The ILX523A is a reduction type CCD linear sensor
designed for facsimile, scanner and OCR use. This
sensor reads A3 size documents at a density of 200
DPI (Dot Per Inch).
In addition, this can be directly driven at 5V logic
and operate on single 12V power supply for easy
use.
ILX523A
22 pin DIP (Cer-DIP)
Features
• Number of effective pixels: 2700 pixels
• Pixel size:11µm ×11µm (11µm pitch)
• Ultra low lag/High Sensitivity
• Built-in Feed through suppression circuit
• Built-in Sample-and-hold circuit
• Maximum data rate: 5MHz
• Single 12V power supply
Absolute Maximum Ratings
• Supply voltageVDD15V
• Operating temperature–10 to +60°C
• Storage temperature–30 to +80°C
Pin Configuration (Top View)
VOUT
V
SS
NC
φS/H
NC
NC
NC
NC
φ1
NC
φROG
10
11
1
2
3
4
5
6
7
8
9
1
2700
22
21
20
19
18
17
16
15
14
13
12
NC
NC
V
DD
T1
φRS
NC
NC
NC
φ2
NC
NC
Block Diagram
18
φRST1
Timing
19
D39
D34
S2700
S2699
S2
S1
D33
D15
D14
Generator
Timing
Generator
Read Out gate
CCD Analog Shift Register
• Output Amplifier
• Sample-and-Hold Circuit
• Feed Through Level
Clamp Circuit
11
9
14
20
2
1
VDD
GNDVOUTφROGφ1φ2
4
φS/H
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
– 1 –
E97442A78
Page 2
Pin Description
Pin No.SymbolDescriptionPin No.SymbolDescription
ILX523A
1
2
3
4
5
6
7
8
9
10
11
VOUT
GND
NC
φS/H
NC
NC
NC
NC
φ1
NC
φROG
Signal output
GND
NC
Sample-and-Hold pulse
NC
NC
NC
NC
Transfer pulse 1
NC
Read out gate pulse
12
13
14
15
16
17
18
19
20
21
22
NC
NC
φ2
NC
NC
NC
φRS
T1
VDD
NC
NC
Note) Connect Pin 4 to GND when not using internal sample-and-hold circuit.
Recommended Pin Voltage
Item
VDD
Min.
11.4
Typ.
12.0
Max.
12.6
Unit
V
NC
NC
Transfer pulse 2
NC
NC
NC
Reset gate pulse
Test pin (Open)
12V power supply
NC
NC
Clock Characteristics
Item
Input capacitance of φ1
Input capacitance of φ2
Input capacitance of φROG
Input capacitance of φRS
Input capacitance of φS/H
Data Rate
Symbol
Cφ1
Cφ2
CφROG
CφRS
CφS/H
—
Min.
—
—
—
—
—
—
Typ.
300
300
10
10
10
1.0
Max.
—
—
—
—
—
5.0
Unit
pF
pF
pF
pF
pF
MHz
– 2 –
Page 3
Electrooptical Characteristics
(Ta = 25°C, VDD = 12V, data rate = 1MHz, mode without S/H (Pin 4 = GND),
light source = 3200K, IR cut filter CM-500S (t = 1.0mm) used)
ItemSymbolMin.Typ.Max.UnitRemarks
ILX523A
Sensitivity
Sencitivity nonuniformity
Saturation output voltage
Dark voltage average
Dark signal nonuniformity
Image Lag
Dynamic range
Saturation exposure
Supply current
Total transfer efficiency
Output impedance
Offset level
Notes)
1. For the sensitivity test, light is applied with a uniform intensity of illumination.
2. PRNU is defined as indicated below. Ray incidence conditions are the same as for Note 1.
The output signal amplitude for test is 1V.
PRNU = × 100 [%]
(VMAX – VMIN)/2
VAVE
R1
PRNU
VSAT
VDRK
DSNU
IL
DR
SE
IVDD
TTE
ZO
VOS
66.5
—
2.0
—
—
—
—
—
—
92.0
—
—
95
2.0
2.5
2.0
7.0
0.02
1250
0.02
15.0
98.0
300
7.4
123.5
10.0
—
8.0
14.0
—
—
—
25.0
—
—
—
V/(lx · s)
%
V
mV
mV
%
—
lx · s
mA
%
Ω
V
Note 1
Note 2
—
Note 3
Note 3
Note 4
Note 5
Note 6
—
—
—
Note 7
The maximum output of all the valid pixels is set to VMAX, the minimum output to VMIN and the average
output to VAVE.
3. Optical signal accumulated time stands at 10ms.
4. Output signal amplitude VOUT = 500mV.
5. Dynamic range is defined as follows.
DR =
When the optical signal accumulated time is shorter, the dynamic range gets wider because the optical
signal accumulated time is in proportion to the dark voltage.
6. Saturation exposure is defined as follows.
SE =
7. VOS is defined as indicated below.
VSAT
VDRK
VSAT
R1
VOUT
D30D31D29D33S1D32
VOS
A
GND
– 3 –
Page 4
ILX523A
2739
D39
D38
D37
D36
D35
D34
S2700
S2699
S2698
S2697
S4
S3
S2
S1
D33
D32
D31
D15
D14
D13
D12
D11
Dummy signal (6 pixels)
(2700 pixels)
Effective picture elements signal
(18 pixels)
Optical black
1-line output period (2739 pixels)
Note) 2750 or more clock pulses (φ1, φ2, φRS) are required.
Dark signal output temperature characteristics (standard characteristics)
100
50
10
5
1
0.5
Output voltage rate
0.1
0.05
0.01
–1020304060
Ta – Ambient temperature [°C]
50010
– 9 –
Page 10
ILX523A
Offset level vs. Temperature characteristics
(Standard characteristics)
12
10
8
6
– Offset level [V]
4
OS
V
2
0
–100306040
Ta – Ambient temperature [°C]
∆Vos
∆Ta
1020
–5mV/ °C
Supply current vs. VDD characteristics
(Standard characteristics)
20
50
Offset level vs. VDD characteristics
(Standard characteristics)
12
10
8
6
∆Vos
– Offset level [V]
4
OS
V
2
0
11.411.612.212.612.4
11.812.0
∆VDD
VDD [V]
Output voltage vs. Integration time
(Standard characteristics)
10
0.8
15
10
– Supply current [mA]
DD
5
Iv
0
11.411.612.212.612.4
11.812.0
VDD [V]
5
Output voltage rate
1
1050100
τ – Integration time [ms]
– 10 –
Page 11
Notes on Handling
1) Static charge prevention
CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following
protective measures.
a) Either handle bare handed or use non chargeable gloves, clothes or material.
Also use conductive shoes.
b) When handling directly use an earth band.
c) Install a conductive mat on the floor or working table to prevent the generation of static electricity.
d) Ionized air is recommended for discharge when handling CCD image sensor.
e) For the shipment of mounted substrates, use boxes treated for prevention of static charges.
2) Notes on Handling CCD Cer-DIP Packages
The following points should be observed when handling and installing Cer-DIP packages.
a) Remain within the following limits when applying static load to the ceramic portion of the package:
(1)Compressive strength:39N/surface (Do not apply load more than 0.7mm inside the outer perimeter of
b) In addition, if a load is applied to the entire surface by a hard component, bending stress may be
generated and the package may fracture, etc., depending on the flatness of the ceramic portion.
Therefore, for installation, either use an elastic load, such as a spring plate, or an adhesive.
c) Be aware that any of the following can cause the glass to crack: because the upper and lower ceramic
layers are shielded by low-melting glass,
(1)Applying repetitive bending stress to the external leads.
(2)Applying heat to the external leads for an extended period of time with soldering iron.
(3)Rapid cooling or heating.
(4)Rapid cooling or impact to a limited portion of the low-melting glass with a small-tipped tool such as
tweezers.
(5)Prying the upper or lower ceramic layers away at a support point of the low-melting glass.
Note that the preceding notes should also be observed when removing a component from a board after it
has already been soldered.
3) Soldering
a) Make sure the package temperature does not exceed 80°C.
b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a grounded 30W
soldering iron and solder each pin in less then 2 seconds. For repairs and remount, cool sufficiently.
c) To dismount an imaging device, do not use a solder suction equipment. When using an electric
desoldering tool, ground the controller. For the control system, use a zero cross type.
– 11 –
Page 12
ILX523A
4) Dust and dirt protection
a) Operate in clean environments.
b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should
dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized
air is recommended.)
c) Clean with a cotton bud and ethyl alcohol if the glass surface is grease stained. Be careful not to scratch
the glass.
d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when
moving to a room with great temperature differences.
5) Exposure to high temperatures or humidity will affect the characteristics. Accordingly avoid storage or
usage in such conditions.
6) CCD image sensors are precise optical equipment that should not be subject to mechanical shocks.
7) Normal output signal is not obtained immediately after device switch on.
– 12 –
Page 13
ILX523A
0° to 9°
12
22pin DIP (400mil)
0.25
10.16
(AT STAND OFF)
10.0 ± 0.5
9.0
11
1. The height from the bottom to the sensor surface is 2.45 ± 0.3mm.
2. The thickness of the cover glass is 0.8mm, and the refractive index is 1.5.
4.45 ± 0.5
M
3.65
0.3
Package OutlineUnit: mm
41.6 ± 0.5
29.7 (11µm × 2700Pixels)
6.73 ± 0.8
22
No.1 Pixel
H
V
5.0 ± 0.5
1
40.2
– 13 –
2.540.51
42 ALLOY
TIN PLATING
Cer-DIP
5.2g
4.0 ± 0.5
PACKAGE MATERIAL
LEAD MATERIAL
LEAD TREATMENT
PACKAGE WEIGHT
PACKAGE STRUCTURE
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