Datasheet ipd90p04p4-05_ds_10 Datasheet

Page 1
IPD90P04P4-05
OptiMOS®-P2 Power-Transistor
Features
• P-channel - Normal Level - Enhancement mode
• AEC qualified
• MSL1 up to 260°C peak reflow
• Green package (RoHS compliant)
• 100% Avalanche tested
Product Summary
V
DS
R
DS(on)
I
D
-40 V
4.7
mΩ
-90 A
PG-TO252-3-313
Type Package Marking
IPD90P04P4-05 PG-TO252-3-313 4P0405
Maximum ratings, at T
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current
Avalanche energy, single pulse
Avalanche current, single pulse
Gate source voltage
Power dissipation
Operating and storage temperature
=25 °C, unless otherwise specified
j
1)
I
D
T V
T V
2)
I
D,pulse
E
AS
I
AS
V
GS
P
tot
T
j
, T
T I
- -90 A
- ±20 V
T
- -55 ... +175 °C
stg
=25°C,
C
=-10V
GS
=100°C,
C
=-10V
GS
=25°C
C
=-45A
D
=25 °C
C
Value
-90 A
2)
-90
-360
60 mJ
125 W
IEC climatic category; DIN IEC 68-1 - - 55/175/56
Rev. 1.0 page 1 2010-05-26
Page 2
IPD90P04P4-05
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
SMD version, device on PCB
Electrical characteristics, at T
2)
R
thJC
R
thJA
- - - 1.2 K/W
minimal footprint - - 62
6 cm
=25 °C, unless otherwise specified
j
2
cooling area
3)
--40
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
V
GS(th)
I
DSS
=0V, I
D
VDS=VGS, I
VDS=-32V, V T
=25°C
j
V
=-32V, V
DS
T
=125°C
j
2)
= -1mA
=-250µA
D
=0V,
GS
=0V,
GS
-40 - - V
-2.0 -3.0 -4.0
- -0.08 -1 µA
- -20 -200
Gate-source leakage current
Drain-source on-state resistance
I
GSS
R
DS(on)VGS
VGS=-20V, V
=-10V, I
=0V
DS
=-90A
D
- - -100 nA
- 3.5 4.7
mΩ
Rev. 1.0 page 2 2010-05-26
Page 3
IPD90P04P4-05
y
g
Parameter Symbol Conditions Unit
Values
min. typ. max.
D
namic characteristics
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate to drain charge
Gate charge total
2)
C
iss
=0V, V
V
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
2)
Q
gs
Q
gd
Q
g
GS
f=1MHz
V
=-20V,
DD
V
=-10V, I
GS
=3.5Ω
R
G
=-32V, I
V
DD
V
=0 to -10V
GS
=-25V,
DS
=-90A,
D
=-90A,
D
- 7900 10300 pF
- 2800 3600
- 76 150
-3-ns
-8-
-7-
-14-
-4060nC
-2142
- 118 154
Gate plateau voltage
V
plateau
- -5.3 - V
Reverse Diode
2)
Diode continous forward current
Diode pulse current
2)
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Current is limited by bondwire; with an R
2)
Defined by design. Not subject to production test.
3)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
2)
2)
I
S
I
S,pulse
V
SD
t
rr
Q
rr
= 1.2K/W the chip is able to carry -138A at 25°C.
thJC
T
=25°C
C
VGS=0V, I T
=25°C
j
V
=-20V, I
R
di
/dt=-100A/µs
F
=-90A,
F
=-50A,
F
connection. PCB is vertical in still air.
- - -90 A
- - -360
- -1 -1.3 V
-56-ns
-56-nC
Rev. 1.0 page 3 2010-05-26
Page 4
1 Power dissipation 2 Drain current
P
= f(TC); V
tot
≤ -6V ID = f(TC); V
GS
GS
IPD90P04P4-05
≤ -6V
140
100
120
80
100
[W]
tot
P
80
60
[A]
D
-I
60
40
40
20
20
0
0 50 100 150 200
TC [°C]
0
0 50 100 150 200
TC [°C]
3 Safe operating area 4 Max. transient thermal impedance
I
= f(VDS); TC = 25 °C; D = 0 Z
D
parameter: t
p
1000
= f(t
thJC
)
p
parameter: D=tp/T
1
10
1 µs
[A]
D
-I
100
10 µs
100 µs
1 ms
10
10
[K/W]
thJC
Z
0
0.5
0.1
-1
0.05
0.01
10
-2
10
single pulse
-3
1
0.1 1 10 100
-VDS [V]
10
10-610
-5
10-410
tp [s]
-3
-2
-1
10
10
10
0
Rev. 1.0 page 4 2010-05-26
Page 5
IPD90P04P4-05
5 Typ. output characteristics 6 Typ. drain-source on-state resistance
I
= f(VDS); Tj = 25 °C R
D
parameter: V
GS
= (ID); T
DS(on)
parameter: V
j
GS
= 25 °C
360
10V
8V
7V
270
[A]
180
D
-I
6V
90
5V
0
0123456
-VDS [V]
]
Ω
[m
DS(on)
R
24
21
18
15
12
-5V
-6V
9
6
3
-7V
-8V
-10V
0
0 90 180 270
-ID [A]
7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance
I
= f(VGS); V
D
parameter: T
= -6V R
DS
j
= f(Tj); ID = -90 A; V
DS(on)
= -10 V
GS
360
270
[A]
180
D
-I
90
175 °C
25 °C
-55 °C
0
2345678
-VGS [V]
6
5
]
Ω
[m
4
DS(on)
R
3
2
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 5 2010-05-26
Page 6
9 Typ. gate threshold voltage 10 Typ. capacitances
V
= f(Tj); V
GS(th)
parameter: -I
4
= V
GS
DS
D
C= f(VDS); V
5
10
= 0 V; f = 1 MHz
GS
IPD90P04P4-05
[V]
GS(th)
-V
3.5
2.5
4
10
250µA
2500µA
C [pF]
10
10
3
2
3
Ciss
Coss
Crss
2
1
1.5
-60 -20 20 60 100 140 180
Tj [°C]
10
0 5 10 15 20 25 30
-VDS [V]
11 Typical forward diode characteristicis 12 Drain-source breakdown voltage
IF = f(V
parameter: T
)V
SD
parameter: T
10
j
3
= f(Tj); ID = -1 mA
BR(DSS)
45
j(start)
44
43
10
2
42
41
[V]
[A]
F
-I
25 °C
10
10
1
0
175 °C
0 0.2 0.4 0.6 0.8 1 1.2 1.4
-VSD [V]
40
BR(DSS)
-V
39
38
37
36
35
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 6 2010-05-26
Page 7
13 Typ. gate charge 14 Gate charge waveforms
V
= f(Q
GS
parameter: V
10
); ID = -90 A pulsed
gate
DD
IPD90P04P4-05
9
8
-8V
7
6
[V]
5
GS
-V
4
3
2
1
0
0 20 40 60 80 100 120
Q
[nC]
gate
-32V
V
V
GS
GS
Q
Q
g
g
Q
Q
gate
gate
Q
Q
Q
gs
gs
Q
gd
gd
Rev. 1.0 page 7 2010-05-26
Page 8
IPD90P04P4-05
Published by Infineon Technologies AG 81726 Munich, Germany
© Infineon Technologies AG 2010
All Rights Reserved.
Legal Disclaimer
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0 page 8 2010-05-26
Page 9
Revision History
IPD90P04P4-05
Version
Revision 1.0
Date
21.05.2010
Changes
Final Data Sheet
Rev. 1.0 page 9 2010-05-26
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