Datasheet ipd80p03p4l-07_ds_10 Datasheet

Page 1
IPD80P03P4L-07
OptiMOS®-P2 Power-Transistor
Features
• P-channel - Logic Level - Enhancement mode
• AEC qualified
• MSL1 up to 260°C peak reflow
• Green package (RoHS compliant)
• 100% Avalanche tested
• Intended for reverse battery protection
Product Summary
V
DS
R
DS(on)
I
D
-30 V
6.8
-80 A
PG-TO252-3-11
mΩ
Type Package Marking
IPD80P03P4L-07 PG-TO252-3-11 4P03L07
Maximum ratings, at T
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current
Avalanche energy, single pulse
Avalanche current, single pulse
Gate source voltage
Power dissipation
=25 °C, unless otherwise specified
j
I
D
TC=25°C,
V
T
V
2)
I
D,pulse
E
AS
I
AS
V
GS
P
tot
TC=25°C
ID=-40A
-
- +5/-16 V
TC=25 °C
=-10V
GS
=100°C,
C
=-10V
GS
Value
1)
2)
-80 A
-65
-320
135 mJ
-80 A
88 W
T
Operating and storage temperature
, T
j
- -55 ... +175 °C
stg
IEC climatic category; DIN IEC 68-1 - - 55/175/56
Rev. 1.0 page 1 2008-07-30
Page 2
IPD80P03P4L-07
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
SMD version, device on PCB
Electrical characteristics, at T
2)
R
thJC
R
thJA
=25 °C, unless otherwise specified
j
- - - 1.7 K/W
minimal footprint - - 62
6 cm
2
cooling area
3)
--40
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
V
GS(th)
I
DSS
=0V, ID= -1mA
VDS=VGS, ID=-130µA
VDS=-24V, VGS=0V, T
=25°C
j
-30 - - V
-1.0 -1.5 -2.0
- -0.03 -1 µA
Gate-source leakage current
Drain-source on-state resistance
I
R
GSS
DS(on)
V
=-24V, VGS=0V,
DS
T
=125°C
j
2)
VGS=-16V, VDS=0V
VGS=-4.5V, ID=-40A
V
=-10V, ID=-80A
GS
- -10 -100
- - -100 nA
- 8.7 12
mΩ
- 5.6 6.8
Rev. 1.0 page 2 2008-07-30
Page 3
IPD80P03P4L-07
y
g
Parameter Symbol Conditions Unit
Values
min. typ. max.
namic characteristics
D
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate to drain charge
Gate charge total
2)
C
iss
V
=0V, VDS=-25V,
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
2)
Q
gs
Q
gd
Q
g
GS
f =1MHz
V
=-15V,
DD
V
=-10V, ID=-80A,
GS
R
=3.5Ω
G
=-24V, ID=-80A,
V
DD
V
=0 to -10V
GS
- 4400 5700 pF
- 1220 1600
-3060
-8-ns
-4-
-15-
-60-
-1620nC
-816
-6380
Gate plateau voltage
V
plateau
- -3.7 - V
Reverse Diode
2)
Diode continous forward current
Diode pulse current
2)
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Current is limited by bondwire; with an R
2)
Defined by design. Not subject to production test.
3)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
2)
2)
I
S
I
S,pulse
V
SD
t
rr
Q
rr
= 1.7K/W the chip is able to carry 92A at 25°C.
thJC
=25°C
T
C
VGS=0V, IF=-80A, T
=25°C
j
V
=-15V, IF=-40A,
R
di
/dt =-100A/µs
F
connection. PCB is vertical in still air.
- - -80 A
- - -320
- - -1.3 V
-50-ns
-40-nC
Rev. 1.0 page 3 2008-07-30
Page 4
1 Power dissipation 2 Drain current
P
= f(TC); V
tot
≤ -6V ID = f(TC); VGS ≤ -6V
GS
IPD80P03P4L-07
100
80
60
[W]
tot
P
40
20
0
0 50 100 150 200
TC [°C]
100
80
60
[A]
D
-I
40
20
0
0 50 100 150 200
TC [°C]
3 Safe operating area 4 Max. transient thermal impedance
I
= f(VDS); TC = 25 °C; D = 0 Z
D
parameter: t
p
1000
1 µs
10 µs
[A]
D
-I
100
100 µs
1 ms
10
1
0.1 1 10 100
-VDS [V]
= f(tp)
thJC
parameter: D =tp/T
1
10
0
10
0.5
0.1
-1
10
10
10
-2
-3
10
0.05
0.01
single pulse
-6
10
-5
[K/W]
thJC
Z
10
10
-3
-4
10
-2
10
-1
10
0
tp [s]
Rev. 1.0 page 4 2008-07-30
Page 5
IPD80P03P4L-07
5 Typ. output characteristics 6 Typ. drain-source on-state resistance
I
= f(VDS); Tj = 25 °C R
D
parameter: V
GS
parameter: V
= (ID); Tj = 25 °C
DS(on)
GS
320
10V
5V
20
17
-4V
-4.5V
6 V
240
]
14
Ω
[m
DS(on)
R
11
[A]
D
-I
4.5V
160
4V
80
3.5V
3V
0
0123456
-VDS [V]
8
5
0 80 160 240 320
-ID [A]
7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance
-5V
-10V
I
= f(VGS); V
D
parameter: T
320
240
[A]
160
D
-I
80
0
123456
= -6V R
DS
j
-55 °C
25 °C
175 °C
-VGS [V]
= f(Tj); ID = -80 A; V
DS(on)
= -10 V
GS
9
8
]
7
Ω
[m
DS(on)
R
6
5
4
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 5 2008-07-30
Page 6
9 Typ. gate threshold voltage 10 Typ. capacitances
IPD80P03P4L-07
V
GS(th)
= f(Tj); V
parameter: -I
2
1.5
[V]
1
GS(th)
-V
0.5
0
-60 -20 20 60 100 140 180
= V
GS
DS
D
1300µA
130µA
C = f(VDS); V
5
10
4
10
3
10
[pF]
= 0 V; f = 1 MHz
GS
Ciss
Coss
C
2
10
Crss
1
10
0 5 10 15 20 25 30
Tj [°C]
-VDS [V]
11 Typical forward diode characteristicis 12 Avalanche characteristics
IF = f(V
parameter: T
) I
SD
j
3
10
2
10
[A]
F
-I
1
10
0
10
175 °C
25 °C
0 0.2 0.4 0.6 0.8 1 1.2 1.4
-VSD [V]
= f(tAV)
AS
parameter: T
100
[A]
10
AV
-I
1
1 10 100 1000
j(start)
150°C
tAV [µs]
25°C
100°C
Rev. 1.0 page 6 2008-07-30
Page 7
IPD80P03P4L-07
13 Avalanche energy 14 Drain-source breakdown voltage
E
= f(Tj) V
AS
parameter: I
D
BR(DSS)
= f(Tj); ID = -1 mA
300
250
20 A
33
32
200
31
[V]
150
[mJ]
AS
E
40 A
BR(DSS)
-V
30
100
80 A
50
0
25 75 125 175
29
28
-60 -20 20 60 100 140 180
Tj [°C]
15 Typ. gate charge 16 Gate charge waveforms
Tj [°C]
V
= f(Q
GS
gate
parameter: V
12
10
8
[V]
6
GS
-V
4
2
0
0 10203040506070
); ID = -80 A pulsed
DD
Q
gate
[nC]
-6V
-24V
V
V
GS
GS
Q
Q
g
g
Q
Q
gate
gate
Q
Q
Q
gs
gs
Q
gd
gd
Rev. 1.0 page 7 2008-07-30
Page 8
IPD80P03P4L-07
r
Published by Infineon Technologies AG 81726 Munich, Germany
© Infineon Technologies AG 2008
All Rights Reserved.
Legal Disclaime
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0 page 8 2008-07-30
Page 9
Revision History
Version Date Changes
IPD80P03P4L-07
Rev. 1.0 page 9 2008-07-30
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