Datasheet ipd90n04s3-h4 Datasheet

Page 1
IPD90N04S3-H4
OptiMOS®-T Power-Transistor
Features
• N-channel - Enhancement mode
• Automotive AEC Q101 qualified
• MSL1 up to 260°C peak reflow
• Green package (RoHS compliant)
• 100% Avalanche tested
Product Summary
V
DS
R
DS(on),max
I
D
40 V
4.3
90 A
PG-TO252-3-11
mΩ
Type Package Marking
IPD90N04S3-H4 PG-TO252-3-11 QN04H4
Maximum ratings, at T
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current
Avalanche energy, single pulse
Avalanche current, single pulse
Gate source voltage
Power dissipation
Operating and storage temperature
=25 °C, unless otherwise specified
j
1)
I
D
TC=25 °C, VGS=10 V
T
V
2)
2)
I
D,pulse
E
AS
I
AS
V
GS
P
tot
T
, T
j
TC=25 °C
ID=45 A
-
- ±20 V
TC=25 °C
- -55 ... +175 °C
stg
=100 °C,
C
=10 V
GS
Value
90 A
2)
90
360
330 mJ
90 A
115 W
IEC climatic category; DIN IEC 68-1 - - 55/175/56
Rev. 1.0 page 1 2008-08-01
Page 2
IPD90N04S3-H4
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
SMD version, device on PCB
Electrical characteristics, at T
2)
R
thJC
R
thJA
=25 °C, unless otherwise specified
j
- - - 1.3 K/W
minimal footprint - - 62
6 cm
2
cooling area
3)
--40
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
V
GS(th)
I
DSS
=0 V, ID= 1 mA
VDS=VGS, ID=65 µA
VDS=40 V, VGS=0 V, T
=25 °C
j
40 - - V
2.1 3.0 4.0
--1µA
Gate-source leakage current
Drain-source on-state resistance
I
R
GSS
DS(on)
V
=40 V, VGS=0 V,
DS
T
=125 °C
j
2)
VGS=20 V, VDS=0 V
VGS=10 V, ID=90 A
- - 100
- - 100 nA
- 3.4 4.3 mΩ
Rev. 1.0 page 2 2008-08-01
Page 3
IPD90N04S3-H4
y
g
Parameter Symbol Conditions Unit
Values
min. typ. max.
namic characteristics
D
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate to drain charge
Gate charge total
2)
C
iss
V
=0 V, VDS=25 V,
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
2)
Q
gs
Q
gd
Q
g
GS
f =1 MHz
V
=20 V, VGS=10 V,
DD
I
=90 A, R
D
=32 V, ID=90 A,
V
DD
V
=0 to 10 V
GS
=3.5 Ω
G
- 3000 3900 pF
- 850 1100
- 130 200
-20-ns
-13-
-30-
-10-
-1824nC
-1218
-4660
Gate plateau voltage
V
plateau
- 5.6 - V
Reverse Diode
2)
Diode continous forward current
Diode pulse current
2)
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Current is limited by bondwire; with an R
2)
Defined by design. Not subject to production test.
3)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
2)
2)
I
S
I
S,pulse
V
SD
t
rr
Q
rr
thJC
T
=25 °C
C
VGS=0 V, IF=90 A, T
=25 °C
j
VR=20 V, IF=IS,
di
/dt =100 A/µs
F
= 1.3K/W the chip is able to carry 122A at 25°C.
connection. PCB is vertical in still air.
- - 90 A
- - 360
- 0.95 1.3 V
-35-ns
-35-nC
Rev. 1.0 page 3 2008-08-01
Page 4
1 Power dissipation 2 Drain current
P
= f(TC); V
tot
≥ 6 V ID = f(TC); V
GS
GS
IPD90N04S3-H4
≥ 6 V
140
100
120
80
100
[W]
tot
P
80
60
[A]
D
I
60
40
40
20
20
0
0 50 100 150 200
TC [°C]
0
0 50 100 150 200
TC [°C]
3 Safe operating area 4 Max. transient thermal impedance
I
= f(VDS); TC = 25 °C; D = 0 Z
D
parameter: t
p
1000
1 µs
10 µs
100 µs
100
1 ms
[A]
D
I
10
1
0.1 1 10 100
VDS [V]
= f(tp)
thJC
parameter: D =tp/T
1
10
0
10
0.5
0.1
-1
[K/W]
thJC
Z
10
10
10
0.05
0.01
-2
single pulse
-3
-5
-6
10
10
10
10
-1
10
-3
10
-4
-2
10
0
tp [s]
Rev. 1.0 page 4 2008-08-01
Page 5
IPD90N04S3-H4
5 Typ. output characteristics 6 Typ. drain-source on-state resistance
I
= f(VDS); Tj = 25 °C R
D
parameter: V
GS
parameter: V
= f(ID); Tj = 25 °C
DS(on)
GS
360
10 V
320
7 V
280
240
6.5 V
200
[A]
D
I
160
6 V
120
80
40
5.5 V
5 V
0
02468
VDS [V]
20
18
5.5 V
16
14
]
Ω
12
[m
10
DS(on)
R
8
6
4
2
0 20 40 60 80 100 120
ID [A]
7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance
6 V
6.5 V
7 V
10 V
I
= f(VGS); V
D
parameter: T
360
320
280
240
200
[A]
D
I
160
120
80
40
0
2345678
= 6V R
DS
j
-55 °C 25 °C
175 °C
VGS [V]
= f(Tj); ID = 90 A; V
DS(on)
GS
= 10 V
7
6
]
5
Ω
[m
DS(on)
4
R
3
2
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 5 2008-08-01
Page 6
9 Typ. gate threshold voltage 10 Typ. capacitances
IPD90N04S3-H4
V
GS(th)
= f(Tj); V
parameter: I
4
3.5
3
[V]
2.5
GS(th)
V
2
1.5
1
-60 -20 20 60 100 140 180
= V
GS
DS
D
650µA
C = f(VDS); V
4
10
= 0 V; f = 1 MHz
GS
Ciss
C [pF]
65µA
10
10
3
Coss
Crss
2
0 5 10 15 20 25 30
Tj [°C]
VDS [V]
11 Typical forward diode characteristicis 12 Typ. avalanche characteristics
IF = f(V
parameter: T
) I
SD
j
3
10
2
10
[A]
F
I
25 °C
175 °C
10
10
1
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
VSD [V]
= f(tAV)
A S
parameter: T
100
[A]
10
AV
I
1
1 10 100 1000
j(start)
100 °C
150 °C
tAV [µs]
25 °C
Rev. 1.0 page 6 2008-08-01
Page 7
IPD90N04S3-H4
13 Typical avalanche energy 14 Typ. drain-source breakdown voltage
E
= f(Tj) V
AS
parameter: I
D
= f(Tj); ID = 1 mA
BR(DSS)
700
55
600
50
500
22.5 A
45
400
[V]
[mJ]
AS
E
300
45 A
200
100
90 A
0
25 75 125 175
BR(DSS)
V
40
35
30
-60 -20 20 60 100 140 180
Tj [°C]
15 Typ. gate charge 16 Gate charge waveforms
Tj [°C]
V
= f(Q
GS
gate
parameter: V
12
10
8
[V]
6
GS
V
4
2
0
0 1020304050
); ID = 90 A pulsed
DD
Q
gate
[nC]
8 V
32 V
V
GS
Q
g
V
gs(th)
Q
g(th)
Q
gs
Q
sw
Q
gd
Q
gate
Rev. 1.0 page 7 2008-08-01
Page 8
IPD90N04S3-H4
r
Published by Infineon Technologies AG 81726 Munich, Germany
© Infineon Technologies AG 2008
All Rights Reserved.
Legal Disclaime
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0 page 8 2008-08-01
Page 9
Revision History
Version Date Changes
IPD90N04S3-H4
Rev. 1.0 page 9 2008-08-01
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