Designed specifically for Automotive applications, this Advanced
Planar Stripe HEXFET ® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per
silicon area. Additional features of this HEXFET power MOSFET
are a 175°C junction operating temperature, low RθJC, fast switching speed and improved repetitive avalanche rating. This combination makes the design an extremely efficient and reliable choice for
use in higher power Automotive electronic systems and a wide
variety of other applications.
G
PD - 94338A
IRF3808S
IRF3808L
HEXFET® Power MOSFET
D
V
= 75V
DSS
R
S
D2Pak
IRF3808S
= 0.007Ω
DS(on)
I
= 106AV
D
TO-262
IRF3808L
Absolute Maximum Ratings
ParameterMax.Units
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V106V
ID @ TC = 100°CContinuous Drain Current, VGS @ 10V75VA
I
DM
PD @TC = 25°CPower Dissipation200W
V
GS
E
AS
I
AR
E
AR
dv/dtPeak Diode Recovery dv/dt S5.5V/ns
T
J
T
STG
Pulsed Drain Current Q550
Linear Derating Factor1.3W/°C
Gate-to-Source Voltage ± 20V
Single Pulse Avalanche EnergyR430mJ
Avalanche CurrentQ82A
Repetitive Avalanche EnergyWSee Fig.12a, 12b, 15, 16mJ
Operating Junction and-55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds300 (1.6mm from case )
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRF3808S/IRF3808L
A
)
15V
DRIVER
+
-
V
R
20V
V
DS
G
t
L
D.U.T
I
AS
0.01
p
Ω
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
DD
800
TOP
640
480
320
160
AS
E , Single Pulse Avalanche Energy (mJ)
0
255075100125150
Starting Tj, Junction Temperature( C
BOTTOM
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
3.5
I
D
34A
58A
82A
V
G
Charge
3.0
2.5
ID = 250µA
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
+
V
-
I
D
Fig 13b. Gate Charge Test Circuit
DS
2.0
Gate threshold Voltage (V)
1.5
GS(th)
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
Fig 14. Threshold Voltage Vs. Temperature
6www.irf.com
Page 7
IRF3808S/IRF3808L
10000
1000
Duty Cycle = Single Pulse
100
10
0.01
0.05
0.10
Avalanche Current (A)
1
0.1
1.0E-071.0E-061.0E-051.0E-041.0E-031.0E-021.0E-01
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
avalanche losses. Note: In no
case should Tj be allowed to
exceed Tjmax
500
400
TOP Single Pulse
BOTTOM 10% Duty Cycle
ID = 140A
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
300
2. Safe operation in Avalanche is allowed as long asT
not exceeded.
jmax
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
200
, Avalanche Energy (mJ)
AR
100
E
4. P
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Average power dissipation per single
D (ave)
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
0
255075100125150175
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
Vs. Temperature
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) =
D (ave)
I
av =
E
AS (AR)
2
∆∆
∆T/ [1.3·BV·Zth]
∆∆
= P
·f
av
D (ave)·tav
∆∆
∆T/ Z
∆∆
thJC
www.irf.com7
is
Page 8
IRF3808S/IRF3808L
Peak Diode Recovery dv/dt Test Circuit
D.U.T*
+
S
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
+
R
-
T
-
+
Q
R
G
V
GS
• dv/dt controlled by R
• ISD controlled by Duty Factor "D"
G
• D.U.T. - Device Under Test
+
V
DD
-
* Reverse Polarity of D.U.T for P-Channel
Driver Gate Drive
P.W.
Period
D =
P.W.
Period
VGS=10V
[ ] ***
D.U.T. ISDWaveform
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. VDSWaveform
Inductor Curent
*** V
= 5.0V for Logic Level and 3V Drive Devices
GS
Fig 17. For N-channel HEXFET
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
®
power MOSFETs
V
DD
[ ]
I
[ ]
SD
8www.irf.com
Page 9
D2Pak Package Outline
IRF3808S/IRF3808L
10.54 (.415)
1.40 (.055)
MA X.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTE S:
1 DIMENSIONS AFTER SOLDER DIP.
2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
3 CONTROLLING DIMENSION : INCH.
4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
2
Pak Part Marking Information
D
10.29 (.405)
- A 2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.2 5 ( .0 10 ) M B A M
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
LEAD ASSIGNMENTS
1 - G ATE
2 - D RA IN
3 - S OURCE
10.16 (.400)
REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350)
REF.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082)
2X
2.54 (.100)
2X
THIS IS AN IRF530S WITH
LO T CO DE 8024
A SSEMBLED O N WW 02, 2000
IN THE ASSEMBLY LINE "L"
INTERNATIONAL
REC TIFIER
LOGO
F530S
PART NUMBER
DA TE CODE
ASSEMBLY
LOT C ODE
YEA R 0 = 20 00
WEE K 02
LINE L
www.irf.com9
Page 10
IRF3808S/IRF3808L
EXAMPL E:T HIS I S AN IRL3103L
LO T CO DE 1789
ASSEMBLY
PART NUMBER
DA TE CODE
WEE K 19
LINE C
LOT C ODE
YEAR 7 = 1997
A SSEM BLED O N WW 19, 1997
IN THE ASSEMBLY LINE "C"
LOGO
REC TIFIER
INTERNATIO NA L
TO-262 Package Outline
TO-262 Par t Mar king Information
10www.irf.com
Page 11
D2Pak Tape & Reel Information
)
)
)
)
)
)
)
)
(
)
)
)
)
(
)
)
)
TRR
1.60 (.063
1.50 (.059
4.10 (.161
3.90 (.153
IRF3808S/IRF3808L
1.60 (.063)
1.50 (.059)
0.368 (.0145)
0.342 (.0135)
FEED DIRECTION
1.85 (.073
1.65 (.065
TRL
10.90 (.429)
10.70 (.421)
FEED DIRECTION
13.50 (.532
12.80 (.504
330.00
14.173
MAX.
NOTES :
1. COMFO R MS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
11.60 (.457)
11.40 (.449)
1.75 (.069)
1.25 (.049)
16.10 (.634)
15.90 (.626)
15.42 (.609)
15.22 (.601)
27.40 (1.079
23.90 (.941
4
26.40 (1.039
24.40 (.961
3
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
60.00 (2.362
M IN .
30.40
1.197
M A X.
4
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.03/02
www.irf.com11
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