version of JEDEC standard at the time of product release.
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.11/08
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