Datasheet IDT74FCT16500CTPVB, IDT74FCT16500CTPV, IDT74FCT16500CTPFB, IDT74FCT16500CTPF, IDT74FCT16500CTPAB Datasheet (Integrated Device Technology)

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Integrated Device Technology, Inc.
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
IDT54/74FCT16500AT/CT/ET
IDT54/74FCT162500AT/CT/ET
FEATURES:
• Common features:
– 0.5 MICRON CMOS Technology
– High-speed, low-power CMOS replacement for
ABT functions
– Typical tSK(o) (Output Skew) < 250ps – Low input and output leakage 1µA (max.)
– ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
– Packages include 25 mil pitch SSOP, 19.6 mil pitch
TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch Cerpack – Extended commercial range of -40°C to +85°C –V
CC = 5V ±10%
• Features for FCT16500AT/CT/ET:
– High drive outputs (-32mA IOH, 64mA IOL) – Power off disable outputs permit “live insertion” – Typical VOLP (Output Ground Bounce) < 1.0V at
VCC = 5V, TA = 25°C
• Features for FCT162500AT/CT/ET:
– Balanced Output Drivers: ±24mA (commercial),
±16mA (military)
– Reduced system switching noise – Typical VOLP (Output Ground Bounce) < 0.6V at
VCC = 5V,TA = 25°C
DESCRIPTION:
The FCT16500AT/CT/ET and FCT162500AT/CT/ET 18-
bit registered transceivers are built using advanced dual metal CMOS technology. These high-speed, low-power 18-bit reg­istered bus transceivers combine D-type latches and D-type flip-flops to allow data flow in transparent, latched and clocked modes. Data flow in each direction is controlled by output­enable (OEAB and
and clock (
CLKAB
OEBA
and
), latch enable (LEAB and LEBA)
CLKBA
) inputs. For A-to-B data flow, the device operates in transparent mode when LEAB is HIGH. When LEAB is LOW, the A data is latched if
CLKAB
is held at a HIGH or LOW logic level. If LEAB is LOW, the A bus data is stored in the latch/flip-flop on the HIGH-to-LOW transition of
CLKAB
port. Data flow from B port to A port is similar but uses LEBA and
. OEAB performs the output enable function on the B
OEBA
CLKBA
. Flow-through organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin.
The FCT16500AT/CT/ET are ideally suited for driving high-capacitance loads and low-impedance backplanes. The output buffers are designed with power off disable capability to allow "live insertion" of boards when used as backplane drivers.
The FCT162500AT/CT/ET have balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot, and controlled output fall times–reducing the need for external series terminating resistors. The FCT162500AT/CT/ET are plug-in replacements for the FCT16500AT/CT/ET and ABT16500 for on-board bus inter­face applications.
,
FUNCTIONAL BLOCK DIAGRAM
OEAB
CLKBA
OEBA
CLKAB
C
A1
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
D
C
D
TO 17 OTHER CHANNELS
MILITARY AND COMMERCIAL TEMPERATURE RANGES AUGUST 1996
1996 Integrated Device Technology, Inc. 5.9 DSC-2548/7
C
B1
D
C
D
2548 drw 01
1
IDT54/74FCT16500AT/CT/ET, 162500AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
OEAB
LEAB
A
GND
A A3
VCC
A4 A5 A
GND
A7 A8
A9 A A11 A12
GND
A13 A14 A
VCC
A16 A
GND
A18
OEBA
LEBA
OEAB
LEAB
A
GND
A A3
VCC
A4 A5 A
GND
A7 A8
A9 A A11 A12
GND
A13 A14 A
VCC
A16 A
GND
A18
OEBA
LEBA
1
2
6
10
15
17
48
43
56 55 54 53 52 51 50 49
47 46 45 44
42 41 40 39 38 37 36 35 34 33 3225 31 30 29
GND CLKAB
B1 GND
2
B B3 VCC
4
B B5 B6 GND B7 B8 B9 B10 B11 B
12
GND B13 B14 B15 VCC
16
B B17 GND
18
B CLKBA
GND
1 2
1
3 4
2
5 6 7 8 9
6
10 11 12 13 14
SO56-1
10
15
SO56-2
SO56-3 16 17 18 19 20
15
21 22 23
17
24
26 27 28
1 2
3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
26 27 28
E56-1
56 55
54 53 52 51 50 49
48
47 46 45 44
43
42 41 40 39 38 37 36 35 34 33 3225 31 30 29
GND CLKAB
B1 GND B
2
B3 VCC B
4
B5 B6 GND B7 B8 B9 B10 B11 B
12
GND B13 B14 B15 VCC B
16
B17 GND B
18
CLKBA GND
SSOP/
TSSOP/TVSOP
TOP VIEW
2548 drw 02
CERPACK
2548 drw 03
TOP VIEW
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IDT54/74FCT16500AT/CT/ET, 162500AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Pin Names Description
OEAB A-to-B Output Enable Input
OEBA
LEAB A-to-B Latch Enable Input LEBA B-to-A Latch Enable Input
CLKAB CLKBA
Ax A-to-B Data Inputs or B-to-A 3-State Outputs Bx B-to-A Data Inputs or A-to-B 3-State Outputs
B-to-A Output Enable Input (Active LOW)
A-to-B Clock Input (Active LOW) B-to-A Clock Input (Active LOW)
2548 tbl 01
FUNCTION TABLE
(1,4)
Inputs Outputs
OEAB LEAB
CLKAB
CLKAB
Ax Bx
LXX XZ HHX LL HHX HH HLLL HLHH HLH XB HLL XB
NOTES: 2548 tbl 02
1. A-to-B data flow is shown. B-to-A data flow is similar but uses LEBA, and
2. Output level before the indicated steady-state input conditions were established.
3. Output level before the indicated steady-state input conditions were established, provided that
4. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-impedance ↓ = HIGH-to-LOW Transition
CLKBA
.
CLKAB
was LOW before LEAB went LOW.
(2)
(3)
OEBA
,
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Description Max. Unit
Terminal Voltage with Respect to
(2)
V
TERM
V
TERM
T
STG
I
OUT
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXXT Output and I/O terminals.
3. Output and I/O terminals for FCT162XXXT.
GND Terminal Voltage with Respect to
(3)
GND Storage Temperature –65 to +150°C
DC Output Current –60 to +120 mA
–0.5 to +7.0 V
–0.5 to
V
CC
+0.5
2548 lnk 03
V
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
Capacitance
CI/O I/O
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
(1)
Conditions Typ. Max. Unit
VIN = 0V 3.5 6.0 pF
VOUT = 0V 3.5 8.0 pF
2548 lnk 04
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IDT54/74FCT16500AT/CT/ET, 162500AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = –40°C to +85°C, VCC = 5.0V ± 10%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 V VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V II H Input HIGH Current (Input pins)
Input HIGH Current (I/O pins)
II L Input LOW Current (Input pins)
Input LOW Current (I/O pins)
(5)
VCC = Max. VI = VCC ±1 µA
(5)
(5)
VI = GND ±1
(5)
±1
±1 IOZH High Impedance Output Current VCC = Max. VO = 2.7V ±1 µA IOZL (3-State Output pins)
(5)
VO = 0.5V ±1 VIK Clamp Diode Voltage VCC = Min., IIN = –18mA 0.7 1.2 V IOS Short Circuit Current VCC = Max., VO = GND
(3)
–80 140 225 mA VH Input Hysteresis 100 mV ICCL
Quiescent Power Supply Current VCC = Max., VIN = GND or VCC 5 500 µA ICCH ICCZ
(2)
Max. Unit
2548 lnk 05
OUTPUT DRIVE CHARACTERISTICS FOR FCT16500T
Symbol Parameter Test Conditions
IO Output Drive Current VCC = Max., VO = 2.5V
(3)
(1)
Min. Typ.
–50 —–180 mA
VOH Output HIGH Voltage VCC = Min. IOH = –3mA 2.5 3.5 V
VIN = VIH or VIL IOH = –12mA MIL.
VOL Output LOW Voltage VCC = Min.
IN = VIH or VIL
V
IOFF Input/Output Power Off Leakage
(5)
VCC = 0V, VIN or VO 4.5V ±1 µA
OH = –15mA COM'L.
I IOH = –24mA MIL.
OH = –32mA COM'L.
I IOL = 48mA MIL.
OL = 64mA COM'L.
I
2.4 3.5 V
2.0 3.0 V
(4)
0.2 0.55 V
(2)
Max. Unit
2548 lnk 06
OUTPUT DRIVE CHARACTERISTICS FOR FCT162500T
Symbol Parameter Test Conditions
IODL Output LOW Current VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V IODH Output HIGH Current VCC = 5V, VIN = VIH or V IL, VOH Output HIGH Voltage VCC = Min.
V
IN = VIH or VIL
VOL Output LOW Voltage VCC = Min.
V
IN = VIH or VIL
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ± 5µA at T
A = –55°C.
(1)
(3)
VOUT = 1.5V
(3)
IOH = –16mA MIL. I
OH = –24mA COM'L.
IOL = 16mA MIL. I
OL = 24mA COM'L.
Min. Typ.
60 115 200 mA
–60 –115 –200 mA
2.4 3.3 V
0.3 0.55 V
(2)
Max. Unit
2548 lnk 07
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IDT54/74FCT16500AT/CT/ET, 162500AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol Parameter Test Conditions
CC Quiescent Power Supply VCC = Max. 0.5 1.5 mA
I
Current TTL Inputs HIGH V
ICCD Dynamic Power Supply Current
IN = 3.4V
(4)
VCC = Max., Outputs Open VIN = VCC 75 120 µA/ OEAB =
(3)
OEBA
= V
CC or GND VIN = GND MHz
(1)
Min. Typ.
One Input Toggling 50% Duty Cycle
I
C Total Power Supply Current
(6)
VCC = Max., Outputs Open VIN = VCC 0.8 1.7 mA f
CP = 10MHz (
CLKAB
)VIN = GND 50% Duty Cycle OEAB =
OEBA
= V
CC
LEAB = GND VIN = 3.4V 1.3 3.2 One Bit Toggling V f
i = 5MHz
IN = GND
50% Duty Cycle
(2)
Max. Unit
V
CC = Max., Outputs Open VIN = VCC 3.8 6.5
fCP = 10MHz (
CLKAB
)VIN = GND 50% Duty Cycle OEAB =
OEBA
= V
CC
LEAB = GND VIN = 3.4V 8.5 20.8 Eighteen Bits Toggling VIN = GND f
i = 2.5MHz
50% Duty Cycle
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Per TTL driven input (V
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
C = IQUIESCENT + IINPUTS + IDYNAMIC
6. I IC = ICC + ICC DHNT + ICCD (fCPNCP/2 + fiNi)
I
CC = Quiescent Current (ICCL, ICCH and ICCZ)
CC = Power Supply Current for a TTL High Input (VIN = 3.4V)
I
H = Duty Cycle for TTL Inputs High
D
T = Number of TTL Inputs at DH
N ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
CP = Number of Clock Inputs at fCP
N fi = Input Frequency N
i = Number of Inputs at fi
CC = 5.0V, +25°C ambient.
IN = 3.4V). All other inputs at VCC or GND.
CC formula. These limits are guaranteed but not tested.
(5)
(5)
2548 tbl 08
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IDT54/74FCT16500AT/CT/ET, 162500AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT16500AT/162500AT FCT16500CT/162500CT FCT16500ET/162500ET
Com'l. Mil. Com'l. Mil. Com'l. Mil.
(1)
Symbol Parameter Condition
to Bx
(4)
CL = 50pF 150 150 150 150 150 — MHz RL = 5001.5 5.1 1.5 5.6 1.5 4.6 1.5 4.6 3.8 ns
fMAX
CLKAB
or
tPLH
Propagation Delay Ax to Bx or Bx to Ax
tPHL tPLH
Propagation Delay LEBA to Ax, LEAB to Bx
tPHL tPLH
Propagation Delay
CLKBA
tPHL tPZH
tPZL
tPHZ
tPLZ
to Ax,
Output Enable Time
OEBA
to Ax, OEAB to Bx
Output Disable Time
OEBA
to Ax, OEAB to Bx
CLKBA
CLKAB
frequency
tSU Set-up Time, HIGH or LOW
Ax to
CLKAB
, Bx to
CLKBA
tH Hold Time, HIGH or LOW
Ax to
CLKAB
, Bx to
CLKBA
tSU Set-up Time
HIGH or LOW Ax to LEAB, Bx to LEBA
Clock HIGH Clock LOW
tH Hold Time, HIGH or LOW
(2)
Min.
Max. Min.
1.5 5.6 1.5 6.0 1.5 5.3 1.5 5.6 4.2 ns
1.5 5.6 1.5 6.0 1.5 5.3 1.5 5.4 4.2 ns
1.5 6.0 1.5 6.4 1.5 5.6 1.5 6.0 4.8 ns
1.5 5.6 1.5 6.0 1.5 5.2 1.5 5.6 4.0 ns
3.0 3.0 3.0 3.0 2.4 ns
0—0—0—0—0———ns
3.0 3.0 3.0 3.0 2.0 ns
1.5 1.5 1.5 1.5 1.5 ns
1.5 1.5 1.5 1.5 0.5 ns
Ax to LEAB, Bx to LEBA
tW LEAB or LEBA Pulse Width
(4)
HIGH
tW
CLKAB
or
CLKBA
Pulse Width
HIGH or LOW
tSK(o) Output Skew
NOTES: 2548 tbl 09
1. See test circuits and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4. This parameter is guaranteed but not tested.
(4)
(3)
3.0 3.0 3.0 3.0 3.0 ns
3.0 3.0 3.0 3.0 3.0 ns
0.5 0.5 0.5 0.5 0.5 ns
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Unit
5.9 6
IDT54/74FCT16500AT/CT/ET, 162500AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS TEST CIRCUITS FOR ALL OUTPUTS
SWITCH POSITION
Test Switch
V
Pulse
Generator
CC
500
V
V
IN
OUT
D.U.T.
50pF
T
R
C
500
L
2548 drw 04
7.0V
Open Drain Disable Low
Enable Low
All Other Tests
DEFINITIONS:
C
L= Load capacitance: includes jig and probe capacitance. T = Termination resistance: should be equal to ZOUT of the Pulse
R
Generator.
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
t
t
REM
H
t
H
t
SU
t
SU
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V
0V
2548 drw 05
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
Closed
Open
2548 lnk 10
1.5V
t
W
1.5V
2548 drw 06
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
t
PLH
t
PLH
t
t
PHL
PHL
3V
1.5V 0V
OH
V
1.5V
V
OL
3V
1.5V 0V
2548 drw 07
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLE DISABLE
3V
CONTROL
INPUT
t
PHZ
PLZ
t
F ≤ 2.5ns; tR 2.5ns
t
PZL
OUTPUT
NORMALLY
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH
2. Pulse Generator for All Pulses: Rate 1.0MHz; t
LOW
SWITCH CLOSED
t
PZH
SWITCH OPEN
3.5V
1.5V
1.5V 0V
0.3V
0.3V
1.5V 0V
3.5V
V
V
0V
OL
OH
2548 drw 08
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IDT54/74FCT16500AT/CT/ET, 162500AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT
Temperature
Range
X
FCT
XXXX
Device
X
PackageXProcess
Type
Blank Commercial B
PV PA PF E
16500AT
MIL-STD-883, Class B Shrink Small Outline Package (SO56-1)
Thin Shrink Small Outline Package (SO56-2) Thin Very Small Outline Package (SO56-3) CERPACK (E56-1)
Non-Inverting 18-Bit Registered Transceiver 16500CT 16500ET 162500AT 162500CT 162500ET
54 74
-55°C to +125°C
-40°C to +85°C
2548 drw 09
5.9 8
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