Datasheet IDT74FCT273CTSOB, IDT74FCT273CTSO, IDT74FCT273CTQB, IDT74FCT273ATSOB, IDT74FCT273ATSO Datasheet (Integrated Device Technology)

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Integrated Device Technology, Inc.
FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET
IDT54/74FCT273T/AT/CT
FEATURES:
• Std., A, and C speed grades
• Low input and output leakage 1µA (max.)
• CMOS power levels
• True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.)
• High drive outputs (-15mA IOH, 48mA IOL)
• Meets or exceeds JEDEC standard 18 specifications
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked)
• Available in DIP, SOIC, QSOP, CERPACK and LCC
packages
FUNCTIONAL BLOCK DIAGRAM
D
0
CP
CP
R
D
1
Q
D
CP
D
R
D
2
D
Q D
QD
CP
R
D
D
DESCRIPTION:
The IDT54/74FCT273T/AT/CT are octal D flip-flops built using an advanced dual metal CMOS technology. The IDT54/ 74FCT273T/AT/CT have eight edge-triggered D-type flip­flops with individual D inputs and O outputs. The common buffered Clock (CP) and Master Reset (MR) inputs load and
reset (clear) all flip-flops simultaneously.
The register is fully edge-triggered. The state of each D input, one set-up time before the LOW-to-HIGH clock transition, is transferred to the corresponding flip-flop’s O output.
All outputs will be forced LOW independently of Clock or Data inputs by a LOW voltage level on the MR input. The device is useful for applications where the true output only is required and the Clock and Master Reset are common to all storage elements.
D
3
CP
R
Q D
D
D
4
CP
R
D
Q D
D
5
Q D
CP
R
D
D
6
D
Q D
CP
R
D
7
Q
CP
R
D
MR
O
0
O
1
O
2
O
3
O
4
O
5
O
6
O
7
2568 drw 03
PIN CONFIGURATIONS
MR
O
D0 D1
O1 O2 D2 D3 O3
GND
0
2 3 4
5 6 7 8 9 10 11
P20-1
D20-1 SO20-2 SO20-8
&
E20-1
20 19 18 17
16 15 14 13 12
VCC1 O D7 D6 O6
O5 D5 D4 O4
CP
7
DIP/SOIC/QSOP/CERPACK
TOP VIEW
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
2568 drw 01
INDEX
D
1
O
1
O
2
D
2
D
3
0D0
O
3 2 20 19
4
1
5 6
L20-2
7 8
9 10111213
3
O
GND
LCC
TOP VIEW
MILITARY AND COMMERCIAL TEMPERATURE RANGES APRIL 1995
1995 Integrated Device Technology, Inc. 6.10 DSC-4209/3
MR
CP
CC
V
4
O
7
O
18
D
7
17
D
6
O O D
6 5
5
2568 drw 02
1
4
D
16 15 14
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IDT54/74FCT273T/AT/CT FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION FUNCTION TABLE
Pin Names Description
DN Data Inputs
MR
Master Reset (Active LOW) CP Clock Pulse Input (Active Rising Edge) ON Data Outputs
2568 tbl 01
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0 V with Respect to GND
(3)
VTERM
TA Operating
Terminal Voltage with Respect to GND
–0.5 to
CC +0.5
V
–0.5 to
VCC +0.5
0 to +70 –55 to +125 °C
V
Temperature
TBIAS Temperature
–55 to +125 –65 to +135 °C Under Bias
TSTG Storage
–55 to +125 –65 to +150 °C Temperature
PT Power Dissipation 0.5 0.5 W IOUT DC Output
–60 to +120 –60 to +120 mA Current
NOTES:
implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability. No terminal voltage may exceed
CC by +0.5V unless otherwise noted.
V
2. Input and V
3. Outputs and I/O terminals only.
CC terminals only.
2568 lnk 03
Operating Mode
Reset (Clear) L X X L
Load "1" H hH Load "0" H IL
NOTE: 2568 tbl 02
1. H = HIGH voltage level steady state h = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock transition L = LOW voltage level steady state I = LOW voltage level one set-up time prior to the LOW-to-HIGH clock transition X = Don’t Care = LOW-to-HIGH Clock Transition
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
Capacitance
COUT Output
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
(1)
Inputs Outputs
CP DN ON
Conditions Typ. Max. Unit
(1)
MR
MR
VIN = 0V 6 10 pF
VOUT = 0V 8 12 pF
2568 lnk 04
6.10 2
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IDT54/74FCT273T/AT/CT FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 V VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V
(4)
(4)
(4)
VCC = Max. VI = 2.7V ±1 µA VCC = Max. VI = 0.5V ±1 µA VCC = Max., VI = VCC (Max.) ±1 µA
II H Input HIGH Current II L Input LOW Current II Input HIGH Current VIK Clamp Diode Voltage VCC = Min., IN = –18mA –0.7 –1.2 V IOS Short Circuit Current VCC = Max. VOH Output HIGH Voltage VCC = Min.
V
IN = VIH or VIL
VOL Output LOW Voltage VCC = Min.
V
IN = VIH or VIL
(3)
, VO = GND –60 –120 –225 mA
IOH = –6mA MIL. I
OH = –8mA COM'L.
IOH = –12mA MIL. I
OH = –15mA COM'L.
IOL = 32mA MIL. I
OL = 48mA COM'L.
2.4 3.3 V
2.0 3.0 V
0.3 0.5 V
VH Input Hysteresis 200 mV ICC Quiescent Power Supply Current VCC = Max.
V
IN = GND or VCC
NOTES: 2568 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test parameter for this parameter is ±5µA at T
CC = 5.0V, +25°C ambient.
A = -55°C.
0.01 1 mA
(2)
Max. Unit
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IDT54/74FCT273T/AT/CT FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol Parameter Test Conditions
ICC
Quiescent Power Supply Current TTL Inputs HIGH
ICCD Dynamic Power Supply
(4)
Current
VCC = Max. V
IN = 3.4V
(3)
VCC = Max. Outputs Open
MR
= V
CC
(1)
V
IN = VCC
V
IN = GND
Min. Typ.
0.5 2.0 mA — 0.15 0.25 mA/
One Input Toggling 50% Duty Cycle
IC Total Power Supply Current
(6)
VCC = Max. Outputs Open f
CP= 10MHz
IN = VCC
V V
IN = GND
1.5 3.5 mA
50% Duty Cycle
MR
= VCC
One Bit Toggling
IN = 3.4V
V V
IN = GND
2.0 5.5
at fi = 5MHz 50% Duty Cycle VCC = Max. Outputs Open f
CP= 10MHz
IN = VCC
V V
IN = GND
3.8 7.3
50% Duty Cycle
MR
= VCC
Eight Bits Toggling
IN = 3.4V
V V
IN = GND
6.0 16.3
at fi = 2.5MHz 50% Duty Cycle
NOTES: 2568 tbl 06
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Per TTL driven input (V
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
6. I
C = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi)
CC = Quiescent Current
I
CC = Power Supply Current for a TTL High Input (VIN = 3.4V)
I D
H = Duty Cycle for TTL Inputs High T = Number of TTL Inputs at DH
N ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f f
i = Input Frequency
i = Number of Inputs at fi
N All currents are in milliamps and all frequencies are in megahertz.
CC = 5.0V, +25°C ambient.
IN = 3.4V); all other inputs at VCC or GND.
CC formula. These limits are guaranteed but not tested.
(2)
Max. Unit
MHz
5)
(5)
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IDT54/74FCT273T/AT/CT FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
IDT54/74FCT273T IDT54/74FCT273AT IDT54/74FCT273CT Com'l. Mil. Com'l. Mil. Com'l. Mil.
Symbol Parameter Condition
tPLH tPHL
Propagation Delay CP to O
N
CL = 50pF RL = 500
tPHL Propagation Delay
MR
to O
N
tSU Set-up Time HIGH or LOW
D
N to CP
tH Hold Time HIGH or LOW DN
to CP
tW CP Pulse Width HIGH or
LOW
tW
MR
Pulse Width LOW
Min.
(2)
Max. Min.
(1)
2.0 13.0 2.0 15.0 2.0 7.2 2.0 8.3 2.0 5.8 2.0 6.5 ns
2.0 13.0 2.0 15.0 2.0 7.2 2.0 8.3 2.0 6.1 2.0 6.8 ns
3.0 3.5 2.0 2.0 2.0 2.0 ns
2.0 2.0 1.5 1.5 1.5 1.5 ns
7.0 7.0 6.0 6.0 6.0 6.0 ns
7.0 7.0 6.0 6.0 6.0 6.0 ns
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max.
Unit
tREM Recovery Time
to CP
NOTES: 2568 tbl 07
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
MR
4.0 5.0 2.0 2.5 2.0 2.5 ns
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IDT54/74FCT273T/AT/CT FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET
TEST CIRCUITS AND WAVEFORMS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS FOR ALL OUTPUTS
V
CC
V
OUT
50pF
C L
Pulse
Generator
V
IN
D.U.T.
T
R
7.0V
500
500
2568 drw 04
SWITCH POSITION
Test Switch
Open Drain Disable Low
Enable Low
All Other Tests
DEFINITIONS:
L= Load capacitance: includes jig and probe capacitance.
C
T = Termination resistance: should be equal to ZOUT of the Pulse
R
Generator.
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
tSU
tSU
tH
tREM
tH
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
2568 drw 05
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
Closed
Open
2568 lnk 08
1.5V
tW
1.5V
2568 drw 06
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
tPLH
tPHL
tPLH tPHL
3V
1.5V 0V
V
OH
1.5V
VOL
3V
1.5V 0V
2568 drw 07
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLE DISABLE
3V
CONTROL
INPUT
t
PLZtPZL
OUTPUT
NORMALLY
LOW
SWITCH CLOSED
3.5V
1.5V
tPZH tPHZ
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable­HIGH
2. Pulse Generator for All Pulses: Rate 1.0MHz; t
SWITCH OPEN
1.5V 0V
F ≤ 2.5ns; tR 2.5ns
0.3V
0.3V
1.5V 0V
3.5V
VOL
VOH
0V
2568 drw 08
6.10 6
Page 7
IDT54/74FCT273T/AT/CT FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDTXX
Temp. Range
FCT
X
Family
XXXX
Device TypeXPackage
X
Process
Blank B
P D SO L E Q
273T
Commercial MIL-STD-883, Class B
Plastic DIP CERDIP Small Outline IC Leadless Chip Carrier CERPACK Quarter-size Small Outline Package
Octal D Flip-Flop w/Clear 273AT 273CT
Blank High Drive
54 74
–55
°
C to +125°C
0
°
C to +70°C
2568 drw 09
6.10 7
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