Datasheet ipd30n03s4l-14_ds_2_1 Datasheet

Page 1
IPD30N03S4L-14
OptiMOS®-T2 Power-Transistor
Features
• N-channel - Enhancement mode
• Automotive AEC Q101 qualified
• MSL1 up to 260°C peak reflow
• Green product (RoHS compliant)
• Ultra low Rds(on)
• 100% Avalanche tested
Product Summary
V
DS
R
DS(on),max
I
D
30 V
13.6
30 A
PG-TO252-3-11
mΩ
Type Package Marking
IPD30N03S4L-14 PG-TO252-3-11 4N03L14
Maximum ratings, at T
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current
Avalanche energy, single pulse
Avalanche current, single pulse
Gate source voltage
Power dissipation
Operating and storage temperature
=25 °C, unless otherwise specified
j
1)
I
D
TC=25 °C, VGS=10 V
T
V
2)
I
D,pulse
E
AS
I
AS
V
GS
P
tot
T
, T
j
TC=25 °C
ID=30 A
TC=25 °C
TC=25 °C
stg
=100 °C,
C
=10 V
GS
Value
30 A
2)
27
120
16 mJ
30 A
±16 V
31 W
-55 ... +175 °C
IEC climatic category; DIN IEC 68-1 55/175/56
Rev. 2.1 page 1 2008-04-18
Page 2
IPD30N03S4L-14
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
SMD version, device on PCB
Electrical characteristics, at T
2)
R
thJC
R
thJA
=25 °C, unless otherwise specified
j
minimal footprint - - 62
2
cooling area
6 cm
3)
- - 4.9 K/W
--40
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
V
GS(th)
I
DSS
=0 V, ID= 1 mA
VDS=VGS, ID=10 µA
VDS=30 V, VGS=0 V, T
=25 °C
j
30 - - V
1.0 1.5 2.2
- 0.01 1 µA
Gate-source leakage current
Drain-source on-state resistance
I
R
GSS
DS(on)
V
=30 V, VGS=0 V,
DS
T
=125 °C
j
V
DS
T
=85 °C
j
2)
=18 V, VGS=0 V,
2)
VGS=16 V, VDS=0 V
VGS=4.5 V, ID=15 A
V
=10 V, ID=30 A
GS
- 10 1000
-560
- 1 100 nA
- 16.1 20.5
mΩ
- 11.2 13.6
Rev. 2.1 page 2 2008-04-18
Page 3
IPD30N03S4L-14
y
g
Parameter Symbol Conditions Unit
Values
min. typ. max.
namic characteristics
D
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate to drain charge
Gate charge total
2)
C
iss
V
=0 V, VDS=25 V,
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
2)
Q
gs
Q
gd
Q
g
GS
f =1 MHz
V
=15 V, VGS=10 V,
DD
I
=30 A, R
D
=24 V, ID=30 A,
V
DD
V
=0 to 10 V
GS
=3.5 Ω
G
- 750 980 pF
- 190 250
-1020
-3-ns
-2-
-12-
-2-
- 2.2 3 nC
- 1.4 3
-1114
Gate plateau voltage
V
plateau
- 3.4 - V
Reverse Diode
Diode continous forward current
I
S
- - 30 A
2)
TC=25 °C
Diode pulse current
2)
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Current is limited by bondwire; with an R
see Application Note ANPS071E at www.infineon.com/optimos
2)
Defined by design. Not subject to production test.
3)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
connection. PCB is vertical in still air.
2)
2)
I
S,pulse
V
t
rr
Q
thJC
SD
rr
VGS=0 V, IF=30 A, T
=25 °C
j
VR=15 V, IF=IS,
di
/dt =100 A/µs
F
= 4.9K/W the chip is able to carry 38A at 25°C. For detailed information
- - 120
0.6 0.95 1.3 V
-12-ns
-10-nC
Rev. 2.1 page 3 2008-04-18
Page 4
1 Power dissipation 2 Drain current
P
= f(TC); V
tot
≥ 6 V ID = f(TC); V
GS
GS
IPD30N03S4L-14
≥ 6 V
40
35
30
30
25
20
[W]
20
tot
P
[A]
D
I
15
10
10
5
0
0 50 100 150 200
TC [°C]
0
0 50 100 150 200
TC [°C]
3 Safe operating area 4 Max. transient thermal impedance
I
= f(VDS); TC = 25 °C; D = 0 Z
D
parameter: t
p
1000
1 µs
100
10 µs
[A]
D
I
10
100 µs
1 ms
1
0.1 1 10 100
VDS [V]
= f(tp)
thJC
parameter: D =tp/T
1
10
0.5
0
0.1
10
0.05
0.01
-1
[K/W]
10
thJC
Z
10
10
-2
-3
10
single pulse
-6
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
tp [s]
Rev. 2.1 page 4 2008-04-18
Page 5
IPD30N03S4L-14
5 Typ. output characteristics 6 Typ. drain-source on-state resistance
I
= f(VDS); Tj = 25 °C R
D
parameter: V
GS
parameter: V
= f(ID); Tj = 25 °C
DS(on)
GS
[A]
D
I
120
100
80
60
10 V
5 V
4.5 V
4 V
]
Ω
[m
DS(on)
40
35
30
25
3.5 V
4 V
4.5 V
R
40
3.5 V
20
3 V
2.5 V
0
0123456
VDS [V]
20
15
10
0 20406080100
ID [A]
7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance
5 V
10 V
I
= f(VGS); V
D
parameter: T
120
100
80
60
[A]
D
I
40
20
0
123456
= 6V R
DS
j
-55 °C
25 °C
175 °C
VGS [V]
= f(Tj); ID = 30 A; V
DS(on)
GS
= 10 V
20
18
16
]
Ω
[m
14
DS(on)
R
12
10
8
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 2.1 page 5 2008-04-18
Page 6
9 Typ. gate threshold voltage 10 Typ. capacitances
IPD30N03S4L-14
V
GS(th)
= f(Tj); V
parameter: I
2
1.75
1.5
1.25
[V]
1
GS(th)
V
0.75
0.5
0.25
0
-60 -20 20 60 100 140 180
= V
GS
DS
D
100 µA
10 µA
C = f(VDS); V
3
10
2
10
[pF]
C
1
10
0
10
= 0 V; f = 1 MHz
GS
Ciss
Coss
Crss
0 5 10 15 20 25 30
Tj [°C]
VDS [V]
11 Typical forward diode characteristicis 12 Typ. avalanche characteristics
IF = f(V
parameter: T
) I
SD
j
3
10
2
10
[A]
F
I
1
10
25 °C
175 °C
0
10
0 0.2 0.4 0.6 0.8 1 1.2 1.4
VSD [V]
= f(tAV)
A S
parameter: T
100
10
[A]
AV
I
1
0.1
1 10 100 1000
j(start)
100 °C
150 °C
tAV [µs]
25 °C
Rev. 2.1 page 6 2008-04-18
Page 7
IPD30N03S4L-14
13 Typical avalanche energy 14 Typ. drain-source breakdown voltage
E
= f(Tj) V
AS
parameter: I
D
= f(Tj); ID = 1 mA
BR(DSS)
70
60
50
7.5 A
34
33
32
40
[mJ]
AS
E
30
15 A
[V]
BR(DSS)
V
31
30
20
30 A
10
0
25 75 125 175
29
28
-55 -15 25 65 105 145
Tj [°C]
15 Typ. gate charge 16 Gate charge waveforms
Tj [°C]
V
= f(Q
GS
gate
parameter: V
10
9
8
7
6
[V]
5
GS
V
4
3
2
1
0
024681012
); ID = 30 A pulsed
DD
Q
gate
[nC]
6 V
24 V
V
GS
Q
g
V
gs(th)
Q
g(th)
Q
gs
Q
sw
Q
gd
Q
gate
Rev. 2.1 page 7 2008-04-18
Page 8
IPD30N03S4L-14
r
Published by Infineon Technologies AG 81726 Munich, Germany
© Infineon Technologies AG 2007
All Rights Reserved.
Legal Disclaime
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non‑infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 2.1 page 8 2008-04-18
Page 9
Revision History
IPD30N03S4L-14
Version
Revision 2.1
Date
18.04.2008
Changes
Update of type and marking in table on page one
Rev. 2.1 page 9 2008-04-18
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