This power MOSFET is designed using he
company’sconsolidatedstrip layout-based MESH
OVERLAYprocess. This technology matches
and improves the performances compared with
standardpartsfrom varioussources.
APPLICATIONS
■ HIGHCURRENT SWITCHING
■ UNINTERRUPTIBLE POWER SUPPLY (UPS)
■ DC/DC COVERTERSFOR TELECOM,
INDUSTRIAL,AND LIGHTINGEQUIPMENT.
R
DS(on)
<0.40Ω
<0.40Ω
I
D
9A
9A
IRF630FP
MESH OVERLAY MOSFET
3
2
1
TO-220TO-220FP
INTERNAL SCHEMATIC DIAGRAM
3
2
1
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
IRF63 0IRF 630FP
V
V
V
I
DM
P
dv/dt(
V
T
(•) Pulsewidth limited by safeoperating area(1)I
First Digit of the DatecodeBeing Z or K IdentifiesSilicon Characterized in this Datasheet
(**)Limited only by Maximum TemperatureAllowed
February 1999
Dra in- sour c e Voltage (VGS= 0)200V
DS
Dra in- gat e Voltage (RGS=20kΩ)200V
DGR
Gat e-source Voltage
GS
Dra in Cu rr ent ( continuous ) a t Tc=25oC99(**)A
I
D
Dra in Cu rr ent ( continuous ) a t Tc=100oC5.75.7(**)A
I
D
20V
±
(•)Dra in Cu rr ent ( p uls ed )3636A
Tot al Dis sipation at Tc=25oC7525W
tot
Der ati ng Factor0.60.20W/
) Peak Diode Recovery voltage slope55V/ ns
1
Insulation W ithstand Voltage (DC)20 00V
ISO
St orage T em pe r at ure-65 to 150
stg
Max. Operating Junct ion Temperat ur e150
T
j
≤
9A, di/dt≤300 A/µs, V
SD
≤
DD
V
(BR)DSS
,Tj≤T
JMAX
o
C
o
C
o
C
1/9
Page 2
IRF630/FP
THERMAL DATA
TO-220TO-220FP
R
thj-case
R
thj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
SymbolParamet erMax ValueUnit
I
AR
E
Ther mal Resistanc e Junct ion-caseMa x1.674.17
Ther mal Resistanc e Junct ion-ambientMax
Ther mal Resistanc e Case-sinkTy p
Maximum Lead Te m pe ra t ure For Soldering Pur p os e
l
Avalanche Current, R epetitiv e or Not-Repetitive
(pulse width limited by T
Single Pul se Avalanc he E nergy
AS
(starting T
=25oC, ID=IAR,VDD=50V)
j
max)
j
62.5
0.5
300
9A
160mJ
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS
=25oC unless otherwisespecified)
(T
case
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
(BR)DSS
Drain-source
ID=250µAVGS= 0200V
Break dow n Vo lt age
I
DSS
I
GSS
Zero Gate Voltage
Drain Curre nt (V
GS
Gat e- bod y Leakage
Current (V
DS
=0)
=0)
V
=MaxRating
DS
=MaxRatingTc=125oC
V
DS
V
=± 20 V
GS
1
50
100nA
±
ON(∗)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage VDS=VGSID= 250µA234V
Sta t ic Drain-s ource On
VGS=10V ID= 5 A0.350.40
Resistance
I
D(on)
On State Drain Current VDS>I
D(on)xRDS(on)max
10A
VGS=10V
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
g
(∗)Forward
fs
Tr ansc on duc tance
C
C
C
Input Capaci t ance
iss
Out put Capac it ance
oss
Reverse Transfer
rss
Capacit a nc e
VDS>I
D(on)xRDS(on)maxID
=5A34S
VDS=25V f=1MHz VGS= 0540
90
35
700
120
50
µA
µA
Ω
pF
pF
pF
2/9
Page 3
IRF630/FP
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
d(on)
t
r
Turn-on Time
Rise Time
VDD=100V ID= 4.5 A
R
=4.7
G
Ω
VGS=10V
10
15
14
20
(see test circuit, figure 3)
Q
Q
Q
Tot al Gate C harge
g
Gat e- Source Charge
gs
Gate-Drain Charge
gd
VDD= 160 VID=9A VGS=10V31
7.5
9
45nC
SWITCHING OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
r(Voff)
t
t
Off-voltage Rise Tim e
Fall T ime
f
Cross-over Tim e
c
VDD=160V ID=9A
=4.7 Ω VGS=10V
R
G
(see test circuit, figure 5)
12
12
25
17
17
35
SOURCEDRAINDIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed:Pulse duration = 300µs, duty cycle 1.5%
(•) Pulse width limited by safeoperating area
Source-drain Current
(•)
Source-drain Current
9
36
(pulsed)
(∗)ForwardOnVoltage ISD=9A VGS=01.5V
Reverse Recovery
rr
Time
Reverse Recovery
rr
ISD=9A di/dt=100A/µs
=50VTj= 150oC
V
DD
(see test circuit, figure 5)
170
0.95
Charge
Reverse Recovery
11
Current
ns
ns
nC
nC
ns
ns
ns
A
A
ns
µ
A
C
SafeOperating Area for TO-220SafeOperating Area for TO-220FP
3/9
Page 4
IRF630/FP
ThermalImpedancefor TO-220
OutputCharacteristics
ThermalImpedance for TO-220FP
TransferCharacteristics
Transconductance
4/9
Static Drain-sourceOn Resistance
Page 5
IRF630/FP
Gate Charge vs Gate-sourceVoltage
NormalizedGate ThresholdVoltage vs
Temperature
CapacitanceVariations
NormalizedOn Resistancevs Temperature
Source-drainDiode Forward Characteristics
5/9
Page 6
IRF630/FP
Fig. 1:
UnclampedInductiveLoad Test Circuit
Fig. 3: SwitchingTimes Test CircuitsFor
ResistiveLoad
Information furnished is believed to be accurateand reliable.However, STMicroelectronics assumesno responsibilityforthe consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication orotherwise under any patent or patent rights of STMicroelectronics. Specificationmentioned in this publication are
subjecttochange without notice.Thispublication supersedes and replaces all information previouslysupplied.STMicroelectronicsproducts
are not authorized foruse as critical components in life support devicesor systemswithout express written approval of STMicroelectronics.
The STlogo is a trademark of STMicroelectronics
1999 STMicroelectronics – Printed in Italy – All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - France - Germany - Italy- Japan - Korea - Malaysia - Malta - Mexico- Morocco - The Netherlands -
Singapore - Spain - Sweden - Switzerland - Taiwan- Thailand - United Kingdom - U.S.A.
http://www.st.com
.
9/9
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