This power MOSFET is designed using he
company’sconsolidatedstrip layout-based MESH
OVERLAYprocess. This technology matches
and improves the performances compared with
standardpartsfrom varioussources.
APPLICATIONS
■ HIGHCURRENT SWITCHING
■ UNINTERRUPTIBLE POWER SUPPLY (UPS)
■ DC/DC COVERTERSFOR TELECOM,
INDUSTRIAL,AND LIGHTING EQUIPMENT.
R
DS(on)
<0.18Ω
<0.18
Ω
Ω
I
D
18 A
18 A
3
2
1
TO-220TO-220FP
INTERNAL SCHEMATIC DIAGRAM
3
2
1
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
IRF 640IRF640F P
V
V
V
I
DM
P
dv/ dt(
V
T
(•) Pulse width limited by safe operating area(1)ISD≤ 18A, di/dt ≤ 300A/µs,VDD≤ V
First Digit of the DatecodeBeing Z or K IdentifiesSiliconCharacterized in this Datasheet
(**)Limited only by Maximum TemperatureAllowed
October 1999
Drain-source Voltage (VGS=0)200V
DS
Dra in- gate Voltag e (RGS=20kΩ)
DGR
Gate -source Voltage± 20V
GS
Dra in Current (c ontinuous) at Tc=25oC1818(**)A
I
D
Dra in Current (c ontinuous) at Tc=100oC1111(**)A
I
D
200V
(•)Dra in Curren t (pu ls ed)7272A
Tot al Dissipation at Tc=25oC12540W
tot
Derating Factor1.00.32W/
) P eak Diode Rec ov e ry v oltage slope55V/ns
1
Insulation Withstand Voltage (DC)2000V
ISO
St orage Tem pe r ature-65 to 1 50
stg
Max. O p er a ti ng Junct ion T e m pe rat ure150
T
j
(BR)DSS
,Tj≤T
JMAX
o
C
o
C
o
C
1/9
Page 2
IRF640/FP
THERMAL DATA
TO-220TO-220FP
R
thj-case
R
thj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
SymbolPara meterMax Val ueUni t
I
AR
E
Ther mal Resist ance Junction- c as eMax1.03.12
Ther mal Resist ance Junction- am b ien tMax
Thermal Resistance Case-sinkTyp
Maximum Le ad T emperat u r e F o r Soldering Purpose
l
Avalanche Cu r rent, Repetitive or No t -Repetit iv e
(pulse width limite d by T
Single Pu lse Avalanche Energy
AS
(starting T
=25oC, ID=IAR,VDD=50V)
j
max)
j
62.5
0.5
300
18A
280mJ
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS
=25oC unless otherwisespecified)
(T
case
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
(BR)DSS
Drain-sourc e
=250µAVGS=0
I
D
200V
Break d own Vo lt age
I
I
DSS
GSS
Zero Gate Voltage
Drain Curr ent (V
GS
Gat e- b ody Leaka ge
Current (V
DS
=0)
=0)
V
=MaxRating
DS
= Max RatingTc=125oC
V
DS
=± 20 V
V
GS
1
10
± 100nA
ON(∗)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
GS(th)
Gate Threshold
V
DS=VGSID
= 250µA
234V
Voltage
R
DS(on)
Static Drain-source On
VGS=10V ID= 9 A0.150.18Ω
Resistanc e
I
D(on)
On State Drain Cu r rent VDS>I
D(on)xRDS(on)max
18A
VGS=10V
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
g
(∗)Forward
fs
Tr ansconductanc e
C
C
C
Input Capacitanc e
iss
Out put Ca pacita nce
oss
Reverse T ransfer
rss
Capacitance
VDS>I
D(on)xRDS(on)maxID
=9A711S
VDS=25V f=1MHz VGS= 01200
200
60
1560
260
80
µ
µA
pF
pF
pF
A
2/9
Page 3
IRF640/FP
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
d(on)
Turn-on Time
r
Rise T ime
t
VDD= 100 VID=9A
R
=4.7
G
Ω
VGS=10V
13
27
17
35
(see te st circuit, figure 3)
Q
Q
Q
Total Gate Charge
g
Gat e- Source Charge
gs
Gate-Drain Ch arge
gd
VDD= 160 VID=18A VGS= 1 0V55
10
21
72nC
SWITCHING OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
r(Voff)
t
t
Off -voltage R ise T ime
Fall Time
f
Cross-ov er T ime
c
VDD= 160 VID=18A
=4.7 ΩVGS=10V
R
G
(see te st circuit, figure 5)
21
25
50
27
32
65
SOURCEDRAINDIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safeoperating area
Source-drain C urr ent
(•)
Source-drain C urr ent
18
72
(pulsed)
(∗)For ward On VoltageISD=18A VGS=01.5V
Reverse Rec o very
rr
Time
Reverse Rec o very
rr
= 18 Adi / dt = 100 A /µs
I
SD
=50VTj= 150oC
V
DD
(see te st circuit, figure 5)
240
1.8
Charge
Reverse Rec o very
15
Current
ns
ns
nC
nC
ns
ns
ns
A
A
ns
µ
A
C
SafeOperating Area for TO-220SafeOperating Area for TO-220FP
3/9
Page 4
IRF640/FP
ThermalImpedancefor TO-220
OutputCharacteristics
ThermalImpedance for TO-220FP
TransferCharacteristics
Transconductance
4/9
Static Drain-sourceOn Resistance
Page 5
IRF640/FP
Gate Charge vs Gate-sourceVoltage
Normalized GateThresholdVoltage vs
Temperature
CapacitanceVariations
Normalized On Resistance vsTemperature
Source-drainDiode ForwardCharacteristics
5/9
Page 6
IRF640/FP
Fig. 1:
UnclampedInductive Load TestCircuit
Fig. 3: SwitchingTimes Test CircuitsFor
ResistiveLoad
Information furnishedis believed to be accurateand reliable.However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specificationmentioned in this publicationare
subjecttochange without notice.This publication supersedesand replaces all information previously supplied.STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The STlogo is a trademark of STMicroelectronics
1999 STMicroelectronics – Printed in Italy – All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco -
Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A.
http://www.st.com
.
9/9
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