Datasheet IDT54FCT841A, IDT54FCT841B, IDT54FCT841C, IDT74FCT841A, IDT74FCT841B Datasheet (Integrated Device Technology)

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查询IDT54FCT841ADB供应商
Integrated Device Technology, Inc.
HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES
IDT54/74FCT841A/B/C
• Equivalent to AMD’s Am29841-46 bipolar registers in pinout/function, speed and output drive over full tem­perature and voltage supply extremes
• IDT54/74FCT841A equivalent to FAST speed
• IDT54/74FCT841B 25% faster than FAST
• IDT54/74FCT841C 40% faster than FAST
• Buffered common latch enable, clear and preset inputs
•I
OL = 48mA (commercial) and 32mA (military)
• Clamp diodes on all inputs for ringing suppression
• CMOS power levels (1mW typ. static)
• TTL input and output level compatible
• CMOS output level compatible
• Substantially lower input current levels than AMD’s bipolar Am29800 series (5µA max.)
• Product available in Radiation Tolerant and Radiation Enhanced versions
• Military product compliant to MIL-STD-883, Class B
FUNCTIONAL BLOCK DIAGRAM
DESCRIPTION:
The IDT54/74FCT800 series is built using an advanced
dual metal CMOS technology.
The IDT54/74FCT840 series bus interface latches are designed to eliminate the extra packages required to buffer existing latches and provide extra data width for wider address/ data paths or buses carrying parity. The IDT54/74FCT841 is a buffered, 10-bit wide version of the popular ‘373 function.
All of the IDT54/74FCT800 high-performance interface family are designed for high-capacitance load drive capability, while providing low-capacitance bus loading at both inputs and outputs. All inputs have clamp diodes and all outputs are designed for low-capacitance bus loading in the high-imped­ance state.
PRE
CLR
LE
OE
D0
D LE
CLR
DN
P
Q
0
Y
D LE
CLR
P
Q
N
Y
2607 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc. FAST is a trademark of National Semiconductor Co.
MILITARY AND COMMERCIAL TEMPERATURE RANGES APRIL 1994
1994 Integrated Device Technology, Inc. 7.22 DSC-4603/2
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IDT54/74FCT841A/B/C HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
1
OE
2
D
0
3
D1
4
D2 D3 D4 D5 D6 D7 D
D9
GND
8
P24-1 D24-1
5
E24-1
6 7
SO24-2
8 9 10
11 12
&
DIP/CERPACK/SOIC
TOP VIEW
24
VCC
23
Y
0
22
Y1
21
Y2
20
Y3
19
Y4
18
5
Y
17
Y6
16
Y7 Y8
15 14
Y9
13
LE
INDEX
D2 D3 D4
NC
D D6 D7
1
D
D0
32
4 5 6 7 8 9
5
10 11
12 13
D8
D9
OE
NC
1
L28-1
NC
GND
CC
V
LE
Y0
Y1
262728
25
Y2
24
Y3
23
Y4
22
NC Y
5
21 20
Y6
19
1817161514
9
Y
Y7
Y8
LCC
TOP VIEW
2607 drw 02
2607 drw 03
PIN DESCRIPTION
Name I/O Description
CLR
DI I The latch data inputs. LE I The latch enable input. The latches are
YI O The 3-state latch outputs.
OE
PRE
I When
CLR
is LOW, the outputs are
LOW if OE is LOW. When
CLR
is HIGH,
data can be entered into the latch.
transparent when LE is HIGH. Input data is latched on the HIGH-to-LOW transition.
I The output enable control. When OE is
LOW, the outputs are enabled. When
OE
is HIGH, the outputs (Y
I) are in the
high-impedance (off) state.
I Preset line. When
PRE
is LOW, the outputs are HIGH if OE is LOW. Preset overrides
CLR
.
2607 tbl 01
LE D
(1)
Inter-
I
nal
Q
Out-
puts
I
Y
I
Function
FUNCTION TABLE
Inputs
CLR
PRE
CLR
PREOEOE
H H H X X X Z High Z H H H H L L Z High Z H H H H H H Z High Z H H H L X NC Z Latched (High Z) H H L H L L L Transparent H H L H H H H Transparent H H L L X NC NC Latched H L L X X H H Preset
L H L X X L L Clear L L L X X H H Preset L H H L X L Z Latched (High Z)
H L H L X H Z Latched (High Z)
NOTE: 2607 tbl 02
1. H = HIGH, L = LOW, X = Don’t Care, NC = No Change, Z = High Impedance
7.22 2
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IDT54/74FCT841A/B/C HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0 V with Respect to GND
(3)
VTERM
Terminal Voltage
–0.5 to VCC –0.5 to VCC V with Respect to GND
TA Operating
0 to +70 –55 to +125 °C
Temperature
TBIAS Temperature
–55 to +125 –65 to +135 °C
Under Bias
TSTG Storage
–55 to +125 –65 to +150 °C
Temperature
PT Power Dissipation 0.5 0.5 W IOUT DC Output
120 120 mA
Current
NOTE: 2607 tbl 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed V
2. Input and V
3. Outputs and I/O terminals only.
CC by +0.5V unless otherwise noted.
CC terminals only.
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
C
IN
Input Capacitance
C
OUT
Output Capacitance
NOTE: 2607 tbl 04
1. This parameter is measured at characterization but not tested.
(1)
Conditions Typ. Max. Unit
VIN = 0V 6 10 pF
V
OUT
= 0V 8 12 pF
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 V VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V II H Input HIGH Current VCC = Max. VI = VCC —— 5µA
VI = 2.7V 5
II L Input LOW Current VI = 0.5V –5
VI = GND –5
IOZH Off State (High Impedance) VCC = Max. VO = VCC ——10µA
Output Current VO = 2.7V 10
IOZL VO = 0.5V –10
VO = GND –10 VIK Clamp Diode Voltage VCC = Min., IN = –18mA –0.7 –1.2 V IOS Short Circuit Current VCC = Max.
(3)
, VO = GND –75 –120 mA
VOH Output HIGH Voltage VCC = 3V, VIN = VLC or VHC, IOH = –32µAVHC VCC —V
VCC = Min. IOH = –300µAVHC VCC VIN = VIH or VIL IOH = –15mA MIL. 2.4 4.3
IOH = –24mA COM'L. 2.4 4.3 — VOL Output LOW Voltage VCC = 3V, VIN = VLC or VHC, IOL = 300µA GND VLC V
VCC = Min. IOL = 300µA GND VLC VIN = VIH or VIL IOL = 32mA MIL. 0.3 0.5
IOL = 48mA COM'L. 0.3 0.5
NOTES: 2607 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
CC = 5.0V, +25°C ambient and maximum loading.
(2)
Max. Unit
(4)
(4)
(4)
(4)
(4)
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IDT54/74FCT841A/B/C HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
VLC = 0.2V; VHC = VCC – 0.2V
Symbol Parameter Test Conditions
ICC
ICC ICCD Dynamic Power Supply
Quiescent Power Supply Current VCC = Max.
IN ≥ VHC; V IN VLC
V Quiescent Power Supply Current TTL Inputs HIGH
VCC = Max.
IN = 3.4V
V
VCC = Max.
(4)
Current
Outputs Open
OE
= GND
CC
LE = V
(3)
(1)
V
IN VHC IN VLC
V
Min. Typ.
0.2 1.5 mA
0.5 2.0 mA — 0.15 0.25 mA/
One Input Toggling
50% Duty Cycle
IC Total Power Supply Current
(6)
VCC = Max.
Outputs Open
fi = 10MHz
VIN VHC V
IN VLC
(FCT)
1.7 4.0 mA
50% Duty Cycle
OE
= GND
LE = V
CC
V
IN = 3.4V IN = GND
V
2.0 5.0
One Bit Toggling
VCC = Max.
Outputs Open
fi = 2.5MHz
VIN VHC
IN VLC
V (FCT)
3.2 6.5
50% Duty Cycle
OE
= GND
LE = V
CC
V
IN = 3.4V IN = GND
V
5.2 14.5
Eight Bits Toggling
NOTES: 2607 tbl 06
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VC
3. Per TTL driven input (V
4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
5. Values for these conditions are examples of the I
6. I
C = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi)
CC = Quiescent Current
I
CC = Power Supply Current for a TTL High Input (VIN = 3.4V)
I D
H = Duty Cycle for TTL Inputs High T = Number of TTL Inputs at DH
N ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f f
i = Input Frequency
i = Number of Inputs at fi
N All currents are in milliamps and all frequencies are in megahertz.
C = 5.0V, +25°C ambient.
IN = 3.4V); all other inputs at VCC or GND.
CC formula. These limits are guaranteed but not tested.
(2)
Max. Unit
MHz
(5)
(5)
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IDT54/74FCT841A/B/C HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT841A FCT841B FCT841C
Com'l. Mil. Com'l. Mil. Com'l. Mil.
(2)
(1)
Min.
Symbol Parameter Conditions
tPLH tPHL
Propagation Delay D
I to YI (LE = HIGH)
CL = 50pF
R
L = 500
CL = 300pF
RL = 500 tPLH tPHL
Propagation Delay LE to Y
I
CL = 50pF
R
L = 500
CL = 300pF
RL = 500 tPLH Propagation Delay,
PRE
to YI CL = 50pF 1.5 12.0 1.5 14.0 1.5 8.0 1.5 10.0 1.5 7.0 1.5 9.0 ns
(4)
(4)
Max. Min.
1.5 9.0 1.5 10.0 1.5 6.5 1.5 7.5 1.5 5.5 1.5 6.3 ns
1.5 13.0 1.5 15.0 1.5 13.0 1.5 15.0 1.5 13.0 1.5 15.0
1.5 12.0 1.5 13.0 1.5 8.0 1.5 10.5 1.5 6.4 1.5 6.8 ns
1.5 16.0 1.5 20.0 1.5 15.5 1.5 18.0 1.5 15.0 1.5 16.0
tPHL RL = 500 1.5 14.0 1.5 17.0 1.5 10.0 1.5 13.0 1.5 9.0 1.5 12.0 tPHL Propagation Delay,
CLR
to YI 1.5 13.0 1.5 14.0 1.5 10.0 1.5 11.0 1.5 9.0 1.5 10.0 ns
tPLH 1.5 14.0 1.5 17.0 1.5 10.0 1.5 10.0 1.5 9.0 1.5 9.0 tPZH
tPZL
Output Enable Time OE to YI CL = 50pF
R
L = 500
CL = 300pF
1.5 11.5 1.5 13.0 1.5 8.0 1.5 8.5 1.5 6.5 1.5 7.3 ns
(4)
1.5 23.0 1.5 25.0 1.5 14.0 1.5 15.0 1.5 12.0 1.5 13.0
RL = 500
L = 500
(4)
1.5 7.0 1.5 9.0 1.5 6.0 1.5 6.5 1.5 5.7 1.5 6.0 ns
1.5 8.0 1.5 10.0 1.5 7.0 1.5 7.5 1.5 6.0 1.5 6.3
tPHZ tPLZ
Output Disable Time OE to Y I CL = 5pF
RL = 500
CL = 50pF
R tSU Data to LE Set-up Time CL = 50pF 2.5 2.5 2.5 2.5 2.5 2.5 ns
tH Data to LE Hold Time RL = 500 2.5 3.0 2.5 2.5 2.5 2.5 ns tW LE Pulse Width tW tW
PRE
Pulse Width
CLR
Pulse Width
tREM Recovery Time tREM Recovery Time
NOTES: 2607 tbl 07
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. These parameters are guaranteed but not tested.
4. These conditions are guaranteed but not tested.
(3)
PRE CLR
HIGH 4.0 5.0 4.0 4.0 4.0 4.0 ns
(3)
LOW 5.0 7.0 4.0 4.0 4.0 4.0 ns
(3)
LOW 4.0 5.0 4.0 4.0 4.0 4.0 ns to LE 4.0 4.0 4.0 4.0 4.0 4.0 ns to LE 3.0 3.0 3.0 3.0 3.0 3.0 ns
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max.
Unit
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IDT54/74FCT841A/B/C HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS TEST CIRCUITS FOR ALL OUTPUTS
V
CC
7.0V
SWITCH POSITION
Test Switch
Open Drain
Pulse
Generator
500
V
V
IN
OUT
D.U.T.
50pF
T
R
CL
500
DEFINITIONS: 2607 tbl 08
CL = Load capacitance: includes jig and probe capacitance.
T = Termination resistance: should be equal to ZOUT of the Pulse
R
Disable Low Closed
Enable Low
All Other Tests Open
Generator.
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
tSU
tSU
tH
tREM
tH
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
1.5V
tW
1.5V
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
tPLH
tPHL
tPLH tPHL
3V
1.5V 0V
V
OH
1.5V
VOL
3V
1.5V 0V
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLE DISABLE
3V
CONTROL
INPUT
PLZtPZL
t
OUTPUT
NORMALLY
LOW
SWITCH CLOSED
3.5V
1.5V
tPZH tPHZ
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable­HIGH
2. Pulse Generator for All Pulses: Rate 1.0MHz; t
SWITCH OPEN
1.5V 0V
F ≤ 2.5ns; tR 2.5ns
0.3V
0.3V
1.5V 0V
3.5V
VOL
VOH
0V
2607 drw 04
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IDT54/74FCT841A/B/C HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT XX
Temp. Range
FCT
XXXX
Device TypeXPackage
X
Process
Blank B
P D E L SO
841A 841B 841C
54 74
Commercial MIL-STD-883, Class B
Plastic DIP CERDIP CERPACK Leadless Chip Carrier Small Outline IC
10-Bit Non-Inverting Latch
–55°C to +125°C 0°C to +70°C
2607 drw 05
7.22 7
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