The IDT7MP4120 is a 1M x 32 Static RAM module constructed on an epoxy laminate (FR-4) substrate using 8 1M x
4 Static RAMs in plastic packages. Availability of four chip
select lines (one for each group of two RAMs) provides byte
access. The IDT7MP4120 is available with access time as fast
as 20ns with minimal power consumption.
The IDT7MP4120 is packaged in a 72-pin FR-4 ZIP (Zigzag In-line vertical Package)or a 72-pin SIMM (Single In-line
Memory Module). The ZIP configuration allows 72 pins to be
placed on a package 4.05" long and 0.365" wide. At only 0.60"
high, this low-profile package is ideal for systems with minimum board spacing while the SIMM configuration allows use
of edge mounted sockets to secure the module.
All inputs and outputs of the IDT7MP4120 are TTL-compatible and operate from a single 5V supply. Full asynchronous circuitry requires no clocks or refresh for operation and
provides equal access and cycle times for ease of use.
Four identification pins (PD0, PD1, PD2 and PD3) are provided for applications in which different density versions of the
module are used. In this way, the target system can read the
respective levels of PD
0, PD1, PD2 and PD3 to determine a 1M
depth.
The contact pins are plated with 100 micro-inches of nickel
covered by 30 micro-inches minimum of selective gold.
TAOperating Temperature 0 to +70°C
TBIASTemperature Under Bias –10 to +85°C
TSTGStorage Temperature –55 to +125°C
OUTDC Output Current50mA
I
NOTE:3019 tbl 06
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
CSCSOEOEWE
Respect to GND
WE
OutputPower
3019 tbl 05
(1)
RECOMMENDED OPERATING
TEMPERATURE AND SUPPLY VOLTAGE
tCLZ
tOEOutput Enable to Output Valid—12—15ns
tOLZ
tCHZ
tOHZ
tOHOutput Hold from Address Change3—3—ns
(1)
tPU
(1)
tPD
Write Cycle
tWCWrite Cycle Time20—25—ns
tCWChip Select to End-of-Write17—20—ns
tAWAddress Valid to End-of-Write17—20—ns
tASAddress Set-up Time0—0—ns
tWPWrite Pulse Width15—20—ns
tWRWrite Recovery Time3—3—ns
tWHZ
tDWData to Write Time Overlap12—15—ns
tDHData Hold from Write Time0—0—ns
OW
t
NOTE:3019 tbl 10
1. This parameter is guaranteed by design, but not tested.
Chip Select to Output in Low-Z3—3—ns
(1)
Output Enable to Output in Low-Z0—0—ns
(1)
Chip Deselect to Output in High-Z—10—12ns
(1)
Output Disable to Output in High-Z—10—12ns
Chip Select to Power-Up Time0—0—ns
Chip Deselect to Power-Down Time—20—25ns
(1)
Write Enable to Output in High-Z—10—15ns
(1)
Output Active from End-of-Write0—0—ns
7.074
Page 5
IDT7MP4120
1M x 32 CMOS STATIC RAM MODULECOMMERCIAL TEMPERATURE RANGE
TIMING WAVEFORM OF READ CYCLE NO. 1
ADDRESS
t
AA
OE
CS
t
ACS
(5)
t
CLZ
DATA
OUT
TIMING WAVEFORM OF READ CYCLE NO. 2
ADDRESS
tAA
(1)
t
RC
t
(1,2,4)
tRC
OLZ
(5)
t
OE
t
CHZ
t
OHZ
(5)
t
OH
(5)
3019 drw 05
tOHtOH
DATAOUT
TIMING WAVEFORM OF READ CYCLE NO. 3
PREVIOUS DATA VALID
(1,3,4)
CS
tACS
(5)
tCLZ
DATAOUT
NOTES:
1.WE is HIGH for Read Cycle.
2. Device is continuously selected. CS = V
3. Address valid prior to or coincident with CS transition LOW.
4.OE = V
5. Transition is measured ±200mV from steady state. This parameter is guaranteed by design, but not tested.
IL.
IL.
DATA VALID
tCHZ
3019 drw 06
(5)
3019 drw 07
7.075
Page 6
IDT7MP4120
1M x 32 CMOS STATIC RAM MODULECOMMERCIAL TEMPERATURE RANGE
TIMING WAVEFORM OF WRITE CYCLE NO. 1 (
tWC
ADDRESS
OE
tAW
CS
(7)
tWP
DATA
DATA
WE
OUT
tAStWR
(6)
tWHZ
(6)
tOHZ
(4)
IN
WEWE CONTROLLED)
(6)
tOW
tDW
DATA VALID
(1, 2, 3, 7)
tDH
(6)
tOHZ
(4)
3019 drw 08
TIMING WAVEFORM OF WRITE CYCLE NO. 2 (
CSCS CONTROLLED)
(1, 2, 3, 5)
tWC
ADDRESS
tAW
CS
tAStWR
tCW
WE
tDW
DATAIN
NOTES:
1.WE or CS must be HIGH during all address transitions.
2. A write occurs during the overlap (t
WR is measured from the earlier of
3. t
4. During this period, I/O pins are in the output state, and input signals must not be applied.
5. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high-impedance state.
6. Transition is measured ±200mV from steady state with a 5pF load (including scope and jig). This parameter is guaranteed by design, but not tested.
7. If OE is LOW during a WE controlled write cycle, the write pulse width must be the larger of t
to be placed on the bus for the required t
be as short as the specified t
WP.
WP) of a LOW
CS
or WE going HIGH to the end of write cycle.
DW. If
CS
and a LOW WE.
OE
is HIGH during a WE controlled write cycle, this requirement does not apply and the write pulse can
DATA VALID
WP or (tWHZ + tDW) to allow the I/O drivers to turn off and data
tDH
3019 drw 09
7.076
Page 7
IDT7MP4120
1M x 32 CMOS STATIC RAM MODULECOMMERCIAL TEMPERATURE RANGE
PACKAGE DIMENSIONS
ZIP VERSION
FRONT VIEW
SIDE VIEW
0.580
0.600
PIN 1
0.100 TYP
0.050 TYP
3.940
3.960
0.250 TYP
REAR VIEW
0.015
0.025
0.025 TYP
0.125
0.175
0.025 TYP
PIN 1
0.365 MAX
0.100 TYP
3019 drw 10
SIMM VERSION
0.640
0.660
0.240
0.260
0.070
0.090
PIN 1
4.240
4.260
FRONT VIEW
3.980
3.988
0.250
TYP.
0.050
TYP.
0.350
MAX.
0.390
0.410
0.045
0.055
SIDE VIEW
BACK VIEW
PIN 1
7.077
3019 drw 11
Page 8
IDT7MP4120
1M x 32 CMOS STATIC RAM MODULECOMMERCIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT
XXXXX
Device
Type
X
PowerXSpeedXPackage
X
Process/
Temperature
Range
Blank
Z
M
20
25
Commercial (0°C to +70°C)
FR-4 ZIP (Zig-Zag In-line vertical Package)
FR-4 SIMM (Single In-line Memory Module)
Speed in Nanoseconds
SStandard Power
7MP4120 1M x 32 Static RAM Module
3019 drw 12
7.078
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