Datasheet ipd70p04p4-09_ds_10 Datasheet

Page 1
IPD70P04P4-09
OptiMOS®-P2 Power-Transistor
Features
• P-channel - Normal Level - Enhancement mode
• AEC qualified
• MSL1 up to 260°C peak reflow
• Green package (RoHS compliant)
• 100% Avalanche tested
Product Summary
V
DS
R
DS(on)
I
D
-40 V
8.9
-73 A
PG-TO252-3-313
mΩ
Type Package Marking
IPD70P04P4-09 PG-TO252-3-313 4P0409
Maximum ratings, at T
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current
Avalanche energy, single pulse
Avalanche current, single pulse
Gate source voltage
Power dissipation
Operating and storage temperature
=25 °C, unless otherwise specified
j
I
D
T V
T V
1)
1)
I
D,pulse
E
AS
I
AS
V
GS
P
tot
T
j
, T
T I
- -73 A
- ±20 V
T
- -55 ... +175 °C
stg
=25°C,
C
=-10V
GS
=100°C,
C
=-10V
GS
=25°C
C
=-36A
D
=25 °C
C
Value
-73 A
1)
-52
-292
24 mJ
75 W
IEC climatic category; DIN IEC 68-1 - - 55/175/56
Rev. 1.0 page 1 2010-05-26
Page 2
IPD70P04P4-09
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
SMD version, device on PCB
Electrical characteristics, at T
1)
R
thJC
R
thJA
- - - 2 K/W
minimal footprint - - 62
6 cm
=25 °C, unless otherwise specified
j
2
cooling area
2)
--40
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
-V
GS(th)VDS=VGS
I
DSS
=0V, I
D
, I
VDS=-32V, V T
=25°C
j
V
=-32V, V
DS
T
=125°C
j
2)
= -1mA
=-120µA
D
=0V,
GS
=0V,
GS
-40 - - V
2.0 3.0 4.0
- -0.04 -1 µA
- -20 -200
Gate-source leakage current
Drain-source on-state resistance
I
GSS
R
DS(on)VGS
VGS=-20V, V
=-10V, I
=0V
DS
=-70A
D
- - -100 nA
- 6.4 8.9
mΩ
Rev. 1.0 page 2 2010-05-26
Page 3
IPD70P04P4-09
y
g
Parameter Symbol Conditions Unit
Values
min. typ. max.
D
namic characteristics
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate to drain charge
Gate charge total
1)
C
iss
=0V, V
V
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
1)
Q
gs
Q
gd
Q
g
GS
f=1MHz
V
=-20V,
DD
V
=-10V, I
GS
=3.5Ω
R
G
=-32V, I
V
DD
V
=0 to -10V
GS
=-25V,
DS
=-73A,
D
=-70A,
D
- 3700 4810 pF
- 1400 1820
-4080
-19-ns
-12-
-24-
-31-
-2026nC
-1020
-5470
Gate plateau voltage
V
plateau
- -5.4 - V
Reverse Diode
1)
Diode continous forward current
Diode pulse current
1)
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Defined by design. Not subject to production test.
2)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
1)
1)
I
S
I
S,pulse
V
SD
t
rr
Q
T
=25°C
C
VGS=0V, I T
=25°C
j
V
=-20V, I
R
di
/dt=-100A/µs
rr
F
=-70A,
F
=-50A,
F
connection. PCB is vertical in still air.
- - -73 A
- - -292
- -1 -1.3 V
-50-ns
-50-nC
Rev. 1.0 page 3 2010-05-26
Page 4
1 Power dissipation 2 Drain current
P
= f(TC); V
tot
≤ -6V ID = f(TC); V
GS
GS
IPD70P04P4-09
= -10V
80
60
[W]
40
tot
P
20
0
0 50 100 150 200
TC [°C]
80
60
[A]
40
D
-I
20
0
0 50 100 150 200
TC [°C]
3 Safe operating area 4 Max. transient thermal impedance
I
= f(VDS); TC = 25 °C; D = 0, SMD Z
D
parameter: t
p
1000
= f(t
thJC
)
p
parameter: D=tp/T
1
10
[A]
D
-I
100
1 µs
10 µs
100 µs
1 ms
10
[K/W]
10
thJC
Z
0
0.5
0.1
0.05
-1
0.01
10
single pulse
-2
10
-3
1
0.1 1 10 100
-VDS [V]
10
10
-6
10
10
10
10
10
10
0
-1
-2
-3
-4
-5
tp [s]
Rev. 1.0 page 4 2010-05-26
Page 5
IPD70P04P4-09
5 Typ. output characteristics 6 Typ. drain-source on-state resistance
I
= f(VDS); Tj = 25 °C R
D
parameter: -V
GS
= (ID); T
DS(on)
parameter: V
j
GS
= 25 °C
280
10V
210
[A]
140
D
-I
70
0
0123456
8V
-VDS [V]
7V
6V
5V
25
20
]
Ω
[m
15
DS(on)
R
10
5
0 70 140 210 280
6V5V
7V
-ID [A]
7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance
I
= f(VGS); V
D
parameter: T
= -6V R
DS
j
= f(Tj); ID = -70 A; V
DS(on)
= -10 V
GS
8V
10V
280
210
[A]
140
D
-I
70
175 °C
25 °C
-55 °C
0
2345678
-VGS [V]
11
10
9
]
Ω
8
[m
DS(on)
7
R
6
5
4
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 5 2010-05-26
Page 6
9 Typ. gate threshold voltage 10 Typ. capacitances
V
= f(Tj); V
GS(th)
parameter: -I
4
3.5
3
= V
GS
DS
D
1200µA
C= f(VDS); V
5
10
4
10
= 0 V; f = 1 MHz
GS
IPD70P04P4-09
Ciss
[V]
GS(th)
-V
2.5
120µA
10
C [pF]
3
2
2
10
1.5
1
1
-60 -20 20 60 100 140 180
Tj [°C]
10
0 5 10 15 20 25 30
-VDS [V]
11 Typical forward diode characteristicis 12 Drain-source breakdown voltage
I
= f(V
F
parameter: T
) V
SD
j
3
10
BR(DSS)
45
44
43
= f(Tj); I
= -1 mA
D
Coss
Crss
10
2
42
41
[V]
[A]
F
-I
25 °C
10
10
1
0
175 °C
0 0.4 0.8 1.2 1.6
-VSD [V]
40
BR(DSS)
-V
39
38
37
36
35
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 6 2010-05-26
Page 7
13 Typ. gate charge 14 Gate charge waveforms
V
= f(Q
GS
parameter: V
[V]
GS
-V
12
10
); I
gate
= -73 A pulsed
D
DD
-8V
-32V
V
V
GS
GS
Q
Q
g
g
8
6
4
2
IPD70P04P4-09
Q
Q
gate
gate
0
0 102030405060
Q
[nC]
gate
Q
Q
Q
gs
gs
Q
gd
gd
Rev. 1.0 page 7 2010-05-26
Page 8
IPD70P04P4-09
Published by Infineon Technologies AG 81726 Munich, Germany
© Infineon Technologies AG 2010
All Rights Reserved.
Legal Disclaimer
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0 page 8 2010-05-26
Page 9
Revision History
IPD70P04P4-09
Version
1.0
Date
21.05.2010
Changes
Final Data Sheet
Rev. 1.0 page 9 2010-05-26
Loading...