Datasheet ipg20n06s2l-65_ds_10 Datasheet

Page 1
IPG20N06S2L-65
OptiMOS® Power-Transistor
Features
• Dual N-channel Logic Level - Enhancement mode
• AEC Q101 qualified
• MSL1 up to 260°C peak reflow
• Green Product (RoHS compliant)
• 100% Avalanche tested
Product Summary
V
DS
R
DS(on),max
I
D
3)
55 V
65
20 A
PG-TDSON-8-4
mΩ
Type Package Marking
IPG20N06S2L-65 PG-TDSON-8-4 2N06L65
Maximum ratings, at T
Parameter Symbol Conditions Unit
Continuous drain current
one channel active
Pulsed drain current one channel active
Avalanche energy, single pulse
Avalanche current, single pulse
Gate source voltage
=25 °C, unless otherwise specified
j
I
1)
1)
1, 3)
3)
D
I
D,pulse
E
AS
I
AS
V
GS
Value
TC=25 °C, VGS=10 V
T
=100 °C, VGS=10 V
C
-
ID=10A
-
14
20 A
80
40 mJ
15 A
- ±20 V
Power dissipation one channel active
Operating and storage temperature
P
tot
T
, T
j
TC=25 °C
- -55 ... +175 °C
stg
43 W
IEC climatic category; DIN IEC 68-1 - - 55/175/56
Rev. 1.0 page 1 2009-09-07
Page 2
IPG20N06S2L-65
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
SMD version, device on PCB
Electrical characteristics, at T
1)
R
thJC
R
thJA
=25 °C, unless otherwise specified
j
- - - 3.5 K/W
minimal footprint - 100 -
6 cm
2
cooling area
2)
-60-
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
V
GS(th)
3)
I
DSS
=0 V, ID= 1 mA
VDS=VGS, ID=14 µA
VDS=55 V, VGS=0 V, T
=25 °C
j
55 - - V
1.2 1.6 2.0
- 0.01 1 µA
Gate-source leakage current
3)
Drain-source on-state resistance
V
=55 V, VGS=0 V,
DS
T
=125 °C
j
I
GSS
3)
R
DS(on)
VGS=20 V, VDS=0 V
VGS=4.5 V, ID=7.5A
V
GS
2)
=10 V, ID=15A
- 1 100
- 1 100 nA
-6779
mΩ
-5365
Rev. 1.0 page 2 2009-09-07
Page 3
IPG20N06S2L-65
y
g
3)
Parameter Symbol Conditions Unit
Values
min. typ. max.
namic characteristics
D
Input capacitance
3)
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate to drain charge
Gate charge total
1)
C
iss
V
=0 V, VDS=25 V,
3)
3)
1, 3)
C
C
t
t
t
t
Q
Q
Q
oss
rss
d(on)
r
d(off)
f
gs
gd
g
GS
f =1 MHz
V
=27.5 V,
DD
V
=10 V, ID=20 A,
GS
R
=11 Ω
G
=44 V, ID=20 A,
V
DD
V
=0 to 10 V
GS
- 315 410 pF
- 90 120
-3550
-2-ns
-3-
-10-
-7-
- 1.2 1.6 nC
- 3.5 5.3
- 9.4 12
Gate plateau voltage
V
plateau
- 3.9 - V
Reverse Diode
Diode continous forward current one channel active
1)
I
S
- - 20 A
TC=25 °C
Diode pulse current one channel active
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Specified by design. Not subject to production test.
2)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
connection. PCB is vertical in still air.
Per channel
1)
1)
1, 3)
I
S,pulse
V
SD
t
rr
Q
rr
VGS=0 V, IF=15 A, T
=25 °C
j
VR=27.5 V, IF=IS,
di
/dt =100 A/µs
F
--80
- 1.0 1.3 V
-30-ns
-28-nC
Rev. 1.0 page 3 2009-09-07
Page 4
1 Power dissipation 2 Drain current
P
= f(TC); V
tot
≥ 6 V; one channel active ID = f(TC); V
GS
GS
IPG20N06S2L-65
≥ 6 V; one channel active
45
25
40
35
20
30
15
25
[W]
tot
20
P
[A]
D
I
10
15
10
5
5
0
0 50 100 150 200
TC [°C]
0
0 50 100 150 200
TC [°C]
3 Safe operating area 4 Max. transient thermal impedance
I
=f(VDS); TC=25°C; D =0; one channel active Z
D
parameter: t
p
100
1 µs
10 µs
10
[A]
D
I
100 µs
1 ms
1
1 10 100
VDS [V]
= f(tp)
thJC
parameter: D =tp/T
1
10
0.5
0
10
0.1
[K/W]
Z
thJC
10
10
-1
-2
10
0.05
0.01
single pulse
-6
10
-5
10
10
-3
-4
10
-2
10
-1
10
0
tp [s]
Rev. 1.0 page 4 2009-09-07
Page 5
IPG20N06S2L-65
5 Typ. output characteristics
3)
ID = f(VDS); Tj = 25 °C R
parameter: V
80
60
40
[A]
D
I
20
0
GS
10 V
5 V
4.5 V
4 V
3.5 V
3 V
012345
VDS [V]
6 Typ. drain-source on-state resistance
= f(ID); Tj = 25 °C
DS(on)
parameter: V
160
140
120
]
Ω
[m
100
DS(on)
R
GS
3.5 V
4 V
4.5 V
5 V
80
60
40
0 20406080
ID [A]
3)
5.5 V
10 V
7 Typ. transfer characteristics
ID = f(VGS); V
parameter: T
80
60
40
[A]
D
I
20
0
1234567
= 6V R
DS
j
VGS [V]
3)
8 Typ. drain-source on-state resistance
= f(Tj); ID = 15 A; V
DS(on)
GS
= 10 V
3)
120
-55 °C
25 °C
100
]
80
175 °C
Ω
[m
DS(on)
R
60
40
20
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 5 2009-09-07
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IPG20N06S2L-65
9 Typ. gate threshold voltage
V
parameter: I
GS(th)
= f(Tj); V
= V
GS
DS
D
2.5
2
1.5
[V]
GS(th)
V
1
14µA
0.5
0
-60 -20 20 60 100 140 180
Tj [°C]
140µA
10 Typ. Capacitances
C = f(VDS); V
4
10
3
10
C [pF]
2
10
1
10
0 5 10 15 20 25 30
= 0 V; f = 1 MHz
GS
3)
Ciss
Coss
Crss
VDS [V]
11 Typical forward diode characteristicis
3)
IF = f(VSD) I
parameter: T
10
10
[A]
F
I
10
j
2
1
25 °C
175 °C
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
VSD [V]
12 Avalanche characteristics
= f(tAV)
A S
parameter: T
100
10
[A]
AV
I
0.1
j(start)
1
1 10 100 1000
tAV [µs]
3)
25 °C
100 °C
150 °C
Rev. 1.0 page 6 2009-09-07
Page 7
IPG20N06S2L-65
13 Avalanche energy
E
= f(Tj) V
AS
parameter: I
D
3)
100
80
5 A
60
[mJ]
AS
E
40
10 A
15 A
20
14 Drain-source breakdown voltage
= f(Tj); ID = 1 mA
BR(DSS)
65
62
59
[V]
BR(DSS)
V
56
53
0
25 50 75 100 125 150 175
15 Typ. gate charge
V
= f(Q
GS
parameter: V
12
10
[V]
GS
V
); ID = 20 A pulsed
gate
DD
8
6
4
50
-60 -20 20 60 100 140 180
Tj [°C]
3)
11 V
44 V
16 Gate charge waveforms
V
GS
V
gs(th)
Tj [°C]
Q
g
2
0
Q
g(th)
Q
gs
Q
sw
Q
gd
Q
gate
0246810
Q
[nC]
gate
Rev. 1.0 page 7 2009-09-07
Page 8
IPG20N06S2L-65
r
Published by Infineon Technologies AG 81726 Munich, Germany
© Infineon Technologies AG 2009
All Rights Reserved.
Legal Disclaime
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0 page 8 2009-09-07
Page 9
Revision History
IPG20N06S2L-65
Version
Revision 1.0
Date
07.09.2009
Changes
Final Data Sheet
Rev. 1.0 page 9 2009-09-07
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