The IN74AC534 is identical in pinout to the LS/ALS534,
HC/HCT534. The device inputs are compatible with standard CMOS
outputs; with pullup resistors, they are compatible with LS/ALS
outputs.
Data meeting the setup time is clocked, in inverted form, to the
outputs with the rising edge of the Clock. The Output Enable input
does not affect the states of the flip-flops, but when Output Enable is
high, the outputs are forced to the high impedance state. Thus, data
may be stored even when the outputs are not enabled.
•
Outputs Directly Interface to CMOS, NMOS, and TTL
•
Operating Voltage Range: 2.0 to 6.0 V
•
Low Input Current: 1.0 µA; 0.1 µA @ 25°C
•
High Noise Immunity Characteristic of CMOS Devices
•
Outputs Source/Sink 24 mA
IN74AC534
ORDERING INFORMATION
IN74AC534N Plastic
IN74AC534DW SOIC
TA = -40° to 85° C for all
packages
PIN ASSIGNMENT
LOGIC DIAGRAM
PIN 20=V
PIN 10 = GND
CC
FUNCTION TABLE
InputsOutput
Output
Enable
LHL
LLH
LL,H,X no
HXXZ
X = don’t care
Z = high impedance
ClockDQ
change
446
Page 2
IN74AC534
MAXIMUM RATINGS
*
SymbolParameterValueUnit
V
CC
V
V
OUT
I
IN
I
OUT
I
CC
P
DC Supply Voltage (Referenced to GND)-0.5 to +7.0V
DC Input Voltage (Referenced to GND)-0.5 to VCC +0.5V
IN
DC Output Voltage (Referenced to GND)-0.5 to VCC +0.5V
DC Input Current, per Pin
DC Output Sink/Source Current, per Pin
DC Supply Current, VCC and GND Pins
Power Dissipation in Still Air, Plastic DIP+
D
SOIC Package+
±
20
±
50
±
50
750
500
TstgStorage Temperature-65 to +150
T
Lead Temperature, 1 mm from Case for 10 Seconds
L
260
(Plastic DIP or SOIC Package)
*
Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
+Derating - Plastic DIP: - 10 mW/°C from 65° to 125°C
SOIC Package: : - 7 mW/°C from 65° to 125°C
mA
mA
mA
mW
°
C
°
C
RECOMMENDED OPERATING CONDITIONS
SymbolParameterMinMaxUnit
V
CC
VIN, V
T
J
T
A
I
OH
I
OL
tr, t
f
*
VIN from 30% to 70% V
This device c ontains p rote ction ci rcuitr y to guard a gainst damage d ue to high st atic voltages or electr ic
fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated
voltages to this high-impedance circuit. For proper operation, V
GND≤(V
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or V
Unused outputs must be left open.
DC Supply Voltage (Referenced to GND)2.06.0V
DC Input Voltage, Output Voltage (Referenced to GND)0V
OUT
Junction Temperature (PDIP)140
Operating Temperature, All Package Types-40+85
Output Current - High-24mA
Output Current - Low24mA
Input Rise and Fall Time
(except Schmitt Inputs)
IN
or V
OUT
)≤VCC.
CC
*
V
V
V
=3.0 V
CC
=4.5 V
CC
=5.5 V
CC
and V
IN
0
0
0
should be constrained to the range
OUT
CC
150
40
25
V
°
C
°
C
ns/V
CC
).
447
Page 3
IN74AC534
DC ELECTRICAL CHARACTERISTICS
(Voltages Referenced to GND)
SymbolParameterTest ConditionsV
V
Minimum High-Level
IH
V
=0.1 V or VCC-0.1 V3 .0
OUT
Input Voltage
V
Maximum Low -
IL
V
=0.1 V or VCC-0.1 V3 .0
OUT
Level Input Voltage
V
OH
Minimum High-Level
I
OUT
≤ -50 µA
Output Voltage
*
VIN=VIH or V
IL
IOH=-12 mA
I
=-24 mA
OH
I
=-24 mA
OH
V
OL
Maximum Low-Level
I
OUT
≤ 50 µA
Output Voltage
*
VIN=VIH or V
IL
IOL=12 mA
I
=24 mA
OL
I
=24 mA
OL
I
IN
Maximum Input
VIN=VCC or GND5.5
Leakage Current
I
I
OZ
OLD
Maximum ThreeState Leakage
Current
+Minimum Dynamic
VIN(OE)= VIH or V
IL
VIN=VCC or GND
V
OUT=VCC
V
OLD
or GND
=1.65 V Max5.575mA
Output Current
I
OHD
+Minimum Dynamic
V
=3.85 V Min5.5-75mA
OHD
Output Current
I
CC
Maximum Quiescent
VIN=VCC or GND5.58.080
Supply Current
(per Package)
*
All outputs loaded; thresholds on input associated with output under test.
+Maximum test duration 2.0 ms, one output loaded at a time.
Note: I
IN
and I
@ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V V