Page 1
PD - 94653
AUTOMOTIVE MOSFET
IRF3205Z
HEXFET® Power MOSFET
Features
● Advanced Process Technology
● Ultra Low On-Resistance
● 175°C Operating Temperature
● Fast Switching
● Repetitive Avalanche Allowed up to Tjmax
G
Description
Specifically designed for Automotive applications, this HEXFET® Power
MOSFET utilizes the latest processing techniques to achieve extremely
low on-resistance per silicon area. Additional features of this design are
a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this
design an extremely efficient and reliable device for use in Automotive
applications and a wide variety of other applications.
Absolute Maximum Ratings
Parameter Units
ID @ TC = 25°C
ID @ TC = 100°C
I
@ TC = 25°C
D
I
DM
PD @TC = 25°C
V
GS
E
AS (Thermally limited)
(Tested )
E
AS
I
AR
E
AR
T
J
T
STG
Continuous Drain Current, V
Continuous Drain Current, V
Continuous Drain Current, V
urrent
Power Dissipation W
Linear Derating Factor W/°C
Gate-to-Source Voltage V
se Avalanche Energy
se Avalanche Energy Tested Value
anche Current
epetitive Avalanche Energy
Operating Junction and
Storage Temperature Range °C
Soldering Temperature, for 10 seconds
Mounting Torque, 6-32 or M3 screw
@ 10V (Silicon Limited)
GS
@ 10V
GS
@ 10V (Package Limited)
GS
Thermal Resistance
Parameter Typ. Max. Units
R
θ JC
R
θ CS
R
θ JA
Junction-to-Case ––– 0.9
Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/W
Junction-to-Ambient ––– 62
www.irf.com 1
D
V
DSS
R
DS(on)
S
ID = 75A
TO-220AB
Max.
110
78
75
440
170
1.1
± 20
180
250
See Fig.12a, 12b, 15, 16
-55 to + 175
300 (1.6mm from case )
y
in (1.1Ny m)
10 lbf
= 55V
= 6.5mΩ
mJ
mJ
A
A
3/25/03
Page 2
IRF3205Z
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
V
(BR)DSS
∆ V
(BR)DSS
R
DS(on)
V
GS(th)
gfs Forward Transconductance 71 ––– ––– S
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C
oss
C
oss
C
eff.
oss
Drain-to-Source Breakdown Voltage 55 ––– ––– V
∆ T
Breakdown Voltage Temp. Coefficient ––– 0.051 ––– V/°C
J
Static Drain-to-Source On-Resistance ––– 4.9 6.5
Gate Threshold Voltage 2.0 ––– 4.0 V
VGS = 0V, ID = 250µA
Reference to 25°C, I
mΩ
V
VDS = VGS, ID = 250µA
V
Drain-to-Source Leakage Current ––– ––– 20 µA
––– ––– 250
Gate-to-Source Forward Leakage ––– ––– 200 nA
Gate-to-Source Reverse Leakage ––– ––– -200
Total Gate Charge ––– 76 110
Gate-to-Source Charge ––– 21 ––– nC
Gate-to-Drain ("Miller") Charge ––– 30 –––
Turn-On Delay Time ––– 18 –––
Rise Time ––– 95 –––
Turn-Off Delay Time ––– 45 ––– ns
Fall Time ––– 67 –––
V
V
V
V
I
V
VGS = 10V
VDD = 28V
I
R
VGS = 10V
Internal Drain Inductance ––– 4.5 ––– Between lead,
nH 6mm (0.25in.)
Internal Source Inductanc e ––– 7.5 ––– from package
and center of die contact
Input Capacitance ––– 3450 –––
Output Capacitance ––– 550 –––
Reverse Transfer Capacitance ––– 310 ––– pF
Output Capacitance ––– 1940 –––
Output Capacitance ––– 430 –––
Effective Output Capacitance ––– 640 –––
VGS = 0V
V
ƒ = 1.0MHz
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz
V
V
GS
DS
DS
DS
GS
GS
= 66A
D
DS
= 66A
D
G
DS
GS
GS
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units
I
S
Continuous Source Current ––– ––– 75
(Body Diode) A
I
V
t
Q
t
SM
SD
rr
rr
on
Pulsed Source Current ––– ––– 440
(Body Diode)
c
Diode Forward Voltage ––– ––– 1.3 V
Reverse Recovery Time ––– 28 42 ns
Reverse Recovery Charge ––– 25 38 nC
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
Limited by T
RG = 25Ω , I
, starting TJ = 25°C, L = 0.08mH
Jmax
= 66A, VGS =10V. Part not
AS
recommended for use above this value.
Pulse width ≤ 1.0ms; duty cycle ≤ 2%.
C
eff. is a fixed capacitance that gives the same charging time
oss
as C
Limited by T
oss
while V
is rising from 0 to 80% V
DS
, see Fig.12a, 12b, 15, 16 for typical repetitive
Jmax
avalanche performance.
This value determined from sample failure population. 100%
tested to this value in production.
MOSFET symbol
showing the
integral reverse
p-n junction diode.
= 25°C, IS = 66A, VGS = 0V
T
J
TJ = 25°C, IF = 66A, VDD = 25V
di/dt = 100A/µs
2 www.irf.com
Conditions
= 1mA
D
= 10V, ID = 66A
e
= 25V, ID = 66A
= 55V, VGS = 0V
= 55V, VGS = 0V, TJ = 125°C
= 20V
= -20V
= 44V
e
= 6.8 Ω
e
= 25V
= 0V, VDS = 44V, ƒ = 1.0MHz
= 0V, VDS = 0V to 44V
f
Conditions
e
.
DSS
e
Page 3
IRF3205Z
1000
V
TOP 15V
)
A
(
t
n
e
r
r
u
C
e
c
r
u
o
S
-
o
t
-
n
i
a
r
D
,
I
10V
7.0V
6.0V
5.5V
100
5.0V
BOTTOM 4.5V
10
D
1
0.1 1 10 100
8.0V
GS
4.5V
20µs PULSE WIDTH
Tj = 25°C
VDS, Drain-to-Source Voltage (V)
1000
)
A
(
t
n
e
r
100
r
u
C
e
c
r
u
o
S
-
o
t
-
10
n
i
a
r
D
,
D
I
1
4.0 5.0 6.0 7.0 8.0 9.0 10.0 11.0
TJ = 25°C
V
DS
20µs PULSE WIDTH
= 25V
VGS, Gate-to-Source Voltage (V)
TJ = 175°C
1000
V
TOP 15V
)
A
(
t
n
e
r
r
u
C
e
c
r
u
o
S
-
o
t
-
n
i
a
r
D
,
I
10V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
100
D
10
0.1 1 10 100
8.0V
GS
4.5V
20µs PULSE WIDTH
Tj = 175°C
VDS, Drain-to-Source Voltage (V)
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
120
)
S
(
100
e
c
n
a
t
c
80
u
d
n
o
c
s
60
n
a
r
T
d
r
a
40
w
r
o
F
,
s
20
f
G
0
0 2 04 06 08 01 0 0
ID, Drain-to-Source Current (A)
TJ = 175°C
V
= 10V
DS
20µs PULSE WIDTH
TJ = 25°C
Fig 3. Typical Transfer Characteristics
Fig 4. Typical Forward Transconductance
Vs. Drain Current
www.irf.com 3
Page 4
IRF3205Z
6000
5000
)
F
4000
p
(
e
c
n
a
t
3000
i
c
a
p
a
C
2000
,
C
1000
0
1 10 100
V
= 0V, f = 1 MHZ
GS
C
= C
= C
= C
gs
gd
ds
Ciss
Coss
Crss
+ Cgd, C
+ C
iss
C
rss
C
oss
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000.0
)
A
(
t
n
e
r
r
u
C
n
i
a
r
D
e
s
r
e
v
e
R
,
D
S
I
100.0
10.0
TJ = 175°C
TJ = 25°C
1.0
0.1
0.2 0.6 1.0 1.4 1.8 2.2
VSD, Source-toDrain Voltage (V)
20
SHORTED
ds
gd
ID= 66A
)
V
(
16
e
g
a
t
l
o
V
12
e
c
r
u
o
S
-
o
8
t
-
e
t
a
G
,
S
4
G
V
0
0 20 40 60 80 100 120
VDS= 44V
VDS= 28V
VDS= 11V
Q
Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
V
GS
= 0V
10000
)
A
1000
(
t
n
e
r
r
u
C
100
e
c
r
u
o
S
-
o
10
t
-
n
i
a
r
D
,
1
D
I
Tc = 25°C
Tj = 175°C
Single Pulse
0.1
1 10 100 1000
OPERATION IN THIS AREA
LIMITED BY RDS(on)
V
, Drain-toSource Voltage (V)
DS
100µsec
1msec
10msec
Fig 7. Typical Source-Drain Diode
Fig 8. Maximum Safe Operating Area
Forward Voltage
4 www.irf.com
Page 5
IRF3205Z
120
LIMITED BY PACKAGE
100
)
A
(
80
t
n
e
r
r
u
C
60
n
i
a
r
D
,
40
D
I
20
0
25 50 75 100 125 150 175
TC , Case Temperature (°C)
Fig 9. Maximum Drain Current Vs.
Case Temperature
1
2.5
e
c
n
a
t
s
i
s
e
R
n
O
)
e
d
c
e
r
z
u
i
l
o
a
S
-
m
r
o
t
o
-
n
N
i
(
a
r
D
,
)
n
o
(
S
D
R
ID = 66A
V
= 10V
GS
2.0
1.5
1.0
0.5
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (°C)
Fig 10. Normalized On-Resistance
Vs. Temperature
D = 0.50
)
C
J
h
t
0.1
Z
(
e
s
n
o
p
s
e
R
l
a
0.01
m
r
e
h
T
0.001
1E-006 1E-005 0.0001 0.001 0.01 0.1
0.20
0.10
0.05
0.02
0.01
SINGLE PULSE
( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com 5
Page 6
IRF3205Z
15V
DRIVER
+
-
V
DD
R
V
20V
V
DS
G
GS
L
D.U.T
I
AS
0.01
t
p
Ω
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
350
)
J
m
(
300
y
g
r
e
n
250
E
e
h
c
n
200
a
l
a
v
A
150
e
s
l
u
P
e
100
l
g
n
i
S
,
50
S
A
E
0
25 50 75 100 125 150 175
I
TOP 27A
47A
BOTTOM 66A
Starting TJ, Junction Temperature (°C)
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
4.0
D
)
V
V
G
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
I
G
Current Sampling Resistors
+
V
DS
-
D
Fig 13b. Gate Charge Test Circuit
(
e
g
a
t
l
o
3.0
V
d
l
o
h
s
e
r
h
t
e
t
a
2.0
G
)
h
t
(
S
G
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175
ID = 250µA
TJ , Temperature ( °C )
Fig 14. Threshold Voltage Vs. Temperature
6 www.irf.com
Page 7
IRF3205Z
1000
Duty Cycle = Single Pulse
Allowed avalanche Current vs
100
)
A
(
t
n
e
r
r
u
C
10
e
h
c
n
a
l
a
v
A
1
0.1
1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
0.01
0.05
0.10
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
avalanche losses. Note: In no
case should Tj be allowed to
exceed Tjmax
200
TOP Single Pulse
BOTTOM 10% Duty Cycle
)
160
J
m
(
y
g
r
e
n
120
E
e
h
c
n
a
l
80
a
v
A
,
R
A
40
E
ID = 66A
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
2. Safe operation in Avalanche is allowed as long asT
jmax
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. P
= Average power dissipation per single
D (ave)
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
0
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
Vs. Temperature
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) = D T/ Z
D (ave)
I
2D T/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
·f
av
D (ave)·tav
thJC
www.irf.com 7
is
Page 8
IRF3205Z
Reverse
Recovery
Current
Driver Gate Drive
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• I SD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied
Voltage
+
-
Period
P.W.
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P.W.
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
R
D.U.T.
D
+
V
DD
-
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 18a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
d(on)tr
t
d(off)tf
Fig 18b. Switching Time Waveforms
8 www.irf.com
Page 9
TO-220AB Package Outline
E
X
A
M
P
L
E
:
T
H
I
S
I
S
A
N
I
R
F
1
0
1
0
L
O
T
C
O
D
E
1
7
8
9
A
S
S
E
M
B
L
E
D
O
N
W
W
1
9
,
1
9
9
7
I
N
T
H
E
A
S
S
E
M
B
L
Y
L
I
N
E
"
C
"
I
N
T
E
R
N
A
T
I
O
N
A
L
R
E
C
T
I
F
I
E
R
L
O
G
O
A
S
S
E
M
B
L
Y
L
O
T
C
O
D
E
P
A
R
T
N
U
M
B
E
R
D
A
T
E
C
O
D
E
Y
E
A
R
7
=
1
9
9
7
W
E
E
K
1
9
L
I
N
E
C
Dimensions are shown in millimeters (inches)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
10.54 (.415)
10.29 (.405)
1 2 3
4
6.47 (.255)
6.10 (.240)
1.15 (.045 )
MIN
4.06 (.160)
3.55 (.140)
3.78 (.149)
3.54 (.139)
- A -
4.69 (.185)
4.20 (.165)
- B -
1.32 (.052)
1.22 (.048)
IRF3205Z
LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
0.93 (.037)
3X
1.40 (.055)
3X
1.15 (.045)
2.54 (.100 )
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB.
2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.
2X
0.69 (.027)
0.36 (.014) M B A M
0.55 (.022 )
3X
0.46 (.018 )
2.92 (.115)
2.64 (.104)
TO-220AB Part Marking Information
TO-220AB packages are not recommended for Surface Mount Application.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Automotive [Q101] market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 3/03
www.irf.com 9