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PD - 95106
IRF3205SPbF
IRF3205LPbF
l Advanced Process Technology
l Ultra Low On-Resistance
l Dynamic dv/dt Rating
l 175°C Operating Temperature
l Fast Switching
l Fully Avalanche Rated
l Lead-Free
G
Description
Advanced HEXFET® Power MOSFETs from International Rectifier
utilize advanced processing techniques to achieve extremely low onresistance per silicon area. This benefit, combined with the fast
switching speed and ruggedized device design that HEXFET power
MOSFETs are well known for, provides the designer with an extremely
efficient and reliable device for use in a wide variety of applications.
2
The D
accommodating die sizes up to HEX-4. It provides the highest power
capability and the lowest possible on-resistance in any existing surface
mount package. The D
because of its low internal connection resistance and can dissipate up
to 2.0W in a typical surface mount application.
The through-hole version (IRF3205L) is available for low-profile
applications.
Pak is a surface mount power package capable of
2
Pak is suitable for high current applications
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 110
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 80 A
I
DM
PD @TC = 25°C Power Dissipation 200 W
V
GS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 5.0 V/ns
T
J
T
STG
Pulsed Drain Current 390
Linear Derating Factor 1.3 W/°C
Gate-to-Source Voltage ± 20 V
Avalanche Current 62 A
Repetitive Avalanche Energy 20 mJ
Operating Junction and -55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Mounting torque, 6-32 or M3 srew 10 lbf•in (1.1N•m)
Thermal Resistance
Parameter Typ. Max. Units
R
θ JC
R
θ JA
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Junction-to-Case ––– 0.75 °C/W
Junction-to-Ambient (PCB mounted, steady-state)* ––– 40
HEXFET® Power MOSFET
D
S
D2Pak
IRF3205SPbF
V
DSS
R
DS(on)
ID = 110A
TO-262
IRF3205LPbF
= 55V
= 8.0mΩ
°C
03/11/04
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IRF3205S/LPbF
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆ V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
E
AS
Drain-to-Source Breakdown Voltage 55 ––– ––– V VGS = 0V, ID = 250µA
/∆ T
Breakdown Voltage Temp. Coefficient ––– 0.057 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 8.0 mΩ V GS = 10V, ID = 62A
Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA
Forward Transconductance 44 ––– ––– S VDS = 25V, ID = 62A
Drain-to-Source Leakage Current
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V
Gate-to-Source Reverse Leakage ––– ––– -100
––– ––– 25
––– ––– 250 VDS = 44V, VGS = 0V, TJ = 150°C
µA
nA
= 55V, VGS = 0V
V
DS
VGS = -20V
Total Gate Charge ––– ––– 146 ID = 62A
Gate-to-Source Charge ––– ––– 35 nC VDS = 44V
Gate-to-Drain ("Miller") Charge ––– ––– 54 VGS = 10V, See Fig. 6 and 13
Turn-On Delay Time ––– 14 ––– VDD = 28V
Rise Time ––– 101 ––– ID = 62A
Turn-Off Delay Time ––– 50 ––– RG = 4.5Ω
ns
Fall Time ––– 65 ––– VGS = 10V, See Fig. 10
4.5
Internal Drain Inductance
Internal Source Inductance ––– –––
––– –––
7.5
Between lead,
6mm (0.25in.)
nH
from package
and center of die contact
Input Capacitance ––– 3247 ––– VGS = 0V
Output Capacitance ––– 781 ––– VDS = 25V
Reverse Transfer Capacitance ––– 211 ––– pF ƒ = 1.0MHz, See Fig. 5
Single Pulse Avalanche Energy ––– 1050 264 mJ I
= 62A, L = 138µH
AS
D
G
S
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Starting T
RG = 25Ω , I
I
SD
TJ ≤ 175°C
* When mounted on 1" square PCB ( FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
2 www.irf.com
Continuous Source Current MOSFET symbol
(Body Diode)
Pulsed Source Current integral reverse
(Body Diode)
––– –––
––– –––
110
390
showing the
A
p-n junction diode.
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 62A, VGS = 0V
Reverse Recovery Time ––– 69 104 ns TJ = 25°C, IF = 62A
Reverse Recovery Charge ––– 143 215 nC di/dt = 100A/µs
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width ≤ 400µs; duty cycle ≤ 2%.
= 25°C, L = 138µH
J
= 62A. (See Figure 12)
AS
≤ 62A, di/dt ≤ 207A/µs, V
DD
≤ V
(BR)DSS
Calculated continuous current based on maximum allowable
junction temperature. Package limitation current is 75A.
This is a typical value at device destruction and represents
,
operation outside rated limits.
This is a calculated value limited to T
= 175°C.
J
G
D
S
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IRF3205S/LPbF
1000
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
1000
100
VGS
TOP
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20µs PULSE WIDTH
T = 25 C
J
V , Drain-to-Source Voltage (V)
DS
°
T = 25 C
J
T = 175 C
J
°
1000
100
TOP
BOTTOM
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
4.5V
10
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH
°
T = 175 C
1
0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
J
Fig 2. Typical Output Characteristics Fig 1. Typical Output Characteristics
2.5
2.0
°
1.5
I =
D
107A
1.0
10
D
I , Drain-to-Source Current (A)
V = 25V
DS
1
4 6 8 10 12
V , Gate-to-Source Voltage (V)
GS
20µs PULSE WIDTH
Fig 3. Typical Transfer Characteristics
(Normalized)
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
Fig 4. Normalized On-Resistance
V =
GS
°
10V
Vs. Temperature
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IRF3205S/LPbF
6000
5000
)
F
4000
p
(
e
c
n
a
t
i
3000
c
a
p
a
C
,
2000
C
1000
0
1 10 100
V
= 0V, f = 1 MHZ
GS
C
= C
iss
rss
oss
gs
= C
= C
C
C
Ciss
Coss
Crss
+ Cgd, C
gd
+ C
ds
gd
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
T = 175 C
100
°
J
SHORTED
ds
16
I =
62A
D
14
12
10
8
6
4
GS
V , Gate-to-Source Voltage (V)
2
0
0 20 40 60 80 100 120
Q , Total Gate Charge (nC)
G
V = 44V
DS
V = 27V
DS
V = 11V
DS
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
10000
OPERATION IN THIS AREA LIMITED
1000
BY R
DS(on)
10us
10
°
T = 25 C
J
1
SD
I , Reverse Drain Current (A)
V = 0 V
0.1
0.2 0.8 1.4 2.0 2.6
V ,Source-to-Drain Voltage (V)
SD
Fig 7. Typical Source-Drain Diode
Fig 7. Typical Source-Drain Diode
Forward Voltage
Forward Voltage
GS
100
100us
D
I , D r ai n C u r r ent ( A ) I , Drain Current (A)
10
°
= 25 C
C
T T= 175 C
Single Pulse
1
1 10 100 1000
°
J
V , Drain-to-Source Voltage (V)
DS
1ms
10ms
Fig 8. Maximum Safe Operating Area
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120
LIMITED BY PACKAGE
100
80
60
40
D
I , Drain Current (A)
20
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
IRF3205S/LPbF
R
D.U.T.
D.U.T.
D
t
t
d(off)tf
d(off)tf
+
V
-
V
V
DS
DS
V
V
GS
GS
R
R
G
G
10V
10V
Pulse Width ≤ 1 µs
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
Fig 10a. Switching Time Test Circuit
V
V
DS
DS
90%
90%
10%
10%
V
V
GS
GS
t
t
d(on)tr
d(on)tr
DD
Fig 9. Maximum Drain Current Vs.
Fig 9. Maximum Drain Current Vs.
Case Temperature
Case Temperature
1
D = 0.50
Fig 10b. Switching Time Waveforms
Fig 10b. Switching Time Waveforms
thJC
0.20
0.1
0.10
P
1 2
DM
t
1
t
2
0.05
0.02
Thermal Response(Z )
0.01
0.01
0.00001 0.0001 0.001 0.01 0.1 1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
SINGLE PULSE
(THERMAL RESPONSE)
Note s:
1. Duty factor D = t / t
2. Peak T = P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
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IRF3205S/LPbF
15V
DRIVER
R
V
G
20V
DS
L
D.U.T
I
AS
Ω
0.01
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
500
TOP
400
+
V
DD
-
300
200
100
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting T , Junction Temperature ( C)
J
BOTTOM
I
D
25A
44A
62A
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Current Regulator
Same Type as D.U.T.
50KΩ
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
12V
Fig 13b. Gate Charge Test Circuit
.2µF
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
I
D
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+
V
DS
-
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IRF3205S/LPbF
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
-
• dv/dt controlled by R
• Driver same type as D.U.T.
G
• I SD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Period
D =
P. W .
Period
+
+
V
DD
-
VGS=10V
*
D.U.T. ISDWaveform
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. VDSWaveform
Inductor Curent
* V
= 5V for Logic Level Devices
GS
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
V
DD
I
SD
Fig 14. For N-Channel HEXFETS
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IRF3205S/LPbF
2
D
Pak Package Outline
Dimensions are shown in millimeters (inches)
D2Pak Part Marking Information (Lead-Free)
T H IS IS AN IR F 530S WIT H
LOT CODE 8024
ASS E MBL E D ON WW 02, 2000
IN THE ASSEMBLY LINE "L"
N ote: "P" in as semb ly line
po s i tio n i nd icate s " L ead- F ree"
INT E R N AT ION AL
RECTIFIER
LOGO
AS SE MB LY
LOT CODE
F530S
PART NUMBE R
DATE CODE
YEAR 0 = 2000
WEEK 02
LINE L
OR
IN T E R N AT ION AL
RECTIFIER
LOGO
AS S EM B LY
LOT CODE
F 530S
8 www.irf.com
PART NUMB ER
DATE CODE
P = DESIGNATE S LEAD-FR EE
PRODUCT (OPTIONAL)
YEAR 0 = 2000
WEEK 02
A = ASSEMBLY SITE CODE
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TO-262 Package Outline
IRF3205S/LPbF
IGBT
1- GATE
2- COLLECTOR
3- EMITTER
TO-262 Part Marking Information
TH IS IS AN IRL 3103L
EXAMPLE:
LOT CODE 1789
ASS EMBLE D ON WW 19, 1997
IN THE ASS EMBLY LINE "C"
Note: "P" in ass embly line
pos iti on indicates "Lead-F ree"
INTE RNAT IONAL
RECTIFIER
LOGO
AS S E MB L Y
LOT CODE
PART NUMBE R
DATE CODE
YEAR 7 = 1997
WEEK 19
LINE C
OR
INTE RNATIONAL
RECT IFIE R
LOGO
ASSEMBLY
LOT CODE
www.irf.com 9
PART NUMBER
DAT E CODE
P = DES IGNATE S LE AD-F REE
PRODUCT (OPT IONAL)
YEAR 7 = 1997
WE EK 19
A = ASSEMBLY SITE CODE
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IRF3205S/LPbF
D2Pak Tape & Reel Infomation
Dimensions are shown in millimeters (inches)
TRR
FEED DI RECTION
TRL
FEED DI RECTION
1.85 (.073)
1.65 (.065)
10.90 (.429)
10.70 (.421)
4.10 (.161)
3.90 (.153)
1.60 (.063)
1.50 (.059)
11.60 (.457)
11.40 (.449)
16.10 (.634)
15.90 (.626)
1.60 (.063)
1.50 (.059)
1.75 (.069)
1.25 (.049)
15.42 (.609)
15.22 (.601)
0.368 (.0145)
0.342 (.0135)
24.3 0 (.95 7)
23.9 0 (.94 1)
4.72 (.136)
4.52 (.178)
13.50 (.532)
12.80 (.504)
330.00
(14.173)
MAX.
NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
This product has been designed and qualified for the industrial market.
27.40 (1.079)
23.90 ( .941)
4
60.00 (2. 362)
MIN.
30.40 (1.197)
26.40 (1.039)
24.40 (.961)
3
MA X.
4
Data and specifications subject to change without notice.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.03/04
10 www.irf.com
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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/