Specifically designed for Automotive applications, this HEXFET® Power MOSFET
utilizes the lastest processing techniques to achieve extremely low on-resistance
per silicon area. Additional features of this design are a 175°C junction operating
temperature, fast switching speed and improved repetitive avalanche rating.
These features combine to make this design an extremely efficient and reliable
device for use in Automotive applications and a wide variety of other applications.
TO-220AB
Absolute Maximum Ratings
ParameterMax.Units
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V210
ID @ TC = 100°CContinuous Drain Current, VGS @ 10V150A
I
DM
PD @TC = 25°CPower Dissipation330W
V
GS
E
AS
I
AR
E
AR
T
J
T
STG
Pulsed Drain Current 850
Linear Derating Factor2.2W/°C
Gate-to-Source Voltage ± 20V
Single Pulse Avalanche Energy460mJ
Avalanche CurrentSee Fig.12a, 12b, 15, 16A
Repetitive Avalanche EnergymJ
Operating Junction and-55 to + 175°C
Storage Temperature Range
Soldering Temperature, for 10 seconds300 (1.6mm from case )
Mounting Torque, 6-32 or M3 screw10 lbf•in (1.1N•m)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRF2204
A
15V
DRIVER
+
-
V
R
G
20V
V
DS
t
L
D.U.T
I
AS
Ω
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
.2µF
12V
V
GS
3mA
.3µF
D.U.T.
+
V
DS
-
DD
900
TOP
750
600
450
300
150
AS
E , Single Pulse Avalanche Energy (mJ)
0
255075100125150175
Starting Tj, Junction Temperature( C)
BOTTOM
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
4.0
)
V
(
3.5
e
g
a
t
l
o
3.0
V
d
l
o
h
s
2.5
e
r
h
t
e
t
a
2.0
G
)
h
t
(
S
1.5
G
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
ID = 250µA
I
D
52A
91A
130A
I
I
G
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
D
Fig 14. Threshold Voltage Vs. Temperature
6www.irf.com
Page 7
IRF2204
)
A
(
t
n
e
r
r
u
C
e
h
c
n
a
l
a
v
A
1000
Duty Cycle = Singl e Pulse
0.01
100
0.05
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
avalanche losses
0.10
10
1
1.0E-071.0E-061.0E-051.0E-041.0E-031.0E-021.0E-01
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
500
TOP Single Pulse
)
J
400
m
(
y
g
r
e
n
300
E
e
h
c
n
a
l
200
a
v
A
,
R
A
100
E
0
255075100125150175
BOTTOM 10% Duty Cycle
ID = 210A
Starting TJ , Junction Temperature (°C)
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
2. Safe operation in Avalanche is allowed as long asT
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. P
= Average power dissipation per single
D (ave)
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
av
·f
jmax
is
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
Fig 16. Maximum Avalanche Energy
Vs. Temperature
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
D (ave)·tav
thJC
www.irf.com7
Page 8
IRF2204
+
-
Peak Diode Recovery dv/dt Test Circuit
D.U.T*
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
+
-
-
+
R
G
V
GS
• dv/dt controlled by R
• I
controlled by Duty Factor "D"
SD
• D.U.T. - Device Under Test
G
V
DD
* Reverse Polarity of D.U.T for P-Channel
Driver Gate Drive
P.W.
Period
D =
P.W.
Period
VGS=10V
[ ] ***
D.U.T. ISDWaveform
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. VDSWaveform
Inductor Curent
*** V
= 5.0V for Logic Level and 3V Drive Devices
GS
Fig 17. For N-channel HEXFET
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
®
power MOSFETs
V
DD
[ ]
I
[ ]
SD
8www.irf.com
Page 9
TO-220AB Package Outline
A
Dimensions are shown in millimeters (inches)
10.54 (.415)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
10.29 (.405)
1 2 3
6.47 (.255)
6.10 (.240)
4
1.15 (.045)
MIN
4.06 (.160)
3.55 (.140)
3.78 (.149)
3.54 (.139)
- A -
4.69 (.185)
4.20 (.165)
- B -
1.32 (.052)
1.22 (.048)
LEAD AS SIGN MENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
IRF2204
0.93 (.037)
3X
1.40 (.055)
3X
1.15 (.045)
2.54 (.100)
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB.
2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.
2X
0.69 (.027)
0.36 (.014) M B A M
TO-220AB Part Marking Information
EXAMPLE : THIS IS AN IRF1010
WITH ASSEMBLY
LOT CODE 9B1M
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
Starting T
RG = 25Ω, I
I
SD
= 25°C, L = 0.06mH
J
= 130A. (See Figure 12).
AS
≤ 130A, di/dt ≤ 170A/µs, V
DD
≤ V
(BR)DSS
TJ ≤ 175°C.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
This product has been designed and qualified for the Automotive [Q101] market.
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY
LOT CODE
C
eff. is a fixed capacitance that gives the same charging time
oss
as C
oss
Calculated continuous current based on maximum allowable
junction temperature. Package limitation current is 75A.
,
Limited by T
avalanche performance.
Data and specifications subject to change without notice.
Qualification Standards can be found on IR’s Web site.
while V
0.55 (.022)
3X
0.46 (.018)
2.92 (.115)
2.64 (.104)
PART NUMBER
IRF1010
9246
9B 1M
DATE CODE
(YYWW)
YY = YEAR
WW = WEEK
is rising from 0 to 80% V
DS
, see Fig.12a, 12b, 15, 16 for typical repetitive
Jmax
DSS
.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.08/02
www.irf.com9
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