Specifically designed for Automotive applications, this HEXFET® Power
MOSFET utilizes the latest processing techniques to achieve extremely
low on-resistance per silicon area. Additional features of this design are
a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this
design an extremely efficient and reliable device for use in Automotive
applications and a wide variety of other applications.
Absolute Maximum Ratings
ParameterMax.Units
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V (Silicon limited)280
ID @ TC = 100°CContinuous Drain Current, VGS @ 10V (See Fig.9)200A
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V (Package limited)75
I
DM
PD @TC = 25°CPower Dissipation330W
V
GS
E
AS
E
(tested)Single Pulse Avalanche Energy Tested Value1160
AS
I
AR
E
AR
T
J
T
STG
Pulsed Drain Current 1080
Linear Derating Factor2.2W/°C
Gate-to-Source Voltage ± 20V
Single Pulse Avalanche Energy670mJ
Avalanche CurrentSee Fig.12a, 12b, 15, 16A
Repetitive Avalanche EnergymJ
Operating Junction and-55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds300 (1.6mm from case )
Mounting Torque, 6-32 or M3 screw10 lbf•in (1.1N•m)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRF2804
A
15V
DRIVER
+
V
DD
-
R
20V
V
V
DS
G
GS
L
D.U.T
I
AS
Ω
0.01
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
1600
)
J
m
(
y
g
r
e
1200
n
E
e
h
c
n
a
l
a
800
v
A
e
s
l
u
P
e
l
400
g
n
i
S
,
S
A
E
0
255075100125150175
I
TOP 31A
53A
BOTTOM 75 A
Starting TJ, Junction Temperature (°C)
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
4.0
D
)
V
V
G
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
+
V
DS
-
I
D
Fig 13b. Gate Charge Test Circuit
(
e
g
a
t
l
o
3.0
V
d
l
o
h
s
e
r
h
t
e
t
a
2.0
G
)
h
t
(
S
G
V
1.0
-75 -50 -25 025 50 75 100 125 150 175
ID = 250µA
TJ , Temperature ( °C )
Fig 14. Threshold Voltage Vs. Temperature
6www.irf.com
Page 7
IRF2804
10000
Duty Cycle = Single Pulse
1000
)
A
(
t
n
e
r
r
u
C
100
e
h
c
n
a
l
a
v
A
10
1
1.0E-071.0E-061.0E-051.0E-041.0E-031.0E-021.0E-01
0.01
0.05
0.10
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
avalanche losses. Note: In no
case should Tj be allowed to
exceed Tjmax
800
TOP Single Pulse
BOTTOM 10% Duty Cycle
)
J
m
600
(
y
g
r
e
n
E
e
400
h
c
n
a
l
a
v
A
,
200
R
A
E
ID = 75A
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
every part type.
2. Safe operation in Avalanche is allowed as long asT
not exceeded.
. This is validated for
jmax
jmax
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. P
avalanche pulse.
= Average power dissipation per single
D (ave)
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
0
255075100125150175
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
Vs. Temperature
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
·f
av
D (ave)·tav
thJC
www.irf.com7
is
Page 8
IRF2804
+
-
+
-
Reverse
Recovery
Current
Driver Gate Drive
D.U.T. ISDWaveform
D.U.T. VDSWaveform
D.U.T
+
-
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
+
V
DD
R
G
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
Re-Applied
Voltage
Inductor Curent
* V
GS
Period
P.W.
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
1 DIMENSIONING & TOLERANCING PER ANS I Y14.5M, 1982. 3 OUTLINE CONFORMS TO JED EC OUTLINE TO-220A B.
2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASU REMENTS DO NOT INCLUDE BURRS.
2X
0.69 (.027)
0.36 (.014) M B A M
0.55 (.022)
3X
0.46 (.018)
2.92 (.115)
2.64 (.104)
TO-220AB Part Marking Information
(;$03/(7+,6,6$1,5)
/27&2'($66(0%/('21,17+($66(0%
:
/</,1(&
:
,17(51$7,21
5(&7,),(5
/2*
2
$66(0%//27&2'
$
/
<
(
TO-220AB package is not recommended for Surface Mount Application.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Automotive [Q101] market.
Qualification Standards can be found on IR’s Web site.
3$57180%(5
'$7
(
&2'(<($5:((./,1
(
&
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 12/02
www.irf.com9
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.