Datasheet IRF530NSPBF Datasheet

Page 1
PD - 95100
IRF530NSPbF
IRF530NLPbF
HEXFET® Power MOSFET
l Advanced Process Technology l Ultra Low On-Resistance l Dynamic dv/dt Rating l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated l Lead-Free
G
D
V
R
DS(on)
DSS
= 100V
= 90mΩ
ID = 17A
S
Description
Advanced HEXFET® Power MOSFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on­resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications.
The D2Pak is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on-resistance in any existing surface mount package. The
2
Pak is suitable for high current applications because of its low internal
D connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRF530NL) is available for low-profile applications.
D2Pak
IRF530NSPbF
TO-262
IRF530NLPbF
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 17 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 12 A I
DM
PD @TA = 25°C Power Dissipation 3.8 W PD @TC = 25°C Power Dissipation 70 W
V
GS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt  7.4 V/ns T
J
T
STG
Pulsed Drain Current  60
Linear Derating Factor 0.47 W/°C Gate-to-Source Voltage ± 20 V Avalanche Current 9.0 A Repetitive Avalanche Energy 7.0 mJ
Operating Junction and -55 to + 175 Storage Temperature Range °C Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Thermal Resistance
Parameter Typ. Max. Units
R
R
θJA
www.irf.com 1
Junction-to-Case ––– 2.15 Junction-to-Ambient (PCB Mounted,steady-state)** ––– 40
°C/W
03/10/04
Page 2
IRF530NS/LPbF
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
E
AS
Drain-to-Source Breakdown Voltage 100 ––– ––– V VGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.11 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 90 mΩ VGS = 10V, ID = 9.0A Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 12 ––– ––– S VDS = 50V, ID = 9.0A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 80V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 100V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge ––– ––– 37 ID = 9.0A Gate-to-Source Charge ––– ––– 7.2 nC VDS = 80V Gate-to-Drain ("Miller") Charge ––– ––– 11 VGS = 10V, See Fig. 6 and 13 Turn-On Delay Time ––– 9.2 ––– VDD = 50V Rise Time ––– 22 ––– ID = 9.0A Turn-Off Delay Time ––– 35 ––– RG = 12Ω
ns
Fall Time ––– 25 ––– VGS = 10V, See Fig. 10 
4.5
Internal Drain Inductance
Internal Source Inductance ––– –––
––– –––
7.5
Between lead,
6mm (0.25in.)
nH
from package
and center of die contact Input Capacitance ––– 920 ––– VGS = 0V Output Capacitance ––– 130 ––– VDS = 25V Reverse Transfer Capacitance ––– 19 ––– pF ƒ = 1.0MHz, See Fig. 5 Single Pulse Avalanche Energy ––– 34093 mJ I
= 9.0A, L = 2.3mH
AS
D
G
S
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode)
––– –––
––– –––
17
60
showing the
A
p-n junction diode.
G
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 9.0A, VGS = 0V Reverse Recovery Time ––– 93 140 ns TJ = 25°C, IF = 9.0A Reverse Recovery Charge ––– 320 480 nC di/dt = 100A/µs

Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11)
Starting T
RG = 25Ω, I
I
SD
= 25°C, L = 2.3mH
J
= 9.0A, VGS=10V (See Figure 12)
AS
≤ 9.0A, di/dt ≤ 410A/µs, V
DD
≤ V
(BR)DSS
TJ ≤ 175°C
Pulse width ≤ 400µs; duty cycle ≤ 2%.
,
This is a typical value at device destruction and represents
operation outside rated limits.
This is a calculated value limited to T
= 175°C .
J
Uses IRF530N data and test conditions.
**When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994
2 www.irf.com
D
S
Page 3
IRF530NS/LPbF
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20µs PULSE WIDTH T = 25 C
J
V , Drain-to-Source Voltage (V)
DS
°
100
TOP
BOTTOM
VGS 15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
4.5V
10
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH
°
T = 175 C
1
0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
J
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
3.5
I =
D
15A
3.0
°
T = 25 C
J
°
T = 175 C
J
2.5
2.0
1.5
(Normalized)
1.0
D
I , Drain-to-Source Current (A)
V = 50V
DS
10
4.0 5.0 6.0 7.0 8.0
V , Gate-to-Source Voltage (V)
GS
20µs PULSE WIDTH
Fig 3. Typical Transfer Characteristics
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
Fig 4. Normalized On-Resistance
V =
GS
°
10V
Vs. Temperature
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Page 4
IRF530NS/LPbF
1600
1200
800
V
=
GS
C
=
iss gs gd , ds
C
=
rss gd
C
=
oss ds gd
C
iss
C
oss
0V, C C C
f = 1MHz
+ C
+ C
C SHORTED
C, Capacitance (pF)
400
C
rss
0
1 10 100
V , Drain- to-Source Voltage (V)
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
100
°
T = 175 C
J
10
1
T = 25 C
SD
I , Reverse Drain Current (A)
0.1
0.2 0.4 0.6 0.8 1.0 1.2 1.4
V ,Source-to-Drain Voltage (V)
SD
J
°
V = 0 V
GS
20
I =
9.0A
D
V = 80V
DS
V = 50V
16
12
8
4
GS
V , Gate-to-Source Voltage (V)
0
0 10 20 30 40
Q , Total Gate Charge (nC)
G
DS
V = 20V
DS
FOR TEST CIRCUIT
SEE FIGURE
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
) A
( t
100
n e
r
r u
C e
c
r
10
u o S
­o
t
­n
i a
r
1
D ,
D
Tc = 25°C
I
Tj = 175°C Single Pulse
0.1 1 10 100 1000
OPERATION IN THIS AREA LIMITED BY RDS(on)
V
, Drain-toSource Voltage (V)
DS
100µsec
1msec
10msec
13
Fig 7. Typical Source-Drain Diode
Fig 8. Maximum Safe Operating Area
Forward Voltage
4 www.irf.com
Page 5
IRF530NS/LPbF
20
16
12
8
D
I , Drain Current (A)
4
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
Fig 9. Maximum Drain Current Vs.
Case Temperature
10
R
V
DS
V
GS
R
G
V
GS
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
D
D.U.T.
Fig 10a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
t
d(off)tf
Fig 10b. Switching Time Waveforms
+
V
DD
-
thJC
D = 0.50
1
0.20
0.10
0.05
0.1
0.02
0.01
SINGLE PULSE
(THERMAL RESPONSE)
Thermal Response (Z )
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
0.01
0.00001 0.0001 0.001 0.01 0.1
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
1 2
P
DM
t
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRF530NS/LPbF
A
15V
DRIVER
+
V
DD
-
R
20V
V
V
DS
G
GS
L
D.U.T
I
AS
Ω
0.01
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
200
TOP
160
120
80
40
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting T , Junction Temperature ( C)
J
BOTTOM
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Current Regulator
Same Type as D.U.T.
I
D
3.7A
6.4A
9.0A
°
50KΩ
Q
G
V
GS
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
12V
Fig 13b. Gate Charge Test Circuit
.2µF
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
I
D
6 www.irf.com
+
V
DS
-
Page 7
IRF530NS/LPbF
Peak Diode Recovery dv/dt Test Circuit
D.U.T*
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance Current Transformer
-
+
-
-
+
R
G
V
GS
• dv/dt controlled by R
• ISD controlled by Duty Factor "D"
G
• D.U.T. - Device Under Test
+
V
DD
-
* Reverse Polarity of D.U.T for P-Channel
Driver Gate Drive
P.W.
Period
D =
P. W .
Period
VGS=10V
[ ] ***
D.U.T. ISDWaveform
Reverse Recovery Current
Re-Applied Voltage
D.U.T. VDSWaveform
Inductor Curent
*** V
= 5.0V for Logic Level and 3V Drive Devices
GS
Fig 14. For N-channel HEXFET
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
®
power MOSFETs
V
DD
[ ]
I
[ ]
SD
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Page 8
IRF530NS/LPbF
2
D
Pak Package Outline
Dimensions are shown in millimeters (inches)
D2Pak Part Marking Information (Lead-Free)
T H IS IS AN IR F 5 30S WIT H
LOT CODE 8024 AS S E M B LE D ON WW 0 2, 2000 IN THE ASS EMBLY LINE "L"
N ote: "P" in as semb ly line po s i tio n i nd icate s "L ead-F ree"
INT ER NAT ION AL
R E CT IF IER
LOGO
AS S E M B L Y LOT CODE
F530S
PART NUMBER
DATE CODE YE AR 0 = 2000 WEE K 02 LINE L
OR
IN T E R N AT ION AL
RECTIFIER
LOGO
AS S EM B LY LOT CODE
F 530S
8 www.irf.com
PART NUMB ER
DATE CODE P = DESIGNATE S LEAD-F RE E
PRODUCT (OPTIONAL)
YEAR 0 = 2000 WEEK 02
A = ASSEMBLY SITE CODE
Page 9
TO-262 Package Outline
IRF530NS/LPbF
IGBT
1- GATE
2- COLLECTOR
3- EMITTER
TO-262 Part Marking Information
TH IS IS AN I RL3103L
E X AMPL E :
LOT CODE 1789 ASS EMBLE D ON WW 19, 1997 IN T HE ASSEMBLY LINE "C"
Note: "P" in ass embl y line pos iti on indicates "L ead-F ree"
INTE RNAT IONAL
RECT IFIER
LOGO
AS S E MB L Y LOT CODE
PART NUMBE R
DATE CODE YEAR 7 = 1997 WEEK 19 LINE C
OR
INTE RNATIONAL
RECT IFIE R
LOGO
ASSEMBLY LOT CODE
www.irf.com 9
PART NUMB ER
DAT E CODE P = DES IGNATES LE AD-FRE E
PRODUCT (OPT IONAL)
YEAR 7 = 1997 WE EK 19
A = ASSEMBLY SITE CODE
Page 10
IRF530NS/LPbF
D2Pak Tape & Reel Infomation
Dimensions are shown in millimeters (inches)
TRR
FEED DI RECTION
TRL
FEED DI RECTION
1.85 (.073)
1.65 (.065)
10.90 (.429)
10.70 (.421)
4.10 (.161)
3.90 (.153)
1.60 (.063)
1.50 (.059)
11.60 (.457)
11.40 (.449)
16.10 (.634)
15.90 (.626)
1.60 (.063)
1.50 (.059)
1.75 (.069)
1.25 (.049)
15.42 (.609)
15.22 (.601)
0.368 (.0145)
0.342 (.0135)
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
13.50 ( .532)
12.80 ( .504)
330.00 (14.173) MAX.
NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
27.40 ( 1.079)
23.90 ( .941)
4
60.00 (2.362) MIN.
30.40 ( 1.197)
26.40 ( 1.03 9)
24.40 ( .961 )
3
MAX.
4
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.03/04
10 www.irf.com
Page 11
Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/
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