Datasheet IDT74FCT841DTSOB, IDT74FCT841DTQB, IDT74FCT841DTQ, IDT74FCT841DTPYB, IDT74FCT841DTPY Datasheet (Integrated Device Technology)

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Integrated Device Technology, Inc.
FAST CMOS BUS INTERFACE LATCHES
IDT54/74FCT841AT/BT/CT/DT
FEATURES:
• Common features:
– Low input and output leakage 1µA (max.) – CMOS power levels – True TTL input and output compatibility
– VOH = 3.3V (typ.)
– VOL = 0.3V (typ.) – Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation Tolerant and Radiation
Enhanced versions – Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked) – Available in DIP, SOIC, SSOP, QSOP, CERPACK
and LCC packages
• Features for FCT841T:
– A, B, C and D speed grades – High drive outputs (-15mA IOH, 48mA IOL) – Power off disable outputs permit “live insertion”
FUNCTIONAL BLOCK DIAGRAM
D0
D1
D2
D3
DESCRIPTION:
The FCT8xxT series is built using an advanced dual metal
The FCT8xxT bus interface latches are designed to elimi­nate the extra packages required to buffer existing latches and provide extra data width for wider address/data paths or buses carrying parity. The FCT841T are buffered, 10-bit wide versions of the popular FCT373T function. They are ideal for use as an output port requiring high IOL/IOH.
All of the FCT8xxT high-performance interface family can drive large capacitive loads, while providing low-capacitance bus loading at both inputs and outputs. All inputs have clamp diodes to ground and all outputs are designed for low-capaci­tance bus loading in high-impedance state.
D4
D5
D8
D9
D
Q
LE
LE
OE
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
D
Q
LE
0
Y
D
Q
LE
1
Y
D
Q
LE
2
Y
D
Q
LE
3
Y
D
Q
LE
4
Y
Y
D
Q
LE
5
D
Q
LE
8
Y
Y
9
2571 drw 01
MILITARY AND COMMERCIAL TEMPERATURE RANGES JUNE 1996
1996 Integrated Device Technology, Inc. 6.22 2571/6
1
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IDT54/74FCT841AT/BT/CT/DT FAST CMOS BUS INTERFACE LATCHES
PIN CONFIGURATIONS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
OE
D D1 D2 D3 D4 D5 D6 D7 D D9
GND
VCC1
24
2
0
3
P24-1
4
D24-1
5
SO24-2
6
SO24-7
7
SO24-8
8
&
9
E24-1
10
8
11 12
23 22 21 20 19 18 17 16 15 14 13
Y Y1 Y2 Y3 Y4 Y Y6 Y7 Y8
Y9 LE
0
5
INDEX
D D D
NC
D D D
1
D
4
2
5
3
6
4
7 8
5
9
6
10
7
11
1213
8
D
DIP/SOIC/SSOP/QSOP/CERPACK
TOP VIEW
2571 drw 02 2571 drw 03
PIN DESCRIPTION FUNCTION TABLE
Name I/O Description
DI I The latch data inputs. LE I The latch enable input. The latches are
transparent when LE is HIGH. Input data is latched on the HIGH-to-LOW transition.
YI O The 3-state latch outputs.
OE
I The output enable control. When OE is
LOW, the outputs are enabled. When is HIGH, the outputs V
are in high-
I
OE
impedance (off) state.
2571 tbl 01
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0 V with Respect to GND
(3)
VTERM
TA Operating
Terminal Voltage with Respect to GND
–0.5 to
V
CC +0.5
–0.5 to
VCC +0.5
0 to +70 –55 to +125 °C
V
Temperature
TBIAS Temperature
–55 to +125 –65 to +135 °C Under Bias
TSTG Storage
–55 to +125 –65 to +150 °C Temperature
PT Power Dissipation 0.5 0.5 W IOUT DC Output
–60 to +120 –60 to +120 mA Current
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed
CC by +0.5V unless otherwise noted.
V
2. Input and V
3. Outputs and I/O terminals only.
CC terminals only.
2571 lnk 03
OE
NOTE: 2571 tbl 02
1. H = HIGH, L = LOW, X = Don’t Care, NC = No Change, Z = High Impedance
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
COUT Output
NOTE:
1. This parameter is measured at characterization but not tested.
Inputs Internal Output
OE
LE DI QI YI Function
H H L L Z High Z H H H H Z High Z H L X NC Z Latched (High Z)
L H L L L Transparent L H H H H Transparent L L X NC NC Latched
Capacitance
Capacitance
OE
NC
1
L28-1
CC
V
Y
Y
262728
25
Y
24
Y
23
Y NC
22
Y
21
Y
20
Y
19
0
D
32
0
1
1817161514
NC
LE
9
8
Y
Y
9
D
GND
LCC
TOP VIEW
(1)
(1)
Conditions Typ. Max. Unit
VIN = 0V 6 10 pF
VOUT = 0V 8 12 pF
2 3 4
5 6 7
2571 lnk 04
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IDT54/74FCT841AT/BT/CT/DT FAST CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 V VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V II H Input HIGH Current II L Input LOW Current
(4)
(4)
VI = 0.5V ±1
VCC = Max. VI = 2.7V ±1 µA
IOZH High Impedance Output Current VCC = Max. VO = 2.7V ±1 µA
(4)
(4)
VO = 0.5V ±1
VCC = Max., VI = VCC (Max.) ±1 µA
IOZL (3-State Output pins) II Input HIGH Current VIK Clamp Diode Voltage VCC = Min., IIN = –18mA –0.7 –1.2 V VH Input Hysteresis 200 mV ICC Quiescent Power Supply Current VCC = Max., VIN = GND or VCC 0.01 1 mA
(2)
Max. Unit
2571 lnk 05
OUTPUT DRIVE CHARACTERISTICS FOR FCT841T
Symbol Parameter Test Conditions
V
OH
V
OL
I
OS
I
OFF
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
5. This parameter is guaranteed but not tested.
Output HIGH Voltage VCC = Min.
IN
= V
IH
or V
V
IL
Output LOW Voltage VCC = Min.
IN
= V
IH
or V
V
IL
Short Circuit Current VCC = Max., VO = GND Input/Output Power Off Leakage
(5)
A = –55°C.
VCC = 0V, V
IN
or V
O
(3)
4.5V
(1)
IOH = –6mA MIL.
OH
= –8mA COM'L.
I IOH = –12mA MIL.
OH
= –15mA COM'L.
I I
OL
= 32mA MIL.
OL
= 48mA COM'L.
I
Min. Typ.
2.4 3.3 V
2.0 3.0 V
0.3 0.5 V
–60 –120 –225 mA
(2)
Max. Unit
±
1
µ
A
2571 lnk 06
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IDT54/74FCT841AT/BT/CT/DT FAST CMOS BUS INTERFACE LATCHES
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol Parameter Test Conditions
ICC Quiescent Power Supply Current
TTL Inputs HIGH
ICCD Dynamic Power Supply Current
(4)
VCC = Max. V
IN = 3.4V
VCC = Max.
(3)
Outputs Open
OE
= GND
(1)
VIN = VCC VIN = GND
Min. Typ.
0.5 2.0 mA
0.15 0.25 mA/
LE = VCC One Input Toggling 50% Duty Cycle
IC Total Power Supply Current
(6)
VCC = Max. VIN = VCC 1.5 3.5 mA Outputs Open
VIN = GND
fi = 10MHz 50% Duty Cycle
OE
= GND
IN = 3.4
V V
IN = GND
1.8 4.5
LE = VCC One Bit Toggling VCC = Max. VIN = VCC 3.0 6.0
Outputs Open
VIN = GND fi = 2.5MHz 50% Duty Cycle
OE
= GND
IN = 3.4
V
V
IN = GND
5.0 14.0
LE = VCC Eight Bits Toggling
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Per TTL driven input (V
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
C = IQUIESCENT + IINPUTS + IDYNAMIC
6. I IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi)
CC = Quiescent Current
I
CC = Power Supply Current for a TTL High Input (VIN = 3.4V)
I
H = Duty Cycle for TTL Inputs High
D
T = Number of TTL Inputs at DH
N ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i = Input Frequency
f
i = Number of Inputs at fi
N All currents are in milliamps and all frequencies are in megahertz.
CC = 5.0V, +25°C ambient.
IN = 3.4V). All other inputs at VCC or GND.
CC formula. These limits are guaranteed but not tested.
(2)
Max. Unit
MHz
(5)
(5)
2571 tbl 07
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IDT54/74FCT841AT/BT/CT/DT FAST CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
(1)
(4)
Min.
1.5 9.0 1.5 10.0 1.5 6.5 1.5 7.5 ns
1.5 13.0 1.5 15.0 1.5 13.0 1.5 15.0
Symbol Parameter Conditions
tPLH tPHL
Propagation Delay
I to YI (LE = HIGH)
D
CL = 50pF
R
L = 500
CL = 300pF
RL = 500 tPLH tPHL
Propagation Delay
I
LE to Y
CL = 50pF
R
L = 500
CL = 300pF
(4)
1.5 12.0 1.5 13.0 1.5 8.0 1.5 10.5 ns
1.5 16.0 1.5 20.0 1.5 15.5 1.5 18.0
RL = 500 tPZH tPZL
Output Enable Time OE to YI CL = 50pF
R
L = 500
CL = 300pF
(4)
1.5 11.5 1.5 13.0 1.5 8.0 1.5 8.5 ns
1.5 23.0 1.5 25.0 1.5 14.0 1.5 15.0
RL = 500
L = 500
(4)
1.5 7.0 1.5 9.0 1.5 6.0 1.5 6.5 ns
1.5 8.0 1.5 10.0 1.5 7.0 1.5 7.5
tPHZ tPLZ
Output Disable Time OE to Y I CL = 5pF
RL = 500
CL = 50pF
R tSU Data to LE Set-up Time CL = 50pF 2.5 2.5 2.5 2.5 ns
tH Data to LE Hold Time RL = 500 2.5 3.0 2.5 2.5 ns tW LE Pulse Width HIGH
NOTES: 2571 tbl 08
1. See test circuit and waveforms. 3. These parameters are guaranteed but not tested.
2. Minimum limits are guaranteed but not tested on Propagation Delays. 4. These conditions are guaranteed but not tested.
(3)
4.0 5.0 4.0 4.0 ns
FCT841AT FCT841BT
Com'l. Mil. Com'l. Mil.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max.
Unit
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT841CT FCT841DT
Com'l. Mil. Com'l. Mil.
Symbol Parameter Conditions
tPLH tPHL
Propagation Delay
I to YI (LE = HIGH)
D
CL = 50pF
R
L = 500
CL = 300pF
(1)
(4)
(2)
Min.
Max. Min.
1.5 5.5 1.5 6.3 1.5 4.2 ns
1.5 13.0 1.5 15.0 1.5 8.0
RL = 500 tPLH tPHL
Propagation Delay
I
LE to Y
CL = 50pF
R
L = 500
CL = 300pF
(4)
1.5 6.4 1.5 6.8 1.5 4.0 ns
1.5 15.0 1.5 16.0 1.5 8.0
RL = 500 tPZH tPZL
Output Enable Time OE to YI CL = 50pF
R
L = 500
CL = 300pF
(4)
1.5 6.5 1.5 7.3 1.5 4.8 ns
1.5 12.0 1.5 13.0 1.5 9.0
RL = 500
L = 500
(4)
1.5 5.7 1.5 6.0 1.5 4.0 ns
1.5 6.0 1.5 6.3 1.5 4.0
tPHZ tPLZ
Output Disable Time OE to Y I CL = 5pF
RL = 500
CL = 50pF
R tSU Data to LE Set-up Time CL = 50pF 2.5 2.5 1.5 ns
tH Data to LE Hold Time RL = 500 2.5 2.5 1.0 ns tW LE Pulse Width HIGH
NOTES: 2571 tbl 09
1. See test circuit and waveforms. 3. These parameters are guaranteed but not tested.
2. Minimum limits are guaranteed but not tested on Propagation Delays. 4. These conditions are guaranteed but not tested.
(3)
4.0 4.0 3.0 ns
(2)
Max. Min.
(2)
Max. Min.
(2)
Max.
Unit
6.22 5
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IDT54/74FCT841AT/BT/CT/DT FAST CMOS BUS INTERFACE LATCHES
TEST CIRCUITS AND WAVEFORMS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS FOR ALL OUTPUTS
V
CC
7.0V
SWITCH POSITION
Test
Open Drain Disable Low
Enable Low
All Other Tests
Generator.
Pulse
Generator
500
V
V
IN
OUT
D.U.T.
50pF
T
R
C
500
L
2571 drw 04
DEFINITIONS:
L= Load capacitance: includes jig and probe capacitance.
C R
T = Termination resistance: should be equal to ZOUT of the Pulse
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
t
t
REM
H
t
H
t
SU
t
SU
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
2571 drw 05
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
Switch
Closed
Open
2571 lnk 11
1.5V
t
W
1.5V
2571 drw 06
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
t
PLH
t
PLH
t
PHL
t
PHL
3V
1.5V 0V
V
OH
1.5V
V
OL
3V
1.5V 0V
2571 drw 07
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLE DISABLE
3V
CONTROL
INPUT
t
PHZ
PLZ
t
F ≤ 2.5ns; tR 2.5ns
t
PZL
OUTPUT
NORMALLY
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable­HIGH
2. Pulse Generator for All Pulses: Rate 1.0MHz; t
LOW
SWITCH CLOSED
t
PZH
SWITCH OPEN
3.5V
1.5V
1.5V 0V
0.3V
0.3V
1.5V 0V
3.5V
V
OL
V
OH
0V
2571 drw 08
6.22 6
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IDT54/74FCT841AT/BT/CT/DT FAST CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT XX
Temp. Range
FCT
XXXX
Device TypeXPackage
X
Process
Blank B
P D E L SO PY Q
841AT 841BT 841CT 841DT
54 74
Commercial MIL-STD-883, Class B
Plastic DIP CERDIP CERPACK Leadless Chip Carrier Small Outline IC Shrink Small Outline Package Quarter-size Small Outline Package
10-Bit Non-Inverting Latch
–55°C to +125°C 0°C to +70°C
2571 drw 09
6.22 7
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