Datasheet irf2204 Datasheet

Page 1
AUTOMOTIVE MOSFET
PD - 94434
IRF2204
Typical Applications
● Electric Power Steering
● 14 Volts Automotive Electrical Systems
HEXFET® Power MOSFET
D
V
= 40V
DSS
Features
● Advanced Process Technology
● Ultra Low On-Resistance
● Dynamic dv/dt Rating
● 175°C Operating Temperature
● Fast Switching
● Repetitive Avalanche Allowed up to Tjmax
G
S
R
DS(on)
= 3.6mΩ
ID = 210A
Description
Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the lastest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications.
TO-220AB
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 210 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 150 A I
DM
PD @TC = 25°C Power Dissipation 330 W
V
GS
E
AS
I
AR
E
AR
T
J
T
STG
Pulsed Drain Current 850
Linear Derating Factor 2.2 W/°C Gate-to-Source Voltage ± 20 V Single Pulse Avalanche Energy 460 mJ Avalanche Current See Fig.12a, 12b, 15, 16 A Repetitive Avalanche Energy mJ Operating Junction and -55 to + 175 °C Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case ) Mounting Torque, 6-32 or M3 screw 10 lbf•in (1.1N•m)
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θCS
R
θJA
Junction-to-Case ––– 0.45 Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/W Junction-to-Ambient ––– 62
www.irf.com 1
08/07/02
Page 2
IRF2204
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C
oss
C
oss
C
eff. Effective Output Capacitance ––– 2380 ––– VGS = 0V, VDS = 0V to 32V
oss
Drain-to-Source Breakdown Voltage 40 –– – –– – V VGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.041 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– 3.0 3.6 mΩ VGS = 10V, ID = 130A Gate Threshold Voltage 2.0 ––– 4.0 V VDS = 10V, ID = 250µA Forward Transconductance 120 ––– ––– S VDS = 10V, ID = 130A
Drain-to-Source Leakage Current
––– ––– 20
––– ––– 250 VDS = 32V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 200 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -200
VDS = 40V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge –– – 130 200 ID = 130A Gate-to-Source Charge ––– 35 52 nC VDS = 32V Gate-to-Drain ("Miller") Charge ––– 39 59 VGS = 10V Turn-On Delay Time ––– 15 ––– VDD = 20V Rise Time ––– 140 ––– ID = 130A Turn-Off Delay Time ––– 62 ––– RG = 2.5Ω
ns
Fall Time ––– 110 ––– VGS = 10V
4.5
Internal Drain Inductance
Internal Source Inductance ––– –––
––– –––
7.5
Between lead,
6mm (0.25in.)
nH
from package
and center of die contact Input Capacitance ––– 5890 ––– VGS = 0V Output Capacitance ––– 1570 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 130 ––– ƒ = 1.0MHz, See Fig. 5 Output Capacitance ––– 8000 ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz Output Capacitance ––– 1370 ––– VGS = 0V, VDS = 32V, ƒ = 1.0MHz
D
G
S
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode)
––– –––
––– –––
210
850
showing the
A
p-n junction diode.
G
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 130A, VGS = 0V Reverse Recovery Time ––– 68 100 n s TJ = 25°C, IF = 130A Reverse RecoveryCharge ––– 120 180 nC di/dt = 100A/µs
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
2 www.irf.com
D
S
Page 3
IRF2204
10000
1000
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
V , Drain-to-Source Voltage (V)
DS
4.5V
20µs PULSE WIDTH
°
T = 25 C
J
1000.00
)
Α
(
t
n
e
r
r
u C e
c
r
100.00
u
o S
-
o
t
-
n
i
a
r D
,
D
I
10.00
TJ = 25°C
V
= 25V
DS
20µs PULSE WIDTH
4.0 5.0 6.0 7.0 8.0 9.0 10.0
VGS, Gate-to-Source Voltage (V)
TJ = 175°C
10000
1000
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
V , Drain-to-Source Voltage (V)
DS
4.5V
20µs PULSE WIDTH T = 175 C
J
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
2.5
210A
I =
D
2.0
1.5
(Normalized)
1.0
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
°
V =
°
10V
GS
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
www.irf.com 3
Page 4
IRF2204
100000
10000
) F
p
(
e
c
n
a
t
i
1000
c
a
p
a C
, C
100
10
1 10 100
V
= 0V, f = 1 MHZ
GS
C
= C
iss rss oss
= C
= C
gs gd ds
+ C
C C
Coss
Crss
+ Cgd, C
gd
Ciss
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
°
T = 175 C
J
10
°
T = 25 C
1
0.1
0.0 0.5 1.0 1.5 2.0 2.5
V ,Source-to-Drain Voltage (V)
SD
J
SD
I , Reverse D rain Current (A)
100
SHORTED
ds
V = 0 V
GS
12
I
=
130A
D
10
8
6
4
GS
2
V , Gate-to-Source Voltage (V)
0
0 30 60 90 120 150
Q , Tota l Ga te C h a rge (nC )
G
V = 32V
DS
V = 20V
DS
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
10000
OPERATION IN THIS AREA
) A
(
t
1000
n
e
r
r
u C e
c
r
u
100
o S
-
o
t
-
n
i
a
r
10
D ,
Tc = 25°C
D
I
Tj = 175°C Single Pulse
1
1 10 100
LIMITED BY RDS(on)
V
, Drain-toSource V oltage (V)
DS
100µsec
1msec
10msec
Fig 7. Typical Source-Drain Diode
Fig 8. Maximum Safe Operating Area
Forward Voltage
4 www.irf.com
Page 5
IRF2204
+
-
250
LIMITED BY PACKAGE
200
150
100
D
I , Drain Current (A)
50
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
Fig 9. Maximum Drain Current Vs.
Case Temperature
1
R
V
DS
V
GS
R
G
D
D.U.T.
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
t
d(off)tf
Fig 10b. Switching Time Waveforms
V
DD
D = 0.50
thJC
Thermal Response (Z )
0.001
0.20
0.1
0.10
0.05
0.02
0.01
0.01
0.00001 0.0001 0.001 0.01 0.1 1
SINGLE PULSE
(THERMAL RESPONSE)
t , Rectangular Pulse Duration (sec)
1
P
DM
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
1 2
J DM thJC C
t
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com 5
Page 6
IRF2204
A
15V
DRIVER
+
-
V
R
G
20V
V
DS
t
L
D.U.T
I
AS
Ω
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
.2µF
12V
V
GS
3mA
.3µF
D.U.T.
+
V
DS
-
DD
900
TOP
750
600
450
300
150
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting Tj, Junction Temperature ( C)
BOTTOM
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
4.0
) V
(
3.5
e
g
a
t
l
o
3.0
V d
l
o
h
s
2.5
e
r
h
t e
t
a
2.0
G
)
h
t
( S
1.5
G
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
ID = 250µA
I
D 52A 91A
130A
I
I
G
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
D
Fig 14. Threshold Voltage Vs. Temperature
6 www.irf.com
Page 7
IRF2204
) A
(
t
n
e
r
r
u C e
h
c
n
a
l
a
v A
1000
Duty Cycle = Singl e Pulse
0.01
100
0.05
Allowed avalanche Current vs avalanche pulsewidth, tav assuming ∆Tj = 25°C due to avalanche losses
0.10
10
1
1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
500
TOP Single Pulse
)
J
400
m
( y
g
r
e
n
300
E e
h
c
n
a
l
200
a
v A
,
R A
100
E
0
25 50 75 100 125 150 175
BOTTOM 10% Duty Cycle ID = 210A
Starting TJ , Junction Temperature (°C)
Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
2. Safe operation in Avalanche is allowed as long asT not exceeded.
3. Equation below based on circuit and waveforms shown in Figures 12a, 12b.
4. P
= Average power dissipation per single
D (ave)
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
av
·f
jmax
is
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
Fig 16. Maximum Avalanche Energy
Vs. Temperature
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
D (ave)·tav
thJC
www.irf.com 7
Page 8
IRF2204
+
-
Peak Diode Recovery dv/dt Test Circuit
D.U.T*
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
+
-
-
+
R
G
V
GS
• dv/dt controlled by R
• I
controlled by Duty Factor "D"
SD
• D.U.T. - Device Under Test
G
V
DD
* Reverse Polarity of D.U.T for P-Channel
Driver Gate Drive
P.W.
Period
D =
P.W.
Period
VGS=10V
[ ] ***
D.U.T. ISDWaveform
Reverse Recovery Current
Re-Applied Voltage
D.U.T. VDSWaveform
Inductor Curent
*** V
= 5.0V for Logic Level and 3V Drive Devices
GS
Fig 17. For N-channel HEXFET
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
®
power MOSFETs
V
DD
[ ]
I
[ ]
SD
8 www.irf.com
Page 9
TO-220AB Package Outline
A
Dimensions are shown in millimeters (inches)
10.54 (.415)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
10.29 (.405)
1 2 3
6.47 (.255)
6.10 (.240)
4
1.15 (.045) MIN
4.06 (.160)
3.55 (.140)
3.78 (.149)
3.54 (.139)
- A -
4.69 (.185)
4.20 (.165)
- B -
1.32 (.052)
1.22 (.048)
LEAD AS SIGN MENTS 1 - GATE 2 - DRAIN 3 - SOURCE 4 - DRAIN
IRF2204
0.93 (.037)
3X
1.40 (.055)
3X
1.15 (.045)
2.54 (.100)
NOTES: 1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB. 2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.
2X
0.69 (.027)
0.36 (.014) M B A M
TO-220AB Part Marking Information
EXAMPLE : THIS IS AN IRF1010 WITH ASSEMBLY LOT CODE 9B1M
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
 Starting T
RG = 25Ω, I
I
SD
= 25°C, L = 0.06mH
J
= 130A. (See Figure 12).
AS
≤ 130A, di/dt ≤ 170A/µs, V
DD
≤ V
(BR)DSS
TJ ≤ 175°C.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
This product has been designed and qualified for the Automotive [Q101] market.
INTERNATIONAL RECTIFIER LOGO
ASSEMBLY LOT CODE
C
eff. is a fixed capacitance that gives the same charging time
oss
as C
oss
Calculated continuous current based on maximum allowable
junction temperature. Package limitation current is 75A.
,
Limited by T
avalanche performance.
Data and specifications subject to change without notice.
Qualification Standards can be found on IR’s Web site.
while V
0.55 (.022)
3X
0.46 (.018)
2.92 (.115)
2.64 (.104)
PART NUMBER
IRF1010
9246
9B 1M
DATE CODE (YYWW) YY = YEAR WW = WEEK
is rising from 0 to 80% V
DS
, see Fig.12a, 12b, 15, 16 for typical repetitive
Jmax
DSS
.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.08/02
www.irf.com 9
Loading...