Datasheet irf5m4905 Datasheet

Page 1
PD - 94155
HEXFET
®
POWER MOSFET
THRU-HOLE (TO-254AA)
Product Summary
Part Number BV
DSS
IRF5M4905 -55V 0.03Ω -35A*
Fifth Generation HEXFET® power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon unit area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications.
These devices are well-suited for applications such as switching power supplies, motor controls, invert­ers, choppers, audio amplifiers and high-energy pulse circuits.
RDS(on) ID
IRF5M4905
55V, P-CHANNEL
TO-254AA
Features:
n Low RDS(on) n Avalanche Energy Ratings n Dynamic dv/dt Rating n Simple Drive Requirements n Ease of Paralleling n Hermetically Sealed n Light Weight
Absolute Maximum Ratings
Parameter Units
ID @ VGS = -10V, TC = 25°C Continuous Drain Current -35*
ID @ VGS = -10V, TC = 100°C Continuous Drain Current -35*
I
DM
PD @ TC = 25°C Max. Power Dissipation 125 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt ➂ 2.2
T
J
T
STG
* Current is limited by package
For footnotes refer to the last page
Pulsed Drain Current ➀ -140
Linear Derating Factor 1.0 W/°C Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy ➁ 490 mJ Avalanche Current ➀ -35 A Repetitive Avalanche Energy ➀ 12.5 mJ
Operating Junction -55 to 150 Storage Temperature Range Lead Temperature 300 (0.063in./1.6mm from case for 10s) Weight 9.3 (Typical) g
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A
V/ns
o
C
03/26/01
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IRF5M4905
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min Typ Max Units Test Conditions
BV
DSS
∆BV
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
LS + L
iss
oss
rss
DSS
Drain-to-Source Breakdown Voltage -55 — — V VGS = 0V, ID = -250µA
/∆TJTemperature Coefficient of Breakdown — -0.053 — V/°C Reference to 25°C, ID = -1.0mA
Voltage Static Drain-to-Source On-State — — 0.03 Ω VGS = -10V, ID = -35A Resistance Gate Threshold Voltage -2.0 — -4.0 V VDS = VGS, ID = -250µA Forward Transconductance 18 — — S ( )VDS = -25V, IDS = -35A ➃ Zero Gate Voltage Drain Current — — -25 V
— — -250 VDS = -44V,
Gate-to-Source Leakage Forward — — -100 VGS = -20V Gate-to-Source Leakage Reverse — — 100 VGS = 20V Total Gate Charge — — 195 VGS =-10V, ID = -35A Gate-to-Source Charge — — 45 n C VDS = -44V Gate-to-Drain (‘Miller’) Charge — — 75 Turn-On Delay Time — — 35 VDD = -28V, ID = -35A, Rise Time — — 165 VGS =-10V, RG = 2.5Ω Turn-Off Delay Time — — 95 Fall Time — — 130 Total Inductance — 6.8 — Measured from drain lead (6mm /
Input Capacitance — 3570 — VGS = 0V, VDS = -25V Output Capacitance — 1310 — p F f = 1.0MHz Reverse Transfer Capacitance — 505 —
Ω
µA
nA
ns
nH
0.25in. from package ) to source
➃
= -55V ,VGS=0V
DS
VGS = 0V, TJ =125°C
lead (6mm/0.25in. from pacakge
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units Test Conditions
I
Continuous Source Current (Body Diode) — — -35*
S
I
Pulse Source Current (Body Diode) ➀ — — -140
SM
V
Diode Forward Voltage — — -1.6 V Tj = 25°C, IS = -35A, VGS = 0V ➃
SD
t
Reverse Recovery Time — — 120 n s Tj = 25°C, IF = -35A, di/dt ≥ 100A/µs
rr
Q
* Current is limited by package
Reverse Recovery Charge — — 365 nC VDD ≤ -30V ➃
RR
t
Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L
on
A
Thermal Resistance
Parameter Min Typ Max Units Test Conditions
thJC
Note: Corresponding Spice and Saber models are available on the G&S Website.
For footnotes refer to the last page
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Junction-to-Case — — 1.0 °C/W
+ LD.
S
Page 3
IRF5M4905
1000
100
10
D
-I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
-15V
-10V
-8.0V
-7.0V
-6.0V
-5.5V
-5.0V
BOTTOM
-4.5V
-4.5V
20µs PULSE WIDTH
T = 25 C
J
-V , Drain-to-Source Voltage (V)
DS
°
Fig 1. Typical Output Characteristics
1000
1000
100
10
D
-I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
-15V
-10V
-8.0V
-7.0V
-6.0V
-5.5V
-5.0V
BOTTOM
-4.5V
-4.5V
20µs PULSE WIDTH
T = 150 C
J
-V , Drain-to-Source Voltage (V)
DS
°
Fig 2. Typical Output Characteristics
2.0
-35A
I =
D
°
T = 25 C
GS
J
°
T = 150 C
J
V = -25V
DS
15
20µs PULSE WIDTH
100
10
D
-I , Drain-to-Source Current (A)
1
4.0 5.0 6.0 7.0 8.0 9.0 10.0
-V , Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
1.5
1.0
(Normalized)
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160
T , Junction Temperature( C)
J
Fig 4. Normalized On-Resistance
V =
GS
°
-10V
Vs. Temperature
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IRF5M4905
7000
6000
5000
4000
3000
C, Capacitance (pF)
2000
1000
0
1 10 100
V
=
0V, C
C C
iss
oss
rss
f = 1MHz
+ C + C
C SHORTED
GS
C
=
iss gs gd , ds
C
=
rss gd
C
=
oss ds gd
C
C
C
-V , Drain-to-Source Voltage (V)
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I =
-35A
D
V =-44V
DS
V =-28V
DS
16
12
8
4
GS
-V , Gate-to-Source Voltage (V)
0
0 40 80 120 160 200
Q , Total Gate Charge (nC)
G
V =-11V
DS
FOR TEST CIRCUIT
SEE FIGURE
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
13
OPERATION IN THIS AREA LIMITED BY RDS(on)
100
°
T = 150 C
J
10
°
T = 25 C
1
SD
I , Reverse Drain Current (A)
0.1
0.2 0.8 1.4 2.0 2.6
V ,Source-to-Drain Voltage (V)
SD
J
V = 0 V
GS
Fig 7. Typical Source-Drain Diode
100
1
1
ms
0ms
10
, Drain-to-Source Current (A)
D
Tc = 25°C
-I
Tj = 150°C Single Pulse
1
110100
-V
, Drain-toSource Voltage (V)
DS
Fig 8. Maximum Safe Operating Area
Forward Voltage
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IRF5M4905
60
LIMITED BY PACKAGE
50
40
30
20
D
-I , Drain Current (A)
10
0
25 50 75 100 125 150
T , Case Temperature ( C)
C
°
Fig 9. Maximum Drain Current Vs.
Case Temperature
10
V
DS
V
GS
G
V
GS
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
D
D.U.T.
Fig 10a. Switching Time Test Circuit
V
GS
10%
90% V
DS
t
d(on)tr
t
d(off)tf
Fig 10b. Switching Time Waveforms
-
+
V
DD
thJC
1
D = 0.50
0.20
0.10
0.1
0.05
Thermal Response (Z )
0.02
0.01
0.01
0.00001 0.0001 0.001 0.01 0.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
P
DM
t
1
1 2
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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Page 6
IRF5M4905
(BR)
L
D.U.T
I
AS
0.01
p
DRIVER
Ω
15V
V
DD
R
-20V
V
DS
G
V
GS
t
Fig 12a. Unclamped Inductive Test Circuit
I
AS
t
p
V
DSS
1250
TOP
1000
A
750
500
250
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150
Starting T , Junction Temperature ( C)
J
BOTTOM
I
D
-15.7A
-22A
-35A
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Fig 12b. Unclamped Inductive Waveforms
Current Regulator
Same Type as D.U.T.
Q
G
-10V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
-12V
12V
V
GS
Fig 13b. Gate Charge Test Circuit
50KΩ
.2µF
.3µF
-3mA
Current Sampling Resistors
­V
DS
+
D.U.T.
I
G
I
D
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Page 7
Footnotes:
Repetitive Rating; Pulse width limited by
maximum junction temperature.
V
= -25 V, Starting TJ = 25°C, L= 0.8mH
DD
Peak IAS = -35A, V
= -10V, RG= 25Ω
GS
I
VDD ≤ -55V, TJ ≤ 150°C
Pulse width ≤ 300 µs; Duty Cycle ≤ 2%
Case Outline and Dimensions — TO-254AA
≤ -35A, di/dt ≤ -230 A/µs,
SD
IRF5M4905
0.12 [.005]
1.27 [.050]
1.02 [.040]
B
R 1.52 [.060]
4.06 [.160]
3.56 [.140]
123
13.84 [.545]
13.59 [.535]
20.32 [.800]
20.07 [.790]
1.14 [.045] 3X
0.89 [.035]
0.36 [.014]
3.78 [.149]
3.53 [.139] A
17.40 [.685]
16.89 [.665]
31.40 [1.235]
30.35 [1.195]
17.40 [.685]
16.89 [.665]
3.81 [.150]
NOTE S:
2X
1. DIMENSIONING & T OLERANCING PER ASME Y14.5M-1994.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMET ERS [INCHES ].
3. CONTROLLING DIMENSION: INCH.
4. CONFORMS TO JE DEC OUTLI NE TO-254AA.
BA
6.60 [.260]
6.32 [.249]
13.84 [.545]
13.59 [.535]
PIN ASSIGNMENTS
1 = DRAIN 2 = SOURCE 3 = GATE
0.12 [.005]
1.27 [.050]
1.02 [.040]
B
3.81 [.150]
22.73 [.895]
21.21 [.835]
3.78 [.149]
3.53 [.139]
17.40 [.685]
16.89 [.665]
4.82 [.190]
3.81 [.150]
A
3.81 [.150] 2X
123
13.84 [.545]
13.59 [.535]
20.32 [.800]
20.07 [.790]
1.14 [.045]
3X
0.89 [.035]
0.36 [.014]
BA
6.60 [.260]
6.32 [.249]
13.84 [.545]
13.59 [.535]
CAUTION
BERYLLIA WARNING PER MIL-PRF-19500
Packages containing beryllia shall not be ground, sandblasted, machined, or have other operations performed on them which will produce beryllia or beryllium dust. Furthermore, beryllium oxide packages shall not be placed in acids that will produce fumes containing beryllium.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 03/01
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