Datasheet ipd70n10s3-12_ds_1_1 Datasheet

Page 1
IPD70N10S3-12
V
OptiMOS
®
-T Power-Transistor
Features
• N-channel- Enhancement mode
• Automotive AEC Q101 qualified
• MSL1 up to 260°C peak reflow
• Green product (RoHS compliant)
• 100% Avalanche tested
Product Summary
V
DS
R
DS(on),max
I
D
100
11.1
PG-TO252-3-11
mW
70 A
Type Package Marking
IPD70N10S3-12 PG-TO252-3-11 QN1012
Maximum ratings, at Tj=25 °C, unless otherwise specified
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current Avalanche energy, single pulse
1)
1)
Avalanche current, single pulse Gate source voltage Power dissipation Operating and storage temperature
I
D
I
D,pulse
E
AS
I
AS
V
GS
P
tot
Tj, T
TC=25°C, VGS=10V
TC=100°C, VGS=10V
TC=25°C ID=35A
TC=25 °C
stg
1)
Value
70 A
48
280 410 mJ
70 A ±20 V 125 W
-55 ...+175 °C
IEC climatic category; DIN IEC 68-1 55/175/56
Rev. 1.1 page 1 2011-10-06
Page 2
IPD70N10S3-12
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case SMD version, device on PCB
1)
R
thJC
R
thJA
minimal footprint - - 62 6 cm2cooling area
2)
- - 1.2 K/W
- - 40
Electrical characteristics, at Tj=25 °C, unless otherwise specified
Static characteristics
Drain-source breakdown voltage Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
V
GS(th)
I
DSS
=0V, ID= 1mA
VDS=VGS, ID=83µA VDS=80V, VGS=0V,
Tj=25°C
100 - - V
2.0 3.0 4.0
- 0.01 0.1 µA
Gate-source leakage current Drain-source on-state resistance
I R
GSS
DS(on)
VDS=80V, VGS=0V, Tj=125°C
1)
VGS=20V, VDS=0V VGS=10V, ID=70A
- 0.1 10
- - 100 nA
- 9.2 11.1
mW
Rev. 1.1 page 2 2011-10-06
Page 3
IPD70N10S3-12
Dynamic characteristics
Gate Charge Characteristics
Reverse Diode
2)
connection. PCB is vertical in still air.
Parameter Symbol Conditions Unit
Values
min. typ. max.
1)
Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time
1)
Gate to source charge Gate to drain charge Gate charge total
C C
C
t t t t
Q Q Q
iss
oss
rss
d(on)
r
d(off)
f
gs
gd
g
VGS=0V, VDS=25V, f=1MHz
VDD=20V, VGS=10V, ID=70A, RG=3.5W
VDD=80V, ID=70A, VGS=0 to 10V
- 3350 4355 pF
- 940 1222
- 105 158
- 17 - ns
- 8 -
- 25 -
- 8 -
- 18 23 nC
- 16 24
- 51 65
Gate plateau voltage
Diode continous forward current
V
plateau
1)
I
S
- 5.5 - V
- - 70 A
TC=25°C
Diode pulse current
1)
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Defined by design. Not subject to production test. Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2(one layer, 70 µm thick) copper area for drain
1)
1)
I
S,pulse
V
SD
t
rr
Q
rr
VGS=0V, IF=70A, Tj=25°C
VR=50V, IF=IS,
diF/dt=100A/µs
- - 280
0.6 1 1.2 V
- 100 - ns
- 265 - nC
Rev. 1.1 page 3 2011-10-06
Page 4
1 Power dissipation 2 Drain current
P
= f(TC); VGS≥ 6 V ID= f(TC); V
tot
GS
IPD70N10S3-12
≥ 6 V
140
120
80
70
60
100
50
80
[W]
tot
P
60
[A]
40
D
I
30
40
20
20
0
0 50 100 150 200
TC[°C]
10
0
0 50 100 150 200
TC[°C]
3 Safe operating area 4 Max. transient thermal impedance
ID= f(VDS); TC= 25 °C; D = 0 Z parameter: t
1000
100
[A]
D
I
p
1 µs
10 µs
100 µs
1 ms
10
1
0.1 1 10 100
VDS[V]
= f(tp)
thJC
parameter: D=tp/T
1
10
0
10
0.5
0.1
-1
[K/W]
10
0.05
thJC
Z
10
10
-2
-3
10
0.01
single pulse
-6
10
-5
10
10
-3
-4
10
-2
10
-1
10
0
tp[s]
Rev. 1.1 page 4 2011-10-06
Page 5
IPD70N10S3-12
5 Typ. output characteristics 6 Typ. drain-source on-state resistance
ID= f(VDS); Tj= 25 °C R parameter: V
280
240
200
160
[A]
D
I
120
80
40
0
GS
10 V
7 V
6.5 V
6 V
5.5V
5V
0 1 2 3 4 5
VDS[V]
= f(ID); Tj= 25 °C
DS(on)
parameter: V
35
25
]
W
[m
DS(on)
R
15
5
0 20 40 60 80 100 120
GS
5.5 V
ID[A]
6 V
6.5 V
7 V
10 V
7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance
ID= f(VGS); VDS= 6V R parameter: T
250
200
150
[A]
D
I
100
50
j
-55 °C
25 °C
175 °C
0
3 4 5 6 7
VGS[V]
= f(Tj); ID= 70 A; VGS= 10 V
DS(on)
25
20
]
W
[m
15
DS(on)
R
10
5
-60 -20 20 60 100 140 180
Tj[°C]
Rev. 1.1 page 5 2011-10-06
Page 6
9 Typ. gate threshold voltage 10 Typ. capacitances
IPD70N10S3-12
V
= f(Tj); VGS= V
GS(th)
parameter: I
4
3.5
3
[V]
2.5
GS(th)
V
2
1.5
1
-60 -20 20 60 100 140 180
DS
D
400 µA
C =f(VDS); VGS= 0 V; f = 1 MHz
4
10
3
10
Ciss
Coss
C [pF]
80 µA
2
10
10
1
Crss
0 5 10 15 20 25 30
Tj[°C]
VDS[V]
11 Typical forward diode characteristicis 12 Typ. avalanche characteristics
IF = f(VSD) I parameter: T
10
10
10
10
[A]
[A]
F
F
I
I
10
10
10
10
j
3
3
2
2
25 °C
1
1
0
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
0 0.2 0.4 0.6 0.8 1 1.2 1.4
175 °C
VSD[V]
VSD[V]
= f(tAV)
A S
parameter: T
100
[A]
10
AV
I
1
0.1 1 10 100 1000
j(start)
150 °C
tAV[µs]
25 °C
100 °C
Rev. 1.1 page 6 2011-10-06
Page 7
IPD70N10S3-12
13 Typical avalanche energy 14 Typ. drain-source breakdown voltage
EAS= f(Tj) V parameter: I
900
800
700
600
500
[mJ]
AS
400
E
300
200
100
D
17.5 A
35 A
70 A
0
25 75 125 175
Tj[°C]
= f(Tj); ID= 1 mA
BR(DSS)
115
110
105
[V]
BR(DSS)
V
100
95
90
-55 -15 25 65 105 145
Tj[°C]
15 Typ. gate charge 16 Gate charge waveforms
VGS= f(Q parameter: V
10
[V]
GS
V
); ID= 70 A pulsed
gate
DD
9
8
20 V 80V
7
6
5
4
3
2
1
0
0 10 20 30 40 50
Q
[nC]
gate
V
GS
Q
V
gs(th)
Q
g(th)
Q
gs
g
Q
sw
Q
gd
Q
gate
Rev. 1.1 page 7 2011-10-06
Page 8
IPD70N10S3-12
Published by
Infineon Technologies AG
81726 Munich, Germany
Infineon Technologies AG 2007
All Rights Reserved.
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Information
www.infineon.com
Warnings
©
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including
without limitation warranties of non‑infringement of intellectual property rights of any third party.
For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (
Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
).
Rev. 1.1 page 8 2011-10-06
Page 9
Revision History
IPD70N10S3-12
Version
Revision 1.1
Date
03.06.2011
Changes Update if Idss
Rev. 1.1 page 9 2011-10-06
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