Datasheet irf1405z Datasheet

Page 1
PD - 94645
AUTOMOTIVE MOSFET
HEXFET® Power MOSFET
Features
l Advanced Process Technology l Ultra Low On-Resistance l 175°C Operating Temperature l Fast Switching l Repetitive Avalanche Allowed up to Tjmax
Description
Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and im­proved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications.
Absolute Maximum Ratings
Parameter Units
ID @ TC = 25°C ID @ TC = 100°C I
@ TC = 25°C
D
I
DM
PD @TC = 25°C
V
GS
E
AS (Thermally limited)
(Tested )
E
AS
I
AR
E
AR
T
J
T
STG
Continuous Drain Current, V Continuous Drain Current, V Continuous Drain Current, V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Single Pulse Avalanche Energy Tested Value Avalanche Current Repetitive Avalanche E nergy Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting Torque, 6-32 or M3 screw
c
c
@ 10V (Silicon Limited)
GS
@ 10V
GS
@ 10V (Package Limited)
GS
d
g
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θCS
R
θJA
Junction-to-Case ––– 0.65 Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/W Junction-to-Ambient ––– 62
G
h
See Fig.12a, 12b, 15, 16
300 (1.6mm from case )
IRF1405Z
D
V
DSS
R
S
Max.
150 110
600 230
1.5
± 20
270 420
-55 to + 175
y
in (1.1Nym)
10 lbf
75
ID = 75A
TO-220AB
= 55V
= 4.9mΩ
A
W
W/°C
V
mJ
A
mJ
°C
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03/27/03
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IRF1405Z
/
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
V
(BR)DSS
∆V
(BR)DSS
R
DS(on)
V
GS(th)
gfs Forward Transconductance 88 ––– ––– S I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C
oss
C
oss
eff.
C
oss
Drain-to-Source Breakdown Voltage 55 ––– ––– V
∆T
Breakdown Voltage Temp. Coeffi cient ––– 0.049 ––– V/°C
J
Static Drain-to-Source On-Resistance ––– 3.7 4.9 Gate Threshold Voltage 2.0 ––– 4.0 V
VGS = 0V, ID = 250µA Reference to 25°C, I
mΩ
V VDS = VGS, ID = 250µA V
Drain-to-Source Leakage Current ––– ––– 20 µA
––– ––– 250 Gate-to-Source Forward Leakage ––– ––– 200 nA Gate-to-Source Reverse Leakage ––– ––– -200 Total Gate Charge ––– 120 180 Gate-to-Source Charge ––– 31 ––– nC Gate-to-Drain ("Miller") Charge ––– 46 ––– Turn-On Delay Time ––– 18 ––– Rise Time ––– 110 ––– Turn-Off Delay Time ––– 48 ––– ns Fall Time ––– 82 –––
V V V V I V VGS = 10V VDD = 25V I R VGS = 10V
Internal Drain Inductance ––– 4.5 ––– Between lead,
nH 6mm (0.25in.)
Internal Source Inductanc e ––– 7.5 ––– from package
and center of die contact
Input Capacitance ––– 4780 ––– Output Capacitance ––– 770 ––– Reverse Transfer Capacitance ––– 410 ––– pF Output Capacitance ––– 2730 ––– Output Capacitance ––– 600 ––– Effective Output Capacitance ––– 910 –––
VGS = 0V V ƒ = 1.0MHz VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz V V
GS
DS DS DS GS GS
= 75A
D
DS
= 75A
D
G
DS
GS GS
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units
I
S
Continuous Source Current ––– ––– 75 (Body Diode) A
I
SM
V
SD
t
rr
Q
rr
t
on
Pulsed Source Current ––– ––– 600 (Body Diode)
c
Diode Forward Voltage ––– ––– 1.3 V Reverse Recovery Time ––– 30 46 ns Reverse Recovery Charge ––– 30 45 nC Forward Turn-On Time
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
 Limited by T
RG = 25Ω, I
, starting TJ = 25°C, L = 0.10mH
Jmax
= 75A, VGS =10V. Part not
AS
recommended for use above this value.
Pulse width ≤ 1.0ms; duty cycle ≤ 2%.
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
C
eff. is a fixed capacitance that gives the same charging time
oss
as C
Limited by T
oss
while V
is rising from 0 to 80% V
DS
, see Fig.12a, 12b, 15, 16 for typical repetitive
Jmax
avalanche performance.
This value determined from sample failure population. 100%
tested to this value in production.
MOSFET symbol showing the
integral reverse p-n junction diode.
T
= 25°C, IS = 75A, VGS = 0V
J
TJ = 25°C, IF = 75A, VDD = 25V di/dt = 100A/µs
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Conditions
= 1mA
D
= 10V, ID = 75A
e
= 25V, ID = 75A = 55V, VGS = 0V = 55V, VGS = 0V, TJ = 125°C = 20V = -20V
= 44V
e
= 4.4Ω
e
G
= 25V
= 0V, VDS = 44V, ƒ = 1.0MHz = 0V, VDS = 0V to 44V
f
Conditions
G
e
.
DSS
D
S
D
S
e
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IRF1405Z
) A
(
t
n
e
r
r
u C e
c
r
u
o S
-
o
t
-
n
i
a
r D
, I
D
1000
100
10
TOP 15V
BOTTOM 4.5V
VGS 10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
20µs PULSE WIDTH Tj = 25°C
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
1000
) A
(
t
n
e
r
r
u C e
c
r
u
o S
-
o
t
-
n
i
a
r D
, I
D
1000
100
10
TOP 15V
BOTTOM 4.5V
VGS 10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
20µs PULSE WIDTH Tj = 175°C
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
200
)
175
)
Α
(
t
n
e
r
100
r
u C e
c
r
u
o S
-
o
t
-
n
10
i
a
r D
,
D
I
TJ = 25°C
V
DS
TJ = 150°C
= 25V
20µs PULSE WIDTH
1
4 6 8 10 12
VGS, Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
S
( e
c
150
n
a
t
c
u
125
d
n
o
c
s
100
n
a
r T
d
75
r
a w
r
o
50
F
,
s
f
G
25
TJ = 25°C
TJ = 175°C
0
0 25 50 75 100 125 150 175 200
ID,Drain-to-Source Current (A)
Fig 4. Typical Forward Transconductance
vs. Drain Current
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Page 4
IRF1405Z
100000
) F
10000
p
(
e
c
n
a
t
i
c
a
p
a C
,
1000
C
100
V
= 0V, f = 1 MHZ
GS
C
= C
iss rss oss
= C
= C
gs
gd
ds
C C
1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance vs.
Drain-to-Source Voltage
1000.00
+ Cgd, C
+ C
gd
SHORTED
ds
C
iss
C
oss
C
rss
) V
( e
g
a
t
l
o V
e
c
r
u
o S
-
o
t
-
e
t
a G
,
S G
V
10000
12.0 ID= 75A
10.0
8.0
6.0
4.0
2.0
0.0 0 20 40 60 80 100 120
Q
VDS= 44V VDS= 28V
Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge vs.
Gate-to-Source Voltage
OPERATION IN THIS AREA
) A
(
t
100.00
n
e
r
r
u C n
i
a
r
10.00
D e
s
r
e
v
e R
,
1.00
D S
I
0.10
TJ = 175°C
TJ = 25°C
0.0 0.5 1.0 1.5 2.0 2.5 VSD, Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode
V
GS
= 0V
) A
(
t
1000
n
e
r
r
u C e
c
r
u
100
o S
-
o
t
-
n
i
a
r D
10
,
D
I
Tc = 25°C Tj = 175°C Single Pulse
1
1 10 100 1000
Fig 8. Maximum Safe Operating Area
LIMITED BY RDS(on)
100µsec
1msec 10msec
VDS, Drain-to-Source Voltage (V)
Forward Voltage
4 www.irf.com
Page 5
IRF1405Z
150
125
) A
(
100
t
n
e
r
r
u C
75
n
i
a
r D
50
,
D
I
25
0
25 50 75 100 125 150 175
TC , Case Temperature (°C)
Limited By Package
Fig 9. Maximum Drain Current vs.
Case Temperature
1
2.5
e
c
n
a
t
s
i
s
e R n O e
c
r
u
o S
-
o
t
-
n
i
a
r D
,
)
n
o
( S D
R
ID = 75A V
= 10V
GS
2.0
)
d
e
z
i
l
1.5
a m
r
o N
(
1.0
0.5
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (°C)
Fig 10. Normalized On-Resistance
vs. Temperature
)
C
J
h
t
Z (
e
s
n
o
p
s
e R
l
a m
r
e
h T
0.001
D = 0.50
0.1
0.01
0.20
0.10
0.05
0.02
0.01 SINGLE PULSE
( THERMAL RESPONSE )
1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10
t1 , Rectangular Pulse Duration (sec)
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRF1405Z
A
15V
DRIVER
+
-
V
DD
R
G
V
20V
V
DS
GS
L
D.U.T
I
AS
0.01
t
p
Ω
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
500
)
J m
( y
g
400
r
e
n E
e
h
c
300
n
a
l
a
v A
e
s
200
l
u P
e
l
g
n
i
100
S
,
S A
E
0
25 50 75 100 125 150 175
TOP 31A
BOTTOM 75A
Starting TJ , Junction Temperature (°C)
Fig 12c. Maximum Avalanche Energy
vs. Drain Current
4.0
I
D
53A
) V
(
V
G
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
+
V
DS
-
I
D
Fig 13b. Gate Charge Test Circuit
3.5
e
g
a
t
l
o
3.0
V d
l
o
h
s
2.5
e
r
h
t e
t
a
2.0
G
)
h
t
( S
1.5
G
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175 200
ID = 250µA
TJ , Temperature ( °C )
Fig 14. Threshold Voltage vs. Temperature
6 www.irf.com
Page 7
IRF1405Z
10000
Duty Cycle = Single Pulse
1000
) A
(
t
n
e
r
r
u C
100
e
h
c
n
a
l
a
v A
10
0.01
0.05
0.10
1
1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
Fig 15. Typical Avalanche Current vs.Pulsewidth
Allowed avalanche Current vs avalanche pulsewidth, tav assuming ∆Tj = 25°C due to avalanche losses
300
TOP Single Pulse
250
)
J m
( y
g
200
r
e
n E
e
h
150
c
n
a
l
a
v
100
A
,
R A
E
50
0
25 50 75 100 125 150 175
BOTTOM 10% Duty Cycle ID = 75A
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
2. Safe operation in Avalanche is allowed as long asT
jmax
not exceeded.
3. Equation below based on circuit and waveforms shown in Figures 12a, 12b.
4. P
= Average power dissipation per single
D (ave)
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
·f
av
D (ave)·tav
thJC
www.irf.com 7
is
Page 8
IRF1405Z
Reverse Recovery Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied Voltage
+
-
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P.W.
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
R
D.U.T.
D
+
V
DD
-
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 18a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
t
d(off)tf
Fig 18b. Switching Time Waveforms
8 www.irf.com
Page 9
TO-220AB Package Outline
E
X
A
M
P
L
E
:
T
H
I
S
I
S
A
N
I
R
F
1
0
1
0
L
O
T
C
O
D
E
1
7
8
9
A
S
S
E
M
B
L
E
D
O
N
W
W
1
9
,
1
9
9
7
I
N
T
H
E
A
S
S
E
M
B
L
Y
L
I
N
E
"
C
"
I
N
T
E
R
N
A
T
I
O
N
A
L
R
E
C
T
I
F
I
E
R
L
O
G
O
A
S
S
E
M
B
L
Y
L
O
T
C
O
D
E
P
A
R
T
N
U
M
B
E
R
D
A
T
E
C
O
D
E
Y
E
A
R
7
=
1
9
9
7
W
E
E
K
1
9
L
I
N
E
C
Dimensions are shown in millimeters (inches)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
10.54 (.415)
10.29 (.405)
1 2 3
4
6.47 (.255)
6.10 (.240)
1.15 (.045 ) MIN
4.06 (.160)
3.55 (.140)
3.78 (.149)
3.54 (.139)
- A -
4.69 (.185)
4.20 (.165)
- B -
1.32 (.052)
1.22 (.048)
IRF1405Z
LEAD ASSIGNMENTS 1 - GATE 2 - DRAIN 3 - SOURCE 4 - DRAIN
0.93 (.037)
3X
1.40 (.055)
3X
1.15 (.045)
2.54 (.100 )
NOTES: 1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB. 2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.
2X
0.69 (.027)
0.36 (.014) M B A M
0.55 (.022 )
3X
0.46 (.018 )
2.92 (.115)
2.64 (.104)
TO-220AB Part Marking Information
TO-220AB packages are not recommended for Surface Mount Application.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Automotive [Q101] market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 03/03
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