l Adavanced Process Technology
l Ultra Low On-Resistance
l P-Channel MOSFET
l Surface Mount
l Available in Tape & Reel
l Dynamic dv/dt Rating
l Fast Switching
Description
Fourth Generation HEXFETs from International
Rectifier utilize advanced processing techniques to
achieve the lowest possible on-resistance per silicon
area. This benefit, combined with the fast switching
speed and ruggedized device design that HEXFET
Power MOSFETs are well known for, provides the
designer with an extremely efficient device for use in
a wide variety of applications.
The SO-8 has been modified through a customized
leadframe for enhanced thermal characteristics and
dual-die capability making it ideal in a variety of power
applications. With these improvements, multiple
devices can be used in an application with dramatically
reduced board space. The package is designed for
vapor phase, infra red, or wave soldering techniques.
Power dissipation of greater than 0.8W is possible in
a typical PCB mount application.
S
S
1
2
3
4
To p View
A
8
DS
V
= -30V
R
DS(on)
DSS
= 0.070Ω
7
D
6
D
5
DG
ID = -4.6A
SO-8
Absolute Maximum Ratings
ParameterMax.Units
ID @ TA = 25°CContinuous Drain Current, VGS @ 10V-4.6
ID @ TA = 70°CContinuous Drain Current, VGS @ 10V-3.7
I
DM
PD @TC = 25°CPower Dissipation2.5
V
GS
dv/dtPeak Diode Recovery dv/dt -3.0V/nS
T
J, TSTG
Pulsed Drain Current -15
W
Linear Derating Factor0.020W/°C
Gate-to-Source Voltage± 20V
Junction and Storage Temperature Range-55 to + 150
°C
Thermal Resistance Ratings
Parameter Min. Typ. Max. Units
R
Maximum Junction-to-Ambient –––
θJA
–––
50 °C/W
A
8/25/97
Page 2
IRF7205
Electrical Characteristics @ T
ParameterMin. Typ. Max. Units Conditions
V
(BR)DSS
∆V
DS(ON)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
(BR)DSS
Drain-to-Source Breakdown Voltage-30––––––VVGS = 0V, ID = -250µA
/∆T
Breakdown Voltage Temp. Coefficient––– -0.024 –––V/°C Reference to 25°C, ID = -1mA