Datasheet irf6608 Datasheet

Page 1
PD - 94727B
IRF6608
l Application Specific MOSFETs
HEXFET® Power MOSFET
l Ideal for CPU Core DC-DC Converters l Low Conduction Losses l Low Switching Losses l Low Profile (<0.7 mm) l Dual Sided Cooling Compatible l Compatible with existing Surface Mount Techniques
Applicable DirectFET Outline and Substrate Outline (see p.7, 8 for details)
SQ SX ST MQ MX MT
V
30V
DSS
Description
The IRF6608 combines the latest HEXFET® Power MOSFET Silicon technology with the advanced DirectFETTM packaging to achieve the lowest on-state resistance in a package that has the footprint of a MICRO-8 and only 0.7 mm profile. The DirectFET package is compatible with existing layout geometries used in power applications, PCB assembly equipment and vapor phase, infra-red or convection soldering techniques, when application note AN-1035 is followed regarding the manufacturing methods and processes. The DirectFET package allows dual sided cooling to maximize thermal transfer in power systems, IMPROVING previous best thermal resistance by 80%.
The IRF6608 balances both low resistance and low charge along with ultra low package inductance to reduce both conduction and switching losses. The reduced total losses make this product ideal for high efficiency DC-DC converters that power the latest generation of processors operating at higher frequencies. The IRF6608 has been optimized for parameters that are critical in synchronous buck converters including Rds(on), gate charge and Cdv/dt-induced turn on immunity. The IRF6608 has been optimized for parameters that are critical in synchronous buck converters including Rds(on) and gate charge to minimize losses in the control FET socket.
R
DS(on)
9.0mΩ@V
max
= 10V
GS
11mΩ@VGS = 4.5V
DirectFET ISOMETRIC
Qg
16nC
Absolute Maximum Ratings
Parameter Units
V
DS
V
GS
@ TC = 25°C
I
D
I
@ TA = 25°C
D
@ TA = 70°C
I
D
I
DM
P
@TA = 25°C
D
P
@TA = 70°C
D
P
@TC = 25°C
D
T
J
T
STG
Drain-to-Source Voltage V Gate-to-Source Voltage Continuous Drain Current, V Continuous Drain Current, V Continuous Drain Current, V Pulsed Drain Current Power Dissipation Power Dissipation Power Dissipation Linear Derating Factor W/°C Operating Junction and °C Storage Temperature Range
Thermal Resistance
Parameter Typ. Max. Units
R R R R R
θ
JA
θJA
θ
JA
θ
JC
θ
J-PCB
Junction-to-Ambient Junction-to-Ambient Junction-to-Ambient Junction-to-Case
ij
Junction-to-PCB Mounted 1.0 –––
g
g
c
fj
gj
hj
@ 10V
GS
@ 10V
GS
@ 10V
GS
Max.
30
±12
55 13 10
100
2.1
1.4 42
0.017
-40 to + 150
––– 58
12.5 ––– 20 ––– °C/W
––– 3.0
A
W
Notes through are on page 2
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Page 2
IRF6608
/
/
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
BV
DSS
∆Β
R
V
∆
I
DSS
I
GSS
V
DS(on)
GS(th)
V
GS(th)
DSS
∆
∆
gfs Forward Transconductance 28 ––– – –– S Q
g
Q
gs1
Q
gs2
Q
gd
Q
godr
Q
sw
Q
oss
t
d(on)
t
r
t
d(off)
t
f
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 30 ––– ––– V
T
Breakdown Voltage Temp. Coefficient ––– 29 ––– mV/°C
J
Static Drai n- to - So urce On-Resist an c e ––– 7.0 9.0
mΩ
––– 8.0 11
Gate Thresh ol d Vol t a ge 1.0 ––– 3.0 V
T
Gate Thresh ol d Vol t a ge Coe f fi cient ––– -5. 4 – –– m V / ° C
J
Drain-to-Source Leakage Current ––– ––– 30 µA
––– ––– 100 Gate-to-So urce Forward Leakage ––– ––– 100 nA Gate-to-So urce Reverse Leak age ––– ––– -100
Total Gate Charge ––– 16 24 Pre-Vth Gat e -t o-S ou r ce Char ge ––– 4.6 ––– Post-Vth Gate-to-Source Charge ––– 1.4 ––– nC Gate-to-Drain Charge ––– 5.3 ––– Gate Charge Overdrive ––– 4.7 ––– See Fig. 16
Switch Charge (Q
+ Qgd)
gs2
––– 6.7 ––– Output Charge ––– 11 ––– nC Turn-On Delay Time ––– 13 ––– Rise Time ––– 12 ––– Turn-Off Delay Time ––– 16 ––– ns Fall Time ––– 3.4 ––– Input Capa citance ––– 2120 ––– Output Capacitance ––– 440 ––– pF Reverse Transfer Capacitance ––– 260 –––
Conditions
VGS = 0V, ID = 250µA Reference to 25 °C , I
= 10V, ID = 13A e
V
GS
= 4.5V, ID = 10A
V
GS
= VGS, ID = 250µA
V
DS
= 24V, VGS = 0V
V
DS
V
= 24V, VGS = 0V, TJ = 125°C
DS
V
= 12V
GS
= -12V
V
GS
V
= 15V, ID = 8.8A
DS
= 15V
V
DS
V
= 4.5V
GS
I
= 8.8A
D
V
= 15V, VGS = 0V
DS
= 15V, VGS = 4.5Ve
V
DD
I
= 8.8A
D
Clamped Inductive Load
= 0V
V
GS
= 15V
V
DS
ƒ = 1.0MHz
= 1mA
D
e
Avalanche Characteristics
Parameter Units
E
AS
I
AR
E
AR
Single Pulse Avalanche E nergyd Avalanc he Cur ren t
c
Repetitive Avalanche Energy c
Typ.
––– ––– –––
Max.
54
8.8
0.21
Diode Characteristics
Parameter Min. Typ. Max. Units
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
Repetitive rating; pulse width limited by
max. junction temperature.
Starting T
RG = 25Ω, I
Pulse width ≤ 400µs; duty cycle ≤ 2%. Surface mounted on 1 in. square Cu board.
Continuous Source Current ––– ––– 13 (Body Diode) A
Pulsed Source Current ––– ––– 100 (Body Diode)
c
Diode Forward Voltage ––– 0.94 1.2 V Reverse Recovery Time ––– 31 47 ns Reverse Recovery Charge ––– 33 50 nC
Used double sided cooling, mounting pad.
= 25°C, L = 1.38mH
J
= 8.8A.
AS
Mounted on minimum footprint full size board with metalized
back and with small clip heatsink.
T
measured with thermal couple mounted to top (Drain) of part.
C
R
is measured at T
θ
MOSFET symbol showing the
integral reverse p-n junction diode.
T
= 25°C, IS = 8.8A, VGS = 0V e
J
= 25°C, IF = 8.8A
T
J
di/dt = 100A/µs e
of approximately 90°C.
J
2 www.irf.com
Conditions
G
mJ
A
mJ
D
S
Page 3
IRF6608
100
) A
(
t
n
e
r
r
u C e
c
r
10
u
o S
-
o
t
-
n
i
a
r D
,
D
I
2.7V
TOP 10V
BOTTOM 2.7V
30µs PULSE WIDTH Tj = 25°C
1
0.1 1.0 10.0 100.0
Fig 1. Typical Output Characteristics
100.0
)
Α
(
t
n
e
r
r
u C e
c
r
10.0
u
o S
-
o
t
-
n
i
a
r D
,
D
I
1.0
2.5 2.8 3.0 3.3 3.5
TJ = 150°C
TJ = 25°C
V
= 20V
DS
30µs PULSE WIDTH
VGS, Gate-to-Source Voltage (V)
VGS
7.0V
4.5V
3.8V
3.5V
3.2V
2.9V
100
) A
(
t
n
e
r
r
u C e
c
r
10
u
o S
-
o
t
-
n
i
a
r D
,
D
I
1
TOP 10V
BOTTOM 2.7V
2.7V
VGS
7.0V
4.5V
3.8V
3.5V
3.2V
30µs PULSE WIDTH
2.9V
Tj = 150°C
0.1 1.0 10.0 100.0
Fig 2. Typical Output Characteristics
2.0
e
c
n
a
t
s
i
s
e R n O
)
e
d
c
e
r
z
u
i
l
o
a
S
-
m
o
r
t
o
-
n
N
i
(
a
r D
,
)
n
o
( S D
R
ID = 12A V
= 10V
GS
1.5
1.0
0.5
-60 -40 -20 0 20 40 60 80 100 120 140 160
TJ , Junction Temperature (°C)
Fig 3. Typical Transfer Characteristics
) F
p
( e
c
n
a
t
i
c
a
p
a C
, C
10000
1000
100
1 10 100
V
= 0V, f = 1 MHZ
GS
C
= C C C
iss rss oss
= C
= C
+ Cgd, C
gs
gd
+ C
ds
SHORTED
ds
gd
Ciss
Coss Crss
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage
Fig 4. Normalized On-Resistance vs. Temperature
12
)
ID= 8.8A
V
10
( e
g
a
t
l
o
8
V e
c
r
u
6
o S
-
o
t
-
e
t
4
a G
,
S G
2
V
VDS= 24V VDS= 15V
0
010203040
Q
Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage
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Page 4
IRF6608
τ
100.0
) A
(
t
n
e
r
r
10.0
u C n
i
a
r D e
s
r
e
v
1.0
e R
,
D S
I
TJ = 150°C
TJ = 25°C
V
GS
= 0V
0.1
0.2 0.4 0.6 0.8 1.0 1.2 VSD, Source-toDrain Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
60
50
) A
(
40
t
n
e
r
r
u C
30
n
i
a
r D
,
20
D
I
10
) V
( e
g
a
t
l
o V
d
l
o
h
s
e
r
h
t e
t
a G
V
1000
OPERATION IN THIS AREA LIMITED BY RDS(on)
) A
(
t
100
n
e
r
r
u C e
c
r
u
10
o S
-
o
t
-
n
i
a
r D
1
,
D
I
Tc = 25°C Tj = 150°C Single Pulse
0.1 0 1 10 100 1000
V
, Drain-toSource Voltage (V)
DS
Fig 8. Maximum Safe Operating Area
2.2
2.0
1.8
1.6
1.4
1.2
)
h
t
( S G
1.0
100µsec
1msec
10msec
ID = 250µA
0
25 50 75 100 125 150
TJ , Junction Temperature (°C)
Fig 9. Maximum Drain Current vs. Case Temperature
100
D = 0.50
)
10
A
J
h
t
Z (
1
e
s
n
o
p
s
e
0.1
R
l
a m
r
e
h T
0.01
0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10 100
0.20
0.10
0.05
0.02
0.01
SINGLE PULSE ( THERMAL RESPONSE )
t1 , Rectangular Pulse Duration (sec)
τ
J
τ
J
τ
1
τ
1
Ci= τi/Ri
0.8
-75 -50 -25 0 25 50 75 100 125 150
TJ , Temperature ( °C )
Fig 10. Threshold Voltage vs. Temperature
R
R
R
R
1
2
R
1
τ
2
3
R
R
2
3
τ
3
τ
τ
2
3
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthja + Tc
Ri (°C/W) τi (sec)
4
R
4
2.023 0.000678
τ
C
τ
19.48 0.240237
4
τ
4
21.78 2.0167
14.71 58
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
4 www.irf.com
Page 5
IRF6608
A
)
0.025
Ω
( e
c
n
a
t
s
i
s
0.020
e R n O e
c
r
u
0.015
o S
­o
t
-
n
i
a
r
0.010
D ,
)
n
o
( S D
0.005
R
3 4 5 6 7 8 9 10
V
Gate -to -Source Voltage (V)
GS,
ID = 12A
Fig 12. On-Resistance Vs. Gate Voltage
15V
DRIVER
+
-
V
R
V
20V
V
DS
G
GS
L
D.U.T
I
AS
0.01
t
p
Ω
Fig 13a. Unclamped Inductive Test Circuit
DD
240
)
J m
( y
200
g
r
e
n E
e
160
h
c
n
a
l
a
120
v A
e
s
l
u
80
P e
l
g
n
i S
40
, S A
E
0
25 50 75 100 125 150
I
TOP
D
3.3A
3.8A
BOTTOM
8.8A
Starting TJ, Junction Temperature (°C)
Fig 13c. Maximum Avalanche Energy Vs. Drain Current
L
D.U.T
D
+
-
V
DD
V
DS
V
GS
Pulse Widt h < 1µs
Duty Factor < 0.1%
V
(BR)DSS
t
p
I
AS
Fig 13b. Unclamped Inductive Waveforms
Current Regulator
Same Type as D.U.T.
50KΩ
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
+
V
DS
-
I
D
Fig 14a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
d(on)
t
r
t
d(off)
t
f
Fig 14b. Switching Time Waveforms
Vds
Vgs(th)
Qgs1
Qgs2 Qgd Qgodr
Id
Vgs
Fig 15. Gate Charge Test Circuit
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Fig 16. Gate Charge Waveform
Page 6
IRF6608
Reverse Recovery Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Current
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance Current Transformer
-
• di/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied Voltage
+
-
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P.W.
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Diode Reverse Recovery Test Circuit for N-Channel
HEXFET® Power MOSFETs
DirectFET Substrate and PCB Layout, ST Outline (Small Size Can, T-Designation).
Please see DirectFET application note AN-1035 for all details regarding the assembly of DirectFET. This includes all recommendations for stencil and substrate designs.
1- Drain 2- Drain 3- Source 4- Source 5- Gate 6- Drain 7- Drain
6
3
5
4
7
1
2
6 www.irf.com
Page 7
IRF6608
DirectFET
Outline Dimension, ST Outline
(Small Size Can, T-Designation).
Please see DirectFET application note AN-1035 for all details regarding the assembly of DirectFET. This includes all recommendations for stencil and substrate designs.
DIMENSIONS
IMPERIAL
MIN
0.187
0.146
0.108
0.014
0.023
0.023
0.030
0.021
0.010
0.035
0.086
0.023
0.001
0.003
MAX
0.191
0.156
0.112
0.018
0.024
0.024
0.031
0.022
0.012
0.039
0.090
0.028
0.003
0.007
Note: Controlling dimensions are in mm
CODE
A B C D E F G H J K L M N P
METRIC
MIN
4.75
3.70
2.75
0.35
0.58
0.58
0.75
0.53
0.26 O.88
2.18
0.59
0.03
0.08
MAX
4.85
3.95
2.85
0.45
0.62
0.62
0.79
0.57
0.30
0.98
2.28
0.70
0.08
0.17
DirectFET Part Marking
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Page 8
IRF6608
DirectFET Tape & Reel Dimension (Showing component orientation).
NOTE: Controlling dimensions in mm Std reel quantity is 4800 parts. (ordered as IRF6618). For 1000 parts on 7" reel, order IRF6618TR1
STANDARD OPTION (QTY 4800)
METRIC CODE A B C D E F G H
MIN
330.0
20.2
12.8
1.5
100.0 N.C
12.4
11.9
MAX N.C N.C
13.2 N.C N.C
18.4
14.4
15.4
REEL DIMENSIONS
IMPERIAL
MIN
MAX
12.992
N.C
0.795
N.C
0.504
0.520
0.059
N.C
3.937
N.C
N.C
0.724
0.488
0.567
0.469
0.606
TR1 OPTION (QTY 1000)
METRIC
MIN
MAX
177.77
N.C
19.06
N.C
13.5
12.8
1.5
N.C
58.72
N.C
N.C
13.50
11.9
12.01
11.9
12.01
MIN
6.9
0.75
0.53
0.059
2.31 N.C
0.47
0.47
IMPERIAL
MAX N.C N.C
0.50 N.C N.C
0.53 N.C N.C
Loaded Tape Feed Direction
NOTE: CONTROLLING DIMENSIONS IN MM
DIMENSIONS
CODE A B C D E F G H
METRIC IM PERIAL
MIN
7.90
3.90
11.90
5.45
5.10
6.50
1.50
1.50
MAX
8.10
4.10
12.30
5.55
5.30
6.70 N.C
1.60
MIN
0.311
0.154
0.469
0.215
0.201
0.256
0.059
0.059
MAX
0.319
0.161
0.484
0.219
0.209
0.264 N.C
0.063
Data and specifications subject to change without notice.
This product has been designed and qualified for the Consumer market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.3/04
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