Datasheet IDT74FCT521TSOB, IDT74FCT521CTSOB, IDT74FCT521CTSO, IDT74FCT521CTQB, IDT74FCT521CTQ Datasheet (Integrated Device Technology)

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Integrated Device Technology, Inc.
FAST CMOS 8-BIT IDENTITY COMPARATOR
IDT54/74FCT521T IDT54/74FCT521AT IDT54/74FCT521BT IDT54/74FCT521CT
FEATURES:
• Std., A, B and C speed grades
• Low input and output leakage 1µA (max.)
• CMOS power levels
• True TTL input and output compatibility – VOH = 3.3V (typ.) – V
OL = 0.3V (typ.)
• High drive outputs (-15mA IOH, 48mA IOL)
• Meets or exceeds JEDEC standard 18 specifications
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked)
• Available in DIP, SOIC, SSOP, QSOP, CERPACK and
LCC packages
A0 B0
A1 B1
A2 B2
A3 B3
A4 B4
OA=B
DESCRIPTION:
The IDT54/74FCT521T/AT/BT/CT are 8-bit identity com­parators built using an advanced dual metal CMOS technol­ogy. These devices compare two words of up to eight bits each and provide a LOW output when the two words match bit for bit. The expansion input
I
A = B also serves as an active LOW
enable input.
PIN CONFIGURATIONSFUNCTIONAL BLOCK DIAGRAM
IA=B
A0 B0
A1
B1 A2
B2
A3
B3
GND
DIP/SOIC/SSOP/QSOP/CERPACK
2 3
P20-1
4
D20-1
SO20-2
5
SO20-7
6
SO20-8
7 8
E20-1 9 10 11
TOP VIEW
20 19 18 17 16 15 14
&
13 12
VCC1 OA=B B
7
A7 B6 A6 B5 A5 B4 A4
2572 drw 02
A5 B5
A6 B6
A7 B7
IA=B
2572 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDEX
A1 B1 A2 B2 A3
A0
B0
IA=B
3 2 20 19
4 5
6 7 8
1
L20-2
9 10111213
4
B3
A
GND
LCC
TOP VIEW
VCC
B4
OA=B
18 17
16 15 14
A5
B7 A7
B6 A6
B5
2572 drw 03
MILITARY AND COMMERCIAL TEMPERATURE RANGES APRIL 1995
1995 Integrated Device Technology, Inc. 6.16 DSC-4210/4
1
IDT54/74FCT521T/AT/BT/CT FAST CMOS 8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Pin Names Description
A0 - A
7
B0 - B
7
IA =
B
OA =
B
FUNCTION TABLE
Word A Inputs Word B Inputs
Expansion or Enable Input (Active LOW) Identity Output (Active LOW)
(1)
2572 tbl 01
Inputs Output
I
A=B A, B
I
L
L H H
NOTE: 2572 tbl 02
1. H = HIGH Voltage Level L = LOW Voltage Level
A0 = B0, A1 = B1, A2 = B2, etc.
*
A = B*
A B
A = B*
A B
O
A=B
O
L H H H
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
Capacitance
COUT Output
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
(1)
Conditions Typ. Max. Unit
VIN = 0V 6 10 pF
VOUT = 0V 8 12 pF
2572 lnk 04
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0 V with Respect to GND
(3)
VTERM
TA Operating
Terminal Voltage with Respect to GND
–0.5 to
CC +0.5
V
–0.5 to
VCC +0.5
0 to +70 –55 to +125 °C
V
Temperature
TBIAS Temperature
–55 to +125 –65 to +135 °C Under Bias
TSTG Storage
–55 to +125 –65 to +150 °C Temperature
PT Power Dissipation 0.5 0.5 W IOUT DC Output
–60 to +120 –60 to +120 mA Current
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed V
CC by +0.5V unless otherwise noted.
2. Input and V
3. Outputs and I/O terminals only.
CC terminals only.
2572 lnk 03
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
V
IH
V
IL
I
I H
I
I L
I
I
V
IK
I
OS
V
OH
V
OL
V
H
I
CC
NOTES: 2572 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
Input HIGH Level Guaranteed Logic HIGH Level 2.0 V Input LOW Level Guaranteed Logic LOW Level 0.8 V
(4)
(4)
(4)
VCC = Max. VI = 2.7V — VCC = Max. VI = 0.5V — VCC = Max., VI = V
CC
(Max.)
Input HIGH Current Input LOW Current Input HIGH Current Clamp Diode Voltage VCC = Min., IN = –18mA –0.7 –1.2 V Short Circuit Current VCC = Max.
(3)
, VO = GND –60 –120 –225 mA
Output HIGH Voltage VCC = Min.
V
IN
= V
IH
or V
IL
Output LOW Voltage VCC = Min.
V
IN
= V
IH
or V
IL
Input Hysteresis
Quiescent Power Supply Current VCC = Max.
V
IN
= GND or V
CC = 5.0V, +25°C ambient.
A = -55°C.
CC
(1)
IOH = –6mA MIL. I
OH
= –8mA COM'L. IOH = –12mA MIL. I
OH
= –15mA COM'L. IOL = 32mA MIL. I
OL
= 48mA COM'L.
Min. Typ.
2.4 3.3 V
2.0 3.0 V
0.3 0.5 V
200 mV — 0.01 1 mA
(2)
Max. Unit
± ± ±
1
µ
A
1
µ
A
1
µ
A
6.16 2
IDT54/74FCT521T/AT/BT/CT FAST CMOS 8-BIT IDENTITY COMPARATOR MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol Parameter Test Conditions
ICC
Quiescent Power Supply Current TTL
CC = Max.
V
IN = 3.4V
V
(3)
(1)
Min. Typ.
0.5 2.0 mA
Inputs HIGH
ICCD Dynamic Power Supply Current
(4)
VCC = Max. Outputs Open
IN = VCC
V
IN = GND
V
0.15 0.25 mA/
One Input Toggling 50% Duty Cycle
IC Total Power Supply Current
(5)
VCC = Max. Outputs Open fi = 10MHz One Bit Toggling
VIN = VCC
IN = GND
V
IN = 3.4V
V
IN = GND
V
1.5 3.5 mA
1.8 4.5
50% Duty Cycle
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Per TTL driven input (V
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
C = IQUIESCENT + IINPUTS + IDYNAMIC
6. I IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi) I
CC = Quiescent Current
CC = Power Supply Current for a TTL High Input (VIN = 3.4V)
I
H = Duty Cycle for TTL Inputs High
D
T = Number of TTL Inputs at DH
N ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i = Input Frequency
f
i = Number of Inputs at fi
N All currents are in milliamps and all frequencies are in megahertz.
CC = 5.0V, +25°C ambient.
IN = 3.4V). All other inputs at VCC or GND.
CC formula. These limits are guaranteed but not tested.
(2)
Max. Unit
MHz
2572 tbl 06
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
IDT54/74FCT521T IDT54/74FCT521AT IDT54/74FCT521BT IDT54/74FCT521CT
Com'l. Mil. Com'l. Mil. Com'l. Mil. Com'l. Mil.
(1)
(2)
Symbol Parameter Condition
t
PLH
t
PHL
Propagation Delay
CL = 50pF
RL = 500
Min.
Max. Min.
1.5 11.0 1.5 15.0 1.5 7.2 1.5 9.5 1.5 5.5 1.5 7.3 1.5 4.5 1.5 5.1 ns
An or Bn to
O
A
=
B
t
PLH
Propagation Delay
t
PHL
I
A
= B to
O
A
=
B
NOTES: 2572 tbl 07
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
1.5 10.0 1.5 9.0 1.5 6.0 1.5 7.8 1.5 4.6 1.5 6.0 1.5 4.1 1.5 4.5 ns
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max.
Unit
6.16 3
IDT54/74FCT521T/AT/BT/CT FAST CMOS 8-BIT IDENTITY COMPARATOR
TEST CIRCUITS AND WAVEFORMS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS FOR ALL OUTPUTS
SWITCH POSITION
Test
V
CC
7.0V
Open Drain Disable Low
Pulse
Generator
500
V
V
IN
D.U.T.
T
R
OUT
50pF
C L
500
2572 drw 04
DEFINITIONS:
L= Load capacitance: includes jig and probe capacitance.
C R
T = Termination resistance: should be equal to ZOUT of the Pulse
Enable Low
All Other Tests
Generator.
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
tSU
tSU
tH
tREM
tH
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V
0V
3V
1.5V 0V
2572 drw 05
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
Switch
Closed
Open
2572 lnk 08
1.5V
tW
1.5V
2572 drw 06
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
tPLH
tPHL
tPLH tPHL
3V
1.5V 0V
V
OH
1.5V
VOL
3V
1.5V 0V
2572 drw 07
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLE DISABLE
3V
CONTROL
INPUT
PLZtPZL
t
OUTPUT
NORMALLY
LOW
SWITCH CLOSED
3.5V
1.5V
tPZH tPHZ
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable­HIGH
2. Pulse Generator for All Pulses: Rate 1.0MHz; t
SWITCH OPEN
1.5V 0V
F ≤ 2.5ns; tR 2.5ns
0.3V
0.3V
1.5V 0V
3.5V
VOL
VOH
0V
2572 drw 08
6.16 4
IDT54/74FCT521T/AT/BT/CT FAST CMOS 8-BIT IDENTITY COMPARATOR MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT XX FCT
Temp. Range
X
Family
XXXX
Device TypeXPackage
X
Process
Blank B
P D E L SO P Q
521T
Commercial MIL-STD-883, Class B
Plastic DIP CERDIP CERPACK Leadless Chip Carrier Small Outline IC Shrink Small Outline Package Quarter-size Small Outline Package
8-Bit Comparator 521AT 521BT 521CT
Blank High Drive
54 74
–55°C to +125°C
0°C to +70°C
2572 drw 09
6.16 5
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