Datasheet ILX551A Datasheet (Sony)

Page 1
2048-pixel CCD Linear Sensor (B/W)
Description
The ILX551A is a reduction type CCD linear sensor designed for facsimile, image scanner and OCR use. This sensor reads B4 size documents at a density of 200DPI (Dot Per Inch). A built-in timing generator and clock-drivers ensure direct drive at 5V logic for easy use.
Features
• Number of effective pixels: 2048 pixels
• Pixel size: 14µm × 14µm (14µm pitch)
• Built-in timing generator and clock-drivers
• Ultra low lag
• Maximum clock frequency: 5MHz
Absolute Maximum Ratings
• Supply voltage VDD1 11 V
VDD2 6V
•Operating temperature –10 to +55 °C
• Storage temperature –30 to +80 °C
Pin Configuration (Top View)
Block Diagram
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E00439-PS
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
ILX551A
22 pin DIP (Cer-DIP)
22 20 17 16 15 14 13 12 10
91142119587632
1
VOUT
Output amplifier
Sample-and-hold
circuit
V
DD2
18
NC V
DD1 GND NC NC NC NC GND NC
V
DD2φROG
SHSWV
DD2
GND
φCLK
V
DD2NCNC
NC
NC
Clock pulse generator
Sample-and-hold pulse generator
Mode
selector
Read out gate
pulse generator
Clock-drivers
CCD analog shift register
Read out gate
D14
D15
S1
D33
S2
S2047
S2048
D34
D35
D36
D37
D38
D39
1 22
V
OUT
2
NC
3
NC
4
SHSW
5
φCLK
6
NC
7
NC
8
V
DD2
9
V
DD2
10
NC
11
21
20
19
18
17
16
15
14
13
12
φROG
V
DD2
VDD2
VDD1
GND
NC
GND
NC
NC
NC
NC
GND
1
2048
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ILX551A
Unit
pF pF
Max.
— —
Typ.
10 10
Min.
— —
Symbol CφCLK CφROG
Item Input capacity of φCLK pin Input capacity of φROG pin
Input Capacity of Pins
Item
Unit
V V
Max.
9.5
5.25
Typ.
9.0
5.0
Min.
8.5
4.75
Item VDD1 VDD2
Recommended Supply Voltage
Pin condition
Pin 4 SHSW
GND
VDD2
Mode in use
S/H Yes
No
Mode Description
Unit
V V
Max.
5.5
0.5
Typ.
5.0 —
Min.
4.5
0.0
Input clock high level Input clock low level
Recommended Input Pulse Voltage
Pin Description
Pin No.
Symbol Description
1 2 3
4 5
6 7 8
9 10 11
VOUT NC NC
SHSW φCLK
NC NC VDD2 VDD2 NC φROG
Signal output NC NC
with S/H → GND
Switch
without S/H → VDD2 Clock pulse NC NC 5V power supply 5V power supply NC Clock pulse
Pin
No.
Symbol Description
12 13 14
15 16
17 18 19 20 21 22
GND NC NC
NC NC
GND NC GND VDD1 VDD2 VDD2
GND NC NC
NC NC
GND NC GND 9V power supply 5V power supply 5V power supply
Note) Rules for raising and lowering power supply voltage
To raise power supply voltage, first raise VDD1 (9V) and then VDD2 (5V). To lower voltage, first lower VDD2 (5V) and then VDD1 (9V).
{
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ILX551A
Unit Remarks
Max.
50
8.0 —
2.0
3.0 — — —
8.0
5.0 — — —
Typ.
40
2.0
1.8
0.3
0.5
0.02
6000
0.045
4.0
1.8
97.0 600
4.0
Min.
30 —
1.5 — — — — — — —
92.0 — —
Symbol R PRNU VSAT VDRK DSNU IL DR SE IVDD1 IVDD2 TTE ZO VOS
Item
Electrooptical Characteristics
(Ta = 25°C, VDD1 = 9V, VDD2 = 5V, Clock frequency = 1MHz, Light source = 3200K, IR cut filter: CM-500S (t = 1.0mm))
Notes)
1. For the sensitivity test light is applied with a uniform intensity of illumination.
2. PRNU is defined as indicated below. Ray incidence conditions are the same as for Note 1. PRNU = × 100 [%]
The maximum output is set to VMAX, the minimum output to VMIN and the average output to VAVE.
3. Integration time is 10ms.
4. VOUT = 500mV
5. DR =
When optical accumulated time is shorter, the dynamic range gets wider because dark voltage is in proportion to optical accumulated time.
6. SE =
7. Vos is defined as indicated below.
(VMAX – VMIN)/2
VAVE
VSAT
R
GND
OS
D31 D32 D33 S1
V
OS
,
V/(lx · s)
%
V mV mV
% —
lx · s
mA mA
%
Ω
V
Note 1 Note 2
— Note 3 Note 3 Note 4 Note 5 Note 6
—
—
—
— Note 7
Secsitivity Sensitivity nonuniformity Saturation output voltage Dark voltage average Dark signal nonuniformity Image lag Dynamic range Saturation exposure 9V supply current 5V supply current Total transfer efficiency Output impedance Offset level
VSAT
VDRK
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ILX551A
Fig. 1. Clock Timing Diagram (without S/H mode)
Dummy signal (33 pixels)
Optical black
(18 pixels)
Dummy signal
(6 pixels)
Effective picture
elements signal
(2048 pixels)
1-line output period (2087 pixels)
1
D2
D3
D4
D5
D6
D11
D12
D13
D14
D15
D31
D32
D33
S1
S2
S3
S4
S2045
S2046
S2047
S2048
D34
D35
D36
S37
S38
D39
2
3
4
2087
1
2
5
φROG
φCLK
V
OUT
0
5
0
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ILX551A
Fig. 2. φCLK, VOUT Timing
,

φCLK
t3 t4
t2t1
t5
t6
V
OUT
Item
φCLK pulse rise/fall time φCLK pulse duty
∗1
φCLK – VOUT 1 φCLK – VOUT 2
Symbol t1, t2 — t5 t6
Min.
0 40 50 30
Typ.
10 50 80 75
Max.
—
60 110 120
Unit
ns
% ns ns
∗1
100 × t3/(t3 + t4)
Fig. 3. φROG, φCLK Timing
φROG
φCLK
t7 t11
t8 t10t9
Item
φROG, φCLK pulse timing φROG pulse rise/fall time φROG pulse period
Symbol t7, t11 t8, t10 t9
Min.
500
0
500
Typ.
1000
10
1000
Max.
— — —
Unit
ns ns ns
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ILX551A
Example of Representative Characteristics
Dark signal voltage rate vs. Ambient temperature
(Standard characteristics)
10
5
1
Dark signal voltage rate
0.5
0.1 0 10 20 30
Ta – Ambient temperature [°C]
40 50 60
VDD1, VDD2 supply current vs. Clock frequency
(Standard characteristics)
10
IVDD1
Ta = 25°C
I
VDD2
5
1
IVDD1, IVDD2 – VDD1, VDD2 supply current [mA]
0.5
0.1
0.1M 1M Clock frequency [Hz]
5M
Spectral sensitivity characteristics
(Standard characteristics)
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1 0
Relative sensitivity
400 500 600 700 800 900 1000
Wavelength [nm]
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ILX551A
Application Circuit
VOUT
NC
NC
SHSW
φCLK
NC
NC
V
DD2 (D)
V
DD2 (D)
NC
φROG
VDD2 (D)
V
DD2 (D)
1Ω
5V
9V
0.01µ
10µ/16V
2SA1175
φCLK φROG
22µ/10V0.01µ
Output signal
3kΩ
VDD1 (A)
GND (A)
NC
GND (A)
NC
NC
NC
NC
GND (D)
22 21 20 19 18 17 16 15 14 13 12
1 2 3 4 5 6 7 8 9 10 11
Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for
any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same.
Page 8
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ILX551A
Notes of Handling
1) Static charge prevention CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following protective measures. a) Either handle bare handed or use non chargeable gloves, clothes or material. Also use conductive shoes. b) When handling directly use an earth band. c) Install a conductive mat on the floor or working table to prevent the generation of static electricity. d) Ionized air is recommended for discharge when handling CCD image sensor. e) For the shipment of mounted substrates, use boxes treated for prevention of static charges.
2) Notes on Handling CCD Cer-DIP Packages The following points should be observed when handling and installing cer DIP packages. a) Remain within the following limits when applying static load to the ceramic portion of the package:
(1) Compressive strength: 39N/surface
(Do not apply load more than 0.7mm inside the outer perimeter of the glass portion.) (2) Shearing strength: 29N/surface (3) Tensile strength: 29N/surface (4) Torsional strength: 0.9Nm
b) In addition, if a load is applied to the entire surface by a hard component, bending stress may be
generated and the package may fracture, etc., depending on the flatness of the ceramic portion. Therefore, for installation, either use an elastic load, such as a spring plate, or an adhesive.
c) Be aware that any of the following can cause the glass to crack: because the upper and lower ceramic
layers are shielded by low-melting glass,
(1) Applying repetitive bending stress to the external leads. (2) Applying heat to the external leads for an extended period of time with soldering iron. (3) Rapid cooling or heating. (4) Rapid cooling or impact to a limited portion of the low-melting glass with a small-tipped tool such as
tweezers. (5) Prying the upper or lower ceramic layers away at a support point of the low-melting glass.
Note that the preceding notes should also be observed when removing a component from a board after it has already been soldered.
3) Soldering a) Make sure the package temperature does not exceed 80°C. b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a grounded
30W soldering iron and solder each pin in less then 2 seconds. For repairs and remount, cool sufficiently.
c) To dismount an imaging device, do not use a solder suction equipment. When using an electric desoldering
tool, ground the controller. For the control system, use a zero cross type.
Upper ceramic layer
39N
Lower ceramic layer
Low-melting glass
(1)
29N
(3)
0.9Nm
(4)
29N
(2)
Page 9
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ILX551A
4) Dust and dirt protection a) Operate in clean environments. b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should
dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized air is recommended.)
c) Clean with a cotton bud and ethyl alcohol if the glass surface is grease stained. Be careful not to scratch
d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when
moving to a room with great temperature differences.
5) Exposure to high temperatures or humidity will affect the characteristics. Accordingly avoid storage or usage in such conditions.
6) CCD image sensors are precise optical equipment that should not be subject to mechanical shocks.
Page 10
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ILX551A
Package Outline Unit: mm
1. The height from the bottom to the sensor surface is 2.45 ± 0.3mm.
2. The thickness of the cover glass is 0.7mm, and the refractive index is 1.5.
V
H
7.35 ± 0.5
22
28.672 (14µm X 2048Pixels)
41.6 ± 0.5
1
11
12
No.1 Pixel
5.0 ± 0.5
4.0 ± 0.5
2.54 0.51
3.65
4.35 ± 0.5
0.25
0° to 9°
10.0 ± 0.5
0.3
22pin DIP (400mil)
M
Cer-DIP
TIN PLATING
42 ALLOY
5.20g
PACKAGE STRUCTURE
PACKAGE MATERIAL
LEAD TREATMENT
LEAD MATERIAL
PACKAGE MASS
DRAWING NUMBER
LS-A18-01(E)
Sony Corporation
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