Page 1
IPD100N06S4-03
OptiMOS®-T2 Power-Transistor
Features
• N-channel - Enhancement mode
• AEC Q101 qualified
• MSL1 up to 260°C peak reflow
• 175°C operating temperature
• Green Product (RoHS compliant)
• 100% Avalanche tested
• Ultra Low R
• Ultra High I
DSon
D
Product Summary
V
DS
R
DS(on),max
I
D
60 V
3.5
100 A
PG-TO252-3-11
mΩ
Type Package Marking
IPD100N06S4-03 PG-TO252-3-11 4N0603
Maximum ratings, at T j=25 °C, unless otherwise specified
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current
Avalanche energy, single pulse
1)
2)
2)
Avalanche current, single pulse
Gate source voltage
Power dissipation
Operating and storage temperature
I
D
I
D,pulse
E
AS
I
AS
V
GS
P
tot
T
, T
j
TC=25°C, VGS=10V
2)
T
=100°C, V GS=10V
C
100
TC=25°C
ID=50A
-
- ±20 V
TC=25°C
- -55 ... +175 °C
stg
Value
100 A
400
300 mJ
100 A
150 W
IEC climatic category; DIN IEC 68-1 - - 55/175/56
−
Rev. 1.0 page 1 2010-02-11
Page 2
IPD100N06S4-03
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
SMD version, device on PCB
Electrical characteristics, at T
2)
R
thJC
R
thJA
=25 °C, unless otherwise specified
j
- - - 1.0 K/W
minimal footprint - - 62
6 cm
2
cooling area
3)
--4 0
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSSVGS
V
GS(th)
I
DSS
=0V, I D= 1mA
VDS=VGS, ID=90µA
VDS=60V, VGS=0V,
T
=25°C
j
60 - - V
2.0 3.0 4.0
- 0.03 1 µA
Gate-source leakage current
Drain-source on-state resistance
I
R
GSS
DS(on)
V
=60V, V GS=0V,
DS
T
=125°C
j
2)
VGS=20V, VDS=0V
VGS=10V, ID=100A
- 10 100
- - 100 nA
- 2.8 3.5
mΩ
Rev. 1.0 page 2 2010-02-11
Page 3
IPD100N06S4-03
Parameter Symbol Conditions Unit
Values
min. typ. max.
namic characteristics
D
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate to drain charge
Gate charge total
2)
C
iss
V
=0V, VDS=25V,
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
2)
Q
gs
Q
gd
Q
g
GS
f =1MHz
V
=30V, V GS=10V,
DD
I
=100A, R
D
=48V, I D=100A,
V
DD
V
=0 to 10V
GS
=3.5Ω
G
- 7980 10400 pF
- 1960 2540
- 75 150
-3 0- n s
-7 0-
-4 0-
-5-
-4 45 7 n C
-1 02 0
- 99 128
Gate plateau voltage
V
plateau
- 5.6 - V
Reverse Diode
2)
Diode continous forward current
Diode pulse current
2)
Diode forward voltage
Reverse recovery time
Reverse recovery charge
1)
Current is limited by bondwire; with an R
2)
Specified by design. Not subject to production test.
3)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
2)
2)
I
S
I
S,pulse
V
SD
t
rr
Q
rr
= 1.0K/W the chip is able to carry 154A at 25°C.
thJC
=25°C
T
C
VGS=0V, IF=100A,
T
=25°C
j
VR=30V, IF=50A,
di
/dt =100A/µs
F
connection. PCB is vertical in still air.
- - 100 A
- - 400
0.6 0.95 1.3 V
- 125 - ns
- 110 - nC
Rev. 1.0 page 3 2010-02-11
Page 4
1 Power dissipation 2 Drain current
P
= f(T C); V
tot
≥ 6 V I D = f( T C); V
GS
GS
IPD100N06S4-03
≥ 6 V
160
120
140
100
120
80
100
[W]
80
tot
P
[A]
D
I
60
60
40
40
20
0
0 50 100 150 200
TC [°C]
20
0
0 50 100 150 200
T
[°C]
C
3 Safe operating area 4 Max. transient thermal impedance
I
= f(V DS); T C = 25 °C; D = 0 Z
D
parameter: t
p
1000
1 µs
10 µs
100
100 µs
[A]
D
I
10
1 ms
1
0.1 1 10 100
VDS [V]
= f(t p)
thJC
parameter: D =t p/T
1
10
0
10
0.5
0.1
-1
[K/W]
10
-2
-3
10
0.05
0.01
single pulse
-6
10
-5
thJC
Z
10
10
10
10
-1
10
-3
10
-4
-2
10
0
tp [s]
Rev. 1.0 page 4 2010-02-11
Page 5
IPD100N06S4-03
5 Typ. output characteristics 6 Typ. drain-source on-state resistance
I
= f(V DS); T j = 25 °C R
D
parameter: V
GS
parameter: V
= f(I D); T j = 25 °C
DS(on)
GS
360
10 V
8 V
7 V
320
280
240
6.5 V
200
[A]
D
I
160
6 V
120
5.5 V
80
40
0
01234
VDS [V]
10
5 V
6 V
9
8
7
]
Ω
6
[m
5
DS(on)
R
4
3
2
1
0 100 200 300 400
ID [A]
7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance
7 V
8 V
10 V
I
= f(V GS); V
D
parameter: T
350
300
250
200
[A]
D
I
150
100
50
0
34567
= 6V R
DS
j
175 °C
25 °C
-55 °C
VGS [V]
= f(T j); I D = 100 A; V
DS(on)
GS
= 10 V
6
5.5
5
4.5
]
4
Ω
[m
3.5
DS(on)
3
R
2.5
2
1.5
1
-60 -20 20 60 100 140 180
Tj [°C]
Rev. 1.0 page 5 2010-02-11
Page 6
9 Typ. gate threshold voltage 10 Typ. capacitances
IPD100N06S4-03
V
GS(th)
= f(T j); V
parameter: I
4
3.5
3
[V]
GS(th)
V
2.5
2
1.5
-60 -20 20 60 100 140 180
= V
GS
DS
D
900 µA
C = f(VDS); V
4
10
3
10
= 0 V; f = 1 MHz
GS
Ciss
Coss
C [pF]
90 µA
2
10
Crss
1
10
0 5 10 15 20 25 30
Tj [°C]
VDS [V]
11 Typical forward diode characteristicis 12 Avalanche characteristics
IF = f(V
parameter: T
) I
SD
j
3
3
10
10
2
2
10
10
[A]
[A]
F
F
I
I
25 °C
25 °C
175 °C
1
1
10
10
0
0
10
10
0 0.2 0.4 0.6 0.8 1 1.2 1.4
0 0.2 0.4 0.6 0.8 1 1.2 1.4
175 °C
VSD [V]
VSD [V]
= f(t AV)
A S
parameter: T
1000
100
[A]
AV
I
10
1
0.1 1 10 100 1000
j(start)
150 °C
tAV [µs]
25 °C
100 °C
Rev. 1.0 page 6 2010-02-11
Page 7
IPD100N06S4-03
13 Avalanche energy 14 Drain-source breakdown voltage
E
= f(T j); I D = 50 A V
AS
= f(T j); I D = 1 mA
BR(DSS)
350
300
250
200
66
64
62
[V]
[mJ]
AS
E
150
100
50
0
25 75 125 175
BR(DSS)
V
60
58
56
-55 -15 25 65 105 145
Tj [°C]
15 Typ. gate charge 16 Gate charge waveforms
Tj [°C]
V
= f(Q
GS
gate
parameter: V
10
9
8
7
6
[V]
5
GS
V
4
3
2
1
0
0 2 04 06 08 01 0 0
); I D = 100 A pulsed
DD
Q
[nC]
gate
12 V
48 V
V
GS
Q
g
V
gs(th)
Q
g(th)
Q
gs
Q
sw
Q
gd
Q
gate
Rev. 1.0 page 7 2010-02-11
Page 8
IPD100N06S4-03
Published by
Infineon Technologies AG
81726 Munich, Germany
© Infineon Technologies AG 2010
All Rights Reserved.
Legal Disclaime
The information given in this document shall in no event be regarded as a guarantee of conditions
or characteristics. With respect to any examples or hints given herein, any typical values stated
herein and/or any information regarding the application of the device, Infineon Technologies hereby
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties
of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact
the nearest Infineon Technologies Office (www.infineon.com ).
Warnings
Due to technical requirements, components may contain dangerous substances.
For information on the types in question, please contact the nearest Infineon Technologies Office.
Infineon Technologies components may be used in life-support devices or systems only with the
express written approval of Infineon Technologies, if a failure of such components can reasonably be
expected to cause the failure of that life-support device or system or to affect the safety or
effectiveness of that device or system. Life support devices or systems are intended to be implanted
in the human body or to support and/or maintain and sustain and/or protect human life.
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0 page 8 2010-02-11
Page 9
Revision History
IPD100N06S4-03
Version
Rev. 1.0
Date
11.02.2010
Changes
Data Sheet 1.0
Rev. 1.0 page 9 2010-02-11