Datasheet IRF3808S, IRF3808L Datasheet (International Rectifier)

Page 1
AUTOMOTIVE MOSFET
Typical Applications
Integrated Starter Alternator
42 Volts Automotive Electrical Systems
Benefits
Advanced Process Technology
Ultra Low On-Resistance
Dynamic dv/dt Rating
175°C Operating Temperature
Fast Switching
Repetitive Avalanche Allowed up to Tjmax
Description
Designed specifically for Automotive applications, this Advanced Planar Stripe HEXFET ® Power MOSFET utilizes the latest pro­cessing techniques to achieve extremely low on-resistance per silicon area. Additional features of this HEXFET power MOSFET are a 175°C junction operating temperature, low RθJC, fast switch­ing speed and improved repetitive avalanche rating. This combina­tion makes the design an extremely efficient and reliable choice for use in higher power Automotive electronic systems and a wide variety of other applications.
G
PD - 94338A
IRF3808S
IRF3808L
HEXFET® Power MOSFET
D
V
= 75V
DSS
R
S
D2Pak
IRF3808S
= 0.007
DS(on)
I
= 106AV
D
TO-262
IRF3808L
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 106V ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 75V A I
DM
PD @TC = 25°C Power Dissipation 200 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt S 5.5 V/ns T
J
T
STG
Pulsed Drain Current Q 550
Linear Derating Factor 1.3 W/°C Gate-to-Source Voltage ± 20 V Single Pulse Avalanche EnergyR 430 mJ Avalanche CurrentQ 82 A Repetitive Avalanche EnergyW See Fig.12a, 12b, 15, 16 mJ
Operating Junction and -55 to + 175 Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case )
°C
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θJA
Junction-to-Case ––– 0.75 °C/W Junction-to-Ambient (PCB Mounted, Steady State)** ––– 40
HEXFET(R) is a registered trademark of International Rectifier.
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03/08/02
Page 2
IRF3808S/IRF3808L
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C
oss
C
oss
C
eff. Effective Output Capacitance U ––– 1140 ––– VGS = 0V, VDS = 0V to 60V
oss
Source-Drain Ratings and Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Q Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
R Starting T
RG = 25, I
S I
SD
TJ ≤ 175°C
T Pulse width ≤ 400µs; duty cycle 2%.
2 www.irf.com
Drain-to-Source Breakdown Voltage 75 ––– ––– VVGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.086 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– 5.9 7.0 m VGS = 10V, ID = 82A T Gate Threshold Voltage 2.0 ––– 4.0 V VDS = 10V, ID = 250µA Forward Transconductance 100 ––– ––– SVDS = 25V, ID = 82A
Drain-to-Source Leakage Current
––– ––– 20 ––– ––– 250 VDS = 60V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 200 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -200
VDS = 75V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge ––– 150 220 ID = 82A Gate-to-Source Charge ––– 31 47 nC VDS = 60V Gate-to-Drain ("Miller") Charge ––– 50 76 VGS = 10VT Turn-On Delay Time ––– 16 ––– VDD = 38V Rise Time ––– 140 ––– ID = 82A Turn-Off Delay Time ––– 68 ––– RG = 2.5
ns
Fall Time ––– 120 ––– VGS = 10V T
4.5
Internal Drain Inductance
Internal Source Inductance ––– –––
––– –––
7.5
Between lead,
6mm (0.25in.)
nH
from package
and center of die contact Input Capacitance ––– 5310 ––– VGS = 0V Output Capacitance ––– 890 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 130 ––– ƒ = 1.0MHz, See Fig. 5 Output Capacitance ––– 6010 ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz Output Capacitance ––– 570 ––– VGS = 0V, VDS = 60V, ƒ = 1.0MHz
Parameter Min. Typ. Max. Units Conditions Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode) Q
––– –––
––– –––
106V
550
showing the
A
p-n junction diode. Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 82A, VGS = 0VT Reverse Recovery Time ––– 93 140 ns TJ = 25°C, IF = 82A Reverse RecoveryCharge ––– 34 0 510 nC di/dt = 100A/µs
T
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
U C
eff. is a fixed capacitance that gives the same charging time
oss
as C
oss
while V
is rising from 0 to 80% V
DS
DSS
V Calculated continuous current based on maximum allowable
= 25°C, L = 0.130mH
J
= 82A. (See Figure 12).
AS
82A, di/dt 310A/µs, V
DD
V
(BR)DSS
junction temperature. Package limitation current is 75A.
W Limited by T
,
avalanche performance.
, see Fig.12a, 12b, 15, 16 for typical repetitive
Jmax
** When mounted on 1" square PCB ( FR-4 or G-10 Material ). For recommended footprint and soldering techniques refer to
application note #AN-994.
G
G
.
D
S
D
S
Page 3
IRF3808S/IRF3808L
)
1000
100
10
D
I , Drain-to-Source Current (A)
1
1000.00
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20µs PULSE WIDTH
0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
T = 25 C
J
°
1000
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
V , Drain-to-Source Voltage (V
DS
4.5V
20µs PULSE WIDTH
T = 175 C
J
°
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
3.0
137A
I =
D
)
100.00
TJ = 175°C
TJ = 25°C
, Drain-to-Source Current
D
I
10.00
1.0 3.0 5.0 7.0 9.0 11.0 13.0 15.0
V
= 15V
DS
20µs PULSE WIDTH
2.5
2.0
1.5
(Normalized)
1.0
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
V =
10V
GS
°
VGS, Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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Page 4
IRF3808S/IRF3808L
100000
10000
V
= 0V, f = 1 MHZ
GS
C
= C
iss rss oss
= C
= C
gs gd ds
C C
+ Cgd, C
+ C
gd
Ciss
1000
C, Capacitance(pF)
Coss
Crss
100
1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000.00
SHORTED
ds
12
D
I =
82A
10
8
6
4
GS
2
V , Gate-to-Source Voltage (V)
0
0 40 80 120 160
Q , Total Gate Charge (nC)
G
V = 60V
DS
V = 37V
DS
V = 15V
DS
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
10000
OPERATION IN THIS AREA
100.00
10.00
TJ = 175°C
1000
100
LIMITED BY RDS(on)
100µsec
TJ = 25°C
, Reverse Drain Current (A)
1.00
SD
I
0.10
0.0 0.5 1.0 1.5 2.0 VSD, Source-toDrain Voltage (V)
Fig 7. Typical Source-Drain Diode
V
GS
= 0V
10
, Drain-to-Source Current (A)
Tc = 25°C
D
I
Tj = 175°C Single Pulse
1
1 10 100 1000
V
, Drain-toSource Voltage (V)
DS
Fig 8. Maximum Safe Operating Area
1msec
10msec
Forward Voltage
4 www.irf.com
Page 5
IRF3808S/IRF3808L
(
)
120
LIMITED BY PACKAGE
100
80
60
40
D
I , Drain Current (A)
20
0
25 50 75 100 125 150 175
T , Case Temperature
C
°
C
Fig 9. Maximum Drain Current Vs.
Case Temperature
1
R
V
DS
V
GS
R
G
D
D.U.T.
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
t
d(off)tf
Fig 10b. Switching Time Waveforms
+
V
DD
-
D = 0.50
thJC
0.20
0.1
0.10
P
0.05
Thermal Response (Z )
0.02
0.01
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
SINGLE PULSE
(THERMAL RESPONSE)
t , Rectangular Pulse Duration (sec)
1
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
J DM thJC C
DM
t
1 2
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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Page 6
IRF3808S/IRF3808L
A
)
15V
DRIVER
+
-
V
R
20V
V
DS
G
t
L
D.U.T
I
AS
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
DD
800
TOP
640
480
320
160
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150
Starting Tj, Junction Temperature( C
BOTTOM
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
3.5
I
D 34A 58A 82A
V
G
Charge
3.0
2.5
ID = 250µA
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50K
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
+
V
-
I
D
Fig 13b. Gate Charge Test Circuit
DS
2.0
Gate threshold Voltage (V)
1.5
GS(th)
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
Fig 14. Threshold Voltage Vs. Temperature
6 www.irf.com
Page 7
IRF3808S/IRF3808L
10000
1000
Duty Cycle = Single Pulse
100
10
0.01
0.05
0.10
Avalanche Current (A)
1
0.1
1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
Allowed avalanche Current vs avalanche pulsewidth, tav assuming ∆Tj = 25°C due to avalanche losses. Note: In no case should Tj be allowed to exceed Tjmax
500
400
TOP Single Pulse BOTTOM 10% Duty Cycle ID = 140A
Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
300
2. Safe operation in Avalanche is allowed as long asT not exceeded.
jmax
3. Equation below based on circuit and waveforms shown in Figures 12a, 12b.
200
, Avalanche Energy (mJ)
AR
100
E
4. P
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Average power dissipation per single
D (ave)
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
0
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
Vs. Temperature
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) =
D (ave)
I
av =
E
AS (AR)
2
∆∆
T/ [1.3·BV·Zth]
∆∆
= P
·f
av
D (ave)·tav
∆∆
T/ Z
∆∆
thJC
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is
Page 8
IRF3808S/IRF3808L
Peak Diode Recovery dv/dt Test Circuit
D.U.T*
+
S
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance Current Transformer
-
+
R
-
T
-
+
Q
R
G
V
GS
dv/dt controlled by R
ISD controlled by Duty Factor "D"
G
D.U.T. - Device Under Test
+
V
DD
-
* Reverse Polarity of D.U.T for P-Channel
Driver Gate Drive
P.W.
Period
D =
P.W.
Period
VGS=10V
[ ] ***
D.U.T. ISDWaveform
Reverse Recovery Current
Re-Applied Voltage
D.U.T. VDSWaveform
Inductor Curent
*** V
= 5.0V for Logic Level and 3V Drive Devices
GS
Fig 17. For N-channel HEXFET
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple 5%
®
power MOSFETs
V
DD
[ ]
I
[ ]
SD
8 www.irf.com
Page 9
D2Pak Package Outline
IRF3808S/IRF3808L
10.54 (.415)
1.40 (.055) MA X.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTE S: 1 DIMENSIONS AFTER SOLDER DIP. 2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 CONTROLLING DIMENSION : INCH. 4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
2
Pak Part Marking Information
D
10.29 (.405)
- A ­2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.2 5 ( .0 10 ) M B A M
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
LEAD ASSIGNMENTS 1 - G ATE 2 - D RA IN 3 - S OURCE
10.16 (.400) REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350) REF.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082) 2X
2.54 (.100) 2X
THIS IS AN IRF530S WITH
LO T CO DE 8024 A SSEMBLED O N WW 02, 2000 IN THE ASSEMBLY LINE "L"
INTERNATIONAL
REC TIFIER
LOGO
F530S
PART NUMBER
DA TE CODE
ASSEMBLY LOT C ODE
YEA R 0 = 20 00 WEE K 02 LINE L
www.irf.com 9
Page 10
IRF3808S/IRF3808L
EXAMPL E: T HIS I S AN IRL3103L
LO T CO DE 1789
ASSEMBLY
PART NUMBER
DA TE CODE
WEE K 19 LINE C
LOT C ODE
YEAR 7 = 1997
A SSEM BLED O N WW 19, 1997 IN THE ASSEMBLY LINE "C"
LOGO
REC TIFIER
INTERNATIO NA L
TO-262 Package Outline
TO-262 Par t Mar king Information
10 www.irf.com
Page 11
D2Pak Tape & Reel Information
)
)
)
)
)
)
)
)
(
)
)
)
)
(
)
)
)
TRR
1.60 (.063
1.50 (.059
4.10 (.161
3.90 (.153
IRF3808S/IRF3808L
1.60 (.063)
1.50 (.059)
0.368 (.0145)
0.342 (.0135)
FEED DIRECTION
1.85 (.073
1.65 (.065
TRL
10.90 (.429)
10.70 (.421)
FEED DIRECTION
13.50 (.532
12.80 (.504
330.00
14.173
MAX.
NOTES :
1. COMFO R MS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
11.60 (.457)
11.40 (.449)
1.75 (.069)
1.25 (.049)
16.10 (.634)
15.90 (.626)
15.42 (.609)
15.22 (.601)
27.40 (1.079
23.90 (.941 4
26.40 (1.039
24.40 (.961
3
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
60.00 (2.362 M IN .
30.40
1.197
M A X.
4
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IRs Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.03/02
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